Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/1998
08/06/1998DE19705044A1 Method for measuring profile depth of profiled bodies
08/06/1998DE19703741A1 Method for absolute optical measurement of shapes of objects
08/06/1998DE19703735A1 Element with varying length
08/06/1998DE19703382A1 Flat bed scanner and method for recording original, using scanner
08/06/1998DE19703332A1 Adjustment system for welding torches
08/06/1998DE19702851C1 Inspecting or testing open but not fully visible, i.e. partially enclosed, hollow space
08/06/1998DE19508052C2 Verfahren und Einrichtung zur Ebenflächigkeitsmessung von sich kontinuierlich bewegenden endlichen Materialoberflächen Method and apparatus for Ebenflächigkeitsmessung of continuously moving finite material surfaces
08/06/1998CA2228605A1 Method for measuring epitaxial film thickness of multilayer epitaxial wafer
08/05/1998EP0856402A1 Image position error detection technique
08/05/1998EP0734305B1 Method for adjusting reamers and similar equipment
08/05/1998EP0566657B1 Simultaneous multiple angle/multiple wavelength ellipsometer and method
08/05/1998CN2287294Y Large range automatic calibertape with raster digital display
08/05/1998CN1189607A Atomic raster measuring method having 0.01 namometer resolution ratio
08/04/1998US5790713 Three-dimensional computer graphics image generator
08/04/1998US5790702 High speed pattern recognition system
08/04/1998US5790687 Method and apparatus for the optical determination of the orientation of a garment workpiece
08/04/1998US5790256 Method of diagnosing/monitoring medical problems in humans
08/04/1998US5790255 Position sensitive detector
08/04/1998US5790253 Method and apparatus for correcting linearity errors of a moving mirror and stage
08/04/1998US5790243 Highway profile measuring system
08/04/1998US5789756 Apparatus for measuring the flying height and orientation of a magnetic head relative to transparent medium based on frustrated total internal reflection
08/04/1998US5789739 Optical detection device for determining the position of an indicator medium
08/04/1998US5789668 Apparatus and related methods for obtaining tire profiles including the tread and both sidewalls
08/04/1998US5787595 Method and apparatus for controlling flatness of polished semiconductor wafer
08/04/1998CA2043020C Device for and method of measurement of an angle of incidence of a luminous beam
07/1998
07/30/1998WO1998033103A1 Method and device for docking an autonomous mobile unit
07/30/1998WO1998033088A1 Method for marking an object made of translucent synthetic material, in particular an ophthalmic lens, marked object and corresponding reader
07/30/1998WO1998033077A2 Coatings, methods and apparatus for reducing reflection from optical substrates
07/30/1998WO1998033039A1 Electro-optical measuring device for determining the relative position of two bodies, or of two surface areas of bodies, in relation to each other
07/30/1998WO1998033038A1 Device for detecting rail junctions
07/30/1998WO1997040342A3 Integrated system for imaging and modeling three-dimensional objects
07/30/1998DE4345448C2 Laser range finder, e.g. for driverless transport system
07/30/1998DE4345446C2 Laser range finder, e.g. for driverless transport system
07/30/1998DE4340756C2 Laserabstandsermittlungsvorrichtung Laser range finding apparatus
07/30/1998DE19803021A1 Pattern examination method for IC chips
07/30/1998CA2279425A1 Coatings, methods and apparatus for reducing reflection from optical substrates
07/29/1998EP0854874A1 Macrocyclic lactone compounds and their production process
07/29/1998CN1039364C Apparatus for monitoring trash in fiber sample
07/28/1998US5786931 For a photoelectric position measuring instrument
07/28/1998US5786897 Method and device for measuring pattern coordinates of a pattern formed on a pattern surface of a substrate
07/28/1998US5786896 Oblique incidence interferometer with fringe scan drive
07/28/1998US5786841 Single track of metering marks on thermal printer media
07/28/1998US5786751 System for monitoring alignment of wheels using a photoelectric sensor
07/28/1998US5786602 Method and apparatus for electro-optically determining the dimension, location and attitude of objects
07/28/1998US5786533 For determining a depth of a separation in the material
07/28/1998US5785651 Distance measuring confocal microscope
07/28/1998CA2077813C Apparatus and method for spot position control in an output device employing a linear array of light sources
07/23/1998WO1998032165A1 Method for controlling the temperature of a growing semiconductor layer
07/23/1998WO1998031984A1 Thickness measuring apparatus
07/23/1998WO1998031979A1 Device for determining the point of impact of darts on a practice target
