Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
11/2005
11/23/2005EP1598782A2 Image information processing apparatus, image information processing method, and program
11/23/2005EP1598663A2 Method and apparatus for X-ray analysis with a two-dimensional array-detector
11/23/2005CN1700885A Rotational angiography based hybrid 3D reconstruction of coronary arterial structure
11/23/2005CN1699979A Nano level high resolution stress measuring method
11/23/2005CN1698541A Direct conversion energy discriminating CT detector
11/23/2005CN1228809C Charged beam apparatus, pattern testing method and pattern display method
11/22/2005US6968043 X-ray analyzer
11/22/2005US6968040 Method and apparatus for improved X-ray device image quality
11/22/2005US6968038 Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray
11/22/2005US6968037 High throughput X-ray diffraction filter sample holder
11/22/2005US6968031 Ray-by-ray fourier image reconstruction from projections
11/22/2005US6967343 Condensed tungsten composite material and method for manufacturing and sealing a radiation shielding enclosure
11/22/2005US6967328 Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor
11/22/2005US6967327 Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer
11/17/2005WO2005108965A1 Classification method for sedimentary rocks
11/17/2005WO2005108935A2 Method for on-line evaluation of materails using prompt gamma ray analysis
11/17/2005WO2005024721A3 2d/3d image registration in image-guided radiosurgery
11/17/2005US20050256687 Generation of a library of periodic grating diffraction signals
11/17/2005US20050256669 Measurement system and method and computer program for processing measurement data
11/17/2005US20050256380 Patient recruitment method and system
11/17/2005US20050255598 Use of an organic compound for the absorption of ionizing radiation
11/17/2005US20050254628 Apparatus for mechanical transmission
11/17/2005US20050254620 Mammogram recording and read-out apparatus
11/17/2005US20050254619 X-ray CT apparatus
11/17/2005US20050254614 Method and apparatus for measuring wall thickness of a vessel
11/17/2005US20050253097 Solid state detector
11/17/2005US20050253082 Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method
11/17/2005US20050253067 Method for controlling charged particle beam, and charged particle beam apparatus
11/17/2005US20050253066 Electron beam apparatus
11/17/2005US20050253065 Methods, apparatus, and software for adjusting the focal spot of an electron beam
11/17/2005DE19629249B4 Verfahren zum Analysieren von Defekten von Halbleitereinrichtungen mit drei Dimensionen A method for analyzing defects of semiconductor devices in three dimensions
11/17/2005DE10361525B4 Verfahren zur Herstellung von Schmelztabletten zur Bestimmung des Gehaltes von keramischen Pulvern an Platingruppenmetallen mittels RFA Process for the preparation of orodispersible tablets for determining the content of ceramic powders of platinum group metals by XRF
11/17/2005DE102004019599A1 Mehrschicht-Computertomographie-Anlage mit Datenübertragungssystem reduzierter Übertragungsbandbreite Multislice computed tomography system with data transfer system reduced transmission bandwidth
11/17/2005DE102004018498A1 Betriebsverfahren für eine Röntgenanlage, rechnergestütztes Ermittlungsverfahren für mindestens eine 3D-Rekonstruktion eines Objekts und hiermit korrespondierende Einrichtungen Operating method for an X-ray machine, computerized criminal investigation for at least a 3D reconstruction of an object and corresponding thereto Facilities
11/16/2005EP1109823B1 Modifications of the vegf receptor-2 protein and methods of use
11/16/2005CN2741046Y Central indicator of ray flaw detector
11/16/2005CN1696676A X-ray CT apparatus
11/16/2005CN1696652A Particle beam device probe operation
11/16/2005CN1227711C Photomultiplier, its manufacturing method and radiation detector
11/15/2005US6965663 X-ray analysis apparatus and method
11/15/2005US6965662 Nonplanar x-ray target anode for use in a laminography imaging system
11/15/2005US6965153 Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method
11/15/2005US6965118 Radiation shield for portable x-ray fluorescence instruments
11/15/2005US6965112 Specimen holder, observation system, and method of rotating specimen
11/10/2005WO2005106458A2 Methods and systems for analyzing solids
11/10/2005WO2005106440A1 Fluorescent x-ray analysis method and fluorescent x-ray analysis device
11/10/2005WO2005106439A1 Fluorescent x-ray analysis method and equipment
11/10/2005WO2005098401A3 Method ans system for automatically scanning and imaging the contents of a moving target
11/10/2005US20050251023 Method and MR apparatus for PPA MR imaging with radial data acquisition
11/10/2005US20050249432 Imaging system
