Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2007
09/05/2007CN100335838C Pipeline internal inspection device and method
09/05/2007CN100335714C Intelligent rope with grating and fibre-optical fibre and enhanced resin rib
09/04/2007US7266446 Helmet mounted tracking system and method
09/04/2007US7266235 Pattern inspection method and apparatus
09/04/2007US7266234 Method and device to control the straightness and torsions of long products
09/04/2007US7266221 Ranging device utilizing image processing
09/04/2007US7265850 Fortified, compensated and uncompensated process-sensitive scatterometry targets
09/04/2007US7265841 Position detecting method
09/04/2007US7265840 Coupling method for coupling high power optical beams into an optical waveguide
09/04/2007US7265821 Caster angle measurement system for vehicle wheels
09/04/2007US7265364 Level sensor for lithographic apparatus
09/04/2007US7264355 Ophthalmologic device and ophthalmologic measuring method
09/04/2007CA2343390C Apparatus for surface image sensing and surface inspection of three-dimensional structures
08/2007
08/30/2007WO2007097841A2 Portable coordinate measurement machine with integrated line laser scanner
08/30/2007WO2007097466A1 Measuring device and method, processing device and method, pattern forming device and method, exposing device and method, and device fabricating method
08/30/2007WO2007097350A1 Position measuring device and position measuring method, mobile body driving system and mobile body driving method, pattern forming device and pattern forming method, exposure device and exposure method, and device manufacturing method
08/30/2007WO2007097244A1 Ultra precision profile measuring method
08/30/2007WO2007096533A1 Method and system for measuring a diameter, and assembly line employing this system
08/30/2007WO2007084175A9 Interferometric apparatus and method for sizing nanoparticles
08/30/2007WO2006083917A3 Laser scanning interferometric surface metrology
08/30/2007WO2006075090A8 Optical probe and device and method making use thereof
08/30/2007US20070203668 Immersed fuel level sensor
08/30/2007US20070201044 Method and apparatus for measuring dimension of photomask pattern
08/30/2007US20070201043 Line Profile Asymmetry Measurement
08/30/2007US20070201042 System And Method Of Determining A Position Of A Radiation Emitting Element
08/30/2007US20070201041 Image measuring system, image measuring method and image measuring program
08/30/2007US20070201040 Laser-based position measuring device
08/30/2007US20070201037 Lens measuring method and device for determining decenter and tilt of the lens
08/30/2007US20070201036 Coherent hybrid electromagnetic field imaging
08/30/2007US20070201035 In situ determination of pixel mapping in interferometry
08/30/2007US20070201034 Symmetrical illumination forming system
08/30/2007US20070201033 Methods and systems for performing angle-resolved fourier-domain optical coherence tomography
08/30/2007US20070201032 Apparatus for inspecting a ball-bumped wafer
08/30/2007DE102007007311A1 Abtasteinheit für eine Positionsmesseinrichtung zur Detektion von optischen Maßverkörperungen sowie entsprechende Positionsmesseinrichtung Scanning for a position measuring device for the detection of optical measuring standards and corresponding position measuring device
08/30/2007DE102007005591A1 Einrichtung zum Steuern der Bewegung eines Bedruckstoffes Means for controlling the movement of a printing material
08/30/2007DE102006015314B3 Einrichtung zur Bestimmung der Ausdehnung eines Objekts, insbesondere eines im Wesentlichen quaderförmigen Pakets Means for determining the extent of an object, in particular a substantially parallelepiped-shaped package
08/30/2007DE102006010161A1 Code structure for object position measurement device, has code traces arranged such that absolute position of scanning device is determined, from combination of position measurement values obtained by scanning structure section
08/30/2007DE102006007805A1 Verfahren zur Bestimmung des Anhängerwinkels zwischen einem Zugfahrzeug und einem dazugehörigen Anhänger Method for the determination of the trailer angle between a tractor and a corresponding trailer
08/30/2007DE102006007614A1 Measuring system for determining an acquisition of a layer thickness, density, homogeneity and/or stability of biofilm, comprises light-emitting unit having first structure, detection unit having second structure, and light detector
08/30/2007DE102006007573A1 Optischer Flächensensor Optical sensor surface
08/29/2007EP1826529A1 External-appearance inspection apparatus
08/29/2007EP1826528A1 Image measuring system, image measuring method and image measuring program
08/29/2007EP1825217A1 Measuring device and method that operates according to the basic principles of confocal microscopy
08/29/2007EP1825216A1 Device for measuring parts by triangulation sensors and an evaluation unit for determining
08/29/2007EP1601931A4 Apparatus and method for detecting overlay errors using scatterometry
08/29/2007CN101027535A Vehicle air bag electrical system
