Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
01/2009
01/07/2009EP2011449A1 Measuring device and method for 3D measuring of tooth models
01/07/2009EP2010892A1 Optical differentiation method for at least two materials
01/07/2009EP2010865A1 Measuring the profile of pipe ends
01/07/2009EP2010863A1 Optical scanning probe
01/07/2009EP2010862A1 Microscope and microscope microexamination procedure method for the measurement of the surface profile of an object
01/07/2009EP1392153B1 Method and apparatus for obtaining geometrical data relating to a canal
01/07/2009CN201177861Y Intelligent eye-sight protector
01/07/2009CN201177599Y Ellipsometric imaging device adopting rotating compensator for integration and sampling
01/07/2009CN201177500Y Multi- light axis consistency test device based on multi- light spectrum target plate and rotating reflector
01/07/2009CN201177499Y Obliquity measuring apparatus
01/07/2009CN101340954A Game controller
01/07/2009CN101340811A Image optimized matching system and method
01/07/2009CN101339913A Method for detecting position of defect on semiconductor wafer
01/07/2009CN101339141A Wheel cable mobile structure video frequency monitoring system for damage
01/07/2009CN101339118A Grain parameter automatic measuring equipment and method
01/07/2009CN101339013A Resetting and calibration of detector for visible and infrared composite light path light axis parallelism
01/07/2009CN101339012A Rolling angle measurement method and device based on grating
01/07/2009CN101339011A High precision angle-measuring method
01/07/2009CN101339010A Cylinder screw thread measurement method and system
01/07/2009CN101339009A Gear cylinder or ball measurement method and system
01/07/2009CN101339008A Device for checking heavy caliber paraboloidal mirror K value coefficient
01/07/2009CN101339007A Phase unwrapping method based on tabu search strategy
01/07/2009CN101339006A Topological type Ronchi grating groove depth optical checking method
01/07/2009CN101339005A Kiln lining thickness measuring system and method
01/07/2009CN101339004A Centroid offset checking method for Hartman wavefront detector based on DFT
01/07/2009CN101339003A Great structure horizontal two-dimensional displacement automatic measuring equipment and method
01/07/2009CN101339002A Large angle Michelson type shearing speckle interferometer
01/07/2009CN101338868A Device for linear illumination of a moving goods belt
01/07/2009CN100449411C Recording material discrimination device, image forming apparatus and method therefor
01/07/2009CN100449359C Method and apparatus for measuring angle of metal wire of liquid crystal display panel
01/07/2009CN100449348C Pattern forming member applied to sectioning image observing device and sectioning image observing device using it
01/07/2009CN100449301C Method and apparatus for non-destructive testing of fruit internal quality based on optical properties
01/07/2009CN100449262C Flatness measuring device
01/07/2009CN100449261C Replaceable embedding type optical fiber strain sensor
01/07/2009CN100449260C Method for precision measuring space offset of telephotolens and eyepiece using interferometer
01/07/2009CN100449259C On-line detection method and device for vehicle wheel set diameter
01/07/2009CN100449258C Real time three-dimensional vision system based on two-dimension colorama encoding
01/07/2009CN100449257C A method for determining material interfacial and metrology information of a sample using atomic force microscopy
01/07/2009CN100449255C Interferometer comprising a mirror assembly for measuring an object to be measured
01/07/2009CN100448655C Joint overlapping common difference in the weaving shade fabric inlay automatic control and surveillance system
01/06/2009US7474993 Selection of wavelengths for integrated circuit optical metrology
01/06/2009US7474804 Method for automatically correcting skew image
01/06/2009US7474765 Image recognition apparatus
01/06/2009US7474420 In-die optical metrology
01/06/2009US7474419 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
01/06/2009US7474418 Position measurement system
01/06/2009US7474417 Method for estimating at least one component placement position on a substrate as well as a device for carrying out such a method
01/06/2009US7474416 System and method for measuring an object and monitoring the surface of an object
01/06/2009US7474415 Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
01/06/2009US7474414 System and method of guiding real-time inspection using 3D scanners
01/06/2009US7474410 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
01/06/2009US7474409 Lithographic interferometer system with an absolute measurement subsystem and differential measurement subsystem and method thereof
01/06/2009US7474401 Multi-layer alignment and overlay target and measurement method
01/06/2009US7474394 Apparatus of inspecting defect in semiconductor and method of the same
01/06/2009US7474386 Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method
01/06/2009US7473920 Measuring device and method for verifying the cut quality of a sheet using image scanning
01/02/2009DE19814057B4 Anordnung zur optischen Kohärenztomographie und Kohärenztopographie Arrangement for optical coherence tomography and coherence topography
01/02/2009DE10315592B4 Verfahren zum Ausführen von Interaktionen an sich räumlich und zeitlich verändernden mikroskopischen Objekten und System hierzu A method of performing interactions varying in space and time itself microscopic objects and accompanying systems
01/02/2009DE102007030390A1 Koordinaten-Messmaschine und Verfahren zur Kalibrierung der Koordinaten-Messmaschine Coordinate measuring machine and method for calibrating the coordinate measuring machine
01/02/2009DE102007029407A1 Child seat and adult occupant distinguishing device for motor vehicle, has receiver to determine spaces lying inside provided space regions and between reflection points, and evaluation unit to distinguish between occupant and child seat
01/02/2009DE102007029299A1 Optischer Sensor für Positionieraufgaben Optical sensor for positioning
01/02/2009DE102007029135A1 Method for detecting position of unidirectional ray of light striking upon display unit, involves forming front side of display unit by transparent photodiode matrix, where photodiode is made from organic material
01/02/2009DE102007028735A1 Method for form and texture collection of object by which three dimensional sensor and digital camera are used for recording of digital photos, involves surrounding object by housing which encloses object with multiple complete solid angle
01/02/2009DE102007018951B3 Modulares Messkopfsystem Modular measuring head system
01/02/2009DE102006050850B4 Verfahren und Vorrichtung zur Wegmessung Method and apparatus for distance measurement
01/02/2009DE102004046860B4 Sensoranordnung und Verfahren zum Anordnen eines Sensors in einem Fahrzeug Sensor assembly and method for placing a sensor in a vehicle
01/01/2009US20090006969 Video microscopy system and multi-view virtual slide viewer capable of simultaneously acquiring and displaying various digital views of an area of interest located on a microscopic slide
01/01/2009US20090006031 Combination laser and photogrammetry target
01/01/2009US20090004580 Detection device, movable body apparatus, pattern formation apparatus and pattern formation method, exposure apparatus and exposure method, and device manufacturing method
01/01/2009US20090003789 Imaging system and related techniques
01/01/2009US20090003765 Imaging system and related techniques
01/01/2009US20090002723 Stage apparatus and vision measuring apparatus
01/01/2009US20090002722 Structure inspection method, pattern formation method, process condition determination method and resist pattern evaluation apparatus
01/01/2009US20090002721 Wafer and stage alignment using photonic devices
01/01/2009US20090002720 Device for measuring positions of structures on a substrate
01/01/2009US20090002719 System and method for scanning and measuring points of an object
01/01/2009US20090002718 Optical Measurement Device
01/01/2009US20090002715 Coordinate measuring machine with vibration decoupling and method for vibration decoupling of a coordinate measuring machine
01/01/2009US20090002694 Optical Inspection of Surfaces Open to Different Directions in a Piece of Material
01/01/2009US20090002690 Inclination detection methods and apparatus
01/01/2009US20090002631 System and method for measuring corneal topography
12/2008
12/31/2008WO2009003172A2 System and method for measuring corneal topography
12/31/2008WO2009002172A1 Measuring system
12/31/2008WO2009001746A1 Position detecting device for actuator
12/31/2008WO2009000341A1 Method and arrangement for optically testing tunnel-type cavities, which are open on one side, in workpieces, in particular cooling ducts in brake disks
12/31/2008WO2009000231A1 Method and arrangement for detecting a surface of an object
12/31/2008WO2008122814A3 Displacement detection kit with intensity and position sensors receiving optical beams op different wavelengths and polarisation orientations
12/31/2008WO2007098119A3 Plasmon tomography
12/31/2008EP2009419A1 Measuring the thickness of organic samples
12/31/2008EP2009390A1 Measuring system
12/31/2008EP2009389A1 Tread depth sensing device and tread depth measuring method
12/31/2008EP2008627A2 Apparatus and method for making and inspecting pre-fastened articles
12/31/2008EP2008120A2 Camera based six degree-of-freedom target measuring and target tracking device
12/31/2008EP2008067A1 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid
12/31/2008EP2008058A2 Geometric measurement system and method of measuring a geometric characteristic of an object
12/31/2008EP1848961B1 Method for calibrating a measuring system
12/31/2008EP1756513B1 A method and a system for height triangulation measurement
12/31/2008EP1449032B1 Imaging apparatus
12/31/2008CN201173895Y Device for double light beam on-line real time measurement for optical film stress
12/31/2008CN201173847Y Wireless remote control type deflection measuring systems for bridge loading experiment