Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
---|
10/15/2008 | CN100425946C Grating ruler reading head pulley |
10/15/2008 | CN100425945C Object detector of vehicle |
10/15/2008 | CN100425944C Position detection apparatus and method |
10/14/2008 | US7437226 Method of constructing artificial mark for autonomous driving, apparatus and method of determining position of intelligent system using artificial mark and intelligent system employing the same |
10/14/2008 | US7437077 Wavefront sensing system employing active updating of reference positions and subaperture locations on wavefront sensor |
10/14/2008 | US7436527 Systems and methods for immersion metrology |
10/14/2008 | US7436526 Real-time system for monitoring and controlling film uniformity and method of applying the same |
10/14/2008 | US7436525 Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method |
10/14/2008 | US7436524 Apparatus and method for three-dimensional measurement and program for allowing computer to execute method for three-dimensional measurement |
10/14/2008 | US7436523 Eyeglass frame measurement apparatus |
10/14/2008 | US7436522 Method for determining the 3D coordinates of the surface of an object |
10/14/2008 | US7436521 Optical measuring apparatus and operating method for imaging error correction in an optical imaging system |
10/14/2008 | US7436520 Method of calibrating an interferometer optics and of processing an optical element having an optical surface |
10/14/2008 | US7436519 System and method for interferometer non-linearity compensation |
10/14/2008 | US7436513 Wafer pre-alignment apparatus and method |
10/14/2008 | US7436507 Method and apparatus for inspecting a pattern |
10/14/2008 | US7436506 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
10/14/2008 | US7436504 Non-destructive testing and imaging |
10/14/2008 | US7436498 Apparatus for determining the shape of a gemstone |
10/14/2008 | US7436380 Electronic Apparatus with level detecting function |
10/14/2008 | US7435959 Microstructured pattern inspection method |
10/14/2008 | US7435945 Optical configuration for imaging-type optical encoders |
10/14/2008 | US7435568 Animal growth regulators; confining cell passageway, bias light source |
10/14/2008 | US7435300 Dynamic film thickness control system/method and its utilization |
10/14/2008 | US7434322 Reference beam generator and system for producing guide beams for field markers |
10/14/2008 | CA2424023C Method and system for characterizing aspheric surfaces of optical elements |
10/14/2008 | CA2381181C Time-resolved photogrammetric measurement of wheel position values |
10/14/2008 | CA2315508C A robot-based gauging system for determining three-dimensional measurement data |
10/09/2008 | WO2008121073A1 Method and device for exact measurement of objects |
10/09/2008 | WO2008120882A1 Apparatus for inspection of three-dimensional shape and method for inspection using the same |
10/09/2008 | WO2008120474A1 Production method and inspection method of continuum of rfid adhesive label |
10/09/2008 | WO2008120457A1 Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non-static object |
10/09/2008 | WO2008120400A1 Sheet-like product inspecting method and device |
10/09/2008 | WO2008119984A1 Method for measuring the thickness or curvature of thin films |
10/09/2008 | WO2008119224A1 Optical tilt monitoring apparatus |
10/09/2008 | WO2008092461A3 Measuring of geometrical parameters for a wind turbine blade |
10/09/2008 | WO2008086111A3 Laser beam alignment devices, systems, and methods |
10/09/2008 | WO2008042581A3 Offset correction methods and arrangement for positioning and inspecting substrates |
10/09/2008 | WO2008011510A3 Compensation of systematic effects in low coherence interferometry |
10/09/2008 | US20080249754 Generation of a library of periodic grating diffraction signals |
10/09/2008 | US20080249738 Method of determining a dimension of a sample of a construction material and associated apparatus |
10/09/2008 | US20080248412 Supervisory etch cd control |
10/09/2008 | US20080247268 Autonomous Depth Control For Wellbore Equipment |
10/09/2008 | US20080246974 Portable Optical Measurement Assembly |
10/09/2008 | US20080246973 Method and Device for Determining the Lateral Relative Displacement Between a Processing Head and a Workpiece |
10/09/2008 | US20080246945 Apparatus for quantifying shear stress on a formulation comprising biomolecules |
10/09/2008 | US20080246941 Wavefront aberration measuring device, projection exposure apparatus, method for manufacturing projection optical system, and method for manufacturing device |
10/09/2008 | US20080246796 System for optically detecting and measuring release agent on a print drum in an ink jet printer |
10/09/2008 | DE202008010270U1 Vorrichtung zur Durchführung des Härtetests von Prüflingen Apparatus for performing the hardness tests of specimens |
10/09/2008 | DE102007043433B3 Vorrichtung und Verfahren zum Adaptieren eines Maskenbildes Apparatus and method for adapting a mask image |
