Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
06/2008
06/26/2008US20080151264 Profiling device
06/26/2008US20080151263 Systems and methods for focusing optics
06/26/2008US20080151262 Light Exposure Apparatus and Manufacturing Method of Semiconductor Device Using the Same
06/26/2008US20080151257 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
06/26/2008US20080151256 Optical image measurement device
06/26/2008US20080151246 Alignment routine for optically based tools
06/26/2008US20080151237 Interferometric endpoint determination in a substrate etching process
06/26/2008US20080151228 Scatterometer, a lithographic apparatus and a focus analysis method
06/26/2008US20080151219 Optical method for the characterization of laterally patterned samples in integrated circuits
06/26/2008US20080148581 Method and device for non-contact measurement of the alignment of motor vehicle wheels
06/26/2008DE20321619U1 Einrichtung zur Messung der Umfangsgestalt rotationssymmetrischer Werkstücke Means for measuring the peripheral shape of rotationally symmetrical workpieces
06/26/2008DE202008002590U1 System zum Untersuchen und/oder Bestimmen der Beschaffenheit oder des Zustandes eines Schiffsrumpfes System for inspecting and / or determining the condition or the condition of a ship's hull
06/26/2008DE19818341B4 Interferometer zum Vermessen asphärischer Linsen Interferometer for measuring aspheric lenses
06/26/2008DE112006001788T5 Mikrovertiefungsmessvorrichtung und -verfahren basierend auf der Doppeloptofaserkopplung Microwell measuring apparatus and method based on the double optical fiber coupling
06/26/2008DE10344922B4 Rundum-Scanner All-scanner
06/26/2008DE102007061248A1 Measuring instrument for measuring the thickness and the height of a semiconductor wafer comprises a laser beam oscillator, a capacitor, a light receiving unit, a light collecting point changing unit and a control device
06/26/2008DE102007031157A1 Optoelektronischer Sensor sowie Verfahren zur Erfassung und Abstandsbestimmung eines Objekts An optoelectronic sensor and method for detecting and determining the distance of an object
06/26/2008DE102006062664A1 Three-axes autocollimation lens for two axes of cartesian coordinate system, has reflector that is arranged movably and cardanically at adjusting retainer ring provided centrally below light input surface of pentaprism
06/26/2008DE102006061970A1 System zum Vermessen und Ausrichten von Teigsträngen in ihrer Länge und Lage System for measuring and aligning strands of dough in their length and location
06/26/2008DE102006061929A1 Optischer Lenkwinkelsensor zur Bestimmung des Absolutwertes des Lenkwinkels Optical steering angle sensor for determining the absolute value of the steering angle
06/26/2008DE102006061465A1 Measuring device for evaluating directional and/or angle coordinates of a vehicle comprises a measuring value receiver formed as a movement sensor and a microcontroller or central processing unit for processing signals from the receiver
06/26/2008DE102006060937A1 Verfahren zur Stabilisierung eines Laserstrahles A method of stabilizing a laser beam
06/26/2008DE102006060622A1 Device for position detection of moving component, has transmitter that moves with component, and transmitter works together in contactless manner with sensor that detects position of transmitter
06/26/2008DE102006060584A1 Method for measuring displacement and geometry of microstructures, involves focusing incident light on examining structure and light coming from structure is detected
06/26/2008DE102006059416A1 Vorrichtung und Verfahren zur Steigerung der Mess-Genauigkeit digitaler 3D-Geometriemesssysteme Apparatus and method for increasing measurement accuracy of digital 3D geometry measurement systems
06/26/2008DE102006059415A1 Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation
06/26/2008DE10152038C5 Verfahren zur optoelektronischen Bestimmung von Gewindeparametern Method for determination of optoelectronic thread parameters
06/26/2008DE10104373B4 Verfahren zur Funktionskontrolle einer Positionsmesseinrichtung und Positionsmesseinrichtung zur Durchführung des Verfahrens Method for function of a position measuring device and position measuring device for implementing the method
06/26/2008CA2673015A1 A system and method for orientating scan cloud data relative to base reference data
06/26/2008CA2672475A1 Method and system for measuring an object
06/25/2008EP1936477A1 Position information detection device, position information detection method, and position information detection program
06/25/2008EP1936349A2 Device for testing a test object, in particular a tyre, using a non-destructive measuring method
06/25/2008EP1936321A2 Three-dimensional measurement probe
06/25/2008EP1936058A1 Sheet of bituminous material and method of manufacturing a sheet of bituminous material
06/25/2008EP1934552A1 Method and device for measuring heights of patterns
06/25/2008EP1851508B1 Optical monitoring system for coating processes
06/25/2008EP1535300A4 Improved method and system for scanning apertureless fluorescence microscope
06/25/2008CN201078743Y Angle calibration apparatus for angle changeable including monochromator optical spectrum tuning
06/25/2008CN101208581A Method of reconstructing a surface topology of an object
