| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 06/10/2009 | CN101452029A Machine for auto detecting multi-terminal image display and aligning device thereof |
| 06/10/2009 | CN101452028A Electrode container and electrostatic discharge simulation source device containing the container |
| 06/10/2009 | CN101452027A Wafer shipment quality guarantee detecting method |
| 06/10/2009 | CN101452026A MAX724 chip detection circuit and detection method thereof |
| 06/10/2009 | CN101452025A Suspension joint type high voltage and high current synchronization measuring method and device |
| 06/10/2009 | CN100499056C Process for fabricating semiconductor integrated circuit device |
| 06/10/2009 | CN100498367C Electric vehicle accumulator internal resistance pulse detecting method |
| 06/10/2009 | CN100498366C Apparatus and method for monitoring battery pack |
| 06/10/2009 | CN100498365C Calculation device calculating available capacity of secondary battery and method of calculating the same |
| 06/10/2009 | CN100498364C System and method of battery capacity estimation |
| 06/10/2009 | CN100498363C Method for testing parameters of synchronization electric motor |
| 06/10/2009 | CN100498361C Electronic part test device |
| 06/10/2009 | CN100498360C Device for failure analysis of surge protector lightning protection component |
| 06/10/2009 | CN100498359C Electric circuit connection detector, electronic equipment and detecting method |
| 06/10/2009 | CN100498358C Insulation monitoring method for low current neutral grounding systems and apparatus for realizing the method |
| 06/10/2009 | CN100498357C High voltage electricity transmission system thunder-proof property parameter test method |
| 06/10/2009 | CN100498356C IC detecting machine |
| 06/10/2009 | CN100498355C Memory card detecting machine |
| 06/10/2009 | CN100498354C Detecting method and equipment for digital wave filter |
| 06/10/2009 | CN100498353C High voltage automatic accessing device for unmanned testing |
| 06/09/2009 | US7546507 Method and apparatus for debugging semiconductor devices |
| 06/09/2009 | US7546506 DRAM stacked package, DIMM, and semiconductor manufacturing method |
| 06/09/2009 | US7546505 Built in self test transport controller architecture |
| 06/09/2009 | US7546504 System and method for advanced logic built-in self test with selection of scan channels |
| 06/09/2009 | US7546503 Selecting between tap/scan with instructions and lock out signal |
| 06/09/2009 | US7546502 1114.9 tap linking modules |
| 06/09/2009 | US7546501 Selecting test circuitry from header signals on power lead |
| 06/09/2009 | US7546500 Slack-based transition-fault testing |
| 06/09/2009 | US7546499 Communication signal testing with a programmable logic device |
| 06/09/2009 | US7546498 Programmable logic devices with custom identification systems and methods |
| 06/09/2009 | US7546496 Packet transmission device and packet transmission method |
| 06/09/2009 | US7546494 Skew-correcting apparatus using dual loopback |
| 06/09/2009 | US7545858 Method of measuring jitter frequency response |
| 06/09/2009 | US7545749 High-accuracy packet pair for network bottleneck bandwidth measurement |
| 06/09/2009 | US7545747 Method, system and program product for actively managing central queue buffer allocation using a backpressure mechanism |
| 06/09/2009 | US7545736 Restoration path calculation in mesh networks |
| 06/09/2009 | US7545735 Scalable protection mechanism for hierarchical multicast service in ring based networks |
| 06/09/2009 | US7545163 Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input |
| 06/09/2009 | US7545162 Method and apparatus for inspecting and repairing liquid crystal display device |
| 06/09/2009 | US7545161 Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes |
| 06/09/2009 | US7545160 Probe chip and probe card |
| 06/09/2009 | US7545159 Electrical test probes with a contact element, methods of making and using the same |
| 06/09/2009 | US7545158 Method for testing system-in-package devices |
| 06/09/2009 | US7545157 Shielded probe apparatus for probing semiconductor wafer |
| 06/09/2009 | US7545156 Test circuit and test method that includes supplying a current to a plurality of light-receiving elements |
| 06/09/2009 | US7545152 Transmission line pulse measurement system for measuring the response of a device under test |
| 06/09/2009 | US7545149 Driver and receiver circuit for a remotely arranged circuit and corresponding method |
| 06/09/2009 | US7544522 Fabrication method of semiconductor integrated circuit device |
| 06/09/2009 | CA2248924C Arc fault detector with multiple channel sensing and circuit breaker incorporating |
| 06/04/2009 | WO2009070665A1 Near field detector for integrated surface plasmon resonance biosensor applications |
