Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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12/31/2008 | CN201173786Y Increment type optical-electric encoder code disc for digital method discriminating rotary direction |
12/31/2008 | CN201173776Y Displacement measuring device suitable for rock formation moving analog simulation experiment |
12/31/2008 | CN201173771Y Projected grating phase displacement vernier device |
12/31/2008 | CN201173770Y Bridge deformation detection device |
12/31/2008 | CN201173769Y Parallel light projection calliper |
12/31/2008 | CN201173768Y Non-contact measurement device for measuring motion state red and hot metal outer diameter and size defect |
12/31/2008 | CN201173767Y Motor vehicles bulb internal dimensional measurement jigs |
12/31/2008 | CN201173766Y Portable hand-held laser measuring instrument |
12/31/2008 | CN201173765Y Piston line cam lift integrated inspection device |
12/31/2008 | CN101335226A Surface roughness recognizing and classifying method for LED chip |
12/31/2008 | CN101334897A Three-dimensional imaging method for implementing material pile real time dynamic tracking |
12/31/2008 | CN101334894A Video camera parameter calibration method by adopting single circle as marker |
12/31/2008 | CN101334271A Steering angle measuring apparatus calibration tool |
12/31/2008 | CN101334270A Laser line scanning feeler geometric transformation calibration and curved face interpolation correcting method and apparatus |
12/31/2008 | CN101334269A Multilayered medium material multi-parameter measurement method and system |
12/31/2008 | CN101334268A Large-sized equipment block type foundation rapid checking method |
12/31/2008 | CN101334267A Digital image feeler vector coordinate transform calibration and error correction method and its device |
12/31/2008 | CN101334266A Circuit board defect off-line checking method based on large-capacity image storage technology |
12/31/2008 | CN101334265A Device for detecting probe position of probe card |
12/31/2008 | CN101334264A Laser welding narrow butt-jointed seam measurement method and device |
12/31/2008 | CN101334263A Circular target circular center positioning method |
12/31/2008 | CN100447546C Telescope all-weather self-calibrating deflection/displacement measuring device and method |
12/31/2008 | CN100447529C Method for providing sensory feedback to the operator of a portable measurement machine |
12/31/2008 | CN100447527C Glint-resistant position determination system |
12/31/2008 | CN100447526C Three directional measuring device |
12/31/2008 | CN100447525C Measuring method of image measuring instrument |
12/31/2008 | CN100447523C Measurement probe for use in coordinate measurng machines |
12/31/2008 | CA2691658A1 System and method for measuring corneal topography |
12/30/2008 | US7472042 Surface profile measuring method |
12/30/2008 | US7471809 Method, apparatus, and program for processing stereo image |
12/30/2008 | US7471400 Measurement method and device for bead cutting shape in electric resistance welded pipes |
12/30/2008 | US7471398 Method for measuring contour variations |
12/30/2008 | US7471396 Dual polarization interferometers for measuring opposite sides of a workpiece |
12/30/2008 | US7471395 Light-emitting module and methods for optically aligning and assembling the same |
12/30/2008 | US7471380 Rubbing angle-measuring equipment, and manufacturing methods of liquid crystal display device and optical film |
12/30/2008 | US7471373 Lithographic apparatus with patterning device position determination |
12/30/2008 | US7471372 Exposure apparatus and production method of device using the same |
12/30/2008 | US7470896 Non-circular-orbit detection method and apparatus |
12/25/2008 | US20080319706 Method for the Determination of the Wheel Geometry and/or Axle Geometry of Motor Vehicles |
12/25/2008 | US20080319704 Device and Method for Determining Spatial Co-Ordinates of an Object |
12/25/2008 | US20080316506 Visual inspection apparatus for a wafer |
12/25/2008 | US20080316505 Determining the Position of a Semiconductor Substrate on a Rotation Device |
12/25/2008 | US20080316504 Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system |
12/25/2008 | US20080316503 Automated Inspection Comparator/Shadowgraph System |
12/25/2008 | US20080316502 Apparatus and method for measuring displacement, surface profile and inner radius |
12/25/2008 | US20080316501 Shape inspection method and apparatus |
12/25/2008 | US20080316499 Tear film measurement |
12/25/2008 | US20080316497 Tracking type laser interferometer and method for resetting the same |
12/25/2008 | US20080316485 Resonant Waveguide-Grating Devices and Methods for Using Same |
12/25/2008 | US20080316471 Determining azimuth angle of incident beam to wafer |
12/25/2008 | US20080315463 Process and Apparatus for Quality Control of a Process for Producing Concrete Articles |
12/25/2008 | US20080313914 Vehicular crash test measuring system |
12/24/2008 | WO2008157619A2 Total internal reflection displacement scale |
12/24/2008 | WO2008157588A2 Systems and methods for fabricating displacement scales |
12/24/2008 | WO2008156907A2 Acquisition of surface normal maps from spherical gradient illumination |
