Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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07/24/2008 | US20080174755 Movable Stage Apparatus |
07/24/2008 | DE102008005191A1 Sensor arrangement for agricultural commercial vehicle, has height tracking system with transmitter for transmitting measuring signal, which is directed within preset measuring area approximately parallel to surface of plant position |
07/24/2008 | DE102007059551A1 Einrichtung zur Messung der Eigenschaften einer Lichtleitfaser Means for measuring the characteristics of an optical fiber |
07/24/2008 | DE102007003059A1 Verfahren zur objektivierten Fokussierung für die optische Längenmesstechnik A method for focusing objectified for optical length metrology |
07/24/2008 | DE102007002880A1 Verfahren und Vorrichtung zum optischen Ausmessen eines Objekts, insbesondere eines Werkstücks oder Werkzeugs Method and device for optically measuring an object, in particular a workpiece or tool |
07/24/2008 | DE102007002722A1 Optische Messeinrichtung und Verfahren zur Bestimmung einer Verformung eines elektrischen Leiters sowie Verwendung der Messeinrichtung und Verwendung des Verfahrens Optical measuring device and method for determining a deformation of an electrical conductor and the use of the measuring device and using the method |
07/24/2008 | DE102006006204B4 Anordnung zur optischen Kontrolle des Arbeitsergebnisses eines Werkzeugs und/oder zur Führung eines Werkeugs Arrangement for optical control of the work result of a tool and / or conduct of Werkeugs |
07/24/2008 | DE102005043000B4 Angetriebenes Werkzeug mit Ausrichtführung und Standbohrmaschine mit Ausrichtführung A power tool with alignment and drill press with alignment |
07/24/2008 | CA2646683A1 Method of, and apparatus for, measuring the quality of a surface of a substrate |
07/23/2008 | EP1947419A1 Non-contact method and system for tyre analysis |
07/23/2008 | EP1947418A1 Optical measuring device and method for determining a deformation in an electric conductor and use of measuring device and use of method |
07/23/2008 | EP1947417A1 Lamination status inspecting apparatus, lamination status inspecting method and lamination status detecting program |
07/23/2008 | EP1946168A2 Optical angle detection |
07/23/2008 | EP1946078A1 Pass-line insensitive sensor |
07/23/2008 | EP1946042A1 Pass-line and tilt insensitive sensor |
07/23/2008 | EP1946041A1 Measuring system for three-dimensional objects |
07/23/2008 | EP1946040A1 Method and apparatus for identifying photocatalytic coatings |
07/23/2008 | EP1945384A1 Method for the detection of strip edges |
07/23/2008 | EP1828712B1 Metrological characterization of microelectronic circuits |
07/23/2008 | EP1567055A4 Method and system for monitoring breathing activity of a subject |
07/23/2008 | EP0964251B1 Optical waveguide probe and its manufacturing method |
07/23/2008 | CN101226892A Measuring apparatus for work held by chuck table, and laser beam machining apparatus |
07/23/2008 | CN101226637A Method for detecting automatically contact point of vehicle wheel and ground |
07/23/2008 | CN101226592A Method for tracing object based on component |
07/23/2008 | CN101226344A Apparatus and method for measuring optical system parameter |
07/23/2008 | CN101226078A Method for detecting long-distance linear organization abnormal vibration based on distributed optical fibre sensor |
07/23/2008 | CN101226055A Method and device for recording the straightness of elongated products |
07/23/2008 | CN101226052A Three-dimensional microcosmic appearance inclined scanning method and apparatus |
07/23/2008 | CN101226051A Temperature self-compensation optical fiber/optical grating dynamic strain measurement method and system |
07/23/2008 | CN101226050A Method for measuring double-camera straight-pulling monocrystal diameter based on digital signal processor |
07/23/2008 | CN101226049A Device for detecting parallelism of two route parallel beams |
07/23/2008 | CN101224472A Plate head bending shape detection device based on nearing fared image and method thereof |
07/23/2008 | CN100405010C Realtime deformation measuring device based on video image |
07/23/2008 | CN100405009C Symmetrical closed laser arch dam deformation monitoring method |
07/23/2008 | CN100405008C Target device and optical tester |
07/23/2008 | CN100405007C Intelligent 3D laser road state detecting vehicle |
07/23/2008 | CN100405006C Position detecting apparatus, a position detecting method and an electronic component carrying apparatus |
07/23/2008 | CN100405005C Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference |
07/23/2008 | CN100405004C High precision and fast extraction device with optical strip image features and method thereof |
07/22/2008 | US7403900 Franking system and method |
07/22/2008 | US7403836 Automatic work apparatus and automatic work control program |
07/22/2008 | US7403669 Land mark, land mark detecting apparatus, land mark detection method and computer program of the same |
07/22/2008 | US7403650 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object |
07/22/2008 | US7403648 Apparatus for generating three-dimensional model data |
07/22/2008 | US7403638 Method and system for monitoring breathing activity of a subject |
07/22/2008 | US7403323 Process control monitors for interferometric modulators |
07/22/2008 | US7403296 Method and apparatus for noncontact relative rail displacement, track modulus and stiffness measurement by a moving rail vehicle |
07/22/2008 | US7403295 Position-detecting system |
07/22/2008 | US7403294 Optical measurement device and method |
07/22/2008 | US7403293 Metrology apparatus, lithographic apparatus, process apparatus metrology method and device manufacturing method |
07/22/2008 | US7403290 Method and means for determining the shape of a rough surface of an object |
07/22/2008 | US7403289 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
07/22/2008 | US7403288 Method and apparatus for measuring thickness of thin article |
07/22/2008 | US7403277 Method and apparatus for measuring face angle |
