Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/1998
09/08/1998US5805284 Optically verified glide
09/08/1998US5805275 Scanning optical rangefinder
09/08/1998US5804816 Position transducer having optical beam generator for covering wide detectable range
09/08/1998US5803606 Surface photothermic testing device
09/08/1998US5802973 Device for register adjustment on a sheet-fed printing press
09/03/1998WO1998038691A1 Method and device for adjusting a distance sensor
09/03/1998WO1998038498A1 Inspection method
09/03/1998WO1998038492A1 Inspection system
09/03/1998DE19708448A1 Wavefront recording arrangement
09/03/1998DE19707937A1 Workpiece surface testing method for parallel, flat parts
09/03/1998DE19707926A1 Imaging micro ellipsometer
09/03/1998DE19707590A1 Verfahren und Vorrichtung zur Justierung eines Entfernungssensors Method and apparatus for adjusting a distance sensor
09/03/1998CA2282498A1 Inspection method
09/02/1998EP0862225A2 Transparent light beam detectors
09/02/1998EP0862053A2 Method and device for investigating the mechanical properties of work-pieces
09/02/1998EP0862045A2 Atomic force microscope with optional replaceable fluid cell.
09/02/1998EP0861418A1 Method for measurement of distance of optoelectronic type and devices for the implementation of said method
09/02/1998EP0861415A2 Computer stereo vision system and method
09/02/1998EP0782736A4 Method and apparatus for image plane modulation pattern recognition
09/02/1998EP0734518B1 Surface photothermic testing device
09/02/1998EP0713593A4 Method and apparatus for ball bond inspection system
09/02/1998CN1192316A Stereoscopic autofocusing, rangefinding and videometry
09/02/1998CN1191967A Apparatus and method for surface inspection
09/01/1998US5802206 Method for determining edge positions
09/01/1998US5801966 Machine vision methods and articles of manufacture for determination of convex hull and convex hull angle
09/01/1998US5801965 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices
09/01/1998US5801835 Surface position detection apparatus and method
09/01/1998US5801834 Vehicle straightener measuring unit, measuring apparatus reliant on reflected beam(s), and source, targets and method
09/01/1998US5801818 Measuring system
09/01/1998US5801817 Method and apparatus for eliminating the effects of varying sample distance on optical measurements
09/01/1998US5801763 Face image taking device
09/01/1998US5801762 Digitally measuring scopes using a high resolution encoder
09/01/1998US5801667 Vehicle display which reduces driver's recognition time of alarm display
09/01/1998US5801378 Optical encoder diffraction gratings for eliminating diffracted light components
09/01/1998US5801066 Method and apparatus for measuring a change in the thickness of polishing pads used in chemical-mechanical planarization of semiconductor wafers
09/01/1998US5800615 Flat line powder coating system
08/1998
08/27/1998WO1998037434A1 Optoelectronic system for detecting space coordinates of an object
08/27/1998WO1998037404A1 Method of scanning semiconductor wafers to inspect for defects
08/27/1998WO1998037379A1 Diffuse surface interference position sensor
08/27/1998DE19708467A1 Hand-held device for indirect measurement of concealed object- and reference points
08/26/1998EP0860726A1 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe
08/26/1998EP0860084A1 Flexible disk mode observer
08/26/1998EP0859941A1 Target for laser leveling systems
08/26/1998EP0174939B2 Panel surface flaw inspection
08/26/1998CN1039603C High-resolution compact three-dimensional shape optical sensor
08/25/1998US5798925 Method and apparatus for monitoring a moving strip
08/25/1998US5798837 Thin film optical measurement system and method with calibrating ellipsometer
08/25/1998US5798836 Optical distance measuring apparatus and method therefor
08/25/1998US5798828 Laser aligned five-axis position measurement device
08/25/1998US5798826 Optical displacement sensor
08/25/1998US5798521 Apparatus and method for measuring strain in bragg gratings
