Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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09/25/2008 | US20080231867 Mechanism for positioning device |
09/25/2008 | US20080231865 determination of surface properties |
09/25/2008 | US20080231864 Method for Measuring Center of Rotation of a Nozzle of a Pick and Place Machine Using a Collimated Laser Beam |
09/25/2008 | US20080231863 Automated process control using optical metrology with a photonic nanojet |
09/25/2008 | US20080231856 Substrate Inspection Apparatus, Substrate Inspection Method and Semiconductor Device Manufacturing Method |
09/25/2008 | US20080231846 Level detection apparatus |
09/25/2008 | US20080231844 Method and apparatus for checking stator core alignment |
09/25/2008 | DE102008011596A1 Kombiniertes Baken- und Szenen-Navigationssystem Combined beacon and scene navigation system |
09/25/2008 | DE102008010917A1 Image processing system for e.g. semiconductor chip, has lighting controller controlling object by all or partial amount of point light sources, and holding camera image, where system checks controller based on shape characteristics |
09/25/2008 | DE102007023293B3 Verfahren zur Optischen Kohärenztomographie A method for optical coherence tomography |
09/25/2008 | DE102007014036A1 Holding device for e.g. rotating stent, has three support elements pivotably supported around rotational axes that are spaced from each other such that cylindrical article is attached at elements, where drive is coupled with one of elements |
09/25/2008 | DE102007013669A1 Mounted catenary wire fine undulation measuring method for railway transportation, involves measuring contact wire sag parabola between sliding pieces by lifting device according to preset equation, where device consists of sliding piece |
09/24/2008 | EP1972887A1 System and method for height measurement |
09/24/2008 | EP1972886A2 Method and apparatus for detecting a location of a workpiece surface using a surface height focus sensor means |
09/24/2008 | EP1972885A1 Displacement/distortion measuring method and displacement/distortion measuring apparatus |
09/24/2008 | EP1971848A1 Systems and methods for generating data based on one or more spectrally-encoded endoscopy techniques |
09/24/2008 | EP1971821A1 Coordinate measurment instrument |
09/24/2008 | EP1971820A1 Creation of a distance image |
09/24/2008 | EP1405100B1 Method for correcting data of several opto-electronic sensors |
09/24/2008 | CN201122097Y Infrared convection pipe type displacement transducer |
09/24/2008 | CN201122096Y Example bench for viewing silicon slice example section |
09/24/2008 | CN101272184A Light beam calibration method and device of optical system |
09/24/2008 | CN101271283A Veilling glare coefficient testing device of photo-etching machine object lens under point light source work condition |
09/24/2008 | CN101270975A Combined interference device for aspheric surface measurement |
09/24/2008 | CN101270974A Analogy method and measuring apparatus for elastohydrodynamic lubricant film shape experiment with self-spin |
09/24/2008 | CN101269664A Detecting instrument for temperature and displacement of steel rail |
09/24/2008 | CN100420917C Small displacement measuring method and instrument |
09/24/2008 | CN100420916C Sensing system of fiber strain |
09/24/2008 | CN100420915C Light source for plane display screen detector |
09/23/2008 | US7428470 Method for monitoring edge exclusion during chemical mechanical planarization |
09/23/2008 | US7428329 Pickup image processing device of electronic part mounting device and pickup image processing method |
09/23/2008 | US7428064 Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus |
09/23/2008 | US7428063 Overlay measurement apparatus |
09/23/2008 | US7428062 Measuring apparatus for work held by chuck table, and laser beam machining apparatus |
09/23/2008 | US7428061 Optical probe for scanning the features of an object and methods thereof |
09/23/2008 | US7428060 Optimization of diffraction order selection for two-dimensional structures |
09/23/2008 | US7428059 Measurement method and apparatus, exposure apparatus, and device manufacturing method |
09/23/2008 | US7428057 Interferometer for determining characteristics of an object surface, including processing and calibration |
09/23/2008 | US7428056 Method and apparatus for optically analyzing a surface |
09/23/2008 | US7428053 Common path frequency domain optical coherence reflectometry/tomography device |
09/23/2008 | US7427747 Optical image pickup apparatus for imaging living body tissue |
09/23/2008 | US7427520 Method and apparatus for measuring thickness of thin film formed on substrate |
09/21/2008 | CA2626334A1 Trailer reversing guidance |
09/18/2008 | WO2008111898A1 Measuring device for measuring a distance |
09/18/2008 | WO2008111724A1 Automatic test system and test method for slump flow of concrete using computing device |
09/18/2008 | WO2008111550A1 Image analysis system and image analysis program |
09/18/2008 | WO2008111452A1 Recognition processing method and image processing device using the same |
09/18/2008 | WO2008111390A1 Scanning probe microscope and method of observing sample using the same |
09/18/2008 | WO2008109908A1 Method and apparatus for the optical measurement of the topography of a sample |
09/18/2008 | WO2008083658A3 Method and apparatus for the examination of an object |
