Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
04/2007
04/12/2007US20070082424 Fabricating method of a thin film transistor array
04/12/2007US20070082416 Semiconductor device
04/12/2007US20070082144 Method for forming thin film pattern, thin film manufacturing device, conductive thin film wiring, electro-optic device, electronic apparatus, and non-contact card medium
04/12/2007US20070080918 Display device
04/12/2007US20070080452 Bump structure and its forming method
04/12/2007US20070080450 Wafer level laser marking system for ultra-thin wafers using support tape
04/12/2007US20070080440 Soi device with different crystallographic orientations
04/12/2007US20070080426 Single lithography-step planar metal-insulator-metal capacitor and resistor
04/12/2007US20070080425 Method for simultaneous fabrication of a nanocrystal and non-nanocrystal device
04/12/2007US20070080424 Well for CMOS imager and method of formation
04/12/2007US20070080421 Memory device having highly integrated cell structure and method of its fabrication
04/12/2007US20070080418 Wafer-level chip-scale package of image sensor and method of manufacturing the same
04/12/2007US20070080412 Electric acoustic converter and electronic device using the same
04/12/2007US20070080411 Semiconductive film with dopant diffusion barrier and tunable work function
04/12/2007US20070080410 Method of forming transistor having recess channel in semiconductor memory, and structure thereof
04/12/2007US20070080409 Mixed-signal semiconductor platform incorporating fully-depleted castellated-gate MOSFET device and method of manufacture thereof
04/12/2007US20070080408 Method for forming a silicidated contact
04/12/2007US20070080407 Insulated gate bipolar transistor
04/12/2007US20070080406 CMOS device with zero soft error rate
04/12/2007US20070080405 Semiconductor device and method for fabricating the same
04/12/2007US20070080401 Structure and method for forming asymmetrical overlap capacitance in field effect transistors
04/12/2007US20070080400 Low Noise Vertical Variable Gate Control Voltage JFET Device in a BiCMOS Process and Methods to Build this Device
04/12/2007US20070080399 Semiconductor device and production method therefor
04/12/2007US20070080398 Fabricating method of a high voltage metal oxide semiconductor device
04/12/2007US20070080397 Semiconductor device including field effect transistor having asymmetric structure and method of manufacturing the same
04/12/2007US20070080396 Metal oxide semiconductor device and fabricating method thereof
04/12/2007US20070080395 Lateral SOI component having a reduced on resistance
04/12/2007US20070080394 Nonvolatile memory
04/12/2007US20070080393 Semiconductor device having n-channel type MOS transistor with gate electrode layer featuring small average polycrystalline silicon grain size
04/12/2007US20070080392 Semiconductor device and method of fabricating the same
04/12/2007US20070080391 Semiconductor device with front side metallization and method for the production thereof
04/12/2007US20070080390 Memory transistor and memory unit with asymmetrical pocket doping region
04/12/2007US20070080389 Dynamic control of capacitance elements in field effect structures
04/12/2007US20070080388 Capacitor assembly
04/12/2007US20070080386 Dual damascene structure
04/12/2007US20070080385 Semiconductor device having vertical transistor and method of fabricating the same
04/12/2007US20070080384 Phase change memory devices using magnetic resistance effect, methods of operating and methods of fabricating the same
04/12/2007US20070080383 Semiconductor device
04/12/2007US20070080382 Semiconductor device
04/12/2007US20070080381 Robust protective layer for MTJ devices
04/12/2007US20070080380 Self-aligned gate isolation
04/12/2007US20070080379 Insulated gate field effect transistor
04/12/2007US20070080378 Ultraviolet Blocking Layer
04/12/2007US20070080376 Solid-state image pickup device, driving method for solid-state image pickup device and image pickup apparatus
04/12/2007US20070080374 Semiconductor device
04/12/2007US20070080372 Composite structure with high heat dissipation
04/12/2007US20070080371 Display device
04/12/2007US20070080370 Display device
04/12/2007US20070080367 Nitride semiconductor and method for manufacturing thereof
04/12/2007US20070080366 Nitride semiconductor substrate, and method for working nitride semiconductor substrate
04/12/2007US20070080364 White light emitting device capable of adjusting color temperature
04/12/2007US20070080356 Display device and method for manufacturing display device
04/12/2007US20070080351 Display device
04/12/2007US20070080350 Panel for flexible display device and manufacturing method thereof
04/12/2007US20070080349 Substrate for display device and liquid crystal display device having the same
04/12/2007US20070080348 Active device array substrate
04/12/2007US20070080346 Organic thin film transistor array panel
