| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 07/08/2008 | US7397569 Method and system for interferometric height measurement |
| 07/08/2008 | US7397565 Device and method for obtaining appearance information |
| 07/08/2008 | US7397550 Parts manipulation and inspection system and method |
| 07/08/2008 | US7397252 Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current |
| 07/08/2008 | US7397039 Real-time compensation of mechanical position error in pattern generation or imaging applications |
| 07/08/2008 | US7396684 Simplified, faster; using ellipsometric measurement and electromagnetic radiation technique in which neither wavelength nor angle of incidence has to be varied after parameter s is set for surface plasmon excitation |
| 07/08/2008 | US7396414 Apparatus for simultaneously coating and measuring parts |
| 07/08/2008 | US7395606 CMM arm with exoskeleton |
| 07/08/2008 | CA2498190C Actuator and object detecting apparatus that uses actuator |
| 07/08/2008 | CA2355621C Latex coat thickness measuring and control apparatus |
| 07/03/2008 | WO2008080127A2 Apparatus and method for measuring characteristics of surface features |
| 07/03/2008 | WO2008079798A1 System and method for measurement of thickness of thin films |
| 07/03/2008 | WO2008079208A1 Method of automated quantitative analysis of distortion shaped vehicle glass by reflected optical imaging |
| 07/03/2008 | WO2008078913A1 Apparatus and method for on-line detecting welding part of strip sheet |
| 07/03/2008 | WO2008078744A1 Distance measuring device, method, and program |
| 07/03/2008 | WO2008021881A3 Method of applying a string of interconnected strain sensors to an object, a pliable support structure, and method of producing a mineral hydrocarbon fluid |
| 07/03/2008 | WO2007087301A3 Interferometer system for monitoring an object |
| 07/03/2008 | US20080162073 Method For Measuring Doctor Blade Geometric Deviations |
| 07/03/2008 | US20080160889 Automatic lens blocking apparatus |
| 07/03/2008 | US20080158573 Means for Measuring a Diameter |
| 07/03/2008 | US20080158572 System and method for measurement of thickness of thin films |
| 07/03/2008 | US20080158571 Photodetector and Optical Pickup Apparatus |
| 07/03/2008 | US20080158541 Inline stress evaluation in microstructure devices |
| 07/03/2008 | US20080156619 Range finder |
| 07/03/2008 | US20080156114 Transport system for test sample carrier |
| 07/03/2008 | DE202007002582U1 Drehimpulsgeber Incremental Encoders |
| 07/03/2008 | DE10302868B4 Verfahren zur Bestimmung von Strukturparametern einer Oberfläche mit einem lernfähigen System A method for determining structural parameters of a surface with an adaptive system |
| 07/03/2008 | DE102007057771A1 Abstandsermittler Distance investigators |
| 07/03/2008 | DE102007002106B3 Object's surface configuration examining device, has control and evaluation unit connected with light sources and light sensor, where light sources are arranged such that optical radiation axis runs in different reference planes |
| 07/03/2008 | DE102007001402A1 Method for contact-free determination of space-form of foot for manufacturing e.g. sport shoe, involves determining target position, in which foot resides, by predetermined measuring value of physical sensor in motor-adjustable device |
| 07/03/2008 | DE102006062673A1 Optical translations-rotations-sensor for integrated switching circuit, has evaluation unit to calculate translation movement and rotation movement of sensor against external surface by determining relationship between sequential images |
| 07/03/2008 | DE102006062447A1 Object's i.e. vehicle tire, three-dimensional surface recording method, involves moving light rays projecting on surface of object by prism parallel to its ray axis so that light rays overcoat surface under constant angle of inclination |
| 07/03/2008 | DE102006062125A1 Optoelectronic sensor arrangement adjusting method, involves detecting receiving signals of light beam by light receiver in position relative to light transmitters, and determining difference between signals for position |
| 07/03/2008 | DE102006061712A1 Distance image generating method for use in e.g. robotics, involves illuminating scene with random- or pseudo random pattern i.e. stripe pattern, and modulating pattern in displacement direction and in direction of epipolar lines |
| 07/03/2008 | DE102006036345B4 Verfahren und Vorrichtung zur Lagebestimmung von Objekten im dreidimensionalen Raum Method and apparatus for determining the position of objects in three-dimensional space |
| 07/02/2008 | EP1939596A1 Sensor and external turbulence measuring method using the same |
| 07/02/2008 | EP1939584A2 Method for measuring the thickness of an electro-plating layer on a polymer film |
| 07/02/2008 | EP1939583A1 Optical device, and method of measuring the dimension of object using optical device |
| 07/02/2008 | EP1939582A1 Face center position detecting device, face center position detecting method, and program |
| 07/02/2008 | EP1939581A1 Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles |
| 07/02/2008 | EP1846727B1 Optical probe and device and method making use thereof |
| 07/02/2008 | CN201081707Y Dual CCD optical measurement system for directly drawn monocrystal oven |
| 07/02/2008 | CN201081696Y Micro three-dimensional projection pattern measuring device |
| 07/02/2008 | CN201081695Y Contact roller type plate thickness distribution measuring device |
