| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/07/1998 | US5777740 Combined interferometer/polarimeter |
| 07/07/1998 | US5777739 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers |
| 07/07/1998 | US5777738 Interferometric measurement of absolute dimensions of cylindrical surfaces at grazing incidence |
| 07/07/1998 | US5777731 Calibration of optical properties to measure depth of a liquid |
| 07/07/1998 | US5777730 Systems, methods and apparatus for inspecting stator cores |
| 07/07/1998 | US5777244 Method for inspecting the outer appearance of a golf ball and illuminating means used therefor |
| 07/07/1998 | US5777219 Apparatus and related methods for automatically testing and analyzing tires utilizing a test pod with a slidably movable cover plate and a gray scale normalization technique |
| 07/07/1998 | US5776064 Frameless stereotaxy system for indicating the position and axis of a surgical probe |
| 07/02/1998 | WO1998028710A1 Image segmentation method |
| 07/02/1998 | WO1998028661A2 Optical height meter, surface-inspection device provided with such a height meter, and lithographic apparatus provided with the inspection device |
| 07/02/1998 | WO1998028632A1 Method and device to measure and check workpieces |
| 07/02/1998 | WO1998028595A1 Method and device for wheel alignment |
| 07/02/1998 | WO1998028594A1 Device and method for measuring the orientation of a surface |
| 07/02/1998 | WO1998028593A1 Apparatus and method for rapid 3d image parametrization |
| 07/02/1998 | WO1998028591A1 Non-contacting torque sensor and displacement measuring apparatus and method |
| 07/02/1998 | DE19757716A1 Optical displacement measuring device |
| 07/02/1998 | DE19756883A1 Optical position sensor with linearity correction circuit |
| 07/02/1998 | DE19725159C1 Measurement apparatus for detecting and measuring components of spectacles |
| 07/02/1998 | DE19721903C1 Spatial three dimensional position detection method of surface points using scanner and electronic scanner |
| 07/02/1998 | DE19651737A1 Degree of inclination measuring apparatus for objective lens of optical pick-up |
| 07/02/1998 | CA2275411A1 Apparatus and method for rapid 3d image parametrization |
| 07/01/1998 | EP0851303A2 Moving interferometer wafer stage |
| 07/01/1998 | EP0851211A1 Optical distance measuring apparatus |
| 07/01/1998 | EP0851210A2 Non-contact type of strain meter |
| 07/01/1998 | EP0851209A1 Process and apparatus for measuring the volume of an object by means of a laser scanner |
| 07/01/1998 | EP0851208A1 Process for measuring the volume of an object by means of a laser scanner and apparatus capable of performing said process |
| 07/01/1998 | EP0851207A1 Process and apparatus for measuring the volume of an object by means of a laser scanner and a CCD detector |
| 07/01/1998 | EP0851206A1 Process and apparatus for measuring the volume of an object |
| 07/01/1998 | EP0850397A1 Methods for detecting striae |
| 07/01/1998 | EP0850330A1 Nonwoven sheet products made from plexifilamentary film fibril webs |
| 07/01/1998 | CN2285463Y Grating rule stroke-sensor |
| 06/30/1998 | US5774574 Pattern defect detection apparatus |
| 06/30/1998 | US5774568 Method of testing a surface non-destructively in particular in a hostile environment |
| 06/30/1998 | US5774220 Continuous contactless measurement of profiles and apparatus for carrying out the measurement process |
| 06/30/1998 | US5774219 Reflection-type optical encoder with light receiving array |
| 06/30/1998 | US5774218 Laser Doppler velocimeter with electro-optical crystal |
| 06/30/1998 | US5774210 Perpendicularity measuring method and an apparatus thereof |
| 06/30/1998 | US5774208 Coaxial electro-optical distance meter |
| 06/30/1998 | US5774207 Light scanner |
| 06/30/1998 | US5774074 Multi-track position encoder system |
| 06/30/1998 | US5773840 Method & apparatus for electro optically determining the dimension, location & attitude of objects |
| 06/30/1998 | US5773820 For an optoelectronic sensor |
| 06/30/1998 | US5773813 Angular position finding system for an observation instrument |
| 06/30/1998 | US5773180 Semiconductor wafers |
| 06/30/1998 | US5773173 Color filter with pictures for light, detetion and evaluation |
| 06/30/1998 | US5771978 Grading implement elevation controller with tracking station and reference laser beam |
| 06/24/1998 | EP0849567A2 Light-electrical position measuring device |
| 06/24/1998 | CN2284609Y Electronic vision protector |
| 06/24/1998 | CN1185580A Instrument for multistage measurement of basementrock's deformation |
| 06/23/1998 | US5771309 Method for measuring position of hole |
| 06/23/1998 | US5771100 Method of measuring dimension of mold or mold-associated component by laser measuring instrument |
| 06/23/1998 | US5771099 Optical device for determining the location of a reflective target |
| 06/23/1998 | US5771091 Sensor and a method for measuring distances to, and/or physical properties of, a medium |