08/25/1998US5797191 Parallel kinematic structure for spatial positioning devices and method of initializing same
08/20/1998WO1998036240A1 Method and device for measuring and quantifying surface defects on a test surface
08/20/1998WO1998036239A1 Method and system for determining tilt of a disk
08/20/1998WO1998036238A1 Outdoor range finder
08/20/1998DE19805794A1 Fast planar segmenting of displacement image data for a robot system
08/20/1998DE19705769A1 Monitoring device for radial and axial clearance between blades and housing of turbo engine
08/20/1998CA2281551A1 Outdoor range finder
08/19/1998EP0859406A2 Permanently mounted reference sample for a substrate measurement tool
08/19/1998EP0859215A1 Photoelectric displacement detector
08/19/1998EP0858640A1 Teat location for milking
08/19/1998EP0858638A1 Astigmatism measurement apparatus and method
08/19/1998EP0823037A4 Method and system for triangulation-based, 3-d imaging utilizing an angled scanning beam of radiant energy
08/19/1998EP0772844B1 Drums for use in a remotely controlled environment
08/19/1998CN1190793A Method and device for checking IC device shell pin
08/19/1998CN1190791A Method and apparatus for controlling flatness of polished semiconductor wafer
08/19/1998CN1190780A Method for determining encentric position and quality of fixed axle rotation magnetic head unit and apparatus thereof
08/18/1998US5796859 Process of operating a stored program controlled apparatus
08/18/1998US5796856 Gap measuring apparatus and method
08/18/1998US5796488 Optical target alignment and technique
08/18/1998US5796487 Dark field, photon tunneling imaging systems and methods for optical recording and retrieval
08/18/1998US5796485 Method and device for the measurement of off-center rotating components
08/18/1998US5796484 System for detecting unevenness degree of surface of semiconductor device
08/18/1998US5796483 Method and apparatus for position sensing
08/18/1998US5796052 Telescopic conveyor for conveying and measuring articles
08/18/1998CA2197810A1 Computer-assisted measurement of linear board feet
08/13/1998WO1998035204A1 Background compensation for confocal interference microscopy
08/13/1998WO1998035203A2 Method and apparatus for performing optical measurements using a rapidly frequency-tuned laser
08/13/1998WO1998034760A1 Method and apparatus for cleaning workpiece surfaces and monitoring probes during workpiece processing
08/13/1998WO1998028661A3 Optical height meter, surface-inspection device provided with such a height meter, and lithographic apparatus provided with the inspection device
08/13/1998DE19803938A1 Method of determining shape of tree trunks
08/13/1998DE19707330A1 Converter for meter readings
08/12/1998EP0858055A2 Device for measuring postal items
08/12/1998EP0857980A1 Range finder
08/12/1998EP0857944A1 Vibration detection and control system for printers
08/12/1998EP0857943A2 Method for measuring epitaxial film thickness of multilayer epitaxial wafer
08/12/1998EP0857336A1 Method and apparatus for identifying characters on a plurality of silicon wafers
08/12/1998EP0857293A1 Optical encoder for indicating the position of an adjustable member
08/12/1998EP0857291A1 Strain gauge
08/12/1998EP0857032A1 Device for the topographical measurement of a surface
08/11/1998US5793493 System for maintaining the cutting condition of double ground knife blades
08/11/1998US5793492 Wheel profile sensor
08/11/1998US5793488 Interferometer with compound optics for measuring cylindrical objects at oblique incidence
08/11/1998US5793483 Optical measurement system
08/11/1998US5793479 Thin-film formation device and method
08/11/1998US5793468 Automated hand-held keratometer
08/06/1998WO1998034098A1 Analytical method and apparatus
08/06/1998WO1998034090A1 Method and device for measuring the pattern depth on a tyre
08/06/1998DE3990155C1 Electronically-adjustable measuring compass
08/06/1998DE19705047A1 Detailed tyre tread depth measurement and recording using laser beam illumination
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