10/09/2008 | DE102007033814A1 Vorrichtung und Verfahren zum Messen der Position von Marken auf einer Maske Apparatus and method for measuring the position of marks on a mask |
10/09/2008 | DE102007016774A1 Method for interference distance measurement of object, involves guiding radiation emitted by radiation sources over transparent substrate and radiation is guided by partial silvering on its rear side in measuring beam and reference beam |
10/09/2008 | DE102007016056A1 Verfahren und Vorrichtung zur Werkstückeinmessung und Werkstückbearbeitung Method and apparatus for workpiece and workpiece machining |
10/09/2008 | DE10054142B4 Verfahren und Systeme zur Messung der Mikrorauhigkeit eines Substrates unter Kombination von Partikelzählung und Atomarkraft-Mikroskopmessungen Methods and systems for measuring the microroughness of a substrate on combination of particle counting and atomic force microscope measurements |
10/08/2008 | EP1978329A1 Method for measuring the roundness of round profiles |
10/08/2008 | EP1978326A1 Apparatus and method for electronic hitpoint evaluation |
10/08/2008 | EP1976470A2 Laser energy calibration based on optical measurement |
10/08/2008 | EP1875164B1 Method for the determination of the wheel geometry and/or axle geometry of motor vehicles |
10/08/2008 | EP1799099A4 Patient visual instruction techniques for synchronizing breathing with a medical procedure |
10/08/2008 | EP1521944B1 Optical encoder |
10/08/2008 | EP1273903B9 Optical interference tomographic image observing apparatus |
10/08/2008 | CN201130432Y Laser protection bridge warning device |
10/08/2008 | CN201130149Y Apparatus for field monitoring all day spectral reflection type floating oil |
10/08/2008 | CN201130030Y Laser phase grating interference displacement sensor |
10/08/2008 | CN201130015Y Vacuum circuit breaker contact wearing capacity detecting device |
10/08/2008 | CN201130013Y Track flatness measuring device |
10/08/2008 | CN201130012Y Sandwich plate flatness measuring device |
10/08/2008 | CN201130011Y Extension type electronic leather measuring machine |
10/08/2008 | CN201130010Y Shielding door clearance detecting device |
10/08/2008 | CN201130009Y Apparatus measuring settling tank compressive layer thickness |
10/08/2008 | CN201130008Y Dynamic displacement detecting system |
10/08/2008 | CN101283234A Method for non-contact dynamic detection of solid contour |
10/08/2008 | CN101282452A Video conferencing apparatus, control method, and program |
10/08/2008 | CN101281144A Method and device for testing and evaluating leadless solder welding spot crystal crack |
10/08/2008 | CN101281143A System and method for safe detecting chassis of automobile |
10/08/2008 | CN101281112A Image type automatic analysis method for mesh adhesion rice corn |
10/08/2008 | CN101281034A Building single image three-dimensional measurement method based on space right-angle relationship |
10/08/2008 | CN101281025A Eccentric inspection apparatus and eccentric adjusting apparatus |
10/08/2008 | CN101281024A Structure light coding, decoding method as well as coding and decoding device |
10/08/2008 | CN101281023A Method and system for acquiring three-dimensional target shape |
10/08/2008 | CN101281022A Method for measuring vehicle distance based on single eye machine vision |
10/08/2008 | CN101281021A Wood automatic monitoring method and system |
10/08/2008 | CN101279517A Method for testing hexagon pore diameter honeycomb paper core stretching rate |
10/08/2008 | CN101279334A Stand device for measuring coil diameter with adjustable angle |
10/08/2008 | CN100424711C Profile refinement for integrated circuit metrology |
10/08/2008 | CN100424545C Fast adjuster of spectrometer |
10/08/2008 | CN100424510C Position regulator for pickup and non-contacted electric resistance rate determiner |
10/08/2008 | CN100424472C Light sensor |
10/08/2008 | CN100424467C Wide-range displacement transducer for measuring linear phase grating profile |
10/08/2008 | CN100424466C Noncontact three-dimensional measuring method and device |
10/08/2008 | CN100424465C Laser detection apparatus and method for in-furnace information |
10/08/2008 | CN100424464C Flexible optical phase-shift device |
10/07/2008 | US7433799 Method of determining shape data |
10/07/2008 | US7433510 Information presentation apparatus and information presentation system using the same |
10/07/2008 | US7433060 Method for correlating a structural parameter of a plurality of gratings and method for determining a structural parameter value of an unknown grating using the same |
10/07/2008 | US7433059 Device for treating bulbous or tuberous plants |
10/07/2008 | US7433058 System and method for simultaneous 3D height measurements on multiple sides of an object |
10/07/2008 | US7433057 Method for accurate high-resolution measurements of aspheric surfaces |
10/07/2008 | US7433056 Scatterometry metrology using inelastic scattering |
10/07/2008 | US7433055 Device for the examination of optical properties of surfaces |