09/18/2008 | WO2008081149A3 Optical computerized method for the 3d measurement of an object by fringe projection and use of a phase-shift method, corresponding system |
09/18/2008 | WO2008062407B1 3d geometric modeling and 3d video content creation |
09/18/2008 | WO2008049500A3 Rotary printing press and method for adjusting a cylinder thereof |
09/18/2008 | US20080227367 Substrate polishing metrology using interference signals |
09/18/2008 | US20080225305 Device for the Optical Analysis, Including Two-Dimensional, of a Thread or Yarn |
09/18/2008 | US20080225304 Optical scanning unit and image forming apparatus using same |
09/18/2008 | US20080225303 Method and Apparatus for the Three-Dimensional Measurement of the Shape and the Local Surface Normal of Preferably Specular Objects |
09/18/2008 | US20080225302 Method of inspecting a body having fine-gap grooves and method of repairing the body |
09/18/2008 | US20080225301 Method, apparatus, and program for processing tomographic images |
09/18/2008 | US20080225294 Apparatus for checking concentricity and method for checking same |
09/18/2008 | US20080225275 Detection system for nanometer scale topographic measurements of reflective surfaces |
09/18/2008 | US20080225267 Optical Measurement Apparatus and Method |
09/18/2008 | DE102008006215A1 Interferometric measuring method for optical function surface, involves arranging screen to block radiation, and detecting intensity distribution of interference pattern produced by reference wave and test wave |
09/18/2008 | DE102007058506A1 Optischer Abstandssensor Optical distance sensor |
09/18/2008 | DE102007012668A1 Strand material length measuring device for measuring length of e.g. cable, has adjusting unit pressed against lateral surface of string material, where unit includes guide roller with guide paths and pressing roller |
09/18/2008 | DE102007012654A1 Measuring device for measurement of surface profile of cylindrical drilling of e.g. engine cylinder, has positioning units to move objective, microscope or optical sensor in radial or axial direction, and relative to surface of drilling |
09/18/2008 | DE102007011877A1 Optisches Sensorsystem an einer Vorrichtung zur Behandlung von Flüssigkeiten An optical sensor system for an apparatus for treating liquids |
09/18/2008 | DE102007011445A1 Verfahren und Vorrichtung zur Untersuchung von Hohlprofilen Method and apparatus for investigating hollow profiles |
09/18/2008 | DE102007010516A1 Polycrystalline origin identification involves determining product image of product with comparison picture of comparison product in polycrystalline structure with help of image evaluation |
09/18/2008 | CA2680015A1 Optical metrology system |
09/17/2008 | EP1970941A2 Stage system and stage driving method for use in exposure apparatus |
09/17/2008 | EP1970694A1 Optical image measuring instrument |
09/17/2008 | EP1970668A1 Method and apparatus for optical measurement of the topography of a sample |
09/17/2008 | EP1970667A1 Method and device for inspecting a perforation in a workpiece as results of an operation on the workpiece |
09/17/2008 | EP1969355A1 Method and arrangement for detecting material defects in workpieces |
09/17/2008 | EP1969343A2 Oblique transmission illumination inspection system and method for inspecting a glass sheet |
09/17/2008 | EP1969311A1 Method of measuring the three-dimensional profile of a ground, and device for implementing said method |
09/17/2008 | EP1969309A1 Method for optically measuring a chassis |
09/17/2008 | EP1969308A1 Method for optically measuring a chassis |
09/17/2008 | EP1969307A1 Coded structured light |
09/17/2008 | EP1969306A2 Method and system for reconstructing the three-dimensional shape of the surface of at least a portion of an ear canal and/or of a concha |
09/17/2008 | EP1883784A4 Method and apparatus for calibrating circular objects using a computer tracking system |
09/17/2008 | EP1321753B1 Optical tactile sensor |
09/17/2008 | CN201116871Y Four-dimensional laser diameter measuring controller |
09/17/2008 | CN201116870Y Height detecting instrument |
09/17/2008 | CN201116869Y Output error detecting device for solar sensor |
09/17/2008 | CN201116868Y Tubular bottle on-line detecting system |
09/17/2008 | CN101268331A Method for accurate high-resolution measurements of aspheric surfaces |
09/17/2008 | CN101268330A Optical encoder having slanted optical detector elements for harmonic suppression |
09/17/2008 | CN101267546A Inspection apparatus for inspecting articles |
09/17/2008 | CN101266937A Measurement of overlay offset in semiconductor processing |
09/17/2008 | CN101266694A A network construction method for single-station territorial laser scanning point cloud |
09/17/2008 | CN101266143A Planarity detection device and method |
09/17/2008 | CN101266142A Concentricity detection device and its method |
09/17/2008 | CN101266141A Signal wheel tooth phase angle automatic detection device |
09/17/2008 | CN101266140A Complicated-type plane metal binder diamond outline detection method |
09/17/2008 | CN101266139A Microstructure appearance test method based on infrared white light interference technique |
09/17/2008 | CN101266138A Large-sized mirror face great error range phase restoration detection device and method |
09/17/2008 | CN101266137A Axis external diameter length detection process and device |
09/17/2008 | CN101266136A Electric diplexer filter inner conductor length on-line measurement method |