| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 10/07/2008 | US7433052 Systems and methods for tilt and range measurement |
| 10/07/2008 | US7433051 Determination of lithography misalignment based on curvature and stress mapping data of substrates |
| 10/07/2008 | US7433050 Exposure apparatus and exposure method |
| 10/07/2008 | US7433049 Multi-axis interferometer with procedure and data processing for mirror mapping |
| 10/07/2008 | US7433048 Interferometer systems for measuring displacement and exposure systems using the same |
| 10/07/2008 | US7433047 Runout characterization |
| 10/07/2008 | US7433040 Apparatus and methods for detecting overlay errors using scatterometry |
| 10/07/2008 | US7433039 Apparatus and methods for reducing tool-induced shift during overlay metrology |
| 10/07/2008 | US7433038 Alignment of substrates for bonding |
| 10/07/2008 | US7433037 System for measuring periodic structures |
| 10/07/2008 | US7433029 Method and system to calibrate a camera system using phase demodulation sensing |
| 10/07/2008 | US7433028 Laser surveying instrument |
| 10/07/2008 | US7433027 Apparatus and method for detecting lens thickness |
| 10/07/2008 | US7433024 Range mapping using speckle decorrelation |
| 10/07/2008 | US7432497 Absolute linear encoder |
| 10/07/2008 | US7432496 Encoder scale writing or calibration at an end-use installation based on correlation sensing |
| 10/07/2008 | US7432021 a test pattern established on the mask substrate having an asymmetrical diffraction grating so as to generate positive first order diffracting light and negative first order diffracting light in different diffraction efficiencies |
| 10/07/2008 | US7431458 Method and arrangement for performing measurements of the topography of a surface by means of a thermal emission from the surface |
| 10/07/2008 | US7431457 Methods and systems for tracking a torsional orientation and position of an eye |
| 10/07/2008 | US7430808 Laser alignment device for drilling machine |
| 10/07/2008 | CA2277211C Variable pitch grating for diffraction range finding system |
| 10/02/2008 | WO2008119073A2 Portable optical measurement assembly and methods |
| 10/02/2008 | WO2008117894A1 Surface extraction method, surface extractor and program |
| 10/02/2008 | WO2008116917A1 Method for detecting surface defects on a substrate and device using said method |
| 10/02/2008 | WO2008116288A1 Divergence ratio distance mapping camera |
| 10/02/2008 | WO2008002973A3 Apparatus and method for determining the orientation of an object such as vehicle wheel alignment |
| 10/02/2008 | WO2007075496A3 System and method for conducting adaptive fourier filtering |
| 10/02/2008 | US20080243430 Multi-Targeting Method For Measuring Distance According to the Phase Measuring Principle |
| 10/02/2008 | US20080243429 Three-dimensional position-measuring apparatus |
| 10/02/2008 | US20080239327 Global calibration for stereo vision probe |
| 10/02/2008 | US20080239326 Workpiece machining apparatus |
| 10/02/2008 | US20080239325 Optical sensing methods and apparatus |
| 10/02/2008 | US20080239324 Optical Tilt Monitoring Apparatus |
| 10/02/2008 | US20080239323 Chromatic confocal sensor fiber interface |
| 10/02/2008 | US20080239320 Light-emitting module and methods for optically aligning and assembling the same |
| 10/02/2008 | US20080239319 Inspection apparatus and inspection method |
| 10/02/2008 | US20080239316 Method and apparatus for quantitative 3-D imaging |
| 10/02/2008 | US20080239287 Inspection of Wood Surface Roughness |
| 10/02/2008 | US20080239282 Method and system for simultaneous measurement of strain and temperature |
| 10/02/2008 | US20080237505 Method and System for Image Processing for Profiling with Uncoded Structured Light |
| 10/02/2008 | US20080236747 Gas analyzing apparatus and substrate processing system |
| 10/02/2008 | US20080235970 CMM Arm With Exoskeleton |
| 10/02/2008 | DE112006003228T5 Zahnmedizinischer optischer Kohärenztomograph Dental optical coherence tomography |
| 10/02/2008 | DE102007016502A1 Measuring method for measuring tool with the help of tool adjusting unit, involves reading tool represented tool data set in measuring task configuration unit |
| 10/01/2008 | EP1975609A1 Methods for predicting dimensional stability of a wood product based on differential characteristics |
| 10/01/2008 | EP1975598A2 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 10/01/2008 | EP1975555A2 Apparatus and method for sensing surface tilt of a workpiece |
| 10/01/2008 | EP1975554A1 Lens configuration for a chromatic distance sensor |
| 10/01/2008 | EP1975553A1 System for measurement |
| 10/01/2008 | EP1975552A2 Dimension measuring apparatus and dimension measuring method |
