Patents
Sitemap › G01 - Measuring; Testing › G01N - Investigating or analysing materials by determining their chemical or physical properties › G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
10/2005
10/27/2005WO2004097938A8 Conductive adhesive bonded semiconductor substrates for radiation imaging devices
10/27/2005US20050239211 Concentration method and apparatus of preparing a liquid specimen for a trace element analysis system
10/27/2005US20050238926 Substrate for a perpendicular magnetic recording medium and a perpendicular magnetic recording medium using the substrate
10/27/2005US20050238140 X-ray imaging system with automatic image resolution enhancement
10/27/2005US20050238138 Radiation imaging apparatus
10/27/2005US20050238137 Multi-slice computer tomography system with data transfer system with reduced transfer bandwidth
10/27/2005US20050238136 Method for taking computed tomography scans with the aid of a CT unit, and a CT unit
10/27/2005US20050237069 Semiconductor device test method and semiconductor device tester
10/27/2005US20050236648 Inspection method and inspection system using charged particle beam
10/27/2005US20050236569 Scanning electron microscope
10/27/2005DE102005015531A1 Stationäres tomographisches Mammographiesystem Stationary tomographic mammography system
10/27/2005DE102004017540A1 Verfahren zur Erstellung von computertomographischen Aufnahmen mit einem CT-Gerät und CT-Gerät Process for the preparation of computed tomography scans with CT scanners and CT scanner
10/27/2005CA2563462A1 Device for the analysis of elements
10/26/2005EP1589792A2 Light source apparatus and exposure apparatus having the same
10/26/2005EP1587912A2 Methods of identifying and designing cell surface receptor inhibitors
10/26/2005EP1587817A2 System and method for examination of microarrays using scanning electron microscope
10/26/2005CN2736766Y Circuit for monitoring accelerator single pulse dosage changes
10/26/2005CN2736765Y Connection equipment for detector module in container inspection system
10/26/2005CN2736764Y Radiation image formation array solid-state detector
10/26/2005CN2736763Y Solid-state detector modular structure for radiation image-formation
10/26/2005CN2736762Y Safeguard member structure of coal quality and composition online detection arrangement
10/26/2005CN1687763A Frequency mixing type gas sensing unit with dual oscillation of crystal in very high frequency
10/26/2005CN1687762A X ray spectrometer with ultra fast temporal resolution
10/26/2005CN1225152C Ray photographing apparatus and method
10/26/2005CN1224936C Apparatus and method for imaging small objects in flow stream using optical tomography
10/26/2005CN1224837C Intelligent scanning beam-defining clipper matched with ray source
10/25/2005US6958477 Electron beam apparatus, and inspection instrument and inspection process thereof
10/25/2005US6958476 coating with a layer of contrast enhancing material, recoating with a second material, ion milling; second material has similar milling characteristics; semiconductors
10/25/2005US6957913 Nonintrusive inspection apparatus
10/20/2005WO2005098871A1 X-ray-use target and device using it
10/20/2005WO2005098401A2 Method ans system for automatically scanning and imaging the contents of a moving target
10/20/2005WO2005098400A2 Eliminating cross-talk in a backscatter inspection portal comprising multiples sources by ensuring that only one source is emitting radiation at a time
10/20/2005WO2005097945A1 Luminous body, electron beam detector using the same, scanning electron microscope, and mass analysis device
10/20/2005WO2005018437A3 X-ray diffraction-based scanning system
10/20/2005WO2004107265A3 Computer and method for processing and/or evaluating a digital image
10/20/2005US20050234745 Automated data entry method and system
10/20/2005US20050234672 Electron beam inspection apparatus
10/20/2005US20050232393 Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer therefor
10/20/2005US20050232392 Nanostructure field emission x-ray analysis
10/20/2005US20050232391 X-ray fluorescence analysis using a waveguide connected to the source and to the detector
10/20/2005US20050232390 Computed tomography unit having an aperture stop
10/20/2005US20050232389 Operating method for an x-ray system and x-ray system
10/20/2005US20050230621 Apparatus and method for investigating or modifying a surface with a beam of charged particles
10/20/2005US20050230619 Method and system for measurement of dielectric constant of thin films using a near field microwave probe
10/20/2005US20050230618 Defect inspection apparatus, program, and manufacturing method of semiconductor device
10/20/2005CA2557001A1 Ionizing radiation treatment system on water-borne platform
10/19/2005EP1585995A1 System and method for ct scanning of baggage
10/19/2005EP1585980A1 X-ray fluorescence flux composition
