Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2008
11/06/2008US20080271328 Method and Apparatus For Vehicle Service System Optical Target Assembly
11/06/2008DE202008011614U1 Werkzeugeinstell- und Messgerät Tool setting and measuring
11/06/2008DE19618283B4 Dreidimensionale kontaktlose Messvorrichtung und Verfahren zur Messung hiermit Three-dimensional non-contact measuring apparatus and methods for measuring hereby
11/06/2008DE102007022361A1 Vorrichtung und Verfahren zum berührungslosen Erfassen räumlicher Koordinaten einer Oberfläche Apparatus and method for non-contact recording of spatial coordinates of a surface
11/06/2008DE102007020950A1 Angle measuring device for bent sheet metal component, has electronic evaluation device computing angle between sheet metal regions with respect to position of optical receiver elements of optical receiver lines
11/06/2008DE102007020604A1 Device for contactless positioning of object, particularly tool of industrial robot, has light receiver for capturing of light intensity differences in measuring plane
11/06/2008DE102007019045A1 Stellantrieb Actuator
11/06/2008CA2680572A1 Method and apparatus for determining the amount of scattered light in a machine vision system
11/05/2008EP1988567A1 Semiconductor device manufacturing method and method for reducing microroughness of semiconductor surface
11/05/2008EP1988359A2 Measurement device for measuring the parameters of a blade rotor and measurement process for measuring with said device
11/05/2008EP1988358A1 Device for measuring wear of trolley wire by image processing
11/05/2008EP1988357A1 Coordinate measuring method and device
11/05/2008EP1988061A1 Method for elongating a glass body
11/05/2008EP1987319A1 Measuring system for the acquisition of the layer thickness of a deposit
11/05/2008EP1277066B1 Three-dimensional image projector
11/05/2008CN201145772Y Register-detecting imaging-locating sleeve
11/05/2008CN201145569Y Special tooling for detecting platform flatness by laser
11/05/2008CN201145568Y Steel tube length measuring apparatus
11/05/2008CN201145567Y Apparatus for detecting railway track by laser
11/05/2008CN201145566Y Side turning-proof rail trolley for measuring hoist-transporting machine rail geometric sense
11/05/2008CN201145565Y Detection device for detecting video camera core pose difference
11/05/2008CN101298986A Field measuring method of sand broad leaf plant leaf area
11/05/2008CN101298985A Photography measurement object space control rod and its use method
11/05/2008CN101298982A Method and instrument for calibrating rotary shaft coaxiality
11/05/2008CN101298981A Method for measuring flat inclination grating diffraction fringe
11/05/2008CN101298980A Design method and manufacturing technique of high-sensitivity temperature self-compensation optical fiber grating strain sensor
11/05/2008CN101298979A Estimate survey technique using metric camera cooperating with theodolite
11/05/2008CN101298978A Shaft-misalignment-measuring device and shaft-misalignment-measuring method
11/05/2008CN100430716C Method and apparatus for characterization of microelectronic feature quality
11/05/2008CN100430693C Sheet material positioning method through double location mark in combination with image taking by photographic arrangement
11/05/2008CN100430692C Laser depth measuring instrument for pavement structure
11/05/2008CN100430690C Method for making three-dimensional measurement of objects utilizing single digital camera to freely shoot
11/05/2008CN100430689C Measuring method of remoteness grain based on laser feedback effect
11/05/2008CN100430688C Method of detecting inclination and inclination detecting apparatus
11/05/2008CN100430687C Test device and test method for optical information storage media
11/05/2008CN100430686C Information processing method and device therefor
11/05/2008CN100430685C Systems and methods for rapidly automatically focusing a machine vision inspection system
11/04/2008US7447408 Imaging system and related techniques
11/04/2008US7447381 Method and apparatus for filtering an image
11/04/2008US7447336 Stroke information measuring apparatus and stroke information measuring method
11/04/2008US7446889 Method of evaluating film thickness, method of detecting polishing terminal, and device-manufacturing apparatus
11/04/2008US7446888 Matching optical metrology tools using diffraction signals
11/04/2008US7446887 Matching optical metrology tools using hypothetical profiles
11/04/2008US7446886 Three-dimensional reconstruction of surface profiles
11/04/2008US7446885 Device for measuring in three dimensions a topographical shape of an object
11/04/2008US7446884 Method for optically detecting the spatial form of inside spaces and a device for carrying out said method
11/04/2008US7446883 Method and apparatus for tilt corrected lateral shear in a lateral shear plus rotational shear absolute flat test
11/04/2008US7446882 Interferometer for determining characteristics of an object surface
11/04/2008US7446881 System, apparatus, and method for determining temperature/thickness of an object using light interference measurements
11/04/2008US7446873 Reflective alignment grating
11/04/2008US7446872 Positioning apparatus and positioning method using the same
11/04/2008US7446863 Automatic collimation device for surveying apparatus
11/04/2008US7444882 Material failure prediction/stress/strain detection method and system using deformation luminescence
11/04/2008US7444752 Method and apparatus for vehicle service system optical target
11/04/2008US7444751 Linear distance measurement by non-driven arm
10/2008
10/30/2008WO2008130477A1 System and method for telescope guiding utilizing an artificial reference star