07/23/1998DE19701781A1 Point of incidence determination device for darts on dartboard
07/23/1998DE19701405A1 In-flight monitoring system for composite fibre aircraft structures
07/22/1998EP0854368A2 Light sensor with signal evaluation based on time of flight of light
07/22/1998EP0853798A1 Method of producing a three-dimensional image from two-dimensional images
07/22/1998EP0853752A1 Device for ascertaining misalignments of two shafts arranged one behind the other
07/22/1998EP0853751A2 Position detection system for an object with at least five degrees of freedom
07/22/1998EP0741857A4 Optical motion sensor
07/22/1998EP0700269A4 System for locating relative positions of objects
07/21/1998US5784352 Apparatus and method for accessing data on multilayered optical media
07/21/1998US5784282 Method and apparatus for identifying the position in three dimensions of a movable object such as a sensor or a tool carried by a robot
07/21/1998US5784168 Position detection system for an object with at least five degrees of freedom
07/21/1998US5784167 Method of measuring thickness of a multi-layers film
07/21/1998US5784166 In a precision motion system
07/21/1998US5784164 Method and apparatus for automatically and simultaneously determining best focus and orientation of objects to be measured by broad-band interferometric means
07/21/1998US5784163 Optical differential profile measurement apparatus and process
07/21/1998US5784162 Spectral bio-imaging methods for biological research, medical diagnostics and therapy
07/21/1998US5784160 Non-contact interferometric sizing of stochastic particles
07/21/1998US5784098 Apparatus for measuring three-dimensional configurations
07/21/1998US5783752 Diffuse surface interference position sensor
07/21/1998US5783342 Method and system for measurement of resist pattern
07/16/1998WO1998030977A1 Method and arrangement for determining the position of an object
07/16/1998WO1998030866A1 Optical profilometer combined with stylus probe measurement device
07/16/1998DE19735358A1 Alignment correction method
07/16/1998DE19654318A1 Verfahren und Vorrichtung zum Messen und Prüfen von Werkstücken Method and apparatus for measuring and testing of workpieces
07/15/1998EP0853251A2 Microprobe chip for detecting evanescent waves and method for making the same, probe provided with the microprobe chip and method for making the same, and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip
07/15/1998EP0852775A1 Mail handling process and device
07/15/1998EP0852732A1 Method and apparatus for determining position and orientation
07/15/1998EP0852696A1 Device and method for checking the geometry of a hole bored in a part
07/15/1998CN1039157C Microcomputerized interference cloud testing instrument
07/14/1998US5781656 Method and apparatus for inspecting patterns composed of reticle data
07/14/1998US5781655 Strand dimension sensing
07/14/1998US5781450 Object inspection system and method
07/14/1998US5781303 Method for determining the thickness of an optical sample
07/14/1998US5781302 Non-contact shape meter for flatness measurements
07/14/1998US5781299 Determining the complex refractive index phase offset in interferometric flying height testing
07/14/1998US5781297 Mixed frequency and amplitude modulated fiber optic heterodyne interferometer for distance measurement
07/14/1998US5781286 Method and apparatus for measurement of axle and wheel positions of motor vehicles
07/14/1998US5781282 Distance measurement device
07/14/1998US5781269 Distance measuring method and distance sensor
07/14/1998US5781224 Device for producing a screen printing stencil
07/14/1998US5780866 Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection
07/14/1998US5780865 Apparatus for detecting images of particulates in liquid
07/14/1998US5779142 Method for achieving a specific temperature behavior of adjusting elements operating in dependence on temperature and an adjusting element operating in dependence on temperature
07/14/1998US5778548 Viewing device and method for three-dimensional noncontacting measurements
07/14/1998CA2130429C Optical sensor displacement monitor
07/09/1998WO1998029709A1 Process for optical measurement of the thickness of an adhesive layer, an optical data-storing disc, its manufacturing and also an adhesive and its use
07/09/1998WO1998029708A1 Depth-from-defocus optical apparatus with invariance to surface reflectance properties
07/07/1998US5778016 Scanning temporal ultrafast delay methods and apparatuses therefor
07/07/1998US5777746 Apparatus and method for dimensional weighing utilizing a mirror and/or prism
07/07/1998US5777745 Method and apparatus for compensating for noise generated by fluctuation of a medium around an object to be measured
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