Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/1998
11/24/1998US5841149 Method of determining the distance of a feature on an object from a microscope, and a device for carrying out the method
11/24/1998US5841138 Method of an apparatus for nondestructuve workpiece testing
11/24/1998US5841134 Photo-electric distance- and angle-measurement system for measuring the displacement of two objects with respect to each other
11/24/1998US5841130 System for monitoring strain in concrete structures
11/24/1998US5841129 Device for optical scanning of objects on a scanning surface and process for operating it
11/24/1998US5841127 Position sensor
11/24/1998US5840595 Calibration of semiconductor pattern inspection device and a fabrication process of a semiconductor device using such an inspection device
11/24/1998CA2145018C Scanning near-field optic/atomic force microscope
11/24/1998CA2047288C Apparatus and method for angle measurement
11/19/1998WO1998052025A1 Surface inspection instrument and surface inspection method
11/19/1998WO1998052021A1 Grating based phase control optical delay line
11/19/1998WO1998051993A1 Height-measuring device
11/19/1998DE19721043A1 Optical characteristic and material layer thickness determination method
11/19/1998DE19720821A1 Calibration standard for optical measuring sensor
11/19/1998DE19720514A1 Device to measure surface roughness and inhomogeneities in transparent optical media layers
11/18/1998EP0878705A1 Container sealing surface area inspection
11/18/1998EP0878690A2 Active reflex optical range finder
11/18/1998EP0877914A1 Scanning phase measuring method and system for an object at a vision station
11/18/1998EP0701686B1 Simultaneous determination of layer thickness and substrate temperature during coating
11/18/1998CN1199459A Position detection system for object with at least five degrees of freedow
11/18/1998CN1198966A Optoelectronic classification apparatus
11/17/1998US5839085 System and method for detecting vehicle types by utilizing information of vehicle height, and debiting system utilizing this system and method
11/17/1998US5838485 Superheterodyne interferometer and method for compensating the refractive index of air using electronic frequency multiplication
11/17/1998US5838450 Direct reticle to wafer alignment using fluorescence for integrated circuit lithography
11/17/1998US5838448 CMP variable angle in situ sensor
11/17/1998US5838447 Polishing apparatus including thickness or flatness detector
11/17/1998US5838442 Device for determining the shape of the wave surface reflected by a substantially plane component
11/17/1998US5838434 For calibration of semiconductor package outlines
11/17/1998US5838432 Optical Angle detection apparatus
11/17/1998US5838430 Dual beam laser device for linear and planar alignment
11/17/1998US5837892 Method and apparatus for measuring the size of drops of a viscous material dispensed from a dispensing system
11/12/1998WO1998050885A2 Method and apparatus for performing global image alignment using any local match measure
11/12/1998WO1998050827A2 Multi-color laser projector for optical layup template and the like
11/12/1998WO1998050779A1 Surface analysis using gaussian beam profiles
11/12/1998WO1998050758A1 Easy toe adjustment
11/12/1998WO1998050757A2 Three dimensional inspection system
11/12/1998WO1998050756A1 Method and apparatus for high speed measurement of oilfield tubular diameter and ovality
11/12/1998CA2288880A1 Surface analysis using gaussian beam profiles
11/11/1998EP0877231A1 Device for non-contact measuring of positon and displacement
11/11/1998EP0877225A2 Optical surface measurement apparatus and methods
11/11/1998EP0876851A1 Optoelectronic grading device
11/11/1998EP0876586A1 Quadrant light detector
11/11/1998EP0876584A1 System for measuring surface flatness using shadow moire technology
11/11/1998EP0876583A1 Radiant energy transducing apparatus with constructive occlusion
11/11/1998EP0760622B1 Digitised sensing process and arrangement for the three-dimensional shape in space of bodies or body parts
11/11/1998EP0748182A4 Device and method for mapping objects
11/11/1998EP0746756A4 Methods and apparatus for determining a first parameter(s) of an object
11/11/1998EP0648324B1 Method and apparatus of stud array upstand setting
11/11/1998CN1198377A Equipment for making film by stretching and double refraction test method
11/10/1998US5835623 Method of and apparatus for distinguishing one workpiece from another workpiece and detecting workpiece position
