Patents
Patents for G11C 11 - Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor (76,008)
06/2003
06/19/2003US20030112689 Semiconductor memory device for realizing external 8K Ref/internal 4K Ref standard without lengthening the refresh cycle
06/19/2003US20030112688 Refresh control method of semiconductor memory device and semiconductor memory device comprising the same control method
06/19/2003US20030112687 System and method for providing asynchronous SRAM functionality with a DRAM array
06/19/2003US20030112686 System and method for hiding refresh cycles in a dynamic type content addressable memory
06/19/2003US20030112684 DRAM reference cell direct write
06/19/2003US20030112683 Fast-sensing amplifier for flash memory
06/19/2003US20030112682 Dynamic RAM and semiconductor device
06/19/2003US20030112681 Fast-sensing amplifier for flash memory
06/19/2003US20030112679 Semiconductor memory device having mesh-type structure of precharge voltage line
06/19/2003US20030112677 Systems and methods for executing precharge commands using posted precharge in integrated circuit memory devices with memory banks each including local precharge control circuits
06/19/2003US20030112676 Semiconductor integrated circuit device with internal potential generating circuit allowing external tuning of internal power supply potential
06/19/2003US20030112675 Semiconductor memory device
06/19/2003US20030112673 Semiconductor integrated circuit having logic circuit comprising transistors with lower threshold voltage values and improved pattern layout
06/19/2003US20030112670 Memory device with support for unaligned access
06/19/2003US20030112668 Semiconductor storage device
06/19/2003US20030112667 Information reproducing method judging a multivalued level of a present cell by referring to judged multivalued levels of a preceding cell and an ensuing cell
06/19/2003US20030112663 Method and system for programming and inhibiting multi-level, non-volatile memory cells
06/19/2003US20030112661 Writable tracking cells
06/19/2003US20030112659 Semiconductor memory device
06/19/2003US20030112658 Low temperature systems for use with magnetoresistive circuit components
06/19/2003US20030112657 Magneto-resistive memory array
06/19/2003US20030112656 Nonvolatile storage device and operating method thereof
06/19/2003US20030112655 Magnetic memory device and manufacturing method thereof
06/19/2003US20030112654 Segmented write line architecture
06/19/2003US20030112653 Semiconductor memory
06/19/2003US20030112652 Semiconductor integrated circuit
06/19/2003US20030112651 System and method for inhibiting imprinting of capacitor structures of a memory
06/19/2003US20030112650 Nonvolatile ferroelectric memory device and method for storing multiple bit using the same
06/19/2003US20030112057 Semiconductor device
06/19/2003US20030112042 Output buffer circuit and integrated semiconductor circuit device with such output buffer circuit
06/19/2003US20030111681 Semiconductor memory device and its manufacturing method
06/19/2003US20030111679 Ovonic unified memory device and magnetic random access
06/19/2003US20030111676 Circuit for controlling an AC-timing parameter of a semiconductor memory device and method thereof
06/19/2003US20030111673 Semiconductor integrated circuit
06/19/2003US20030111670 Method and system for molecular charge storage field effect transistor
06/19/2003US20030111626 Magnetic memory device having magnetic shield layer, and manufacturing method thereof
06/18/2003EP1320104A1 Magnetic memory device and manufacturing method thereof
06/18/2003EP1320103A2 Ferroelectric memory device
06/18/2003EP1320102A2 Magnetic random access memory and method of operating the same
06/18/2003EP1319234A2 Planar inductive element
06/18/2003EP1319231A1 Programmable molecular device
06/18/2003EP0872847B1 Memory
06/18/2003CN1424764A Semiconductor memory
06/18/2003CN1424760A Checking method and device for eliminating diode interrelationship
06/18/2003CN1111941C Temperature independent oscillator
06/18/2003CN1111911C Semiconductor memory device and fabrication method thereof
06/18/2003CN1111870C Semiconductor memory capable of testing regardless of spare unit configuration
06/18/2003CN1111869C Semiconductor memory device
06/18/2003CN1111868C Semiconductor integrated circuit device capable of externally monitoring internal voltage
06/18/2003CN1111867C Fuse restoring circuit
