Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/1996
08/29/1996WO1996026545A1 Capacitor on ultrathin semiconductor on insulator
08/29/1996WO1996026544A1 Method of forming a dram bit line contact
08/29/1996WO1996026543A1 Configuration and fabrication of semiconductor structure having two levels of buried regions
08/29/1996WO1996026542A1 Semiconductor processing method of forming an electrically conductive contact plug
08/29/1996WO1996026541A1 Tunneling technology for reducing intra-conductive layer capacitance
08/29/1996WO1996026539A1 Method and device for analyzing abnormality of production line and method and device for controlling production line
08/29/1996WO1996026538A1 Chemical solutions for removing metal-compound contaminants from wafers after cmp and the method of wafer cleaning
08/29/1996WO1996026537A1 A PROCESS FOR IN-SITU DEPOSITION OF A Ti/TiN/Ti ALUMINUM UNDERLAYER
08/29/1996WO1996026536A1 Semiconductor apparatus with crystal defects and process for its fabrication
08/29/1996WO1996026463A1 Liquid crystal display device and production method thereof
08/29/1996WO1996026446A1 Manipulator for automatic test equipment test head
08/29/1996WO1996026039A1 Method and apparatus for making holes in an insulating film on a carrier strip for electronic card modules
08/29/1996WO1996026030A1 Heat-sinking structures and electrical sockets for use therewith
08/29/1996WO1996019911A3 Process for preparing an insulated multilayer structure
08/29/1996WO1996019831A3 Circuit arrangement, and junction field effect transistor suitable for use in such a circuit arrangement
08/29/1996WO1996016433A3 Process for the anisotropic and selective dry etching of nitride over thin oxides
08/29/1996WO1996015549A3 Use of oblique implantation in forming base of bipolar transistor
08/29/1996DE19607328A1 Semiconductor source voltage stabilisation device for internal logic cell
08/29/1996DE19606463A1 Multi-chamber cathode sputtering appts.
08/29/1996DE19603136A1 Silicon@ single crystal block with uniform quality over whole length
08/29/1996DE19529237C1 High power semiconductor circuit device
08/29/1996DE19525770C1 Bonding connections testing system for bonded semiconductor wafers
08/29/1996DE19525769C1 Bonding connections testing system for bonded semiconductor wafers
08/29/1996CA2213611A1 Emitter ballast bypass for radio frequency power transistors
08/29/1996CA2213515A1 Heat-sinking structures and electrical sockets for use therewith
08/28/1996EP0729188A2 Semiconductor device having junction field effect transistors
08/28/1996EP0729187A2 Non-volatile semiconductor memory device and method of manufacturing the same
08/28/1996EP0729186A1 MOS-technology power device integrated structure and manufacturing process thereof
08/28/1996EP0729185A2 Improvements in or relating to charge monitoring devices
08/28/1996EP0729184A2 Semiconductor package stack module and method of producing the same
08/28/1996EP0729182A2 Chip carrier and method of manufacturing and mounting the same
08/28/1996EP0729178A1 Rework process for semiconductor chips mounted on an organic substrate
08/28/1996EP0729177A2 Bipolar transistor
08/28/1996EP0729176A2 Process of damage etching the backside of a semiconductor wafer with protected wafer frontside
08/28/1996EP0729175A1 Method for producing deep vertical structures in silicon substrates
08/28/1996EP0729073A1 Positioning system and method and apparatus for device manufacture
08/28/1996EP0729072A1 A process for fabricating a device in which the process is controlled by near-field imaging latent features introduced into energy sensitive resist materials
08/28/1996EP0729020A2 Method and system for assessing the operating condition of a pressure regulator in a corrosive gas distribution system
08/28/1996EP0728850A2 Quasi hot wall reaction chamber
08/28/1996EP0728838A2 Composition for cleaning and process for cleaning
08/28/1996EP0728567A1 A method and machine for resin molding
08/28/1996EP0728531A1 Method for forming particle layer on substrate, method for flattening irregular substrate surface, and particle-layered substrate
08/28/1996EP0728367A1 A flash eprom transistor array and method for manufacturing the same
08/28/1996EP0728365A1 Electron radiation dose tailoring by variable beam pulse generation
08/28/1996EP0728359A1 Flash eprom integrated circuit architecture
08/28/1996EP0728298A1 Method of producing at least one recess in a surface of a substrate, device for carrying out the said method and use of the product thus obtained
08/28/1996EP0728224A1 Apparatus for a thin film manufacturing
08/28/1996EP0500690B1 Multi-layer lead frames for integrated circuit packages