| 10/01/2008 | EP1975551A1 Chromatic confocal sensor fiber interface |
| 10/01/2008 | EP1975546A1 Multi-axis positioning and measuring system and method of using |
| 10/01/2008 | EP1974180A1 Device for measuring structures on an object |
| 10/01/2008 | EP1974069A1 Symmetrical pulling of composite ribbons |
| 10/01/2008 | EP1973701A2 Light beam targeting and positioning system for a paint or coating removal blasting system |
| 10/01/2008 | EP1815209A4 Improved measurement system |
| 10/01/2008 | CN201126356Y Apparatus for detecting more one rolling wheel or rod bar meanwhile |
| 10/01/2008 | CN201126355Y Automatic positioning one-way focusing device |
| 10/01/2008 | CN201126354Y Portable examination tool for railway track height |
| 10/01/2008 | CN101278177A Sensor and external turbulence measuring method using the same |
| 10/01/2008 | CN101276499A Intelligent monitoring apparatus of ATM equipment based on all-directional computer vision |
| 10/01/2008 | CN101276481A Method for extracting multi-dimension curvature characteristic on triangle gridding |
| 10/01/2008 | CN101276323A Minimum discontinuousness two-dimension phase unwrapping method based on phase discontinuousness area detection |
| 10/01/2008 | CN101276214A Automated process control using optical metrology with a photonic nanojet |
| 10/01/2008 | CN101276213A System for testing electronic parts and control method thereof |
| 10/01/2008 | CN101276151A Method and apparatus for measuring wafer surface flatness |
| 10/01/2008 | CN101276138A Binocular stereoscopic camera with self-adjusting base length |
| 10/01/2008 | CN101276016A Polarized light plate and sticking number inspection method |
| 10/01/2008 | CN101275916A Distributed type non-slippage optical fiber strain sensor and manufacturing method thereof |
| 10/01/2008 | CN101275827A Optical detect system and optical detect method |
| 10/01/2008 | CN101275826A Surface offset measuring method and device for non-spherical lens |
| 10/01/2008 | CN101275825A Measuring apparatus of wafer lower fluid film intermediate variable in CMP process |
| 10/01/2008 | CN101275824A Method for detecting rice granule type |
| 10/01/2008 | CN101275823A Three-dimensional position-measuring apparatus |
| 10/01/2008 | CN101275822A Second confocal measuring method and apparatus based on movable phase interfere |
| 10/01/2008 | CN101275821A Multi-axis positioning and measuring system and method of using |
| 10/01/2008 | CN100422744C Optical movement information detector, movement information detection system, electronic equipment and encoder |
| 10/01/2008 | CN100422688C Contact surface topography measuring method and instrument based on vertical displacement scanning |
| 10/01/2008 | CN100422687C Phase solution package method base on template in micro-nano structure 3-D contour measuring |
| 10/01/2008 | CN100422686C Optical alignment detection system |
| 10/01/2008 | CN100422350C Monitored laser shock peening |
| 09/30/2008 | US7430489 Device and a method for producing information about the properties of an environment |
| 09/30/2008 | US7430319 Image collating apparatus for comparing/collating images before/after predetermined processing, image forming apparatus, image collating method, and image collating program product |
| 09/30/2008 | US7430052 Method for correlating the line width roughness of gratings and method for measurement |
| 09/30/2008 | US7430051 Methods for characterizing semiconductor material using optical metrology |
| 09/30/2008 | US7430050 Stage apparatus and vision measuring apparatus |
| 09/30/2008 | US7430049 Method and device for analyzing the surface of a substrate |
| 09/30/2008 | US7430038 Apparatus for enhancing visualization of mechanical stress |
| 09/30/2008 | US7429999 Camera calibrating apparatus and method |
| 09/30/2008 | US7428781 Method and apparatus for performing overhead crane rail alignment surveys |
| 09/25/2008 | WO2008115532A1 Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam |
| 09/25/2008 | WO2008114531A1 Position detection method and position detection device |
| 09/25/2008 | WO2008114471A1 Film thickness measuring method, its apparatus, and manufacturing system for thin-film device |
| 09/25/2008 | WO2008114263A1 System and method for height measurement |
| 09/25/2008 | WO2008113972A1 Sensor |
| 09/25/2008 | WO2008093332A3 Systems and methods for producing clip-ons for a primary eyewear |
| 09/25/2008 | WO2008079162A3 Celestial object identification device |
| 09/25/2008 | US20080232676 Fabrication method of semiconductor integrated circuit device |
| 09/25/2008 | US20080232674 Method and apparatus for inspecting pattern defects |
| 09/25/2008 | US20080232215 Position Detector and Detected Element |