H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/1988
10/25/1988	US4780590 Laser furnace and method for zone refining of semiconductor wafers
10/25/1988	US4780431 Process for making structures including E2PROM nonvolatile memory cells with self-aligned layers of silicon and associated transistors
10/25/1988	US4780430 Forming three epitaxial growth layers, doping
10/25/1988	US4780429 Doping, etching, insulated gates
10/25/1988	US4780428 Forming and removing silicon dioxide, silicon nitaide and oxygen-doped silicon films; gate insulation
10/25/1988	US4780427 Doping, etching, diffusing
10/25/1988	US4780426 Method for manufacturing high-breakdown voltage semiconductor device
10/25/1988	US4780425 Method of making a bipolar transistor with double diffused isolation regions
10/25/1988	US4780424 Nitriding, oxidation, doping, etching
10/25/1988	US4780382 Process for making a transmission mask
10/25/1988	US4780169 Non-uniform gas inlet for dry etching apparatus
10/25/1988	US4779986 Reduction projection system alignment method and apparatus
10/25/1988	US4779981 Reject chip marking device and method of discriminating reject mark
10/25/1988	US4779946 Microminiature optical assembly
10/25/1988	US4779877 Wafer support assembly
10/25/1988	US4779835 Mold for transfer molding
10/25/1988	US4779732 Container for a plurality of disk-shaped articles and container part thereof
10/25/1988	US4779724 Support structure for annular magnetic recording disks
10/25/1988	US4779565 Apparatus for through hole substrate printing
10/25/1988	US4779561 Crucible for multi-bath liquid phase epitaxy
10/25/1988	US4779338 Method of mounting LSI
10/25/1988	CA1243782A1 Method and apparatus for low-energy scanning electron beam lithography
10/20/1988	WO1988008206A1 Heterojunction bipolar transistor
10/20/1988	WO1988008203A1 Packaging system for stacking integrated circuits
10/20/1988	WO1988008137A1 Determination of ions in fluids
10/20/1988	WO1988008044A1 Double buffer vacuum system
10/20/1988	WO1988007983A1 Ceramic base and process for its production
10/20/1988	WO1988006804A3 Low leakage cmos/insulator substrate devices and method of forming the same
10/20/1988	EP0276257A4 Method of epitaxially growing compound semiconductor materials.
10/20/1988	DE3716471A1 Patterned semiconductor body
10/19/1988	EP0287385A2 Method of fabricating a field-effect transistor
10/19/1988	EP0287384A2 Dial deposition and processing apparatus
10/19/1988	EP0287338A2 Security fuse circuit for programmable logic array
10/19/1988	EP0287318A2 Integrated transistor and manufacturing process therefor
10/19/1988	EP0287147A2 Monolithic integrated power circuit in semibridge configuration, particularly for piloting electric motors
10/19/1988	EP0287118A2 Molecular-beam epitaxy apparatus
10/19/1988	EP0287111A2 Method for manufacturing an electronic part
10/19/1988	EP0287096A1 Method of forming holes in semiconductor integrated circuit device
10/19/1988	EP0287056A2 Dynamic random access memory device having a plurality of one transistor type memory cells
10/19/1988	EP0287031A2 High breakdown voltage insulating film provided between polysilicon layers
10/19/1988	EP0286879A1 Integrated-circuit arrangement for controlling an integrated oscillator
10/19/1988	EP0286855A1 Process for etching moats in a silicon substrate
10/19/1988	EP0286854A1 Method for making a multilayer thin-film circuit
10/19/1988	EP0286829A2 Electronic device comprising a polyimide layer, and method for its production
10/19/1988	EP0286708A1 Method of producing contact holes in a double insulation layer
10/19/1988	EP0286690A1 Aluminum nitride and semiconductor substrate formed therefrom
10/19/1988	EP0286660A1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer.
