Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
07/2007
07/11/2007EP1806771A1 Exposure device and device manufacturing method
07/11/2007EP1806601A1 Optical element manufacturing method, optical element, nipkow disc, confocal optical system, and 3d measurement device
07/11/2007EP1806558A1 Method and device for the online determination of the micrometric topography of moving products
07/11/2007EP1806461A1 Method and device for monitoring roof loads
07/11/2007EP1805717A1 Scanner arrangement
07/11/2007EP1805482A1 Method and system for determining the properties of a surface of revolution
07/11/2007EP1805481A1 System and method for measuring a body and for monitoring the surface thereof
07/11/2007EP1805480A2 Method and device for detecting the contour data and/or optical characteristics of a three-dimensional semi-transparent object
07/11/2007EP1805479A1 An optical proximity sensor for a liquid-jet instrument, and a liquid-jet instrument equipped with such a sensor
07/11/2007EP1805478A1 Device for the three-dimensional measurement of objects
07/11/2007EP1805476A1 Interferometer comprising a mirror assembly for measuring an object to be measured
07/11/2007EP1287482A4 Method and system for scanning a surface and generating a three-dimensional object
07/11/2007CN2921824Y On-line detecting liquid density digital sensing transmitter
07/11/2007CN2921777Y Articles detecting machine
07/11/2007CN1997926A Method for measuring topographic structures on components
07/11/2007CN1997871A Device and method for inspecting the internal surfaces of holes
07/11/2007CN1997870A Non-contact method and system for tyre analysis
07/11/2007CN1997869A Application of scatterometry alignment in imprint lithography
07/11/2007CN1997770A Epitaxial reactor with controlled positioning susceptor
07/11/2007CN1996392A Figure reconstruction method in 3D scanning system
07/11/2007CN1996387A Mark point matching method for point-cloud registration in 3D scanning system
07/11/2007CN1996091A Constant-offset collimated output beam splitter
07/11/2007CN1995954A Visual measuring system and method for performance parameter of water-saving toilet bowl
07/11/2007CN1995909A Low-voltage micro-displacement drive circuit and control method therefor
07/11/2007CN1995908A Single-photodetector confocal laser triangulation device
07/11/2007CN1995907A Surface profile detection device and method therefor
07/11/2007CN1995906A Method for detecting substrate surface film thickness
07/11/2007CN1326204C Grating alignment procedure
07/11/2007CN1326090C System and method for reducing image relative system location error in inner reference image displacement
07/11/2007CN1326079C Multiple sensor system
07/11/2007CN1325930C Automatic underwater object positioning method and system
07/11/2007CN1325875C Surveying method and surveying instrument
07/11/2007CN1325020C Human body measurement calculating and analysis method
07/10/2007US7242789 Moving-body detecting image sensor
07/10/2007US7242486 Note skew detector
07/10/2007US7242485 Displacement gauge and displacement measuring method
07/10/2007US7242484 Apparatus and methods for surface contour measurement
07/10/2007US7242483 Smart spacecraft structures based on laser metrology
07/10/2007US7242482 Capacitance gap calibration
07/10/2007US7242481 Laser vibrometry with coherent detection
07/10/2007US7242480 Low coherence interferometry for detecting and characterizing plaques
07/10/2007US7242477 Apparatus and methods for detecting overlay errors using scatterometry
07/10/2007US7242476 Alignment measuring system and method of determining alignment in a photolithography process
07/10/2007US7242475 Method of determining aberration of a projection system of a lithographic apparatus
07/10/2007US7242466 Remote pointing system, device, and methods for identifying absolute position and relative movement on an encoded surface by remote optical method
07/10/2007US7242465 Device and process for quantitative assessment of the orientation of two machines relative to one another
07/10/2007US7242463 Method and device for detecting patterns on a substrate
07/10/2007US7242460 Method and apparatus for automatic registration and visualization of occluded targets using ladar data
07/10/2007US7242016 Surface inspection apparatus and method thereof
07/10/2007US7241202 Substrate polishing apparatus
07/10/2007US7240541 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder
07/10/2007CA2443263C Streamlined method and apparatus for aligning a sensor to an aircraft
07/10/2007CA2356618C Sensing head and apparatus for determining the position and orientation of a target object
07/10/2007CA2136886C Apparatus, system and method for real-time wafer temperature measurement based on light scattering
07/05/2007WO2007075029A1 3-d shape measuring method for auto-grinding equipment of lcd color filter and 3-d shape measuring apparatus for the same
07/05/2007WO2007074752A1 Tilt sensor and encoder
07/05/2007WO2007073879A1 Method and arrangement for detecting material defects in workpieces
07/05/2007WO2007073650A1 A measuring system for inner diameter of axle hole
07/05/2007US20070153298 Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs
07/05/2007US20070153297 Photogrammetric Targets
07/05/2007US20070153296 Optical measuring device for measuring a cavity
07/05/2007US20070153295 Transmission shear grating in checkerboard configuration for EUV wavefront sensor
07/05/2007US20070153294 Measurement method and apparatus, exposure apparatus, and device manufacturing method
07/05/2007US20070153293 Method and apparatus for modifying the spread of a laser beam
07/05/2007US20070153292 Optical encoder having slanted optical detector elements for harmonic suppression
07/05/2007US20070153285 Measuring a surface characteristic
07/05/2007US20070153276 Accurate positioning of components of an optical assembly
07/05/2007US20070153275 Optical metrology system and metrology mark characterization device
07/05/2007US20070153274 Optical metrology system and metrology mark characterization device
07/05/2007US20070153264 Apparatus and method for inspecting defects
07/05/2007US20070153261 Method and system for inspecting surfaces
07/05/2007DE60125025T2 System für simultanprojektionen von mehrfach phasenverschobenen mustern für die dreidimensionale inspektion eines objektes System for simultaneously project ion of multiple phase-shifted patterns for the three-dimensional inspection of a Building
07/05/2007DE19983341B4 Verfahren und Einrichtung zur Erfassung stereoskopischer Bilder unter Verwendung von Bildsensoren Method and apparatus for recording stereoscopic images using image sensors
07/05/2007DE102006062691A1 Codierungselement für einen Positionsgeber Coding element for a position sensor
07/05/2007DE102006000674A1 Vorrichtung und Verfahren zum Abtasten von Oberflächen Apparatus and method for scanning surfaces
07/05/2007DE102005063217A1 Verfahren zum Konfigurieren einer Überwachungseinrichtung zum Überwachen eines Raumbereichs A method of configuring a monitoring means for monitoring a region of space
07/05/2007DE102005063083A1 Optical chassis measurement method for use at test station, involves adapting sizes of object section after localization of interested object structures to different vehicle types and rim sizes
07/05/2007DE102005063082A1 Vehicle chassis optical measurement method, involves extracting surface profiles from scanned surface structure, and determining spatial position characteristic of surface points as position data to determine chassis data
07/05/2007DE102005063051A1 Verfahren zur optischen Fahrwerksvermessung A method for optical wheel alignment
07/05/2007DE102005063050A1 Verfahren und Vorrichtung zur berührungslosen Messung der Achsgeometrie Method and device for contactless measurement of the axle geometry
07/05/2007DE102005061987A1 Informationsträger Information carrier
07/05/2007DE102005061464A1 Opto-electronic measuring method for absolute measurement of gaps/clearances applies two or more stages with different large areas of clearness and different measuring accuracy
07/04/2007EP1804106A2 Stereoscopic examination system, stereoscopic image processing apparatus and operating method
07/04/2007EP1804105A2 Stereoscopic examination system, stereoscopic image processing apparatus and operating method
07/04/2007EP1804104A2 Stereoscopic examination system, stereoscopic image processing apparatus and operating method
07/04/2007EP1804050A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
07/04/2007EP1523654B1 Method and device for three-dimensionally detecting objects and the use of this device and method
07/04/2007CN2919189Y Online measuring system for measuring thickness of oil layer on photoelectric liquid surface
07/04/2007CN2919188Y Laser non-contact online detecting device
07/04/2007CN1993804A Stage apparatus and exposure apparatus
07/04/2007CN1993599A Method and apparatus for inspecting display panel and method for manufacturing display panel
07/04/2007CN1992817A Image processing apparatus and operation condition setting method thereof
07/04/2007CN1992479A Optical encoder device for small-sized motor and method of producing the same
07/04/2007CN1991939A Automatic laser auxiliary positioning system and method used for display device production line
07/04/2007CN1991432A Image focusing display system and method
07/04/2007CN1991333A Zero-Abbe error measuring system and its method
07/04/2007CN1991300A Image measuring system and method
07/04/2007CN1991299A Testing method for guiding hole coppering thickness in wiring board
07/04/2007CN1991298A Shaft cone metrology system and method
07/04/2007CN1991297A Approximate co-optical path outer difference interference offset measuring system