Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2007
10/18/2007WO2007062658A3 Impression scanning for manufacturing of dental restorations
10/18/2007WO2007046820A3 Interferometric analysis for the manufacture of nano-scale devices
10/18/2007WO2003064969A3 Spray can targeting and positioning system
10/18/2007US20070242583 Method and apparatus for measuring surface structure of a near-field object
10/18/2007US20070242280 Digitizer adapter
10/18/2007US20070242279 Device and method for the contactless measurement of at least one curved surface
10/18/2007US20070242278 Size difference measuring method and size difference measuring apparatus
10/18/2007US20070242277 Optical navigation in relation to transparent objects
10/18/2007US20070242272 Pattern transfer apparatus, imprint apparatus, and pattern transfer method
10/18/2007US20070242271 Infrared interferometric-spatial-phase imaging using backside wafer marks
10/18/2007US20070241293 Method and system for detecting the position of an edge of a web
10/18/2007DE102007017354A1 Optische Mehrachsen-Codierer Optical multi-axis encoder
10/18/2007DE102007017013A1 Reflexionsbasierte optische Codierer, die kein Codemedium aufweisen Reflection-based optical encoder having no code medium
10/18/2007DE102007015257A1 Measuring device for measuring e.g. cross section of rails, has arrangement for optical scanning of surfaces, which has transverse profile control device arranged at distance to cross section of surface and drive for moving scanning device
10/18/2007DE102007009316A1 Vorrichtung und Verfahren zum Inspizieren und/oder Überwachen einer eine oder mehrere Weichen aufweisenden Weichenanlage Apparatus and method for inspecting and / or monitoring of one or more switches having switch system
10/18/2007DE102006017423A1 Semiconductor wafer`s edge determining device, has illumination device arranged such that reflection point is produced with light beam at hitting point at wafer, and position-sensitive sensor arranged so that point is represented on sensor
10/18/2007DE102006017283A1 Semiconductor wafer pattern`s structural unit measuring method for semiconductor manufacturing system, involves providing model of ellipsometry irradiation, and calculating measurements of structural units on wafer based on model
10/18/2007DE102006016101A1 Transparent organic layer thickness measuring method for e.g. sheet metal strap, involves determining respective absorption of light in different wavelength ranges by measurement of reflected light
10/18/2007DE102006015792A1 Verfahren und System zur Formmessung einer reflektierenden Oberfläche Method and system for measuring the shape of a reflective surface
10/18/2007DE102006015123A1 Vorrichtung und Verfahren zum Prüfen eines Reifens, insbesondere mittels eines interferometrischen Messverfahrens Apparatus and method for testing a tire, in particular by means of an interferometric measurement technique
10/18/2007DE102006012432B3 Verfahren zur Erfassung der Oberflächenform einer teilspiegelnden Oberfläche A method for detecting the surface shape of a part of the reflecting surface
10/18/2007DE10145912B4 Faseroptischer interferometrischer Sensor, Signalverarbeitungssystem eines faseroptischen interferometrischen Sensors und Speichermedium A fiber-optic interferometric sensor signal processing system of a fiber optic interferometric sensor, and storage medium
10/17/2007EP1845338A1 Method of optically scanning the tread surface of a pneumatic tyre of a vehicle wheel
10/17/2007EP1845337A1 Apparatus for contactless 3D wheel alignment, system and method therefor
10/17/2007EP1845336A1 Method and device for the optical detection of moving objects
10/17/2007EP1845335A2 Size difference measuring method and size difference measuring apparatus
10/17/2007EP1845334A1 Optical sensor
10/17/2007EP1844870A1 Workpiece bending angle detecting device and workpiece bending machine
10/17/2007EP1844490A1 Measuring apparatus, exposure apparatus and method, and device manufacturing method
10/17/2007EP1844295A1 Device and method for scanning multiple objects
10/17/2007EP1247070B1 Apparatus and methods for surface contour measurement
10/17/2007CN200962030Y Non enhanced optical fiber grating reinforcing steel bar device
10/17/2007CN200962029Y 3D distortion measurement system based on bundle optical fiber
10/17/2007CN200961214Y Photoelectric cloth seam detector
10/17/2007CN101057316A Position measurement method, position control method, measurement method, loading method, exposure method, exoposure apparatus, and device production method
10/17/2007CN101057121A Optical proximity sensor for a liquid-jet instrument, and a liquid-jet instrument equipped with such a sensor
10/17/2007CN101055232A Method of optically scanning the tread surface of a pneumatic tyre of a vehicle wheel
10/17/2007CN101055230A Apparatus for contactless 3D wheel alignment, system and method therefor
10/17/2007CN101055218A Bridge flexibility and displacement monitoring device and monitoring method
10/17/2007CN101055177A Double surface drone based flow type tri-dimensional visual measurement splicing method
10/17/2007CN101055174A Profile measuring machine
10/17/2007CN101055170A Replaceable embedding type optical fiber strain sensor
10/17/2007CN101055169A Apparatus and method for nondestructive evaluation of insulating coating film
10/17/2007CN101055168A Optical detection system
10/17/2007CN100343725C Method for aligning optical system by hologram and apparatus thereof
10/17/2007CN100343693C Distance measurement sensor
