Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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06/26/2008 | US20080151264 Profiling device |
06/26/2008 | US20080151263 Systems and methods for focusing optics |
06/26/2008 | US20080151262 Light Exposure Apparatus and Manufacturing Method of Semiconductor Device Using the Same |
06/26/2008 | US20080151257 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method |
06/26/2008 | US20080151256 Optical image measurement device |
06/26/2008 | US20080151246 Alignment routine for optically based tools |
06/26/2008 | US20080151237 Interferometric endpoint determination in a substrate etching process |
06/26/2008 | US20080151228 Scatterometer, a lithographic apparatus and a focus analysis method |
06/26/2008 | US20080151219 Optical method for the characterization of laterally patterned samples in integrated circuits |
06/26/2008 | US20080148581 Method and device for non-contact measurement of the alignment of motor vehicle wheels |
06/26/2008 | DE20321619U1 Einrichtung zur Messung der Umfangsgestalt rotationssymmetrischer Werkstücke Means for measuring the peripheral shape of rotationally symmetrical workpieces |
06/26/2008 | DE202008002590U1 System zum Untersuchen und/oder Bestimmen der Beschaffenheit oder des Zustandes eines Schiffsrumpfes System for inspecting and / or determining the condition or the condition of a ship's hull |
06/26/2008 | DE19818341B4 Interferometer zum Vermessen asphärischer Linsen Interferometer for measuring aspheric lenses |
06/26/2008 | DE112006001788T5 Mikrovertiefungsmessvorrichtung und -verfahren basierend auf der Doppeloptofaserkopplung Microwell measuring apparatus and method based on the double optical fiber coupling |
06/26/2008 | DE10344922B4 Rundum-Scanner All-scanner |
06/26/2008 | DE102007061248A1 Measuring instrument for measuring the thickness and the height of a semiconductor wafer comprises a laser beam oscillator, a capacitor, a light receiving unit, a light collecting point changing unit and a control device |
06/26/2008 | DE102007031157A1 Optoelektronischer Sensor sowie Verfahren zur Erfassung und Abstandsbestimmung eines Objekts An optoelectronic sensor and method for detecting and determining the distance of an object |
06/26/2008 | DE102006062664A1 Three-axes autocollimation lens for two axes of cartesian coordinate system, has reflector that is arranged movably and cardanically at adjusting retainer ring provided centrally below light input surface of pentaprism |
06/26/2008 | DE102006061970A1 System zum Vermessen und Ausrichten von Teigsträngen in ihrer Länge und Lage System for measuring and aligning strands of dough in their length and location |
06/26/2008 | DE102006061929A1 Optischer Lenkwinkelsensor zur Bestimmung des Absolutwertes des Lenkwinkels Optical steering angle sensor for determining the absolute value of the steering angle |
06/26/2008 | DE102006061465A1 Measuring device for evaluating directional and/or angle coordinates of a vehicle comprises a measuring value receiver formed as a movement sensor and a microcontroller or central processing unit for processing signals from the receiver |
06/26/2008 | DE102006060937A1 Verfahren zur Stabilisierung eines Laserstrahles A method of stabilizing a laser beam |
06/26/2008 | DE102006060622A1 Device for position detection of moving component, has transmitter that moves with component, and transmitter works together in contactless manner with sensor that detects position of transmitter |
06/26/2008 | DE102006060584A1 Method for measuring displacement and geometry of microstructures, involves focusing incident light on examining structure and light coming from structure is detected |
06/26/2008 | DE102006059416A1 Vorrichtung und Verfahren zur Steigerung der Mess-Genauigkeit digitaler 3D-Geometriemesssysteme Apparatus and method for increasing measurement accuracy of digital 3D geometry measurement systems |
06/26/2008 | DE102006059415A1 Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation |
06/26/2008 | DE10152038C5 Verfahren zur optoelektronischen Bestimmung von Gewindeparametern Method for determination of optoelectronic thread parameters |
06/26/2008 | DE10104373B4 Verfahren zur Funktionskontrolle einer Positionsmesseinrichtung und Positionsmesseinrichtung zur Durchführung des Verfahrens Method for function of a position measuring device and position measuring device for implementing the method |
06/26/2008 | CA2673015A1 A system and method for orientating scan cloud data relative to base reference data |
06/26/2008 | CA2672475A1 Method and system for measuring an object |
06/25/2008 | EP1936477A1 Position information detection device, position information detection method, and position information detection program |
06/25/2008 | EP1936349A2 Device for testing a test object, in particular a tyre, using a non-destructive measuring method |
06/25/2008 | EP1936321A2 Three-dimensional measurement probe |
06/25/2008 | EP1936058A1 Sheet of bituminous material and method of manufacturing a sheet of bituminous material |
06/25/2008 | EP1934552A1 Method and device for measuring heights of patterns |
06/25/2008 | EP1851508B1 Optical monitoring system for coating processes |
06/25/2008 | EP1535300A4 Improved method and system for scanning apertureless fluorescence microscope |
06/25/2008 | CN201078743Y Angle calibration apparatus for angle changeable including monochromator optical spectrum tuning |
06/25/2008 | CN101208581A Method of reconstructing a surface topology of an object |
