Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2008
11/26/2008CN100437028C Ultrasonic wave and laser system for measuring three-dimensional space
11/26/2008CN100437026C Body surface three-dimensional topographic information measuring device
11/26/2008CN100437025C Proximity detector
11/26/2008CN100437024C Method for on-line measuring refractive index of blooming
11/26/2008CN100437023C Device and method for measuring the thickness of a transparent sample
11/26/2008CN100437022C Three differential confocal microscopic imaging method and device
11/26/2008CN100437021C Automatically balancing method of interfering measuring system
11/25/2008US7457721 Method and apparatus for measuring small displacement
11/25/2008US7457545 Process for controlling a Hartmann wavefront sensor (WFS) in an adaptive optic (AO) system
11/25/2008US7457463 System and method for the measurement of the relative position of an object with respect to a point of reference
11/25/2008US7457453 Pattern inspection method and apparatus
11/25/2008US7456978 Shape measuring apparatus
11/25/2008US7456977 Wireless substrate-like sensor
11/25/2008US7456976 Statistical method of generating a synthetic hologram from measured data
11/25/2008US7456975 Methods and systems for interferometric analysis of surfaces and related applications
11/25/2008US7456974 Optical measuring system for detecting geometric data of surfaces
11/25/2008US7456973 Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object
11/25/2008US7456967 Mark position detection apparatus
11/25/2008US7456966 Alignment mark system and method to improve wafer alignment search range
11/25/2008US7456964 Detector configurations for optical metrology
11/25/2008US7456949 Methods and systems for laser calibration and eye tracker camera alignment
11/25/2008US7456947 Inspecting apparatus and inspecting method
11/25/2008US7456945 Photonic device package with aligned lens cap
11/25/2008US7456944 Apparatus and method for detection of optical systems in a terrain area
11/25/2008US7456943 Laser positioning measurement system and method
11/25/2008US7456859 Image pickup device
11/25/2008US7456815 Optoelectronic device for position and/or movement detection as well as the associated method
11/25/2008US7455878 Method for simultaneously coating and measuring parts
11/25/2008US7454841 Method and apparatus for wheel alignment system target projection and illumination
11/20/2008WO2008140321A1 Apparatus for characterizing a surface structure
11/20/2008WO2008139735A1 Surface tester and surface testing method
11/20/2008WO2008138688A1 Interferometric measuring device
11/20/2008WO2008138687A1 Optics for image processing and method for reducing aberrations in said optics
11/20/2008WO2008138502A1 Optical position measuring device
11/20/2008WO2008138501A1 Position measuring device
11/20/2008WO2008098716A3 Scanning sensor system for the non-contact optical scanning of object surfaces
11/20/2008WO2008087463A3 Method of, and apparatus for, measuring the quality of a surface of a substrate
11/20/2008US20080285060 Measuring System for Optical Monitoring of Coating Processes
11/20/2008US20080285059 Apparatus and method for in-situ monitoring of wafer bonding time
11/20/2008US20080285058 Optical position-measuring device
11/20/2008US20080285057 High Precision Wide-Angle Electro-Optical Positioning System and Method
11/20/2008US20080285056 Compact 3D scanner with fixed pattern projector and dual band image sensor
11/20/2008US20080285055 Method and System For Determining the Properties of a Surface of Revolution
11/20/2008US20080285054 Optical metrology optimization for repetitive structures
11/20/2008US20080285053 Measuring the shape, thickness variation, and material inhomogeneity of a wafer
11/20/2008US20080285052 Shape measuring apparatus, exposure apparatus, and computer
11/20/2008US20080285051 Multiple-degree of freedom interferometer with compensation for gas effects
11/20/2008US20080285050 Position-measuring device
11/20/2008US20080285049 Device for optically measuring an object
11/20/2008US20080285020 Device having a field mirror for optically testing a surface
11/20/2008US20080285019 Interferometry testing of lenses, and systems and devices for same
11/20/2008US20080284837 Methods and systems for therma-based laser processing a multi-material device
11/20/2008US20080283510 Monitoring Method and Device by Shadowscopy
11/20/2008US20080282564 Measurement Probe for Use in Coordinate Measuring Machines
11/20/2008DE4327250C5 Verfahren zur Koordinatenmessung an Werkstücken A method for coordinate measurement on workpieces
11/20/2008DE102008008873A1 Positionsmesseinrichtung The position measuring device