11/10/1998US5835622 Method and apparatus to locate and measure capillary indentation marks on wire bonded leads
11/10/1998US5835251 Scanner system
11/10/1998US5835226 Method for determining optical constants prior to film processing to be used improve accuracy of post-processing thickness measurements
11/10/1998US5835224 To measure displacement in a direction of a movable object
11/10/1998US5835223 System for measuring surface flatness using shadow moire technology
11/10/1998US5835221 Process for fabricating a device using polarized light to determine film thickness
11/10/1998US5835219 Device for determining the shape of the wave surface transmitted by a substantially parallel-faced transparent component
11/10/1998US5835218 For measuring the shape of a contoured surface
11/10/1998US5835213 Triple modulation experiment for a fourier transform spectrometer
11/10/1998US5835209 Relative-angle detection apparatus
11/10/1998US5835208 Apparatus to measure wedge and centering error in optical elements
11/10/1998US5835190 Ophthalmologic curvature measuring device and method to conjointly measure a central and peripheral portion of a curved surface
11/10/1998US5834767 For detecting a surface position of an object
11/10/1998US5834644 Automatic atomic force microscope with piezotube scanner
11/10/1998US5832617 On a steerable vehicle wheel
11/05/1998WO1998049538A1 Monitoring of minimum features on a substrate
11/05/1998WO1998049522A1 Method and apparatus for imaging an object by diffractive autofocus
11/05/1998WO1998049521A1 Equipment for inspecting semiconductor devices
11/05/1998DE19818076A1 Non-contact determination of object surface in measuring chamber
11/05/1998DE19718494A1 Non-contact measurement of object having complex surface, such as gear
11/04/1998EP0875873A1 Opto-electronic sensor
11/04/1998EP0875785A2 Image display apparatus
11/04/1998EP0875771A2 Opto-electronic sensor with multiple photosensitive elements arranged in a row or array
11/04/1998EP0875644A2 A device for the automatic handling of an auto vehicle in a tower parking lot and a handling process concerning said device
11/04/1998EP0875359A2 Oriented film producing facility and birefringence measuring method
11/04/1998EP0875044A1 Edge sensing
11/04/1998EP0874950A2 Device for monitoring radial gaps between a turbine housing and blade tips
11/04/1998EP0763187A4 Pipe alignment apparatus and method using green light
11/04/1998EP0722285A4 Processing of keratoscopic images using local spatial phase
11/04/1998EP0695414B1 Method for measuring the thickness of a transparent material
11/04/1998CN2296517Y Laser measuring hammer
11/04/1998CN1198230A Apparatus and method for recreating and mainpulating 3D ojbect based on 2D projection thereof
11/03/1998US5832116 Method of extracting two edges of a road by active contour propagation
11/03/1998US5832107 Optical system for stereoscopically measuring feature heights based on lateral image offsets
11/03/1998US5831854 Method and device for supporting the repair of defective substrates
11/03/1998US5831762 Imaging sensor having multiple fields of view and utilizing all-reflective optics
11/03/1998US5831741 Method and apparatus for detecting holes in copy media
11/03/1998US5831737 In motion dimensioning system for cuboidal objects
11/03/1998US5831736 Method and apparatus for generating a three-dimensional topographical image of a microscopic specimen
11/03/1998US5831735 Non-contact optical measurement probe
11/03/1998US5831733 Apparatus and methods for measuring gaps while compensating for birefringence effects in the measurement path
11/03/1998US5831719 Laser scanning system
11/03/1998US5831621 Positional space solution to the next best view problem
11/03/1998US5831262 Article comprising an optical fiber attached to a micromechanical device
10/1998
10/29/1998WO1998048252A1 Laser detection of material thickness
10/29/1998WO1998048242A1 Method and device for measuring three-dimensional shapes
10/29/1998WO1998048241A1 Device and method for determining the position of a point
10/29/1998WO1998047348A1 Apparatus and method for recognising and determining the position of a part of an animal
10/29/1998WO1998035203A3 Method and apparatus for performing optical measurements using a rapidly frequency-tuned laser
10/29/1998DE19818032A1 Measuring inner diameter of hole in object using circular beam formed from light source
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