Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2008
12/31/2008CN201173786Y Increment type optical-electric encoder code disc for digital method discriminating rotary direction
12/31/2008CN201173776Y Displacement measuring device suitable for rock formation moving analog simulation experiment
12/31/2008CN201173771Y Projected grating phase displacement vernier device
12/31/2008CN201173770Y Bridge deformation detection device
12/31/2008CN201173769Y Parallel light projection calliper
12/31/2008CN201173768Y Non-contact measurement device for measuring motion state red and hot metal outer diameter and size defect
12/31/2008CN201173767Y Motor vehicles bulb internal dimensional measurement jigs
12/31/2008CN201173766Y Portable hand-held laser measuring instrument
12/31/2008CN201173765Y Piston line cam lift integrated inspection device
12/31/2008CN101335226A Surface roughness recognizing and classifying method for LED chip
12/31/2008CN101334897A Three-dimensional imaging method for implementing material pile real time dynamic tracking
12/31/2008CN101334894A Video camera parameter calibration method by adopting single circle as marker
12/31/2008CN101334271A Steering angle measuring apparatus calibration tool
12/31/2008CN101334270A Laser line scanning feeler geometric transformation calibration and curved face interpolation correcting method and apparatus
12/31/2008CN101334269A Multilayered medium material multi-parameter measurement method and system
12/31/2008CN101334268A Large-sized equipment block type foundation rapid checking method
12/31/2008CN101334267A Digital image feeler vector coordinate transform calibration and error correction method and its device
12/31/2008CN101334266A Circuit board defect off-line checking method based on large-capacity image storage technology
12/31/2008CN101334265A Device for detecting probe position of probe card
12/31/2008CN101334264A Laser welding narrow butt-jointed seam measurement method and device
12/31/2008CN101334263A Circular target circular center positioning method
12/31/2008CN100447546C Telescope all-weather self-calibrating deflection/displacement measuring device and method
12/31/2008CN100447529C Method for providing sensory feedback to the operator of a portable measurement machine
12/31/2008CN100447527C Glint-resistant position determination system
12/31/2008CN100447526C Three directional measuring device
12/31/2008CN100447525C Measuring method of image measuring instrument
12/31/2008CN100447523C Measurement probe for use in coordinate measurng machines
12/31/2008CA2691658A1 System and method for measuring corneal topography
12/30/2008US7472042 Surface profile measuring method
12/30/2008US7471809 Method, apparatus, and program for processing stereo image
12/30/2008US7471400 Measurement method and device for bead cutting shape in electric resistance welded pipes
12/30/2008US7471398 Method for measuring contour variations
12/30/2008US7471396 Dual polarization interferometers for measuring opposite sides of a workpiece
12/30/2008US7471395 Light-emitting module and methods for optically aligning and assembling the same
12/30/2008US7471380 Rubbing angle-measuring equipment, and manufacturing methods of liquid crystal display device and optical film
12/30/2008US7471373 Lithographic apparatus with patterning device position determination
12/30/2008US7471372 Exposure apparatus and production method of device using the same
12/30/2008US7470896 Non-circular-orbit detection method and apparatus
12/25/2008US20080319706 Method for the Determination of the Wheel Geometry and/or Axle Geometry of Motor Vehicles
12/25/2008US20080319704 Device and Method for Determining Spatial Co-Ordinates of an Object
12/25/2008US20080316506 Visual inspection apparatus for a wafer
12/25/2008US20080316505 Determining the Position of a Semiconductor Substrate on a Rotation Device
12/25/2008US20080316504 Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
12/25/2008US20080316503 Automated Inspection Comparator/Shadowgraph System
12/25/2008US20080316502 Apparatus and method for measuring displacement, surface profile and inner radius
12/25/2008US20080316501 Shape inspection method and apparatus
12/25/2008US20080316499 Tear film measurement
12/25/2008US20080316497 Tracking type laser interferometer and method for resetting the same
12/25/2008US20080316485 Resonant Waveguide-Grating Devices and Methods for Using Same
12/25/2008US20080316471 Determining azimuth angle of incident beam to wafer
12/25/2008US20080315463 Process and Apparatus for Quality Control of a Process for Producing Concrete Articles
12/25/2008US20080313914 Vehicular crash test measuring system
12/24/2008WO2008157619A2 Total internal reflection displacement scale
12/24/2008WO2008157588A2 Systems and methods for fabricating displacement scales
12/24/2008WO2008156907A2 Acquisition of surface normal maps from spherical gradient illumination