10/19/1988	EP0181355B1 Monolithic integrated planar semi-conductor device
10/19/1988	EP0084558B1 Monolithically merged field effect transistor and bipolar junction transistor
10/19/1988	CN88102047A Electric circuit having superconducting multilayered structure and manufacturing method for same
10/19/1988	CN88101860A Method for manufacturing semiconductor components
10/19/1988	CN88101753A Orthogonal axis device with linear motors for positioning and processing workpieces, in particular for bonding wires onto electronic components
10/18/1988	US4779231 Gate array arrangement in complementary metal-oxide-semiconductor technology
10/18/1988	US4779227 Semiconductor memory device
10/18/1988	US4779161 Multi-driver integrated circuit
10/18/1988	US4779127 Three-dimensional integrated circuit
10/18/1988	US4779123 Insulated gate transistor array
10/18/1988	US4779046 Electron beam integrated circuit tester
10/18/1988	US4779004 Infrared imager
10/18/1988	US4779001 Interferometric mask-wafer alignment
10/18/1988	US4778776 Removal of silicon dioxide from surface; preventing oxidation during deposition of polycrystalline layer
10/18/1988	US4778775 Integrated circuit formed in recrystallized silicon layer over dielectric
10/18/1988	US4778774 In semiconductor substrate; high speed
10/18/1988	US4778773 Semiconductors; gate electrode as mask for photoresist layer being exposed through transparent substrate
10/18/1988	US4778772 Method of manufacturing a bipolar transistor
10/18/1988	US4778771 Preliminary testing and selection for completion
10/18/1988	US4778739 Reworking developed layer, release agent of polyethersulfone powder in n-methylpyrrolidone with absorptive dye
10/18/1988	US4778727 Adhesion promoter
10/18/1988	US4778720 Product of diamine and diimine schiff base; semiconductors
10/18/1988	US4778692 Irradiation decomposition
10/18/1988	US4778583 Semiconductor etching process which produces oriented sloped walls
10/18/1988	US4778580 Lattice disorder formation by cathode sputtering in inert gas plasma
10/18/1988	US4778564 Process for producing an assembly tape for bonding metal fingers to electronic devices
10/18/1988	US4778563 Gas mixture of silicon tetrachloride and hydrogen chloride
10/18/1988	US4778561 Electron cyclotron resonance plasma source
10/18/1988	US4778560 Method for production of thin film transistor array substrates
10/18/1988	US4778559 Using a heat exchanging metal(s) melt
10/18/1988	US4778552 Alarm tag and method of making and deactivating it
10/18/1988	US4778536 Mixture with water and sulfuric acid; cleaning semiconductors
10/18/1988	US4778532 Continuous process of cleaning semiconductors with fluid, removal by rinsing, then drying; automatic, safe
10/18/1988	US4778382 Apparatus for automatic baking treatment of semiconductor wafers
10/18/1988	US4778332 Wafer flip apparatus
10/18/1988	US4778331 Carrier system for silicon wafer
10/18/1988	US4778326 Method and means for handling semiconductor and similar electronic devices
10/18/1988	US4778275 Method of aligning a mask and a substrate relative to each other and arrangement for carrying out the method
10/18/1988	US4778233 Steering mirror
10/18/1988	US4778146 Leadframe for flash-free insert molding and method therefor
10/18/1988	US4777970 Vapor drying apparatus
10/18/1988	US4777804 Method and apparatus for easing surface particle removal by size increase
10/18/1988	US4777732 Wafer centrifugal drying apparatus
10/18/1988	CA1243447A1 Photopolymer process and composition employing a photooxidizable component capable of forming endoperoxides
10/18/1988	CA1243427A1 Laser pattern generation apparatus
10/18/1988	CA1243425A1 Two mask technique for planarized trench oxide isolation of integrated devices
10/18/1988	CA1243424A1 Logic-circuit layout for large-scale integrated circuits
10/18/1988	CA1243423A1 Logic-circuit layout for large-scale integrated circuits
10/18/1988	CA1243422A1 Contact vias in semiconductor devices
10/18/1988	CA1243421A1 Shallow junction complementary vertical bipolar transistor pair
10/18/1988	CA1243420A1 Selectively doping isolation trenches utilized in cmos devices
10/18/1988	CA1243418A1 Method and apparatus for optically determining defects in a semiconductor material
10/18/1988	CA1243416A1 Method of imaging resist patterns of high resolution on the surface of a conductor

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