10/30/2008WO2008130385A1 Method for use with an optical aligner system for positioning a fixture relative to a vehicle
10/30/2008WO2008129952A1 Angle sensor
10/30/2008WO2008129650A1 Container mouth portion defect inspection method and device
10/30/2008WO2008129073A2 Measuring arrangement and method for the three-dimensional measurement of an object
10/30/2008WO2008128610A1 Modular measurement head system
10/30/2008WO2008128504A1 Method for detecting and classifying surface defects on continuously cast slabs
10/30/2008WO2007015954A3 Focused droplet nebulizer for evaporative light scattering detector
10/30/2008WO2006060562A3 Method for designing an overlay mark
10/30/2008US20080270044 Defect Review Apparatus and Method of Reviewing Defects
10/30/2008US20080267487 Process and System for Analysing Deformations in Motor Vehicles
10/30/2008US20080266577 Apparatus for Measuring an Internal Dimension of a Well Bore
10/30/2008US20080266576 Optical displacement measuring apparatus
10/30/2008US20080266575 Hybrid Contact Mode Scanning Cantilever System
10/30/2008US20080266574 Interferometer and method for measuring characteristics of optically unresolved surface features
10/30/2008US20080266562 Image Locking System for Dna Micro-Array Synthesis
10/30/2008US20080266561 Optical gain approach for enhancement of overlay and alignment systems performance
10/30/2008US20080266560 Apparatus for angular-resolved spectroscopic lithography characterization and device manufacturing method
10/30/2008US20080266553 Optical Angle Detection
10/30/2008US20080266552 Method and apparatus for assessing head pose of a vehicle driver
10/30/2008US20080266543 Systems and methods for measuring ultra-short light pulses
10/30/2008DE202008009107U1 Winkelmessgerät Angle Meter
10/30/2008DE102008017834A1 Pixels correspondences determining method for stereoscopically recorded images, involves dividing image into image sections of specific size, and calculating accumulated costs for interior of image sections in each unidimensional path
10/30/2008DE102007019453A1 Koordinatenmessgerät mit zwei Schlitten auf gemeinsamer Führung Coordinate measuring machine with two carriages on joint management
10/30/2008DE102007019267A1 Messanordnung sowie Verfahren zum dreidimensionalen Messen eines Objekts Measuring system and method for three-dimensional measuring an object
10/30/2008DE102007018865A1 Length measuring system, particularly for machine tool, has reflection device that is fastened to arm in rotatable manner, where reflection device reflects back assigned ray of light
10/30/2008DE102007018810A1 Verfahren zur Bewegungsüberwachung bei einer medizintechnischen Anlage sowie zugehörige medizintechnische Anlage A method for monitoring movement at a medical facility and related medical facility
10/30/2008DE102007018606B3 Device for determining relative locomotion and dislocation of test object, has cylindrically formed test object guide, and multiple optical sensor element aligns in test area of test object guide directly or indirectly in limited chamber
10/30/2008DE102007018204A1 Device for detecting fault position in animal skins, has machining table with contact surface for animal skin, light source for illuminating area of animal skin
10/30/2008DE102007018203A1 Defective area detecting device for animal skin, has marking element formed based on type of writing implement, which permits fitting of line-shaped markings on animal skin, where fluorescent symbols are applied on animal skin by die
10/30/2008DE102007018201A1 Defective area detecting device for animal skin, has recording device for visually recording region of animal skin, and light sources and part of recording device arranged within opaque cover
10/30/2008DE102007013883A1 Damage i.e. hail damage, detecting and examining method for body of motor vehicle, involves detecting damages by scanning surface of motor vehicle while scanning devices i.e. laser scanners, are moved automatically relative to surface
10/30/2008DE102007010223A1 Verfahren zur Bestimmung geometrischer Parameter eines Wafers und Verwendung des Verfahren bei der optischen Inspektion von Wafern A method for determining geometric parameters of a wafer and use of the method for the optical inspection of wafers
10/30/2008DE102006060584B4 Verfahren und Vorrichtung zur Messung von Verschiebungen und/oder einer Geometrie von Mikrostrukturen Method and apparatus for the measurement of displacements and / or a geometry of microstructures
10/30/2008DE102004014048B4 Vermessungseinrichtung und Verfahren nach dem Grundprinzip der konfokalen Mikroskopie Measuring device and method according to the principle of confocal microscopy
10/30/2008CA2682297A1 Measuring arrangement and method for three-dimensional measuring of an object
10/29/2008EP1986153A2 Method and system for determining object poses from range images
10/29/2008EP1985969A1 Method and apparatus for determining the amount of scattered light in a maschine vision system
10/29/2008EP1985968A1 Noncontact measuring apparatus for interior surfaces of cylindrical objects based on using the autofocus function that comprises means for directing the probing light beam towards the inspected surface
10/29/2008EP1985966A1 Apparatus and method for checking threaded elements
10/29/2008EP1985416A1 Mobile robot
10/29/2008EP1984862A2 Plasmon tomography
10/29/2008EP1984770A1 Method and arrangement for a rapid and robust chromatic confocal 3d measurement technique
10/29/2008EP0943088B2 Wafer inspection system for distinguishing pits and particles
10/29/2008CN201141843Y Double-beam laser interferometry instrument for material heat expansibility
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