Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2007
05/15/2007US7218773 Pose estimation method and apparatus
05/15/2007US7218760 Stereo-coupled face shape registration
05/15/2007US7218403 Scanning interferometer for aspheric surfaces and wavefronts
05/15/2007US7218402 Wavefront sensor using hybrid optical/electronic heterodyne techniques
05/15/2007US7218400 In-situ overlay alignment
05/15/2007US7218399 Method and apparatus for measuring optical overlay deviation
05/15/2007US7218398 Method and apparatus for determining liquid crystal cell parameters from full Mueller matrix measurements
05/15/2007US7218390 Apparatus and methods for automatically measuring a curl of an optical sheet
05/15/2007US7218389 Method and apparatus for inspecting pattern defects
05/15/2007US7218385 Preceding vehicle recognition apparatus
05/15/2007US7218379 Scanning exposure apparatus and method
05/15/2007US7217923 Microstructured pattern inspection method
05/15/2007CA2377307C Analysing method and device for automatically sorting products such as fruits
05/10/2007WO2007053788A1 Method and apparatus for identifying photocatalytic coatings
05/10/2007WO2007053462A1 Retro-reflective target wafer for a visual position determination system
05/10/2007WO2007052507A1 Replace timing detector of conveyor chain and replace timing detection method of conveyor chain
05/10/2007WO2007052462A1 Shape recognizing device and deformation evaluating device
05/10/2007WO2007052360A1 Lamination status inspecting apparatus, lamination status inspecting method and lamination status detecting program
05/10/2007WO2007051659A1 Apparatus for optical recording of piece goods
05/10/2007WO2007051567A1 Measurement system for measurement of boundary surfaces or surfaces of workpieces
05/10/2007WO2007051299A1 Surface analysis method and system
05/10/2007WO2006113390A3 A three-dimensional measuring apparatus for scanning an object and a measurement head of a three-dimensional measuring apparatus and method of using the same
05/10/2007WO2006093753A3 Non-destructive testing and imaging
05/10/2007WO2005108918A3 Methods and apparatus for determining three dimensional configurations
05/10/2007US20070103701 Displacement sensor
05/10/2007US20070103700 Moving device
05/10/2007US20070103699 Multiple fanned laser beam metrology system
05/10/2007US20070103698 Fanned laser beam metrology system
05/10/2007US20070103697 Integrated displacement sensors for probe microscopy and force spectroscopy
05/10/2007US20070103696 Apparatus for measuring the position of an object with a laser interferometer system
05/10/2007US20070103685 Methods and apparatus for generating a mask
05/10/2007US20070103675 Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object
05/10/2007US20070103673 Passive-optical locator
05/10/2007US20070103672 Laser surveying instrument
05/10/2007US20070103463 Simulation apparatus
05/10/2007DE202006019856U1 Dachtragwerksüberwachungssystem Roof structure monitoring system
05/10/2007DE10356290B4 Lenkradmesswaage Steering wheel measuring scales
05/10/2007DE10224164B4 Eine zweidimensionale Struktur zum Bestimmen einer Überlagerungsgenauigkeit mittels Streuungsmessung A two-dimensional structure for determining an overlay accuracy using scatterometry
05/10/2007DE102006041357A1 Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung The position measuring device and method of operating a position measuring device
05/10/2007DE102006011124B4 Anordnung und Verfahren zum dreidimensionalen Lokalisieren eines Körpers Apparatus and method for three-dimensional localization of a body
05/10/2007DE102005053787A1 Optische Abtasteinheit Optical scanning
05/10/2007DE102005053180A1 Vorrichtung zur Anordnung in einem Lenksystem eines Kraftfahrzeugs A device for arrangement in a steering system of a motor vehicle
05/10/2007DE102005053097A1 Automatic distinction between single, dual, multiple plate layers involves illuminating layers so optical contrast exists between illuminated part of each lateral surface and background, processing camera image to detect layer situation
05/10/2007DE102005052743A1 Messsystem zur Vermessung von Grenz- oder Oberflächen von Werkstücken Measurement system for measuring interfaces or surfaces of workpieces
05/10/2007DE102004007830B4 Verfahren zur Lokalisierung von Fehlstellen und Markiersystem A method for locating flaws and marking
05/10/2007DE10133315B4 Vorrichtung zur Prüfung der Maßhaltigkeit von Werkstücken mit einer Bildverarbeitungsanlage Apparatus for testing the dimensional accuracy of workpieces with an image processing system