07/22/2008 | US7403270 Method for whole field thin film stress evaluation |
07/22/2008 | US7403219 Driving lane recognizer and driving lane recognizing method |
07/22/2008 | US7402785 System and method for correction of turbulence effects on laser or other transmission |
07/22/2008 | CA2488474C Variable test object and holder for variable test objects |
07/22/2008 | CA2386094C Calculating camera offsets to facilitate object position determination using triangulation |
07/22/2008 | CA2370151C Position detector with auxiliary means for detecting the direction of the gravity vector |
07/19/2008 | WO2007079805A1 Creation of a distance image |
07/17/2008 | WO2008085163A1 Method for detecting the alignment of films for automated defect detection |
07/17/2008 | WO2008084523A1 Position information detection device, position information detection method, and position information detection program |
07/17/2008 | WO2008084468A2 A method, device and system for imaging |
07/17/2008 | WO2008067561A3 Interior contour measurement probe |
07/17/2008 | WO2008056180A3 Object position and orientation detection system |
07/17/2008 | WO2008054457A3 Plasmon tomography |
07/17/2008 | WO2008021109A3 Method and apparatus for contact free measurement of periodically moving objects |
07/17/2008 | WO2007130158A3 Interferometers for the measurement of large diameter thin wafers |
07/17/2008 | US20080172313 Billing system and method for determining transportation charges for packages |
07/17/2008 | US20080170243 Measuring apparatus for work held by chuck table, and laser beam machining apparatus |
07/17/2008 | US20080170242 Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables |
07/17/2008 | US20080170241 Automated process control using optical metrology and a correlation between profile models and key profile shape variables |
07/17/2008 | US20080170240 Measurement method, exposure method, exposure apparatus, and device fabrication method |
07/17/2008 | US20080170239 Light Source Unit For Alignment, Alignment Apparatus, Exposure Apparatus, Digital Exposure Apparatus, Alignment Method, Exposure Method And Method For Setting Lighting Apparatus Condition |
07/17/2008 | US20080170238 Three-dimensional shape measuring device, and portable measuring device |
07/17/2008 | US20080170234 Method and apparatus of optical test stand using blue to ultra-violet light source for component level measurement of head gimbal assembly for use in hard disk drive |
07/17/2008 | US20080170222 Methods and systems for determining vehicle wheel alignment |
07/17/2008 | US20080170219 Methods, systems, and computer program products for performing real-time quadrature projection based Fourier domain optical coherence tomography |
07/17/2008 | US20080170204 Method and apparatus for determining the shape, distance and orientation of an object |
07/17/2008 | US20080169587 Optical modeling apparatus |
07/17/2008 | DE4201511C5 Positionsdetektor und Verfahren zur Positionsmessung Position detector and method for position measurement |
07/17/2008 | DE19857791B4 Verfahren zur Herstellung einer Elektronenstrahlröhre, Verfahren zur Messung der relativen Position von Elektroden eines Strahlsystems einer solchen Elektronenstrahlröhre und Anordnung zur Durchführung eines solchen Verfahrens A process for preparing a cathode ray tube, method for measuring the relative position of electrodes of a beam of such a cathode ray tube system and device for implementing such a method |
07/17/2008 | DE10322907B4 Vorrichtung zur Messung von Maßen von Messobjekten An apparatus for measuring dimensions of objects to be measured |
07/17/2008 | DE102008004438A1 Messvorrichtung für durch Einspanntisch gehaltenes Werkstück und Laserstrahlbearbeitungsvorrichtung Measuring device held by chuck workpiece and laser beam machining apparatus |
07/17/2008 | DE102008003756A1 Surface sensor has photosensitive area in given or stochastically determined multiple pixels, particularly in all pixels, particularly in laid down or stochastically determined multiple lines, particularly in all lines |
07/17/2008 | DE102008003471A1 Procedure for capturing object image and for inspecting object, comprises imaging given number of object areas and rows on a surface sensor by a time-delay-integration imaging procedure and separately selecting signals of surface sensors |
07/17/2008 | DE102007003086A1 Vorrichtung zum Messen der Fahrwerksgeometrie Apparatus for measuring the suspension geometry |
07/17/2008 | DE102007003060A1 Verfahren zur Bestimmung der Güte eines Messpunktes bei der Kantendetektion in der optischen Längenmesstechnik A method for determining the quality of a measurement point in the edge detection in the optical length measurement technology |
07/17/2008 | DE102007001949A1 Camera e.g. video camera, for use with computer, is connected with global positioning system receiver for impression of position and height of image recording, and is connected with directional device e.g. digital compass |
07/17/2008 | DE10163463B9 Vorrichtung und Verfahren zu in-situ-Messung von auf Trägern aufgedruckten Polymermengen An apparatus and method for in-situ measurement of the printed on carriers amounts of polymer |
07/17/2008 | CA2675028A1 Method and apparatus for the examination of an object |
07/16/2008 | EP1944734A2 Distance correcting apparatus of surrounding monitoring system and vanishing point correcting apparatus thereof |
07/16/2008 | EP1944569A1 Method and device for optical measurement of an object in particular of a workpiece or tool |
07/16/2008 | EP1815235B1 A system for locating a physical alteration in a structure and a method thereof |
07/16/2008 | EP1776556B1 Device for measuring or orienting objects such as fruits and the like |
07/16/2008 | EP1285255B1 Aligning an optical detection system with a capillary channel in a microfluidic lab chip |
07/16/2008 | EP1210638A4 Method/system measuring object features with 2d and 3d imaging coordinated |
07/16/2008 | EP1125096B1 Method of and device for determining the warpage of a wafer |
07/16/2008 | CN201086322Y Detecting device of chip paper tape punch |