10/17/2007CN100343625C Measuring splice method and device of large three-dimensional body shape based on splicing target
10/17/2007CN100343624C Position-measuring device
10/17/2007CN100343623C Surveying instrument
10/17/2007CN100343622C Quick determining method for micro-lens structural parameters and surface deformation
10/16/2007US7283661 Image processing apparatus
10/16/2007US7283658 Topographic measurement using stereoscopic picture frames
10/16/2007US7283307 Common aperture vision system
10/16/2007US7283256 Method and apparatus for measuring wafer thickness
10/16/2007US7283255 Wireless substrate-like sensor
10/16/2007US7283254 Apparatus for shifting reference distance of laser displacement sensor
10/16/2007US7283253 Multi-axis integration system and method
10/16/2007US7283252 Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method
10/16/2007US7283250 Measurement of object deformation with optical profiler
10/16/2007US7283249 Lithographic apparatus and a method of calibrating such an apparatus
10/16/2007US7283237 Overlay targets with isolated, critical-dimension features and apparatus to measure overlay
10/16/2007US7283236 Alignment system and lithographic apparatus equipped with such an alignment system
10/16/2007US7283235 Optical device and inspection module
10/16/2007US7283202 In-situ interferometer arrangement
10/16/2007US7282716 Digital imaging assembly and methods thereof
10/16/2007US7282703 Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
10/16/2007US7282157 Method of manufacturing light-propagating probe for near-field microscope
10/16/2007US7281921 Scatterometry alignment for imprint lithography
10/16/2007US7281432 Displacement sensor with an excitation coil and a detection coil
10/11/2007WO2007114313A1 Information processing method and information processing apparatus
10/11/2007WO2007114227A1 Device for measuring wear of trolley wire by image processing
10/11/2007WO2007114189A1 Three-dimensional color and shape measuring device
10/11/2007WO2007113975A1 View point detecting device
10/11/2007WO2007113377A1 Method for measuring/recognizing a shape
10/11/2007WO2007113166A1 Device for determining the size of an object in particular an essentially parallelepiped packet
10/11/2007WO2007112872A1 Method and apparatus for determining and gauging deviations in shape and waviness of rotationally symmetrical parts
10/11/2007WO2007112655A1 Optical tilt sensor
10/11/2007US20070236705 Azimuthal scanning of a structure formed on a semiconductor wafer
10/11/2007US20070236703 Geometric measurement system and method of measuring a geometric characteristic of an object
10/11/2007US20070236702 Geometric measurement system and method of measuring a geometric characteristic of an object
10/11/2007US20070236701 Geometric measurement system and method of measuring a geometric characteristic of an object
10/11/2007US20070236695 Registration method and apparatus therefor
10/11/2007US20070236694 3-Dimensional imaging by acoustic warping and defocusing
10/11/2007US20070236687 Microscope
10/11/2007US20070236685 Optical tilt sensor
10/11/2007US20070236680 Calibration system for sawmill scanning systems
10/11/2007US20070236677 Geo-location with laser and sensor system
10/11/2007US20070236454 Apparatus For Determining The Location Of A Pointer Within A Region Of Interest
10/11/2007US20070234786 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
10/11/2007US20070234783 Pressure Resistance Inspecting Method and Pressure Resistance Inspecting Apparatus for Heat Exchangers
10/11/2007DE102006032533B3 Non-uniform laminar pattern`s e.g. book, two-dimensional image equalizing method, involves assigning two-dimensional image point in scanned image to each determined three-dimensional surface point of pattern
10/11/2007DE102006029938A1 Verfahren, Vorrichtung und Verwendung eines faseroptischen Biegesensors zur Erfassung einer Form zumindest eines Teils einer Wirbelsäule A method, apparatus and use of a fiber optic bending sensor for detecting a shape of at least a portion of a spine
10/11/2007DE102006016677A1 Object`s e.g. solid object, geometrical characteristics e.g. surface forms of component range, measuring method, involves converting relative measuring data under consideration of detected spatial position of one of reference objects
10/11/2007DE102006016523A1 Kippsensor Tilt sensor
10/11/2007DE102006016229A1 Verfahren und Vorrichtung zur simultanen Ermittlung von Höhenunterschieden und Zusammensetzungen mittels Glimmentladungsspektroskopie Method and apparatus for the simultaneous determination of height differences and compositions by Glow Discharge
10/11/2007DE102006016209A1 Register control`s marks detecting and processing arrangement for printing machine, has light emitting diodes array arranged at optical axis of camera in such manner that light rays with line stands perpendicular to print material
10/11/2007DE102006014070A1 Vorrichtung und Verfahren zum Prüfen eines Reifens, insbesondere mittels eines interferometrischen Messverfahrens Apparatus and method for testing a tire, in particular by means of an interferometric measurement technique
10/11/2007DE102004053905B4 Verfahren zur berührungslosen Erfassung von geometrischen Eigenschaften einer Objektoberfläche A method for contactless detection of geometrical characteristics of an object surface
10/11/2007CA2648381A1 Method for measuring/recognizing a shape
10/10/2007EP1843145A1 Illuminating method in paint defect detecting machine
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