| 06/04/2009 | WO2009069615A1 Secondary cell degradation state judgment system |
| 06/04/2009 | WO2009069440A1 Probe device |
| 06/04/2009 | WO2009069438A1 Holding member for inspection and method for manufacturing holding member for inspection |
| 06/04/2009 | WO2009069209A1 Short-circuit wiring fixture, method for measuring skew, and method for adjusting skew |
| 06/04/2009 | WO2009069201A1 Battery management system and charger |
| 06/04/2009 | WO2009069190A1 Insert, tray and electronic component testing apparatus |
| 06/04/2009 | WO2009069189A1 Insert, tray and electronic component testing apparatus |
| 06/04/2009 | WO2009068070A1 Test equipment for testing an additional center tank (act) system of an aircraft |
| 06/04/2009 | WO2009068069A1 Method and apparatus for testing valve control system |
| 06/04/2009 | WO2009068063A1 Tester for testing signal lines of a flight control system for a ths motor of an aircraft |
| 06/04/2009 | WO2009068062A1 Method and kit for testing 3-phase supplies onboard of an aircraft |
| 06/04/2009 | WO2009068061A1 Method and apparatus for testing aircraft electrical systems |
| 06/04/2009 | WO2009068060A1 Aircraft power failure simulation apparatus and method |
| 06/04/2009 | WO2009068059A1 Tester for testing operational reliability of a cockpit oxygen distribution circuit |
| 06/04/2009 | WO2009068058A1 Test equipment and method for testing an aircraft oxygen system control device |
| 06/04/2009 | WO2009044113A3 Semiconductor wafer metrology apparatus and method |
| 06/04/2009 | WO2007048045A3 System and method for detecting power system conditions |
| 06/04/2009 | US20090144675 Transaction based verification of a system on chip on system level by translating transactions into machine code |
| 06/04/2009 | US20090144595 Built-in self-testing (bist) of field programmable object arrays |
| 06/04/2009 | US20090144594 Method and apparatus for describing and testing a system-on-chip |
| 06/04/2009 | US20090144593 Method and apparatus for describing parallel access to a system-on-chip |
| 06/04/2009 | US20090144592 Method and Apparatus for Describing Components Adapted for Dynamically Modifying a Scan Path for System-on-Chip Testing |
| 06/04/2009 | US20090144012 Transaction based verification of a system on chip on system level by translating transactions into machine code |
| 06/04/2009 | US20090144002 Method and apparatus for detecting faults in a current sensing device |
| 06/04/2009 | US20090144001 Networked Battery Monitors |
| 06/04/2009 | US20090143999 Real time system for monitoring the commonality, sensitivity, and repeatability of test probes |
| 06/04/2009 | US20090141644 Twisted pair cable plant cross talk coupling simulator |
| 06/04/2009 | US20090141640 Port failure communication in cross-connect applications |
| 06/04/2009 | US20090140763 Method of measuring on-resistance in backside drain wafer |
| 06/04/2009 | US20090140762 Layout for dut arrays used in semiconductor wafer testing |
| 06/04/2009 | US20090140761 Method of testing semiconductor device |
| 06/04/2009 | US20090140760 Probe card |
| 06/04/2009 | US20090140759 IC socket having contact devices with low impedance |
| 06/04/2009 | US20090140758 Test carrier |
| 06/04/2009 | US20090140757 Microdisplay Assemblies and Methods of Packaging Microdisplays |
| 06/04/2009 | US20090140756 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment |
| 06/04/2009 | US20090140755 Circuit board testing system |
| 06/04/2009 | US20090140750 Interference Exclusion Capability Testing Apparatus |
| 06/04/2009 | US20090140748 High voltage harness testing system |
| 06/04/2009 | US20090140747 Detection of faults in an injector arrangement |
| 06/04/2009 | US20090140746 Testing circuit board |
| 06/04/2009 | US20090140745 Power converter current sensor testing method |
| 06/04/2009 | US20090140744 Method and device for determining state of health of the battery, and battery power supply system |
| 06/04/2009 | US20090140719 Smart sensors for solar panels |
| 06/04/2009 | US20090140248 On-Chip Test Circuit for an Embedded Comparator |
| 06/04/2009 | DE202009003966U1 Messspitzen Measuring tips |
| 06/04/2009 | DE102008053344A1 Adaptiver Filteralgorithmus zum Schätzen des Lebensalters einer Batterie An adaptive filtering algorithm for estimating the age of a battery |
| 06/04/2009 | DE102007057501A1 Electrical contact device for controller of motor vehicle, has bus bar for supplying electrical energy to controller from cable or pole terminal, and press-fit connection placed in electrical contact with bus bar |
| 06/04/2009 | DE10063996B4 Sensoranordnung mit Funktionsstörungsdetektor Sensor array detector malfunction |
| 06/04/2009 | CA2707108A1 Method and apparatus for testing valve control system |