| 06/23/1998 | US5771068 Apparatus and method for display panel inspection |
| 06/23/1998 | US5770864 Apparatus and method for dimensional weighing utilizing a laser scanner or sensor |
| 06/23/1998 | US5770856 Near field sensor with cantilever and tip containing optical path for an evanescent wave |
| 06/23/1998 | US5770855 Microscopic electromagnetic radiation transmitter or detector |
| 06/23/1998 | US5770155 Composite structure resin cure monitoring apparatus using an optical fiber grating sensor |
| 06/23/1998 | US5769540 Non-contact optical techniques for measuring surface conditions |
| 06/23/1998 | US5768759 Method and apparatus for reflective in-flight component registration |
| 06/23/1998 | CA2224925A1 Moving interferometer wafer stage |
| 06/18/1998 | WO1998026278A1 Method and devices for checking container glass |
| 06/18/1998 | DE19651924A1 Behälterglasprüfverfahren und -vorrichtungen Container glass test methods and devices |
| 06/17/1998 | EP0848245A2 Method and apparatus for measuring the height of an object |
| 06/17/1998 | EP0847838A2 Product scanner |
| 06/17/1998 | EP0847543A1 Dark field, photon tunneling imaging systems and methods |
| 06/17/1998 | EP0576610B1 Measuring method and apparatus |
| 06/17/1998 | CN2284378Y Photoelectric measuring meter for large shaft bending |
| 06/17/1998 | CN1038781C High precision large aperture phase-shifting digital planaer interferometer |
| 06/16/1998 | US5768401 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged |
| 06/16/1998 | US5768154 Method and apparatus for measuring the width of metal strip |
| 06/16/1998 | US5768150 Device and method for measuring a characteristic of an optical element |
| 06/16/1998 | US5767975 Method and device for detecting the position for a crease line of a packaging web |
| 06/16/1998 | US5767973 Wheelset sensing system |
| 06/16/1998 | US5767972 Method and apparatus for providing data age compensation in an interferometer |
| 06/16/1998 | US5767962 Inspection system and device manufacturing method using the same |
| 06/16/1998 | US5767960 Optical 6D measurement system with three fan-shaped beams rotating around one axis |
| 06/16/1998 | US5767953 Light beam range finder |
| 06/16/1998 | US5767525 Method and apparatus for electro-optically determining the dimension, location and attitude of objects |
| 06/16/1998 | US5767523 Multiple detector alignment system for photolithography |
| 06/16/1998 | US5767380 Measuring arrangement and method for checking the geometric and dynamic accuracy of two machine elements displaceable with respect to one another |
| 06/11/1998 | WO1998025171A1 Polyfocal representation of the surface profile of any given object |
| 06/11/1998 | WO1998025131A1 Wafer inspection system for distinguishing pits and particles |
| 06/11/1998 | WO1998025106A1 Wheel alignment system |
| 06/11/1998 | WO1998025105A1 A system and method for performing selected optical measurements |
| 06/11/1998 | WO1998025104A1 Method and device for determining deformations and elongations in curved forms |
| 06/11/1998 | WO1998025103A1 Interferometric measurement of positions, position changes and physical quantities derivated therefrom |
| 06/10/1998 | EP0846944A1 Device assembly for measuring geometric quantities of frames of cycles or motorcycles |
| 06/10/1998 | EP0846932A2 Scanning near-field optic/atomic force microscope |
| 06/10/1998 | EP0846249A1 Device and process for measuring two opposite surfaces of a body |
| 06/10/1998 | EP0846248A1 High bandwith, dynamically rigid metrology system for the measurement and control of intelligent manufacturing processes |
| 06/10/1998 | DE19650876A1 Measuring device for material surface esp. for soft, elastic material, e.g. plastics |
| 06/10/1998 | DE19650705A1 Contactless imaging method of radiometric or geometric properties of object or material for optical inspection of products |
| 06/10/1998 | DE19650703A1 Verfahren zum interferometrischen Messen von Positionen, Positionsänderungen und daraus abgeleiteter physikalischer Größen Interferometric method for measuring positions, position changes and derived physical quantities |
| 06/10/1998 | DE19650690A1 Code ruler or code disk arrangement for optical position sensor |
| 06/10/1998 | DE19650629A1 Vehicle tilt measurement, especially for motor vehicle |
| 06/10/1998 | DE19650391A1 Anordnung und Verfahren zur simultanen polyfokalen Abbildung des Oberflächenprofils beliebiger Objekte Apparatus and method for simultaneous polyfocal illustration of the surface profile of any objects |
| 06/10/1998 | DE19650325A1 Verfahren und Vorrichtung zur Ermittlung von Verformungen und Dehnungen an gekrümmten Körpern Method and device for determining deformation and strain of the curved bodies |
| 06/10/1998 | CN2283831Y Gate fibre-optical open-extent instrument |
| 06/10/1998 | CN2283830Y Projector for measuring impact test piece |