Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
06/2008
06/19/2008US20080144031 Overlay target and measurement method using reference and sub-grids
06/19/2008US20080144020 Mobile radio positioning aided by single fan laser
06/19/2008US20080144019 Rotary Encoder
06/19/2008US20080144006 Method for Measuring Topographic Structures on Devices
06/19/2008US20080144001 Spectral imaging device
06/19/2008DE102006060090A1 Device for determination of structures of photolithographic masks, has illuminating sources emitting coherent light, where illuminating sources illuminate photolithographic mask by illumination beam paths
06/19/2008DE102006060089A1 Device for determination of structures of photolithographic masks, has illuminating sources emitting coherent light, where illuminating sources illuminate photolithographic mask by illumination beam paths
06/19/2008DE102006059440A1 Metrology apparatus for mask used with lithographic projection apparatus and used for manufacturing integrated circuits has mask holder which supports mask along horizontal edge of mask with uniformly distributed force against gravity
06/19/2008DE102006059439A1 Verfahren und Vorrichtung zur dynamischen Messung der axialen Deformation einer rotierenden Hohlwelle Method and device for the dynamic measurement of the axial deformation of a rotating hollow shaft
06/19/2008DE102006059269A1 Optical distance measuring device has imaging arrangement for forming image of 2 laser beams on optical detector, device for evaluating intensity distribution of image of light scattered at object on detector from which distance is derived
06/19/2008DE102005022344B4 Vorrichtung und Verfahren zur Werkstückeinmessung Apparatus and method for workpiece
06/19/2008CA2672679A1 Method and apparatus for thickness measurement
06/18/2008EP1931942A1 Method for contactlessly and dynamically recording the profile of a solid body
06/18/2008EP1931941A1 Interferometric determination of a layer thickness
06/18/2008EP1931940A1 Apparatus for measuring and/or monitoring three-dimensional expansion features of glue traces on workpieces
06/18/2008EP1588126B1 Calibration certification for wheel alignment equipment
06/18/2008EP1506370B1 System and method for control of paint thickness by using an optoacoustic technique
06/18/2008CN201075000Y Reflecting image-taking device of single lens particle decisionmaking instrument
06/18/2008CN201074999Y Lay length tester
06/18/2008CN101203810A Image position measuring apparatus and exposure apparatus
06/18/2008CN101202322A Method for determining the thickness of phosphor layer and method for manufacturing light emitting apparatus
06/18/2008CN101202237A Method for on-position detecting a light-permeable object and device for detecting
06/18/2008CN101201371A Method and device for detecting printed circuit
06/18/2008CN101201292A Apparatus for measuring the characteristics of an optical fiber
06/18/2008CN101201276A Method and apparatus for detecting stress of shaft journals on two end of submergence roller
06/18/2008CN101201248A Avigation close range photography displacement measurement system based on unmanned aerial vehicle as well as measurement method thereof
06/18/2008CN101201245A Method for measuring deformation of metallic material in hyperthermia mechanical test as well as observation instrument
06/18/2008CN101201244A Method and apparatus for prognosticating tumbling time of business occupancy with bottom-frame structure
06/18/2008CN101201243A Device for measuring linewidth of narrow linewidth laser based on optical fiber time-delay self heterodyne method as well as method for measuring thereof
06/18/2008CN101201242A Method for measurement of straightness of metallic fine wire and measuring equipment of same
06/18/2008CN101201241A Method and system for measuring movement of ship model
06/18/2008CN101201240A Method for detecting automatically position of image viewfinding device and vehicle collision caution system
06/18/2008CN100395542C Image testing method for chemical fibre thermal contraction rate and testing apparatus thereof
06/18/2008CN100395520C High precision photoelectric measuring method and measuring apparatus for three-dimensional dip
06/18/2008CN100395519C Figure checking device
06/18/2008CN100395518C Figure checking method and device
06/18/2008CN100395517C Sensor for measuring three dimension shape and its measuring method
06/18/2008CN100395516C Optical fiber interference type device and method for measuring thickness
06/18/2008CN100395515C Tension line video deflection measuring device and method
06/18/2008CN100395514C Object detecting apparatus having light radiation power regulating function
06/18/2008CN100395513C Optical encoder and scale for encoder
06/17/2008US7389199 Method of determining a dimension of a sample of a construction material and associated apparatus
06/17/2008US7388979 Method and apparatus for inspecting pattern defects
06/17/2008US7388970 Image recognition method and apparatus
06/17/2008US7388969 Method of measuring rotational amount of body having curved surface and direction of rotational axis thereof, apparatus of measuring rotational amount thereof and direction of rotational axis thereof, and method of specifying three-dimensional posture thereof
