Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
07/2008
07/31/2008WO2008070635A3 Method and system for determining a critical dimension of an object
07/31/2008WO2007143505A3 Method and apparatus for automatically processing multiple applications in a predetermined order to affect multi-application sequencing
07/31/2008US20080182343 Real-Time Parameter Tuning Using Wafer Temperature
07/31/2008US20080181553 System for monitoring sealing wear
07/31/2008US20080181487 Method and apparatus for automatic registration and visualization of occluded targets using ladar data
07/31/2008US20080181354 Counting device, distance meter, counting method, and distance measuring method
07/31/2008US20080181268 Pre-amplifier for detection lasers within laser ultrasonic inspection systems
07/31/2008US20080180698 Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry
07/31/2008US20080180697 Measuring instrument and laser beam machine for wafer
07/31/2008US20080180696 Process window for EUV lithography
07/31/2008US20080180695 Unevenness elimination end-point detecting apparatus and unevenness elimination end-point detecting method for CMP apparatus
07/31/2008US20080180694 Scanning interferometry for thin film thickness and surface measurements
07/31/2008US20080180689 Interferometric Height Measurement
07/31/2008US20080180688 System for measuring the image quality of an optical imaging system
07/31/2008US20080180687 Interferometric Height Measurement
07/31/2008US20080180685 Interferometry for lateral metrology
07/31/2008US20080180684 Thin-film metrology using spectral reflectance with an intermediate in-line reference
07/31/2008US20080180669 Apparatus for checking concentricity between lens barrel and barrel holder
07/31/2008US20080180668 Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus
07/31/2008US20080180656 Surface characteristic analysis
07/31/2008DE202008006523U1 Koordinationsmessgerät Coordination Meter
07/31/2008DE102007059185A1 Verfahren und Vorrichtung zur Messung der Geradheit von Langprodukten Method and apparatus for measuring the straightness of long products
07/31/2008DE102007014062A1 Component e.g. hinge web, mounting position detection method for airbag, involves detecting modulated signal reflected from component, and evaluating signal with respect to geometrical constants such as lattice constant of component
07/31/2008DE102007004934A1 Geometrical error checking method for positioning machine i.e. coordinate measuring machine, involves comparing distance difference measured by length measuring system with distance difference calculated from coordinates of end effector
07/31/2008DE102007004423A1 Steuerung eines Betriebes eines Koordinatenmessgerätes Controlling an operation of a coordinate measuring machine
07/31/2008DE102007003852A1 Galvanometric motor for laser scanning system, has LED to direct light beam towards reflection surface of deflection unit in such manner that light beam forms angle of less than thirty five degrees with rotation axis of rotor
07/31/2008DE102007003712A1 Pig iron position determining method for aluminum-smelting furnace, involves recording gray-tone image and distance image from top side of pig iron stack and combining images in image evaluation system to determine position of iron
07/31/2008DE102006055070B4 Verfahren und Vorrichtung zum interferometrischen Vermessen einer Form eines Testobjekts Method and device for interferometric measurement of a shape of a test object
07/31/2008CA2676249A1 Method and apparatus for quantitative 3-d imaging
07/31/2008CA2676224A1 Method and apparatus for quantitative 3-d imaging
07/30/2008EP1950561A1 Contactless control of the stiffness of wood products in the production line
07/30/2008EP1949146A1 Retro-reflective target wafer for a visual position determination system
07/30/2008EP1949027A1 Optical measurement of metallic surfaces
07/30/2008EP1949026A1 Method and device for assessing joins of workpieces
07/30/2008EP1949025A1 Sorting tablets by measuring diameter
07/30/2008EP1678466A4 Line profile asymmetry measurement
07/30/2008EP1568262B1 Electronic parts mounting apparatus and method
07/30/2008CN201094033Y Surface mounting or soldering type stress-strain test sensing equipment
07/30/2008CN201094007Y Optical grating length measuring machine
07/30/2008CN201094006Y Rotatable image taking device of single lens particle determining instrument
07/30/2008CN201094005Y Object detecting machine with light shield apparatus
07/30/2008CN201094004Y Filter tip rod circle centre cotton thread offset detector
07/30/2008CN201094003Y Special device of tile detection based on machine vision
07/30/2008CN101233387A Thod for measuring a shape anomaly on an aircraft structural panel and system therefor
07/30/2008CN101233386A Method for measuring decentralization of optical axis on the front and the rear surface of lens
07/30/2008CN101231750A Calibrating method of binocular three-dimensional measuring system
07/30/2008CN101231749A Method for calibrating industry robot
07/30/2008CN101231690A Living-tissue pattern detecting method, living-tissue pattern detecting device, biometric authentication method, and biometric authentication device