05/10/2007CA2628090A1 Method and apparatus for identifying photocatalytic coatings
05/10/2007CA2628087A1 Surface analysis method and system
05/09/2007EP1783453A1 Device for contactlessly controlling the surface profile of objects
05/09/2007EP1783452A1 Position detection based on two-directional correlation
05/09/2007EP1782929A2 Automated product profiling apparatus
05/09/2007EP1782379A2 Monitoring system communication system and method
05/09/2007EP1782226A2 Apparatus and method for producing a numeric display corresponding to the volume of a selected segment of an item
05/09/2007EP1782021A1 Optical monitoring apparatus and method of monitoring optical coatings
05/09/2007EP1782020A2 Process, system and software arrangement for determining at least one location in a sample using an optical coherence tomography
05/09/2007EP1723385B1 Device for measuring the topography of an optical surface
05/09/2007EP0968400B1 Topological and motion measuring tool
05/09/2007CN2898804Y Reflective automatic inspector of car's body pendulum angle
05/09/2007CN2898767Y Angle measuring equipment of multifunctional boiler burner
05/09/2007CN2898766Y Inspector for fibre-optic and grating sensor of underground pipeline
05/09/2007CN2898765Y Digital image inspector
05/09/2007CN1960836A Substrate peripheral portion measuring device and substrate peripheral portion polishing apparatus
05/09/2007CN1959371A Full wave cross-sectional testing system
05/09/2007CN1959338A Method for repairing dim spot area in surface topography map
05/09/2007CN1959337A 3D non-contacting type coordinates equipment for measuring fabric or garment material
05/09/2007CN1957788A Revolving fixed point body measurement method
05/09/2007CN1314943C Micro angular displacement measuring device based on linear array charge-coupled device
05/09/2007CN1314942C Device for scanning teeth mode
05/09/2007CN1314941C Measuring instrument for space curve type long distance fine pipe internal surface shape and its detecting method
05/09/2007CN1314940C Coordinate detector
05/08/2007US7216045 Selection of wavelengths for integrated circuit optical metrology
05/08/2007US7215431 Systems and methods for immersion metrology
05/08/2007US7215430 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
05/08/2007US7215425 Optical alignment for flow cytometry
05/08/2007US7214954 Method for operating optical sensors
05/08/2007US7214946 Speckle reduction method and apparatus
05/08/2007US7214928 Scanning unit for an optical position measuring device
05/08/2007US7214917 Rotating position measuring instrument
05/08/2007US7214554 Monitoring the deposition properties of an OLED
05/08/2007US7213447 Method and apparatus for detecting topographical features of microelectronic substrates
05/08/2007CA2353976C Method and device for object recognition
05/04/2007CA2563146A1 Multi-dimensional imaging method and apparatus
05/03/2007WO2007050747A1 Methods for determining coating thickness of a prosthesis
05/03/2007WO2007049603A1 Stage apparatus, coordinate correction method for the stage apparatus, exposure apparatus, and device production method
05/03/2007WO2007048477A1 Method for the detection of strip edges
05/03/2007WO2007016051A3 Optical encoder having slanted optical detector elements for harmonic suppression
05/03/2007US20070100578 Phaseshift interferometer
05/03/2007US20070098251 Non-contact three-dimensional measuring methods and apparatuses
05/03/2007US20070098249 Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program
05/03/2007US20070097383 Method and apparatus for integrating metrology with etch processing
05/03/2007US20070097382 System for identifying the position of three-dimensional machine for measuring or machining in a fixed frame of reference
05/03/2007US20070097381 Hand-size structured-light three-dimensional metrology imaging system and method
05/03/2007US20070097380 Profiling complex surface structures using height scanning interferometry
05/03/2007US20070097379 Integrated interference scanning method
05/03/2007US20070097378 Interferometer
05/03/2007US20070097367 Exposure apparatus and exposure method
05/03/2007US20070097357 Position detection based on two-directional correlation
05/03/2007US20070096044 System and method of imaging the characteristics of an object
05/03/2007DE4429892B4 Taktlineal oder Taktscheibe Timing rule or timing disk
05/03/2007DE102006051710A1 Length standardization e.g. for examination and or for measurement by articles such as printed elements and notes, involves having opening for articles with picture recording procedure provided which can be measured and examined