| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/14/2005 | WO2005064273A1 Laser scanner, and method for the optical scanning and measurement of a laser scanner environment |
| 07/14/2005 | WO2005062826A2 Method and apparatus for absolute metrology |
| 07/14/2005 | WO2004113985A3 Laser line generating device with swivel base and laser level |
| 07/14/2005 | US20050154548 Method for calibration of a 3D measuring device |
| 07/14/2005 | US20050152229 Method and apparatus for optically reading information attached to a target |
| 07/14/2005 | US20050151980 Dimension measurement method, method of manufacturing semiconductor device, dimension measurement apparatus and measurement mark |
| 07/14/2005 | US20050151979 Optical measuring device and optical measuring method |
| 07/14/2005 | US20050151978 Non-contact surface configuration measuring apparatus and method thereof |
| 07/14/2005 | US20050151977 Thickness measurement of moving webs and seal integrity system using dual interferometer |
| 07/14/2005 | US20050151975 Fabry-perot fiber optic sensing device and method |
| 07/14/2005 | US20050151970 Automated material handling laser alignment tool |
| 07/14/2005 | US20050151962 Measurement of optical properties of radiation sensitive materials |
| 07/14/2005 | US20050151863 Arrangement in a measuring system |
| 07/14/2005 | US20050151771 Detecting location of edge of media sheet |
| 07/14/2005 | US20050151070 Rotation angle transmitter and method of scanning a code disc of a rotation angle transmitter |
| 07/14/2005 | US20050150288 Measuring device |
| 07/14/2005 | DE202005007089U1 Sensor arrangement for optically detecting the edges of a product, e.g. to measure its width, comprises point light sources and a optical fiber arrangement that detects light reflected back from the product under-surface |
| 07/14/2005 | DE202005006593U1 Alignment aid for an optical sensor system, e.g. for setting up optical barriers or for use with laser measurement systems, provides a three-stage acoustic output indicating the deviation of the alignment from the optimum |
| 07/14/2005 | DE19738900B4 Interferometrische Meßvorrichtung zur Formvermessung an rauhen Oberflächen Interferometric measurement device for shape measurement on rough surfaces |
| 07/14/2005 | DE10358544A1 Fast three dimensional object shape recording procedure uses projected stripe intersections with coordinate calculation by forward projection and line approximation |
| 07/14/2005 | DE10350716B3 Verfahren zur Messung des Füllstandes einer Flüssigkeit in einem Hohlraum mit sub-mm breiter Öffnung A method for measuring the level of a liquid in a cavity with sub-mm wide opening |
| 07/14/2005 | DE102004061842A1 Markerless augmented reality mobile object tracking procedure uses camera with client server radio link to receive instructions and return only necessary data |
| 07/14/2005 | CA2550658A1 Method and apparatus for determining absolute position of a tip of an elongate object on a plane surface with invariant features |
| 07/13/2005 | EP1553672A1 Method for detecting projecting adherend and method for producing super plug using that method |
| 07/13/2005 | EP1553406A1 Method for double sided optical inspection of thin film disks or wafers |
| 07/13/2005 | EP1553405A2 Inspecting machine |
| 07/13/2005 | EP1553404A1 Method and apparatus for quality inspection |
| 07/13/2005 | EP1552946A2 Detecting location of edge of media sheet |
| 07/13/2005 | EP1552244A1 Method and apparatus for measuring strain using a luminescent photoelastic coating |
| 07/13/2005 | EP1552243A2 Common-path frequency-scanning interferometer |
| 07/13/2005 | EP1016038A4 Method and apparatus for performing global image alignment using any local match measure |
| 07/13/2005 | CN2709991Y Test device for precision mould |
| 07/13/2005 | CN2709934Y Measuring instrument rack |
| 07/13/2005 | CN2709933Y Digital shape and size measuring instrument |
| 07/13/2005 | CN2709932Y Automatic interpretoscope for shape size of gunpowder |
| 07/13/2005 | CN1639541A Dynamic artefact comparison |
| 07/13/2005 | CN1639540A Moire projecting 3D surface shape measuring method and equipment |
| 07/13/2005 | CN1637865A Method and apparatus for measuring slider mounting position in magnetic head, and magnetic head manufacturing system using the measurement apparatus |
| 07/13/2005 | CN1637772A Method and apparatus for optically reading information attached to a target |
| 07/13/2005 | CN1637434A Distance measurement sensor |
| 07/13/2005 | CN1210541C Method and device for evaluating tolerance in bearings or joints consisting of coupled components |
| 07/12/2005 | US6917720 Reference mark, method for recognizing reference marks and method for object measuring |
| 07/12/2005 | US6917702 Calibration of multiple cameras for a turntable-based 3D scanner |
| 07/12/2005 | US6917700 Method and apparatus for the determination of the contour of sheet metal blanks |
| 07/12/2005 | US6917421 Systems and methods for multi-dimensional inspection and/or metrology of a specimen |
| 07/12/2005 | US6917420 Rotational stage with vertical axis adjustment |
| 07/12/2005 | US6917418 Accuracy analyzing apparatus for machine tool |
| 07/12/2005 | US6916225 Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer |
| 07/12/2005 | US6915582 Alignment structure |
| 07/12/2005 | CA2485543A1 Wheel alignment gauge |
| 07/07/2005 | WO2005062103A1 Optical system with a cameras device for viewing several objects arranged remotely from each other |