08/28/1996CN1129853A A method for forming a plug in a semiconductor device
08/28/1996CN1129851A Method for forming contact holes in semiconductor device
08/28/1996CN1129850A Method of fabricating semiconductor device
08/28/1996CN1129734A Composition for cleaning and process for cleaning
08/28/1996CN1129619A Wire bonding apparatus
08/28/1996CN1032671C Self-shielding semiconductor components
08/27/1996US5551014 Method and apparatus for designing integrated circuits according to master slice approach
08/27/1996US5550839 Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays
08/27/1996US5550838 Method for testing characteristics of a semiconductor memory device in a series of steps
08/27/1996US5550773 Semiconductor memory having thin film field effect selection transistors
08/27/1996US5550771 Programmable semiconductor integrated circuit
08/27/1996US5550770 Semiconductor memory device having ferroelectric capacitor memory cells with reading, writing and forced refreshing functions and a method of operating the same
08/27/1996US5550711 Ultra high density integrated circuit packages
08/27/1996US5550701 Power MOSFET with overcurrent and over-temperature protection and control circuit decoupled from body diode
08/27/1996US5550699 Hot plug tolerant ESD protection for an IC
08/27/1996US5550634 Semiconductor manufacturing system with self-diagnosing function and self-diagnosing method thereof
08/27/1996US5550633 Optical measuring apparatus having a partitioning wall for dividing gas flow in an environmental chamber
08/27/1996US5550484 Apparatus and method for inspecting thin film transistor
08/27/1996US5550479 Signal measuring apparatus and signal measuring method
08/27/1996US5550466 Hinged conduit for routing cables in an electronic circuit tester
08/27/1996US5550427 Substrate contact electrode having refractory metal bump structure with reinforcement sidewall film
08/27/1996US5550409 Semiconductor device having internal wire and method of fabricating the same
08/27/1996US5550408 Semiconductor device
08/27/1996US5550407 Package
08/27/1996US5550406 Multi-layer tab tape having distinct signal, power and ground planes and wafer probe card with multi-layer substrate
08/27/1996US5550405 Processing techniques for achieving production-worthy, low dielectric, low interconnect resistance and high performance ICS
08/27/1996US5550402 Electronic module of extra-thin construction
08/27/1996US5550400 Nonstoichiometric silicon nitride antifuse film between electrodes on substrate and floating gate electrode; field programmable gate arrays
08/27/1996US5550399 Integrated circuit with windowed fuse element and contact pad
08/27/1996US5550396 Vertical field effect transistor with a trench structure
08/27/1996US5550395 Semiconductor device and process of producing same
08/27/1996US5550392 Semiconductor switching devices
08/27/1996US5550390 Semiconductor device and manufacturing method thereof
08/27/1996US5550388 Heterojunction FET having barrier layer consisting of two layers between channel and buffer layers
08/27/1996US5550372 Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices
08/27/1996US5550351 Process and apparatus for contamination-free processing of semiconductor parts
08/27/1996US5550091 Method of sputtering a silicon nitride film
08/27/1996US5550090 Method for fabricating a monolithic semiconductor device with integrated surface micromachined structures
08/27/1996US5550088 Optical fibers
08/27/1996US5550087 Process for bonding a semiconductor die to a variable die size inner lead layout
08/27/1996US5550086 Ceramic chip form semiconductor diode fabrication method
08/27/1996US5550085 Method for making a buried contact
08/27/1996US5550084 Integrated circuit fabrication using a metal silicide having a sputterdeposited metal nitride layer
08/27/1996US5550083 Process of wirebond pad repair and reuse
08/27/1996US5550082 Method and apparatus for doping silicon wafers using a solid dopant source and rapid thermal processing
08/27/1996US5550081 Method of fabricating a semiconductor device by oxidizing aluminum-bearing 1H-V semiconductor in water vapor environment
08/27/1996US5550080 Method for fabricating capacitors of semiconductor device
08/27/1996US5550079 Method for fabricating silicide shunt of dual-gate CMOS device
08/27/1996US5550078 Reduced mask DRAM process
08/27/1996US5550077 DRAM cell with a comb-type capacitor
08/27/1996US5550076 Method of manufacture of coaxial capacitor for dram memory cell and cell manufactured thereby
08/27/1996US5550075 Ion implanted programmable cell for read only memory applications
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