06/25/2008 | CN101208580A Mapping a surface profile |
06/25/2008 | CN101208579A Optical probe and device and method making use thereof |
06/25/2008 | CN101208161A Method and device for optimization of flatness control in the rolling of a strip |
06/25/2008 | CN101207058A Chip measuring device and laser processing machine |
06/25/2008 | CN101206995A Method for monitoring crystal round pallet obliteration performance |
06/25/2008 | CN101206212A Fabric pincher elasticity tester |
06/25/2008 | CN101206182A Device for testing a test object, in particular a tyre, using a non-destructive measuring method |
06/25/2008 | CN101206116A Goal spot global automatic positioning method |
06/25/2008 | CN101206110A Three-dimensional measurement probe |
06/25/2008 | CN101206109A Method for testing cable insulation thickness |
06/25/2008 | CN101205700A Laser rapid detecting system for pavement deflection |
06/25/2008 | CN101204957A Traffic lane offset warning method and device |
06/25/2008 | CN101204888A Printer applicable to uni-directional printing adjusting printing deviation and adjusting method |
06/25/2008 | CN100397557C Semiconductor wafer carrier mapping sensor |
06/25/2008 | CN100397158C Liquid-crystal panel inspecting tool and method |
06/25/2008 | CN100397095C Distance measuring device, distance measuring equipment and distance measuring method |
06/25/2008 | CN100397045C Method of manufacturing scales and photoelectric encoder |
06/25/2008 | CN100397036C Method and arrangement in a measuring system |
06/25/2008 | CN100397035C Three-dimensional measuring apparatus, filter lattice moire plate and illuminating means |
06/25/2008 | CN100397034C Monitor device for anchorage cable long term working state and its method |
06/25/2008 | CN100397033C Displacement detector |
06/25/2008 | CN100396988C Adjustable device with universal joints |
06/25/2008 | CN100396529C Online detection method and device for train wheel pair size |
06/25/2008 | CN100396435C Technical method for manufacturing large-diameter grinding machine drum |
06/25/2008 | CN100396392C Method of measuring misalignment of multi-stage rolling mill and measuring device therefor |
06/24/2008 | US7392155 Distance calculation device and calculation program |
06/24/2008 | US7391524 System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines |
06/24/2008 | US7391523 Curvature/tilt metrology tool with closed loop feedback control |
06/24/2008 | US7391522 Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting program |
06/24/2008 | US7391521 Position detection apparatus and method |
06/24/2008 | US7391518 Device and method for the determination of the quality of surfaces |
06/24/2008 | US7391513 Lithographic apparatus and device manufacturing method using overlay measurement quality indication |
06/24/2008 | US7391507 Method of photo-reflectance characterization of strain and active dopant in semiconductor structures |
06/24/2008 | US7389593 Locating and tracing tool |
06/22/2008 | CA2620949A1 Method and apparatus for optical image reconstruction using contour determination |
06/20/2008 | CA2609576A1 Seal gum thickness measurement |
06/19/2008 | WO2008073033A1 Monitoring a flexible power cable |
06/19/2008 | WO2008072693A1 Glass sheet defect detection device, glass sheet manufacturing method, glass sheet, glass sheet quality judging device, and glass sheet inspection method |
06/19/2008 | WO2008072369A1 Measurement device and measurement method |
06/19/2008 | WO2008072276A1 Wheel alignment device adapted to compensate for runout error |
06/19/2008 | WO2008071619A1 Method and apparatus for reading a key profile |
06/19/2008 | WO2008071414A1 Apparatus and method for increasing the measurement accuracy of digital 3d geometry measuring systems |
06/19/2008 | WO2008071338A1 Method and device for thickness measurement |
06/19/2008 | WO2008071337A1 Method and device for thickness measurement |
06/19/2008 | WO2008071269A1 Apparatus and method for mask metrology |
06/19/2008 | WO2008071204A1 System and method for the defect analysis of workpieces |
06/19/2008 | WO2008071106A1 Optical displacement sensor and distance measuring apparatus |
06/19/2008 | WO2008052925A3 Method for producing a sensitive zone comprising a number of sensitive notches of a fibre-optic bending sensor, and associated fibre-optic bending sensor |
06/19/2008 | WO2007100785A3 Multi-color heterodyne interferometric apparatus and method for sizing nanoparticles |
06/19/2008 | WO2007064928A3 Method for measuring wear in the refractory lining of a metallurgical melting vessel |
06/19/2008 | US20080147347 Non-destructive testing and imaging |
06/19/2008 | US20080146120 Determining physical property of substrate |
06/19/2008 | US20080145049 Apparatus for measuring the characteristics of an optical fiber |
06/19/2008 | US20080144050 Method for correlating the line width roughness of gratings and method for measurement |
06/19/2008 | US20080144049 Method and apparatus for thermographic nondestructive evaluation of an object |
06/19/2008 | US20080144048 Semiconductor device, and testing method and device for the same |
06/19/2008 | US20080144047 Position measurement apparatus, imaging apparatus, exposure apparatus, and device manufacturing method |
06/19/2008 | US20080144046 Hand-held survey probe |
06/19/2008 | US20080144045 Apparatus and methods for measuring workpieces |
06/19/2008 | US20080144044 Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging |
06/19/2008 | US20080144042 Stage apparatus, control system, exposure apparatus, and device manufacturing method |