06/17/2008US7388943 Method for adjusting gap between two objects and exposure method using the same, gap adjusting apparatus, and exposure apparatus
06/17/2008US7388704 Determination of interferometric modulator mirror curvature and airgap variation using digital photographs
06/17/2008US7388680 Gap monitor arrangement
06/17/2008US7388679 Pattern light irradiation device, three dimensional shape measuring device, and method pattern light irradiation
06/17/2008US7388678 Method and device for three-dimensionally detecting objects and the use of this device and method
06/17/2008US7388677 Optical metrology optimization for repetitive structures
06/17/2008US7388675 Interferometers for the measurement of large diameter thin wafers
06/17/2008US7388673 Heterodyne optical spectrum analyzer
06/17/2008US7388663 Optical position assessment apparatus and method
06/17/2008US7388658 Inclination detection methods and apparatus
06/17/2008US7388654 Retroreflector covered by window
06/17/2008US7387245 Information pattern discriminating apparatus
06/17/2008US7387027 Characterization of materials with optically shaped acoustic waveforms
06/17/2008US7386975 Method for determining the effects of fancy yarn
06/17/2008CA2326642C Wireless optical instrument for position measurement and method of use therefor
06/17/2008CA2281113C Automatic inspection of print quality using an elastic model
06/12/2008WO2008070736A1 Determining copper concentration in spectra
06/12/2008WO2008070411A2 Coating thickness measurement using a near infrared absorbance technique and a light diffuser
06/12/2008WO2008069263A1 Egg quality index examination device
06/12/2008WO2008069084A1 Sphere absolute angle detection system, sphere actuator, and pointing device
06/12/2008WO2008068896A1 Defect detecting device, defect detecting method, information processing device, information processing method, and program therefor
06/12/2008WO2008068895A1 Defect detecting device, defect detecting method, information processing device, information processing method, and program therefor
06/12/2008WO2008068894A1 Defect detecting device, defect detecting method, information processing device, information processing method and program
06/12/2008WO2008068791A1 Three-dimensional optical radar method and device which use three rgb beams modulated by laser diodes, in particular for metrological and fine arts applications
06/12/2008WO2008068388A1 Fibre optic cable and method for producing the same
06/12/2008WO2008068172A1 Roll gap measurement for a cluster rolling mill
06/12/2008WO2008068136A1 Method and device for measuring a height difference
06/12/2008WO2008047329A3 Method and apparatus for distributed sensing with strokes-locked reference laser
06/12/2008WO2008018909A3 Laser energy calibration based on optical measurement
06/12/2008US20080141287 Out-of-round coder
06/12/2008US20080140342 Assessment and optimization for metrology instrument
06/12/2008US20080140341 Interferometric Synthetic Aperture Microscopy
06/12/2008US20080140333 Method and apparatus for optical chassis measurement
06/12/2008US20080140328 Optical tomographic imaging apparatus
06/12/2008US20080140324 Optical Displacement Sensor
06/12/2008US20080137106 Method for determining the thickness of phosphor layer and method for manufacturing light emitting apparatus
06/12/2008US20080137105 Laser-ultrasound inspection using infrared thermography
06/12/2008US20080137104 Method and Device for Recording and Determining the Weight of Fish
06/12/2008US20080137103 Optical Displacement Sensor and Optical Displacement Measurement Device
06/12/2008US20080137102 Device For Positioning Markings
06/12/2008US20080137101 Apparatus and Method for Obtaining Surface Texture Information
06/12/2008US20080137100 Optical Probe and Device and Method Making Use Thereof
06/12/2008US20080137099 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
06/12/2008US20080137097 Position measuring method, position measuring system, and exposure apparatus
06/12/2008US20080137096 Exposure apparatus and device-manufacturing method
06/12/2008US20080137095 Method and apparatus for resonant frequency identification through out-of-plane displacement detection
06/12/2008US20080137090 Hologram and Method of Manufacturing an Optical Element Using a Hologram
06/12/2008US20080137083 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device
06/12/2008US20080135750 High Speed Measurement, Analysis and Imaging Systems and Methods For Length Scales From Meter to Sub-Nanometer
06/12/2008DE4128595B4 Holographische Skala Holographic scale
06/12/2008DE112006002170T5 Laser-Entfernungsmessgerät Laser Distance Meter
06/12/2008DE10345982B4 Verfahren zur Minimierung von mikroskopischen und makroskopischen Ausrichtungsfehlern einer Mehrfachschicht A method for minimizing microscopic and macroscopic alignment errors of a multiple layer
06/12/2008DE102007010588B3 Interferometer assembly, to measure object rough surfaces, directs two different beam alignments through a diffractive structure
06/12/2008DE102006058383A1 Verfahren zur optischen Fahrwerksvermessung A method for optical wheel alignment
06/12/2008DE102006032645B4 Vorrichtung zur Erfassung des Profils eines mit Pulver oder Nasslack zu beschichtenden Werkstücks A device for detecting the profile of a powder or wet paint workpiece to be coated