08/29/2007CN101025551A Projection apparatus, elevation angle control method therefor and recording medium
08/29/2007CN101025362A Mobile terminal for measuring seam width
08/29/2007CN101025361A Large-vehicle positioning instrument wheel-base measuring method
08/29/2007CN101025360A Non-contact type hand-driven automobile body left-right symmetric point height difference detector
08/29/2007CN100334426C Method and apparatus for dynamically measuring blade distance variation of minisize gyroplane
08/29/2007CN100334425C Method for measuring deformation at lous temp of focal plane probe and special Dewar
08/29/2007CN100334424C Appts. for measuring rod-like, matter diameter esp. rod-like matter of tobacco processing industry
08/29/2007CN100334423C Method for positioning a measuring device emitting and receiving optical radiation for measuring wear in the lining of a container
08/29/2007CN100334422C Interferential position measuring device
08/28/2007US7263412 Robot self-position identification system and self-position identification method
08/28/2007US7263217 Three-dimensional monitoring apparatus
08/28/2007US7263216 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof
08/28/2007US7263172 X-ray apparatus having means for determining movable component positions
08/28/2007US7262868 Method of and apparatus for ascertaining the transverse dimensions of rod-shaped articles
08/28/2007US7262867 Device to determine the thickness of a conductive layer
08/28/2007US7262866 Analytical method and apparatus
08/28/2007US7262865 Method and apparatus for controlling a calibration cycle or a metrology tool
08/28/2007US7262864 Method and apparatus for determining grid dimensions using scatterometry
08/28/2007US7262863 Distance measuring device
08/28/2007US7262862 Measurement of a 3d surface of an object during pressure exposure
08/28/2007US7262861 Ultrasound single-element non-contacting inspection system
08/28/2007US7262860 Compensation for errors in off-axis interferometric measurements
08/28/2007US7262852 Wafer-level testing of optical and optoelectronic chips
08/28/2007US7262851 Method and apparatus for detecting relative positional deviation between two objects
08/28/2007US7262850 Method for inspection of periodic grating structures on lithography masks
08/28/2007US7262849 Method of polishing thin film formed on substrate
08/28/2007US7262841 Laser alignment for ion source
08/28/2007US7262837 Noninvasive method for characterizing and identifying embedded micropatterns
08/28/2007US7261415 Methods and systems for tracking a torsional orientation and position of an eye
08/28/2007CA2356863C Hand held probe for measuring tire tread wear
08/23/2007WO2007094420A1 Mobile robot
08/23/2007WO2007093497A1 Method for producing a test structure in order to test flexibility of a membrane of a micromechanical component and corresponding examination structure
08/23/2007WO2007093385A1 Optical surface sensor
08/23/2007WO2007093374A1 Measuring system for the acquisition of the layer thickness of a deposit
08/23/2007WO2007093044A1 Method and apparatus for determining the shape, distance and orientation of an object
08/23/2007WO2007001653A3 Reticle alignment technique
08/23/2007WO2005022600A3 Method and systems for processing overlay data
08/23/2007US20070198211 Selection of wavelengths for integrated circuit optical metrology
08/23/2007US20070196029 Image processing device, method, and program
08/23/2007US20070195334 Displacement detection apparatus, polarization beam splitter, and diffraction grating
08/23/2007US20070195333 Atomic force microscope
08/23/2007US20070195332 System And Method For Coherent Optical Inspection
08/23/2007US20070195331 Coating thickness gauge
08/23/2007US20070195330 Optical interference apparatus
08/23/2007US20070195326 Image processing alignment method and method of manufacturing semiconductor device
08/23/2007US20070195325 Method and apparatus for measuring optical overlay deviation
08/23/2007US20070195323 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics
08/23/2007US20070195316 Pattern defect inspection method and its apparatus
08/23/2007US20070195313 Leveling method and leveling device
08/23/2007US20070195311 Device and method for non-contact scanning of contact lens and contact lens mold geometry
08/23/2007US20070193378 Powder monitor
08/23/2007DE102006023887B3 Transmitted-light microscopy method involves sequentially separating the pictures in light dispersion direction with poly-chromatic source of light to time point or with wavelength-variable source of light
08/23/2007DE102006014345B3 Visual inspection device for use in automated manufacturing process, has evaluation unit provided for defining test criteria by evaluating marked area of reference object, where test criteria are considered during evaluation of image
08/23/2007DE102006011540A1 Scanning unit for detection of optical measure embodiments, has aperture diaphragm array arranged in picture-sided focal plane of micro lens array, and aperture opening is located in picture-lateral focal point of each micro lens of array