06/25/2008CN101208580A Mapping a surface profile
06/25/2008CN101208579A Optical probe and device and method making use thereof
06/25/2008CN101208161A Method and device for optimization of flatness control in the rolling of a strip
06/25/2008CN101207058A Chip measuring device and laser processing machine
06/25/2008CN101206995A Method for monitoring crystal round pallet obliteration performance
06/25/2008CN101206212A Fabric pincher elasticity tester
06/25/2008CN101206182A Device for testing a test object, in particular a tyre, using a non-destructive measuring method
06/25/2008CN101206116A Goal spot global automatic positioning method
06/25/2008CN101206110A Three-dimensional measurement probe
06/25/2008CN101206109A Method for testing cable insulation thickness
06/25/2008CN101205700A Laser rapid detecting system for pavement deflection
06/25/2008CN101204957A Traffic lane offset warning method and device
06/25/2008CN101204888A Printer applicable to uni-directional printing adjusting printing deviation and adjusting method
06/25/2008CN100397557C Semiconductor wafer carrier mapping sensor
06/25/2008CN100397158C Liquid-crystal panel inspecting tool and method
06/25/2008CN100397095C Distance measuring device, distance measuring equipment and distance measuring method
06/25/2008CN100397045C Method of manufacturing scales and photoelectric encoder
06/25/2008CN100397036C Method and arrangement in a measuring system
06/25/2008CN100397035C Three-dimensional measuring apparatus, filter lattice moire plate and illuminating means
06/25/2008CN100397034C Monitor device for anchorage cable long term working state and its method
06/25/2008CN100397033C Displacement detector
06/25/2008CN100396988C Adjustable device with universal joints
06/25/2008CN100396529C Online detection method and device for train wheel pair size
06/25/2008CN100396435C Technical method for manufacturing large-diameter grinding machine drum
06/25/2008CN100396392C Method of measuring misalignment of multi-stage rolling mill and measuring device therefor
06/24/2008US7392155 Distance calculation device and calculation program
06/24/2008US7391524 System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines
06/24/2008US7391523 Curvature/tilt metrology tool with closed loop feedback control
06/24/2008US7391522 Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting program
06/24/2008US7391521 Position detection apparatus and method
06/24/2008US7391518 Device and method for the determination of the quality of surfaces
06/24/2008US7391513 Lithographic apparatus and device manufacturing method using overlay measurement quality indication
06/24/2008US7391507 Method of photo-reflectance characterization of strain and active dopant in semiconductor structures
06/24/2008US7389593 Locating and tracing tool
06/22/2008CA2620949A1 Method and apparatus for optical image reconstruction using contour determination
06/20/2008CA2609576A1 Seal gum thickness measurement
06/19/2008WO2008073033A1 Monitoring a flexible power cable
06/19/2008WO2008072693A1 Glass sheet defect detection device, glass sheet manufacturing method, glass sheet, glass sheet quality judging device, and glass sheet inspection method
06/19/2008WO2008072369A1 Measurement device and measurement method
06/19/2008WO2008072276A1 Wheel alignment device adapted to compensate for runout error
06/19/2008WO2008071619A1 Method and apparatus for reading a key profile
06/19/2008WO2008071414A1 Apparatus and method for increasing the measurement accuracy of digital 3d geometry measuring systems
06/19/2008WO2008071338A1 Method and device for thickness measurement
06/19/2008WO2008071337A1 Method and device for thickness measurement
06/19/2008WO2008071269A1 Apparatus and method for mask metrology
06/19/2008WO2008071204A1 System and method for the defect analysis of workpieces
06/19/2008WO2008071106A1 Optical displacement sensor and distance measuring apparatus
06/19/2008WO2008052925A3 Method for producing a sensitive zone comprising a number of sensitive notches of a fibre-optic bending sensor, and associated fibre-optic bending sensor
06/19/2008WO2007100785A3 Multi-color heterodyne interferometric apparatus and method for sizing nanoparticles
06/19/2008WO2007064928A3 Method for measuring wear in the refractory lining of a metallurgical melting vessel
06/19/2008US20080147347 Non-destructive testing and imaging
06/19/2008US20080146120 Determining physical property of substrate
06/19/2008US20080145049 Apparatus for measuring the characteristics of an optical fiber
06/19/2008US20080144050 Method for correlating the line width roughness of gratings and method for measurement
06/19/2008US20080144049 Method and apparatus for thermographic nondestructive evaluation of an object
06/19/2008US20080144048 Semiconductor device, and testing method and device for the same
06/19/2008US20080144047 Position measurement apparatus, imaging apparatus, exposure apparatus, and device manufacturing method
06/19/2008US20080144046 Hand-held survey probe
06/19/2008US20080144045 Apparatus and methods for measuring workpieces
06/19/2008US20080144044 Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging
06/19/2008US20080144042 Stage apparatus, control system, exposure apparatus, and device manufacturing method