12/24/2008WO2008156883A2 Tear film measurement
12/24/2008WO2008156329A1 System for measuring the wrinkle on web in r2r process
12/24/2008WO2008156053A1 Apparatus and method for measuring pattern pitch and apparatus and method for inspecting surface
12/24/2008WO2008156022A1 Object measuring method and device
12/24/2008WO2008155269A2 Measuring arrangement and method for the optical measuring of separating tools
12/24/2008WO2008133650A3 Method and system for providing a high definition triangulation system
12/24/2008EP2006623A2 Sensor system for a refrigerator dispenser
12/24/2008EP2005109A2 Surface measurement instrument
12/24/2008EP1782379A4 Monitoring system communication system and method
12/24/2008EP1603620B1 Determining the geometry and dimensions of a three-dimensional object
12/24/2008EP1112550A4 An automated wafer defect inspection system and a process of performing such inspection
12/24/2008DE202008013568U1 Einrichtung zur unmittelbaren Messung bei schichtweiser Bearbeitung von Körpern mittels Laserstrahlung wenigstens eines Lasers A direct measurement stratified treatment of bodies by means of laser radiation at least one laser
12/24/2008DE112006003165T5 Arbeitsvorrichtung und Arbeitsverfahren für Schaltungsplatinen Working apparatus and the procedures for circuit boards
12/24/2008DE102008028532A1 Flat printing substrate's i.e. paper sheet, rear edge detecting device for e.g. paper sheet processing rotary printing press, has detector formed as laminar detector arranged outside substrate level and perpendicularly above or below edge
12/24/2008DE102008026479A1 Locator for optical navigation system for determining position and orientation of body in area, comprises multiple passive or active reflector elements, where switching function is realized through control and evaluation mechanism
12/24/2008DE102008019604A1 Object's i.e. vehicle, spatial position and orientation estimating method for driver assistance system, involves determining error margin based on polar coordinates, and adjusting spatial position and orientation of object based on margin
12/24/2008DE102007028943A1 Abtasteinheit für eine optische Positionsmesseinrichtung Scanning unit for an optical position measuring device
12/24/2008DE102007028174A1 Messanordnung und Verfahren zum optischen Vermessen von Trennwerkzeugen Measuring system and method for optical measurement of cutting tools
12/24/2008CN201170897Y Touch control screen system capable of automatically detecting dimension and module thereof
12/24/2008CN201170773Y System for detecting building cranny
12/24/2008CN201170723Y Vehicle hub detection apparatus base on CCD image technology
12/24/2008CN201170722Y 物件检测机 Object detection machines
12/24/2008CN101331381A Three-dimensional shape data aligning method and device
12/24/2008CN101331380A Three-dimensional shape data storing/displaying method and device, and three-dimensional shape gauging method and device
12/24/2008CN101331378A Selecting unit cell configuration for repeating structures in optical metrology
12/24/2008CN101331377A Sorting tablets by measuring diameter
12/24/2008CN101331376A Apparatus for and a method of determining surface characteristics
12/24/2008CN101329204A Method and apparatus for measuring thin film non-uniform stress on line
12/24/2008CN101329174A Full field vision self-scanning measurement apparatus
12/24/2008CN101329170A Method for dynamically measuring guide rail linearity
12/24/2008CN101329169A Neural network modeling approach of electron-beam welding consolidation zone shape factor
12/24/2008CN101329168A Twin array Michelson optical fiber white light interference strain gage
12/24/2008CN101329167A Dynamic measurement method of slide bearing lubricating film and fiber optic sensor for measurement
12/24/2008CN101329166A Device and method for detecting bulk automatic lading
12/24/2008CN101329165A Space positioning method based on double-rotating laser plane transmitter network
12/24/2008CN101329164A Global calibration for stereo vision probe
12/24/2008CN101329163A Three-dimensional surface model building system based on binocular
12/24/2008CN101329153A Apparatus and method for measuring waviness of sheet materials
12/24/2008CN101328803A Controlling a dynamic signal range in an optical time domain reflectometry
12/24/2008CN100445691C Method and system for simultaneously imaging multiple views of a plant embryo
12/23/2008US7469192 Parallel profile determination for an optical metrology system
12/23/2008US7468800 Method and apparatus for determining surface properties
12/23/2008US7468799 Scanning interferometry for thin film thickness and surface measurements
12/23/2008US7468798 System and method for polarization characteristic measurement of optical systems via centroid analysis
12/23/2008US7468795 Method of selecting a grid model for correcting a process recipe for grid deformations in a lithographic apparatus and lithographic assembly using the same