| 07/02/2008 | CN201081694Y Contactless photoelectric thickness gauge |
| 07/02/2008 | CN201081693Y Weld head position tester |
| 07/02/2008 | CN201079781Y On-line accessory appearance detecting sorting machine |
| 07/02/2008 | CN101213494A Drawing device and drawing method |
| 07/02/2008 | CN101213440A Method for forming master data for inspecting protruding and recessed figure |
| 07/02/2008 | CN101213418A Diffraction method for measuring thickness of a workpart |
| 07/02/2008 | CN101212649A Portable monitoring device and its monitoring method |
| 07/02/2008 | CN101210841A Method and device for validating special object on weighing conveyer |
| 07/02/2008 | CN101210813A Vehicular monitoring device |
| 07/02/2008 | CN101210809A Continuous casting machine sector section centering measurement method |
| 07/02/2008 | CN101210806A Laser emission axis and mechanical base level coaxiality measuring method based on secondary light source |
| 07/02/2008 | CN101210805A Transmission modules coaxiality measurement method based on focal plane imaging method |
| 07/02/2008 | CN101210804A Laser emission axis and mechanical base level coaxiality measuring method based on angle prism |
| 07/02/2008 | CN101210803A Two-dimensional transversal zeeman double-frequency laser linearity/coaxiality measuring device |
| 07/02/2008 | CN101210802A Micro-displacement transducer |
| 07/02/2008 | CN101210801A Micro-displacement measurement method |
| 07/02/2008 | CN101210800A Apparatus and method of measuring distance using structured light |
| 07/02/2008 | CN101209753A Star sensor system imaging structure |
| 07/02/2008 | CN101209462A Steel tube punching machine three-roller centring device center alignment degree integration measurement method |
| 07/02/2008 | CN101209461A Steel tube punching machine three-roller centring device center alignment degree on-line measurement method |
| 07/02/2008 | CN100399213C Method for reducing diffraction angle in holographic phasic difference magnification |
| 07/02/2008 | CN100399039C 印刷电路板检查装置 A printed circuit board inspection apparatus |
| 07/02/2008 | CN100398983C Double-camera video frequency large-deformation measurement method and video frequency extension device based thereon |
| 07/02/2008 | CN100398982C Apparatus for measuring movement of current collector |
| 07/02/2008 | CN100398981C X-ray speckle device and application thereof in microdisplacement measurement |
| 07/02/2008 | CN100398980C Three-dimensional super-resolution confocal array scanning and micro-detecting method and device |
| 07/02/2008 | CN100398979C Method for determining the position of an object in a space |
| 07/02/2008 | CN100398978C Manual image measuring instrument |
| 07/02/2008 | CN100398694C Method and device for controlling thickness of optical film, insulation multilayer film and making device |
| 07/01/2008 | US7394918 Image recognition method and apparatus |
| 07/01/2008 | US7394917 Apparatus for measuring a trajectory |
| 07/01/2008 | US7394554 Selecting a hypothetical profile to use in optical metrology |
| 07/01/2008 | US7394553 Integrated measurement device |
| 07/01/2008 | US7394552 Method for measuring the separation of extended objects in conjunction with an optical observation system and microscope for carrying out the same |
| 07/01/2008 | US7394550 Displacement detector |
| 07/01/2008 | US7394549 Method and arrangement for optical coherence tomography |
| 07/01/2008 | US7394536 Method and apparatus for inspecting front surface shape |
| 07/01/2008 | US7394532 Surface inspection method and apparatus |
| 07/01/2008 | US7394527 Measuring device and measuring method for determining distance and/or position |
| 07/01/2008 | US7394084 Method of generating image and illumination device for inspecting substrate |
| 06/27/2008 | CA2615186A1 Apparatus and method for measuring waviness of sheet materials |
| 06/26/2008 | WO2008076850A2 Apparatus and methods for measuring workpieces |
| 06/26/2008 | WO2008076608A1 Method and system for measuring an object |
| 06/26/2008 | WO2008076601A1 Determining physical property of substrate |
| 06/26/2008 | WO2008076482A2 Hand-held survey probe |
| 06/26/2008 | WO2008074088A1 A system and method for orientating scan cloud data relative to base reference data |
| 06/26/2008 | WO2008061186A3 Distance measuring interferometer and encoder metrology systems for use in lithography tools |
| 06/26/2008 | WO2008049501A3 Rotary printing press and method for adjusting a cylinder thereof |
| 06/26/2008 | WO2007123701A3 Optical metrology of multiple patterned layers |
| 06/26/2008 | US20080151271 Method for monitoring film thickness, a system for monitoring film thickness, a method for manufacturing a semiconductor device, and a program product for controlling film thickness monitoring system |
| 06/26/2008 | US20080151270 Drop Analysis System |
| 06/26/2008 | US20080151269 Model and parameter selection for optical metrology |
| 06/26/2008 | US20080151268 Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty |
| 06/26/2008 | US20080151267 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method |
| 06/26/2008 | US20080151266 Evaluation method for evaluating optical characteristics of optical system, evaluation method for evaluating projector, evaluation device for evaluating optical characteristics, and screen |
| 06/26/2008 | US20080151265 Method for positioning a target portion of a substrate with respect to a focal plane of a projection system |