Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
07/2005
07/28/2005US20050161601 Electron beam system and electron beam measuring and observing method
07/28/2005US20050161600 Sample electrification measurement method and charged particle beam apparatus
07/28/2005US20050161599 Electron beam irradiation apparatus, electron beam irradiation method, and apparatus for and method of manufacturing disc-shaped object
07/28/2005DE19919423B4 Computertomographie(CT)-Gerät Computed tomography (CT) device
07/28/2005DE10361397A1 Bildaufnahmevorrichtung Imaging device
07/27/2005EP1557864A1 X-ray microscopic inspection apparatus
07/27/2005EP1155308A4 Radiation detector bad pixel processing
07/27/2005EP0986745A4 Single beam photoneutron probe and x-ray imaging system for contraband detection and identification
07/27/2005CN1645548A Charged particle beam device, its control method, substrate inspecting method and manufacture of semiconductor device
07/27/2005CN1645116A Electrochemical sensor fo appraising ultraviolet shielding behaviour of nanometer oxide powder
07/27/2005CN1645091A Production of X-ray stress measuring calibrated sample
07/27/2005CN1644165A X-ray CT apparatus and imaging method
07/26/2005US6922461 Inspection system for air cargoes or vehicles
07/26/2005US6922460 Explosives detection system using computed tomography (CT) and quadrupole resonance (QR) sensors
07/26/2005US6922459 X-ray inspection device for food products
07/26/2005US6921896 Automatic backscatter gauge
07/21/2005WO2005065848A1 Device and method for separating bulk materials
07/21/2005WO2005065090A2 Techniques for building-scale electrostatic tomography
07/21/2005WO2005065039A2 An x-ray diffraction (xrd) means for identifying the content in a volume of interest and a method thereof
07/21/2005US20050159903 Radiographic apparatus, and control method and program thereof
07/21/2005US20050158653 spin coating thin films having electrical resistance on semiconductor wafer, photomask and optical masks, then evaluating using radiation beams
07/21/2005US20050157918 Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge
07/21/2005US20050157849 Diagnosing system for an x-ray source assembly
07/21/2005US20050157844 Traveling X-ray inspection system with collimators
07/21/2005US20050157843 Portable and on-line arsenic analyzer for drinking water
07/21/2005US20050157842 Single boom cargo scanning system
07/21/2005US20050157841 Three-dimensional x-ray imaging system
07/21/2005US20050157840 X-ray CT apparatus and imaging method
07/21/2005US20050156125 Method and apparatus for managing imaging system workflow
07/21/2005US20050156121 Methods and devices for charge management for three-dimensional and color sensing
07/21/2005DE10360981A1 Computer tomography (CT) method for generating CT images of a subject/patient under examination handles a sectional area moving from time to time like a beating heart
07/20/2005EP1554685A2 Optical tomography of small moving objects using time delay and integration imaging
07/20/2005EP1554566A2 Method and apparatus for in situ depositing of neutral cs under ultra-high vacuum to analytical ends
07/20/2005EP1328189A4 Method and apparatus for anatomical and functional medical imaging
07/20/2005CN2711728Y Array three-dimension scanner structure for portable gamma ray detector
07/20/2005CN2711727Y Miniature gamma ray industrial computerized tomography imaging device
07/20/2005CN1643619A Detector for x-ray computer tomography
07/20/2005CN1643371A Systems and methods for imaging large field-of-view objects
07/20/2005CN1642482A Computer tomograph comprising energy discriminating detectors
07/20/2005CN1641343A Nano carbon tube detecting and qualitative classifying method based on photoconductive change rate
07/20/2005CN1641332A Glancing fluorescent on-line measuring device of optical multi-layer membrane thickness
07/19/2005US6920200 Density-nonuniform multilayer film analyzing method, and apparatus and system thereof
07/19/2005US6920198 Methods and apparatus for processing a fluoroscopic image
07/19/2005US6920197 Vehicle-carried mobile container inspection apparatus
07/19/2005US6919563 Defect evaluation apparatus utilizing positrons
07/19/2005US6918698 Integrated crystal mounting and alignment system for high-throughput biological crystallography
07/19/2005US6918310 Sampling apparatus
07/14/2005WO2005064323A1 Process for producing fused beads determining the platimum group metal content of ceramic powders by means of xrf analysis
07/14/2005WO2005003718A3 Method and apparatus for material identification using characteristic radiative emissions
07/14/2005WO2004051311A3 Radiation scanning units including a movable platform