04/12/2007US20070080345 Volatile negative differential resistance device using metal nanoparticles
04/12/2007US20070080344 Thin film diode panel for trans-reflective liquid crystal display
04/12/2007US20070080343 New materials for electroluminescence and the utilization thereof
04/12/2007US20070080340 Variable Capacitor Single-Electron Device
04/12/2007US20070080339 Universal gates for ising TQFT via time-tilted interferometry
04/12/2007US20070080338 Infra-red light-emitting device
04/12/2007US20070080337 Radiation emitting component
04/12/2007US20070080335 Gettering using voids formed by surface transformation
04/12/2007DE4042699B4 MOS device, esp. power vertical-MOSFET - with high switch=off capacitance and no signal conductor effects
04/12/2007DE19527131B4 Halbleitervorrichtung mit einer T-förmigen Gatestruktur und Verfahren zu deren Herstellung A semiconductor device comprising a T-shaped gate structure and process for their preparation
04/12/2007DE10303335B4 Halbleiterbauteil Semiconductor device
04/12/2007DE10260185B4 Halbleiterspeicher mit vertikalen Charge-trapping-Speicherzellen und Verfahren zu seiner Herstellung A semiconductor memory with vertical charge-trapping memory cells and methods for its preparation
04/12/2007DE102006004627B3 Leistungshalbleiterbauelement mit Ladungskompensationsstruktur und Verfahren zur Herstellung desselben Power semiconductor component thereof having charge compensation structure and method for producing
04/12/2007DE102005048000A1 Transistor mit zuverlässiger Source-Dotierung und Verfahren zur Herstellung Transistor with reliable source doping and methods for preparing
04/12/2007DE102005047169A1 Lateral DMOS transistor has trench drain zone where load current is guided in drift zone both vertically through buried layer and laterally through conductive filler structure
04/12/2007DE102005047058A1 Herstellungsverfahren für einen Graben-Transistor und entsprechender Graben-Transistor Manufacturing method of a trench transistor and trench transistor corresponding
04/12/2007DE102005047054A1 Power-metal oxide semiconductor transistor e.g. power-insulated gate bipolar transistor, for integrated circuit, has inversion channel characterized as channel region, formed in section of body region and arranged in one semiconductor layer
04/12/2007DE102005047000A1 Halbleiterstruktur zur Ableitung eines Überspannungsimpulses und Verfahren zur Herstellung desselben A semiconductor structure for deriving an overvoltage pulse and method of manufacturing the same
04/12/2007DE102005046706A1 JBS-SiC-Halbleiterbauelement JBS-SiC semiconductor device
04/12/2007DE102005046007A1 Lateral compensation semiconductor component for use as high voltage transistor, has coupling layers for connection of compensation cells with each other, where layers are of p-type conduction and are in connection with source region
04/12/2007DE102004024112B4 Schaltung zur Messung des Stromes durch einen Leistungs-MOSFET Circuit for measuring the current through a power MOSFET
04/12/2007DE10127950B4 Verfahren zur Herstellung eines Halbleiterbauelements und Halbleiterbauelement A process for producing a semiconductor device and semiconductor device
04/12/2007DE10127945B4 Matrix-Substrat für Flüssigkristallanzeige und Verfahren zum Herstellen eines Matrix-Substrats für eine Flüssigkristallanzeige Matrix substrate for liquid crystal display and method of manufacturing a matrix substrate for a liquid crystal display
04/11/2007EP1772906A1 High-voltage field-effect transistor and method of making a high-voltage field-effect transistor
04/11/2007EP1772905A1 Process for fabrication of a planar heterostructure
04/11/2007EP1771888A2 Nanoscale fet
04/11/2007EP1771887A1 Bipolar transistor and method of manufacturing the same
04/11/2007EP1771886A1 Insulated gate field effect transistors
04/11/2007EP1771885A1 Semiconductor device and method of manufacturing the same
04/11/2007EP1771884A1 Semiconductor device and method of manufacturing the same
04/11/2007EP1771876A1 Methods of fabricating nitride-based transistors with a cap layer and a recessed gate
04/11/2007EP1644988A4 High-density finfet integration scheme
04/11/2007EP1518277B1 Method for the production of an nrom memory cell field
04/11/2007EP1480304B1 Quantum nano-composite semiconductor laser and quantum nano-composite array
04/11/2007EP1292648B1 Heterostructure with rear-face donor doping
04/11/2007EP1247299B1 Encapsulated tungsten gate mos transistor and memory cell and method of making same
04/11/2007EP1173896B1 Electrostatically controlled tunneling transistor
04/11/2007CN2888651Y Structure of high-overload resisting SOI pressure sensitive chip
04/11/2007CN1947264A III-nitride bidirectional switch
04/11/2007CN1947263A Gate layer diode method and apparatus
04/11/2007CN1947262A LDMOS transistor and manufacture method thereof
04/11/2007CN1947261A Trench semiconductor device and method of manufacturing it
04/11/2007CN1947260A Isolation trench