| 07/07/2005 | WO2005062029A2 A tape manufacturing system |
| 07/07/2005 | WO2005061989A1 Optical imaging system |
| 07/07/2005 | WO2005061987A1 Measurement of metal polish quality |
| 07/07/2005 | WO2005061986A1 Optical measuring device for heterodyn interferometric surface measurements |
| 07/07/2005 | WO2005060823A1 Optical measuring system and optical measuring method |
| 07/07/2005 | WO2005022081A3 Manufacturing applications of stripe laser technology |
| 07/07/2005 | US20050147289 Method and instrument for measuring bead cutting shape of electric welded tube |
| 07/07/2005 | US20050147287 Method and apparatus for inspecting pattern defects |
| 07/07/2005 | US20050146729 Method and appratus for measurements of patterned structures |
| 07/07/2005 | US20050146728 In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
| 07/07/2005 | US20050146721 Method of measurement, method for providing alignment marks, and device manufacturing method |
| 07/07/2005 | US20050146718 Light-force sensor and method for measuring axial optical-trap forces from changes in light momentum along an optic axis |
| 07/07/2005 | US20050146714 Pattern inspection apparatus and method |
| 07/07/2005 | US20050146708 Systems and methods for deformation measurement |
| 07/07/2005 | US20050146707 Optical movement information detector and electronic equipment having same |
| 07/07/2005 | US20050146699 Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby |
| 07/07/2005 | US20050146605 Video surveillance system employing video primitives |
| 07/07/2005 | US20050145021 Method and apparatus for manipulating a sample |
| 07/07/2005 | US20050144799 Portable coordinate measurement machine |
| 07/07/2005 | DE4244240B4 Taststift Stylus |
| 07/07/2005 | DE19828592B4 Verfahren und Vorrichtung zum Vermessen eines aus einer Sprühdüse austretenden Sprühstrahls Method and apparatus for measuring a spray jet emanating from a spray nozzle |
| 07/07/2005 | DE10357062A1 Measuring tilt in e.g. analytical microsystem, employs structuring to cause characteristic alteration in incident beam which is picked up by sensitive detector |
| 07/07/2005 | DE10356832A1 Photoelectric measuring device for measuring e.g. distance between vehicles, has light source for forming beam flux having wavelength that is in predetermined local minimum of atmospheric spectral transmission factor |
| 07/07/2005 | DE10356765A1 Optische Messvorrichtung und optisches Messverfahren Optical measuring apparatus and optical measuring method |
| 07/07/2005 | DE10356519A1 Process to determine a geometric shape on a semiconductor layer surface irradiates with radiation to which the layer is transparent and analyses transmitted or reflected image |
| 07/07/2005 | DE10349230A1 Gerät zur interferometrischen Augenlängenmessung mit erhöhter Empfindlichkeit Device for interferometric eye length measurement with increased sensitivity |
| 07/07/2005 | DE10297676T5 Verfahren und Struktur zum Kalibrieren einer Messanlage auf Streumessungsbasis, die zum Messen von Abmessungen von Strukturelementen auf einem Halbleiterbauelement verwendet wird A method and structure for calibrating a measuring system based on scatter measurement, which is used for measurement of dimensions of structural elements on a semiconductor component |
| 07/06/2005 | EP1550980A1 Image calibration method, image calibration processing device, and image calibration processing terminal |
| 07/06/2005 | EP1549906A2 Spatial reference system |
| 07/06/2005 | EP1549905A1 Height determination of the profile of a moving object using a plurality of ccd arrays |
| 07/06/2005 | EP1365894B1 Co-ordinate measuring device with a video probehead |
| 07/06/2005 | CN1209658C Compact disc driver optical axis adjusting method and apparatus therefor |
| 07/06/2005 | CN1209653C Three-dimensional profile measuring method and equipment with optical fiber panel and confocal microscope |
| 07/06/2005 | CN1209599C Differential confocal scanning detection method with high spatial resolution |
| 07/06/2005 | CN1209598C Method for utilizing time domain method to make difference measurement of accurate reconfiguration |
| 07/06/2005 | CN1209529C Rail construction machinery for measuring rail position |
| 07/05/2005 | US6915231 Method and apparatus for determining a head position of a vehicle driver |
| 07/05/2005 | US6915072 Finder, marker presentation member, and presentation method of positioning marker for calibration photography |
| 07/05/2005 | US6915008 Method and apparatus for multi-nodal, three-dimensional imaging |
| 07/05/2005 | US6914685 Apparatus and method for measuring the shape of a three dimensional object using projected multi-stripe patterns |
| 07/05/2005 | US6914683 Measurement of small, periodic undulations in surfaces |
| 07/05/2005 | US6914676 System and method for optical multiplexing and/or demultiplexing |
| 07/05/2005 | US6914675 Ellipsometric method and control device for making a thin-layered component |
| 07/05/2005 | US6914664 Lithographic apparatus, alignment method and device manufacturing method |
| 07/05/2005 | US6914623 Image processing measuring apparatus and measuring endoscope apparatus |
| 07/05/2005 | US6913511 Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers |
| 06/30/2005 | WO2005059823A2 Systems and methods for detecting defects in printed solder paste |
| 06/30/2005 | WO2005059531A1 Advanced roughness metrology |
| 06/30/2005 | WO2005059470A1 Method for the dynamic, three-dimensional detection and representation of a surface |