07/14/2005US20050152590 Methods and apparatus for back-projection and forward-projection
07/14/2005US20050152505 Method and apparatus for reconstruction of the attenuation density of an object from x-ray projection image data
07/14/2005US20050152504 Method and apparatus for automated tomography inspection
07/14/2005US20050152497 X-ray diffractometer
07/14/2005US20050152494 Efficient image reconstruction algorithm for the circle and arc cone beam computer tomography
07/14/2005US20050151086 Imaging device
07/14/2005DE10358182A1 Specimen for electron microscopic investigations has coating for draining away charge that has opening at point at which electron beam is incident on specimen
07/14/2005DE10355616A1 X ray imager has adjustable angle secondary radiation absorbing grid in front of line array receiver
07/14/2005DE102004061448A1 Verfahren und Vorrichtung zur Verarbeitung von Radiologiebildern Method and apparatus for processing of radiology images
07/14/2005DE102004059794A1 Multischichtreflektor für CT-Detektor Multilayer reflector for CT detector
07/14/2005DE102004059664A1 Semiconductor wafer measurement point focusing method for semiconductor manufacturing process, involves regulating lens current value to perform focusing while widening focus depth, if evaluation value is less than preset level
07/13/2005EP1553416A1 Rotary support and apparatus used for the multiple spectroscopic characterisation of samples of solid materials
07/13/2005EP1553407A1 Scatter measurement method, scatter correction method, and x-ray CT apparatus
07/13/2005EP1551601A1 End effector
07/13/2005EP1228361A4 Digital image orientation marker
07/13/2005CN2709976Y Integral device for powder sampling and investigating
07/13/2005CN1640209A System and method for building and manipulating a centralized measurement value database
07/13/2005CN1639559A Simultaneous multifocal coherent X-ray scanning (cxrs)
07/13/2005CN1637584A Projector and zoom adjustment method
07/13/2005CN1636517A Method and apparatus for positioning an object with respect to the isocenter of an acquisition system
07/13/2005CN1636516A Scatter measurement method, scatter correction method, and x-ray CT apparatus
07/13/2005CN1636513A Methods and apparatus for dynamical helical scanned image production
07/13/2005CN1210562C X-ray induced photoelectronic phase contrast imaging device
07/13/2005CN1210561C Method for making x-ray detector array unit
07/13/2005CN1209999C Apparatus for ganging detector elements in multislice computed tomography system
07/12/2005US6917668 Ray tracing kernel calibration
07/12/2005US6916657 Evaluation method for polycrystalline silicon
07/12/2005US6916623 Generation of soluble protein; obtain vector, incubate with nucleotide sequnces coding protein domains, digest sequences, ligate, express vector in cell free system, recover protein
07/12/2005US6915715 Inspection probe for an internal wall of a duct
07/12/2005US6915685 Tool holder for measurement means
07/07/2005WO2005062313A2 Non-destructive method for controlling a nuclear reactor element
07/07/2005WO2005061112A1 Test specimen and production thereof
07/07/2005WO2005015189A3 X-ray fluorescence system with apertured sample mask for analyzing patterned surfaces
07/07/2005WO2004079752A3 Systems and methods for controlling an x-ray source
07/07/2005WO2004073655A3 Radiation phantom
07/07/2005US20050147209 Method and apparatus for measuring matter properties
07/07/2005US20050147203 Reading imaging data
07/07/2005US20050147200 Scatter measurement method, scatter correction method, and X-ray CT apparatus
07/07/2005US20050145793 Electron microscope
07/07/2005US20050145791 Scanning electron microscope
07/07/2005DE10358036A1 Verfahren und Vorrichtung zum Charakterisieren einer Tiefenstruktur in einem Substrat Method and apparatus for characterizing a deep structure in a substrate,
07/06/2005EP1549934A2 Folded array ct baggage scanner
07/06/2005EP1549218A1 Method and apparatus for detection of ionizing radiation
07/06/2005CN1635366A Process for detecting phosphorus utilizing low resolution inductively coupled plasma mass spectrograph
07/06/2005CN1635365A TEM sample wafer for observing surface damage caused by ion beam and preparing method therefor
07/05/2005US6914444 Semiconductor device test method and semiconductor device tester
07/05/2005US6914441 Detection of defects in patterned substrates
07/05/2005US6914249 Particle-optical apparatus, electron microscopy system and electron lithography system
06/2005
06/30/2005WO2005059531A1 Advanced roughness metrology
06/30/2005WO2005059514A2 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture