Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2007
10/10/2007EP1843125A2 System and method for locating features on an object
10/10/2007EP1842027A2 Hologram and method of manufacturing an optical element using a hologram
10/10/2007EP1604191B1 A method and apparatus for determining one or more physical properties of a rolled smoking article or filter rod
10/10/2007CN200958941Y Light-object angle-measuring probe of V-shaped light-transmitting slit
10/10/2007CN200958940Y System for measuring object three-dimensional deformation based on optical fiber and electronic phase-transfer speckle technology
10/10/2007CN200958939Y Hobbing checker
10/10/2007CN101052857A Perspective distortion inspecting equipment and method of translucent panel
10/10/2007CN101052480A Device and method for aligning roller mill frame feeding device and rolling channel
10/10/2007CN101051619A Substrate check device and substrate check method
10/10/2007CN101050956A Detecting system and method for rationality of screw plug-in position
10/10/2007CN101050952A Synchronous optical measurement and inspection method and means
10/10/2007CN101050951A Rotational angle detector
10/10/2007CN101050950A Monitoring device for output shaft centering state with spring mounted power device
10/10/2007CN101050949A Measuring system and its measuring method for large field object micro surface three dimension topography
10/10/2007CN101050948A Sensing and visual method and device for space flexible sail plate structure form
10/10/2007CN101050947A Detecting system and method for curved surface vibration deformation
10/10/2007CN101050946A Apparatus for measuring thickness of glass substrate
10/10/2007CN101050945A Method and device for designing linear laser three dimension scanner
10/10/2007CN101050944A Object detecting system, actuating device control system, vehicle, and object detecting method
10/10/2007CN101050943A Object detecting system, actuating device control system, vehicle, and object detecting method
10/10/2007CN101050941A Sub nano grade double frequency laser interferometer signal subdivision system
10/10/2007CN101050940A High precision double frequency laser interferometer signal subdivision system
10/10/2007CN101049865A Device for aligning container and labeling machine with thereof
10/10/2007CN100342216C Displacement sensor with single grating
10/10/2007CN100342211C Position detector for double grating displacement transducer metering mode and detection method thereof
10/10/2007CN100342210C Laser self-collimation zero reference error angle measuring method
10/10/2007CN100342209C Calibrating method for laser self-collimation angle measuring system
10/10/2007CN100342208C Modeling method of laser auto collimating measurement for angle in 2D
10/10/2007CN100342207C Detector for three-dimensional appearance of micro-member through-hole inner surface and its marking and using method
10/10/2007CN100342076C Optical fiber grating intelligent dragline
10/09/2007US7280714 Device and method for optoelectronically identifying the displacement and/or position of an object
10/09/2007US7280685 Object segmentation from images acquired by handheld cameras
10/09/2007US7280233 Method and apparatus for inspecting an edge exposure area of a wafer
10/09/2007US7280232 Method and apparatus for measuring wafer thickness
10/09/2007US7280231 Apparatus for determining wall thickness of microcapsule
10/09/2007US7280230 Parametric profiling using optical spectroscopic systems
10/09/2007US7280229 Examining a structure formed on a semiconductor wafer using machine learning systems
10/09/2007US7280228 System and method of measurement, system and method of alignment, lithographic apparatus and method
10/09/2007US7280227 Device, method and system for measuring the distribution of selected properties in a material
10/09/2007US7280226 Method and device for enlarging the measurement volume of an optical measurement system
10/09/2007US7280225 Stage apparatus and control method including first and second measurement systems for measuring a stage position and a switching unit for switching between the measurement systems
10/09/2007US7280224 Interferometry systems and methods of using interferometry systems
10/09/2007US7280223 Interferometry systems and methods of using interferometry systems
10/09/2007US7280222 Compact optical apparatus
10/09/2007US7280213 Light detection device
10/09/2007US7280212 Apparatus and methods for detecting overlay errors using scatterometry
10/09/2007US7280211 Method of adjusting monitor axis
10/09/2007US7280210 Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program
10/09/2007US7280200 Detection of a wafer edge using collimated light
10/09/2007US7280199 System for detecting anomalies and/or features of a surface
10/09/2007US7280198 Apparatus for optically analyzing products such as fruit having bilateral imaging devices
10/09/2007US7278740 Ophthalmic apparatus
10/09/2007US7278218 Laser line generating device with swivel base
10/09/2007CA2389205C Aircraft identification and docking guidance systems
10/09/2007CA2365654C Apparatus and method for detecting twist in articles
10/04/2007WO2007112300A2 Systems and methods for measuring one or more characteristics of patterned features on a specimen
10/04/2007WO2007112022A2 Optimization of diffraction order selection for two-dimensional structures
10/04/2007WO2007111156A1 Measurement of gaps between valve seats and attachment parts
10/04/2007WO2007110395A1 Contactless method of measuring an optogeometrical characteristic of a material by interference spectroscopy
10/04/2007WO2007110269A1 Electro-optical output unit and measuring device comprising said electro-optical output unit
10/04/2007WO2007110107A1 Method for the three-dimensional measurement of fast-moving objects
10/04/2007US20070233424 Inclination calculation apparatus and inclination calculation program, and game apparatus and game program
10/04/2007US20070229855 In-die optical metrology
10/04/2007US20070229854 Optical metrology of multiple patterned layers
10/04/2007US20070229853 Nanometer contact detection method and apparatus for precision machining
10/04/2007US20070229852 Systems and Methods for Measuring One or More Characteristics of Patterned Features on a Specimen
10/04/2007US20070229851 Component placement unit as well as a component placement device comprising such a component placement unit
10/04/2007US20070229850 System and method for three-dimensional image capture
10/04/2007US20070229847 Interferometers for the Measurement of Large Diameter Thin Wafers
10/04/2007US20070229846 Thickness measurement of moving webs and seal integrity system using dual interferometer
10/04/2007US20070229845 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
10/04/2007US20070229844 Method of and apparatus for measuring layer thicknesses and layer homogeneities in containers
10/04/2007US20070229829 Apparatus and methods for detecting overlay errors using scatterometry
10/04/2007US20070229828 Lithographic processing cell and device manufacturing method
10/04/2007US20070229827 Optical monitoring of products of the tobacco-processing industry
10/04/2007US20070229815 Apparatus and Method for Inspecting Semiconductor Wafer
10/04/2007US20070229802 Multi-dimensional measuring system
10/04/2007US20070229796 Optical range finder
10/04/2007US20070229791 Step Measuring Device and Apparatus, and Exposure Method and Apparatus
10/04/2007US20070229700 Method And Apparatus For Automatically Optimizing Optical Contrast In Automated Equipment
10/04/2007DE202007010525U1 Aufnahmevorrichtung Cradle
10/04/2007DE19758466B4 Planheits-Regelungssystem für Metallband Flatness control system for metal strip
10/04/2007DE102007011631A1 Vorrichtung zum Vermessen einer dreidimensionalen Form An apparatus for measuring a three-dimensional shape
10/04/2007DE102007009971A1 Movable object e.g. paper, edge`s image acquisition method for e.g. sheet processing rotary printing machine, involves illuminating object`s edge and activating lighting and image acquisition devices in synchronism with object movement
10/04/2007DE102006036166A1 Vorrichtung und Verfahren zur Messung der Entfernung eines Objekts Apparatus and method for measuring the distance of an object
10/04/2007DE102006015627A1 Rotation symmetric part`s form deviation and ripple determining method, involves conducting high pass filtering of measurement curve of reflection signal, where curve shows form deviation of testing part
10/04/2007DE102006015159A1 Physical values e.g. vibration, spatially distributed and/or distant measurement method for use at building, involves correlating digital response signal with modulation signal for generation of n-measuring data sets
10/04/2007DE102006007948B3 Vehicle`s e.g. lorry, tire tread depth measuring method, involves guiding measuring head to measuring bar, and measuring tread depth in two tracks during forward or backward movement of head from or to starting position, respectively
10/04/2007DE10033366B4 Verfahren und Erfassungsvorrichtung zur Erfassung von Parametern an maschinellen Einrichtungen A method and detection device for detecting the parameters of machine equipment
10/03/2007EP1840503A1 A component placement unit as well as a component placement device comprising such a component placement unit
10/03/2007EP1840502A1 Optical interferometer for measuring changes in thickness
10/03/2007EP1839714A2 Inclination calculation apparatus and inclination calculation program, and game apparatus and game program
10/03/2007EP1839193A1 Provision of target specific information
10/03/2007EP1839081A1 Slide misload detection system
10/03/2007EP1839013A2 Anodizing system with a coating thickness monitor and an anodized product
10/03/2007EP1839011A1 Method for determining a space coordinate of a measuring point on a test object and corresponding coordinate measuring device
10/03/2007EP1839010A1 Method for determining a space coordinate of a measuring point on a test object and corresponding coordinate measuring device
10/03/2007EP1838632A2 On-line thickness gauge and method for measuring the thickness of a moving glass substrate
10/03/2007EP1200799B1 Instruments for analyzing binding assays based on attenuation of light by thin films
10/03/2007EP1092124B1 Method and apparatus for ultrasonic laser testing
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