11/10/2005US20050249330 Folded array CT baggage scanner
11/10/2005US20050249329 X-ray computed tomographic apparatus
11/10/2005US20050249328 Method for taking tomograms of a beating heart
11/10/2005US20050249327 Rotational angiography based hybrid 3-d reconstruction of coronary arterial structure
11/10/2005US20050249326 Method and apparatus for error-tolerant data transfer for a CT system
11/10/2005US20050248334 System and method for monitoring erosion
11/10/2005US20050247889 Movable inclination-angle measuring apparatus for ion beam, and method of use
11/10/2005US20050247876 Sample dimension measuring method and scanning electron microscope
11/10/2005US20050247874 Scanning probe microscope and molecular structure change observation method
11/10/2005US20050247867 System and methods for determining nonuniformity correction parameters in detector-array imaging
11/10/2005US20050247860 Electron microscope, measuring method using the same, electron microscope system, and method for controlling the system
11/10/2005US20050247493 Method for compensation of near-neighbor sample effects in a NMR check weighing system
11/09/2005EP1592347A1 Dual function ct scan
11/09/2005CN2739624Y High resolution neutron diffraction intensified imaging device
11/09/2005CN2739623Y Quasi-coaxial holographic atomic beam phase contrast imaging device
11/09/2005CN1692885A Method for taking tomograms of a beating heart
11/09/2005CN1226781C Miniature pattern inspection apparatus and method, CD-SEM managing apparatus and method
11/08/2005US6963630 Method for evaluating an SOI substrate, evaluation processor, and method for manufacturing a semiconductor device
11/08/2005US6963206 System and method of evaluating gate oxide integrity for semiconductor microchips
11/08/2005US6963072 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
11/03/2005WO2005103632A2 Irradiation system having cybernetic parameter acquisition system
11/03/2005WO2005102170A1 Cone-beam coherent-scatter computer tomograph
11/03/2005WO2005102152A2 Characterizing biological tissues
11/03/2005WO2005053534A3 Mobile computed radiography
11/03/2005US20050245819 X-ray means for determining the location of malignant neoplasm and its radiotherapy
11/03/2005US20050244588 Method of observing monolayer ultraviolet decomposition process, method of controlling degree of surface decomposition, and patterning method
11/03/2005US20050244049 Apparatus and method for inspecting pattern on object
11/03/2005US20050243968 System and method for eliminating the effects of saturated pixels in solid state x-ray detectors
11/03/2005US20050243965 CT apparatus, CT imaging method and method of providing service using the same
11/03/2005US20050243963 Imaging system to compensate for x-ray scatter
11/03/2005US20050243962 Computed tomography method
11/03/2005US20050241374 High Aspect Ratio Tip Atomic Force Microscopy Cantilevers and Method of Manufacture
11/03/2005DE202004020695U1 X-ray optical analysis system, for combinatory screening of sample library on flat sample plate, allows plate to rotate around two axes
11/03/2005DE102004019030A1 Vorrichtung für die Elementanalyse Apparatus for elemental analysis
11/03/2005DE102004017538A1 Computertomographie-Gerät mit Aperturblende Computed tomography device with aperture
11/02/2005EP1592056A1 Method for inspection, process for making analytic piece, method for analysis, analyzer, process for producing soi wafer, and soi wafer
11/02/2005CN2738247Y Dust sampling and density metering device
11/02/2005CN1691644A Fault-tolerance data transmission method and apparatus used for computer aided radiography
11/02/2005CN1691269A Method of implanting a substrate and an ion implanter for performing the method
11/02/2005CN1689524A Multi-layer computed tomography device for reducing transmission bandwidth data of transmission system
11/02/2005CN1689523A X-ray computed tomographic apparatus
11/02/2005CN1225647C Apparatus for continuous and automatic measurement of radial flow sediment content
11/01/2005US6961404 Method and system for reconstructing an image from projection data acquired by a cone beam computed tomography system
11/01/2005US6960765 Probe driving method, and probe apparatus
11/01/2005US6960764 Method of measuring the performance of a scanning electron microscope
11/01/2005US6960020 Image positioning method and system for tomosynthesis in a digital X-ray radiography system
11/01/2005CA2354080C Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
10/2005
10/27/2005WO2005100963A1 Device for the analysis of elements
10/27/2005WO2005099635A1 Systems and methods for forming identifiable structures in a solid freeform fabrication system
10/27/2005WO2005062313A3 Non-destructive method for controlling a nuclear reactor element