06/18/2003CN1111866C Method and device for reducing bias current in reference voltage circuit
06/17/2003US6580657 Low-power organic light emitting diode pixel circuit
06/17/2003US6580654 Boosted voltage supply
06/17/2003US6580651 Reduced power bit line selection in memory circuits
06/17/2003US6580650 DRAM word line voltage control to insure full cell writeback level
06/17/2003US6580649 Semiconductor memory device
06/17/2003US6580643 Nonvolatile semiconductor storage device and method for operating the same
06/17/2003US6580638 Flash EEPROM system with simultaneous multiple data sector programming and storage of physical block characteristics in other designated blocks
06/17/2003US6580636 Magnetoresistive memory with a low current density
06/17/2003US6580634 Data memory device
06/17/2003US6580633 Nonvolatile semiconductor memory device
06/17/2003US6580632 Semiconductor memory device, method for driving the same and method for fabricating the same
06/17/2003US6580631 256 Meg dynamic random access memory
06/17/2003US6580629 Semiconductor device array having dense memory cell array and hierarchical bit line scheme
06/17/2003US6580312 Apparatus for generating stable high voltage signal
06/17/2003US6580310 Double flux quantum superconductor driver
06/17/2003US6580298 Three input sense amplifier and method of operation
06/17/2003US6580270 Magnetoresistive sensor or memory elements with decreased magnetic switch field
06/17/2003US6580124 Multigate semiconductor device with vertical channel current and method of fabrication
06/17/2003US6580120 Two bit non-volatile electrically erasable and programmable memory structure, a process for producing said memory structure and methods for programming, reading and erasing said memory structure
06/17/2003US6579764 Integrated circuit memory devices having non-volatile memory transistors and methods of fabricating the same
06/17/2003US6579760 Self-aligned, programmable phase change memory
06/17/2003US6579754 Semiconductor memory device having ferroelectric film and manufacturing method thereof
06/17/2003US6579729 Memory cell configuration and method for fabricating it
06/17/2003US6579625 Magnetoelectronics element having a magnetic layer formed of multiple sub-element layers
06/12/2003WO2003049121A1 Low voltage operation of static random access memory
06/12/2003WO2003049120A2 Magnetoresistive memory cell comprising a dynamic reference layer
06/12/2003WO2003049119A2 Cascode sense amp and column select circuit and method of operation
06/12/2003WO2003049118A2 Method and architecture for refreshing a 1t memory proportional to temperature
06/12/2003US20030110411 Flash EEprom system
06/12/2003US20030110348 Sequential nibble burst ordering for data
06/12/2003US20030109093 Multi-state non-volatile integrated circuit memory systems that employ dielectric storage elements
06/12/2003US20030108144 Clock control method for preventing charge couple device from saturation
06/12/2003US20030108139 Register controlled delay locked loop circuit
06/12/2003US20030107943 Semiconductor device using SCL circuit
06/12/2003US20030107941 Semiconductor memory device and electronic instrument
06/12/2003US20030107940 Row access information transfer device using internal wiring of a memory cell array
06/12/2003US20030107939 Refresh apparatus for semiconductor memory device, and refresh method thereof
06/12/2003US20030107938 Apparatus for controlling refresh of memory device without external refresh command and method thereof
06/12/2003US20030107936 Semiconductor memory device employing temperature detection circuit
06/12/2003US20030107935 Dram with bias sensing
06/12/2003US20030107932 Semiconductor memory device and data access method for semiconductor memory device
06/12/2003US20030107931 Method of verifying a semiconductor integrated circuit apparatus, which can sufficiently evaluate a reliability of a non-destructive fuse module after it is assembled
06/12/2003US20030107924 Semiconductor device
06/12/2003US20030107917 Diode decoupled sensing method and apparatus
06/12/2003US20030107916 Thin film magnetic memory device conducting data read operation without using a reference cell
06/12/2003US20030107915 Magnetic random access memory
06/12/2003US20030107914 Magnetic random access memory
06/12/2003US20030107913 Semiconductor memory circuit hard to cause soft error
06/12/2003US20030107912 Half density ROM embedded DRAM