07/30/2008CN101231343A Apparatus for measuring parallelism of laser rangefinder sighting and receiving axes based on liquid crystal modulation
07/30/2008CN101231165A Counting device, distance meter, counting method, and distance measuring method
07/30/2008CN101231163A Method for measuring real roundness
07/30/2008CN101231162A Method for measuring pitch automatically
07/30/2008CN101231161A Method for measuring particle diameter
07/30/2008CN101231160A Method for representing nondestructive film
07/30/2008CN101231159A Method of measuring topology of functional liquid droplet in pixel, and topology measuring apparatus of functional liquid in pixel
07/30/2008CN101231158A Device for fast detecting exiguity object three-dimensional contour dimension based on liquid zoom lens
07/30/2008CN101231157A Laser measuring instrument for railway work lifting and lining path
07/30/2008CN101231156A Earth stone dam displacement subsection laser collimation monitoring method
07/30/2008CN101229053A 光图像计测装置 Optical image measurement device
07/30/2008CN101228973A Non-contact measurement method and system for human outside measurement
07/30/2008CN100407617C 移动无线终端和使用这种终端的网络商务系统 Mobile wireless terminals and network business systems using this terminal
07/30/2008CN100407391C 用以校准用于测量半导体装置特征尺寸的散射测量工具的方法以及结构 Scattering measurement used to calibrate the instrument for measuring dimensions of a semiconductor device characterized by a method and the structure
07/30/2008CN100406893C 光学速度计,位移信息测量装置以及输送和处理装置 Optical speedometer, displacement measuring devices and information delivery and processing means
07/30/2008CN100406850C 角度检测装置以及使用其的扫描型执行器 Angle detection device and using the same scanning actuator
07/30/2008CN100406848C 三维形状测量装置及三维形状测量方法 The three-dimensional shape measuring apparatus and a three-dimensional shape measuring method
07/30/2008CN100406847C 用于植物胚胎圆形顶部三维成像的方法和系统 A method for three-dimensional imaging of plant embryos circular top and systems
07/30/2008CN100406846C 对准检测装置及对准偏移量的检测方法 Alignment detection apparatus and method for detecting alignment of the offset
07/30/2008CN100406845C 确定光束位置的装置和操作确定光束位置的装置的方法 Means to determine the beam position and the operating means for determining the position of the light beam a method
07/30/2008CN100406844C 一种激光视觉全局测量量值传递方法 A laser vision global measurement value transfer method
07/30/2008CN100406843C 距离探测设备和方法 Distance detection apparatus and method
07/30/2008CN100406842C 位置侦测装置、位置侦测方法、测试装置以及摄影模块制造装置 Position detection device, position detection methods, testing equipment and photography module manufacturing equipment
07/30/2008CN100405939C Machine vision equipment to determine cigarette product physical characters, and method for forming machine vision equipment
07/29/2008US7406394 Spectra based endpointing for chemical mechanical polishing
07/29/2008US7406391 System, method, and computer product for detection instrument calibration
07/29/2008US7406227 Efficient coupling of light into a light guides
07/29/2008US7405835 High-accuracy pattern shape evaluating method and apparatus
07/29/2008US7405834 Compensated coherent imaging for improved imaging and directed energy weapons applications
07/29/2008US7405833 Method for calibration and removal of wavefront errors
07/29/2008US7405831 Laser scanning interferometric surface metrology
07/29/2008US7405830 Vibration-insensitive interferometer
07/29/2008US7405810 Method and apparatus for positioning a substrate on a substrate table
07/29/2008US7405726 3D cursor or joystick device
07/29/2008US7405078 Bed material for cell culture, method for co-culture of cell and co-cultured cell sheet obtainable therefrom
07/29/2008US7405032 employing a non-lithographic shrink technique to heat a photoresist for causing the photoresist to just enter a liquid phase to mitigate line-edge roughness, which in turn increases a distance between gates and decrease a thickness of the photoresist layer; trim etching to mitigate increase distance
07/29/2008US7404929 Apparatus for detecting dysplasic or cancerous tissues
07/29/2008US7404259 Optical position measuring instrument
07/24/2008WO2008087974A1 Data processing apparatus and method, and recording medium
07/24/2008WO2008087503A1 An assembly for analysing a three-dimensional surface of a workpiece and machine comprising such an assembly
07/24/2008WO2008087059A1 Objective focusing method for optical length measurement systems
07/24/2008WO2008086773A1 Device for the measurement of undercarriage geometry
07/24/2008US20080177501 Device and method for sensing a position of a drive unit
07/24/2008US20080177482 Structure Monitor System
07/24/2008US20080174789 Method For Optical Chassis Measurement
07/24/2008US20080174788 Scanner Device
07/24/2008US20080174787 System and method for selectively setting optical navigation resolution
07/24/2008US20080174785 Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles
07/24/2008US20080174784 Apparatus and method for measuring characteristics of surface features
07/24/2008US20080174782 Method of speckle size and distribution control and the optical system using the same
07/24/2008US20080174779 Wafer alignment method for dual beam system
07/24/2008US20080174778 Method and System For Optimizing Sub-Nanometer Critical Dimension Using Pitch Offset