12/24/2008 | WO2008156883A2 Tear film measurement |
12/24/2008 | WO2008156329A1 System for measuring the wrinkle on web in r2r process |
12/24/2008 | WO2008156053A1 Apparatus and method for measuring pattern pitch and apparatus and method for inspecting surface |
12/24/2008 | WO2008156022A1 Object measuring method and device |
12/24/2008 | WO2008155269A2 Measuring arrangement and method for the optical measuring of separating tools |
12/24/2008 | WO2008133650A3 Method and system for providing a high definition triangulation system |
12/24/2008 | EP2006623A2 Sensor system for a refrigerator dispenser |
12/24/2008 | EP2005109A2 Surface measurement instrument |
12/24/2008 | EP1782379A4 Monitoring system communication system and method |
12/24/2008 | EP1603620B1 Determining the geometry and dimensions of a three-dimensional object |
12/24/2008 | EP1112550A4 An automated wafer defect inspection system and a process of performing such inspection |
12/24/2008 | DE202008013568U1 Einrichtung zur unmittelbaren Messung bei schichtweiser Bearbeitung von Körpern mittels Laserstrahlung wenigstens eines Lasers A direct measurement stratified treatment of bodies by means of laser radiation at least one laser |
12/24/2008 | DE112006003165T5 Arbeitsvorrichtung und Arbeitsverfahren für Schaltungsplatinen Working apparatus and the procedures for circuit boards |
12/24/2008 | DE102008028532A1 Flat printing substrate's i.e. paper sheet, rear edge detecting device for e.g. paper sheet processing rotary printing press, has detector formed as laminar detector arranged outside substrate level and perpendicularly above or below edge |
12/24/2008 | DE102008026479A1 Locator for optical navigation system for determining position and orientation of body in area, comprises multiple passive or active reflector elements, where switching function is realized through control and evaluation mechanism |
12/24/2008 | DE102008019604A1 Object's i.e. vehicle, spatial position and orientation estimating method for driver assistance system, involves determining error margin based on polar coordinates, and adjusting spatial position and orientation of object based on margin |
12/24/2008 | DE102007028943A1 Abtasteinheit für eine optische Positionsmesseinrichtung Scanning unit for an optical position measuring device |
12/24/2008 | DE102007028174A1 Messanordnung und Verfahren zum optischen Vermessen von Trennwerkzeugen Measuring system and method for optical measurement of cutting tools |
12/24/2008 | CN201170897Y Touch control screen system capable of automatically detecting dimension and module thereof |
12/24/2008 | CN201170773Y System for detecting building cranny |
12/24/2008 | CN201170723Y Vehicle hub detection apparatus base on CCD image technology |
12/24/2008 | CN201170722Y 物件检测机 Object detection machines |
12/24/2008 | CN101331381A Three-dimensional shape data aligning method and device |
12/24/2008 | CN101331380A Three-dimensional shape data storing/displaying method and device, and three-dimensional shape gauging method and device |
12/24/2008 | CN101331378A Selecting unit cell configuration for repeating structures in optical metrology |
12/24/2008 | CN101331377A Sorting tablets by measuring diameter |
12/24/2008 | CN101331376A Apparatus for and a method of determining surface characteristics |
12/24/2008 | CN101329204A Method and apparatus for measuring thin film non-uniform stress on line |
12/24/2008 | CN101329174A Full field vision self-scanning measurement apparatus |
12/24/2008 | CN101329170A Method for dynamically measuring guide rail linearity |
12/24/2008 | CN101329169A Neural network modeling approach of electron-beam welding consolidation zone shape factor |
12/24/2008 | CN101329168A Twin array Michelson optical fiber white light interference strain gage |
12/24/2008 | CN101329167A Dynamic measurement method of slide bearing lubricating film and fiber optic sensor for measurement |
12/24/2008 | CN101329166A Device and method for detecting bulk automatic lading |
12/24/2008 | CN101329165A Space positioning method based on double-rotating laser plane transmitter network |
12/24/2008 | CN101329164A Global calibration for stereo vision probe |
12/24/2008 | CN101329163A Three-dimensional surface model building system based on binocular |
12/24/2008 | CN101329153A Apparatus and method for measuring waviness of sheet materials |
12/24/2008 | CN101328803A Controlling a dynamic signal range in an optical time domain reflectometry |
12/24/2008 | CN100445691C Method and system for simultaneously imaging multiple views of a plant embryo |
12/23/2008 | US7469192 Parallel profile determination for an optical metrology system |
12/23/2008 | US7468800 Method and apparatus for determining surface properties |
12/23/2008 | US7468799 Scanning interferometry for thin film thickness and surface measurements |
12/23/2008 | US7468798 System and method for polarization characteristic measurement of optical systems via centroid analysis |
12/23/2008 | US7468795 Method of selecting a grid model for correcting a process recipe for grid deformations in a lithographic apparatus and lithographic assembly using the same |