10/19/2005CN1685211A Optical tomography of small moving objects using time delay and integration imaging
10/19/2005CN1684568A Operating method for an X-ray system, method for determining object 3-d reproduction and relative device
10/19/2005CN1223848C X-ray analyzing device
10/19/2005CN1223827C Multiple point thickness meter
10/18/2005US6956929 Method for controlling modulation of X-ray tube current using a single topogram
10/18/2005US6956928 Vertical small angle x-ray scattering system
10/18/2005US6956927 Radiation therapy planning device
10/18/2005US6956925 Methods and systems for multi-modality imaging
10/18/2005US6956212 Electron microscope observation system and observation method
10/18/2005CA2276051C Phase retrieval in phase contrast imaging
10/13/2005WO2005095933A1 Method and device for determining the material of an object
10/13/2005WO2005095932A1 Method for inspecting ceramic structures
10/13/2005WO2005095931A2 Contraband detection systems and methods
10/13/2005WO2005095042A1 Processing method for organic crystal, processing device for organic crystal, and observing device for organic crystal
10/13/2005WO2005094318A2 Morphology and spectroscopy of nanoscale regions using x-rays generated by laser produced plasma
10/13/2005US20050226494 Pattern inspection apparatus, pattern inspection method, and recording medium
10/13/2005US20050226486 Image processing apparatus and method, and program
10/13/2005US20050226380 Multichannel contactless power transfer system for a computed tomography system
10/13/2005US20050226379 X-ray diffraction apparatus and method
10/13/2005US20050226376 Dual-band detector system for x-ray imaging of biological samples
10/13/2005US20050226375 Enhanced X-ray imaging system and method
10/13/2005US20050226373 Portable x-ray fluorescence using machine source
10/13/2005US20050226372 X-ray image magnifying device
10/13/2005US20050226371 Stationary Tomographic Mammography System
10/13/2005US20050226370 Method and system for imaging a volume using a three-dimensional spiral scan trajectory
10/13/2005US20050226369 Digital x-ray tomosynthesis system
10/13/2005US20050226368 Arrangement and method for obtaining imaging data
10/13/2005US20050226367 Arrangement and method for obtaining tomosynthesis data
10/13/2005US20050226366 Method, system and storage medium for reference normalization for blocked reference channels
10/13/2005US20050226365 Radius-in-image dependent detector row filtering for windmill artifact reduction
10/13/2005US20050226363 Stationary computed tomography system and method
10/13/2005US20050226362 Ray-by-ray fourier image reconstruction from projections
10/13/2005US20050226361 Computed tomography scanning system and method using a field emission x-ray source
10/13/2005US20050226360 System and method for detecting objects with differential operators
10/13/2005US20050225756 Fluorescent sensor on basis of multichannel structures
10/13/2005US20050225004 Identifiable structures and systems and methods for forming the same in a solid freeform fabrication system
10/13/2005DE102005008068A1 Verfahren zum Analysieren eines Metallelementes auf einem Wafer A method for analyzing a metal element on a wafer
10/13/2005DE102004014445A1 Sekundärkollimator für eine Röntgenstreuvorrichtung sowie Röntgenstreuvorrichtung Secondary collimator for an X-ray scattering device and X-ray scattering device
10/13/2005DE102004010226A1 Crystal backscattered electron pattern processing improvement procedure for crystallography uses electron lens or mirror to magnify divergence of scattered paths
10/12/2005EP1584916A1 Fluorescent sensor comprising a plurality of capillaries and microspheres placed in said capillaries
10/12/2005EP1583985A1 Radiation detector with shielded electronics for computed tomography
10/12/2005EP1051609B1 Gated transmission and scatter detection for x-ray imaging
10/12/2005CN2733414Y Quasi-aplanatic atomic beam holographic interferometer for measuring phase change
10/12/2005CN1680809A Fluorescent sensor based on multi-channel structure
10/12/2005CN1680808A Method for taking computed tomography scans with the aid of a CT unit, and a CT unit
10/12/2005CN1679447A Computerized tomography X ray scanner with aperture diaphram
10/12/2005CN1222246C Multi-layered scintillators for computed tomograph systems
10/11/2005US6954514 X-ray detector provided with a heating device
10/11/2005US6953939 Testing apparatus using scanning electron microscope
10/11/2005US6953755 Technique for monitoring the state of metal lines in microstructures
10/11/2005US6953694 Screening sample for signal from preferential chemical intermediates; obtain sample, monitor surface of liquid for signal, detect signal
10/11/2005CA2300166C Apparatus and method for in-situ thickness and stoichiometry measurement of thin films
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