11/20/2008DE102007023516A1 Medium e.g. air, transmitting arrangement for use between basic unit and active unit, has points in two positions of active units relative to basic unit in opposite manner to transmission of medium of basic unit into active unit
11/20/2008DE102007023483A1 Geometrical size examination method for drill hole, involves carrying out knowledge-based evaluation of standardized description values with respect to defined reference value, and deriving testing result from result of evaluation
11/20/2008DE102007023445A1 Confocally imaging optical system for measuring instrument, has shading element designed as center screen that is formed by half nominal diameter of aperture, where shading element is designed as elliptical center screen
11/20/2008DE102007021964A1 Object surface's three-dimensional optical detection executing method, involves determining height gradients of object surface in two directions from brightness distributions received in cameras, where distributions are detected by surface
11/20/2008DE102005031121B4 Haltevorrichtung und optische Messanordnung für eine aus einem Gitter aufgebaute Röhre Holding device and optical measuring arrangement for a composed of a mesh tube
11/20/2008DE10036512B4 Verfahren zur Doppelbogenkontrolle mit optischen Sensoren A method for double sheet control with optical sensors
11/20/2008CA2687059A1 Apparatus and method for characterizing a surface structure
11/19/2008EP1993103A1 Cantilever assembly and process of manufacturing the same
11/19/2008EP1993102A1 Cantilever assembly and process of manufacturing the same
11/19/2008EP1992909A1 Circular shape measurement method, cylindrical shape measurement method, and cylindrical shape measurement apparatus
11/19/2008EP1992908A2 Method and system for determining angular position of an object
11/19/2008EP1992907A2 Method for generating pseudo-random pattern designs for optical position determination systems
11/19/2008EP1992906A1 Bragg network extensometer and measurement device comprising at least one such extensometer
11/19/2008EP1992905A1 Optical sensor with tilt error correction
11/19/2008EP1991826A1 Method, system and computer program product for locating a measuring device and for measuring large objects
11/19/2008EP1427985B1 Position measuring system and method for operating such a position measuring system
11/19/2008CN201152739Y Measuring instrument
11/19/2008CN201152738Y Improved construction of measurement instrument
11/19/2008CN101310161A Face center position detecting device, face center position detecting method, and program
11/19/2008CN101308099A Optical inspection device
11/19/2008CN101308018A Stereo vision measuring apparatus based on binocular omnidirectional visual sense sensor
11/19/2008CN101308017A Batteries plate thickness on-line measurement method utilizing baseband thickness for self-calibration
11/19/2008CN101308016A Electric products panel light transmission checking method
11/19/2008CN101308015A Light veil type laser based high precision position and posture detection method and apparatus
11/19/2008CN101308014A System and method for determining position posture adopting multi- bundle light
11/19/2008CN101308013A Position measuring device
11/19/2008CN101308012A Double monocular white light three-dimensional measuring systems calibration method
11/19/2008CN101308011A Integration scanning type optical measurement method
11/19/2008CN101307584A Track correction measurement and control method
11/19/2008CN101306505A Method and device of alignment detection and adjustment of conterminous rotation shafts
11/19/2008CN100435560C Information processing method and apparatus
11/19/2008CN100434862C Method for measuring minute angle based on self-commix interference of laser and apparatus thereof
11/19/2008CN100434861C Optical tracking transducer
11/19/2008CN100434860C Device for the optical analysis, including two-dimensional, of a thread or yarn
11/18/2008US7454275 Method of measuring the compression of a shock absorber, and an airplane undercarriage constituting an application thereof
11/18/2008US7454066 Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program
11/18/2008US7454054 Three-dimensional shape input device
11/18/2008US7453777 Method and device for optical form measurement and/or estimation
11/18/2008US7453584 Examining a structure formed on a semiconductor wafer using machine learning systems
11/18/2008US7453583 Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
11/18/2008US7453582 Position detection system
11/18/2008US7453581 Method of and apparatus for determining focus of an imaging system
11/18/2008US7453580 Three-dimensional image measuring apparatus
11/18/2008US7453578 4Pi microscope
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