| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 06/21/2007 | WO2007045696A3 Method and system for reconstructing the three-dimensional shape of the surface of at least a portion of an ear canal and/or of a concha |
| 06/21/2007 | US20070141734 Optical method for measuring thin film growth |
| 06/21/2007 | US20070139660 Laser irradiation apparatus and laser irradiation method and method for manufacturing semiconductor device |
| 06/21/2007 | US20070139659 Device and method for capturing speckles |
| 06/21/2007 | US20070139658 Luminous projecting device for the topography of spherical and non-spherical reflective surfaces |
| 06/21/2007 | US20070139657 Three-dimensional geometric measurement and analysis system |
| 06/21/2007 | US20070139656 Measurement of thin films using fourier amplitude |
| 06/21/2007 | US20070139641 Shaft cone metrology system and method |
| 06/21/2007 | US20070139059 Optical measuring system for detecting geometric data of surfaces |
| 06/21/2007 | DE202006002317U1 Einrichtung zur Inspektion von Filamentspulen Means for inspection of filament spools |
| 06/21/2007 | DE19961830B4 Verfahren zur Erzeugung von Zeitmarken beliebiger Punkte beweglicher Bauteile und optische Triggereinrichtung zur Durchführung des Verfahrens A method for generating time stamps of any points of movable components and optical triggering device for performing the method |
| 06/21/2007 | DE102006050834A1 Micrometer and submicrometer surface height measuring apparatus for semiconductor fabrication, has spectrometer analyzing wavelength composition of light returning through coupler, and microscope providing over view of surface |
| 06/21/2007 | DE102005060893A1 Vorrichtung und Verfahren zur Prozesszustandsermittlung durch Tonwert- und Farbtonwiedergabemessung Apparatus and method for process state determination by tonal and color reproduction measurement |
| 06/21/2007 | DE102005060772A1 Detection of the edge of print media in a digital sheet printer by use of linear print sensor with one or two linear sensor array arranged according to the size of sheet being printed |
| 06/21/2007 | DE10160297B4 Vorrichtung zur Untersuchung der Oberfläche eines rotationssystemmetrischen Körpers Apparatus for inspecting the surface of a rotation system metric body |
| 06/20/2007 | EP1798515A2 Measuring or reference unit and chassis measurement therewith |
| 06/20/2007 | EP1797813A1 Optical measuring device for measuring a hollow space |
| 06/20/2007 | EP1393014A4 Microinterferometers with performance optimization |
| 06/20/2007 | CN2914032Y Optics non-contact type three-dimensional shaped measuring instrument |
| 06/20/2007 | CN2914031Y Fiber laser weld image sensor |
| 06/20/2007 | CN1985148A Method for measuring the sagging of a glass panel |
| 06/20/2007 | CN1985147A Apparatus for detecting joints in rubber sheets |
| 06/20/2007 | CN1983037A Exposure method, exposure device, and method of manufacturing device |
| 06/20/2007 | CN1983023A Method and system for detecting corrugation defect and manufacturing method of photomask |
| 06/20/2007 | CN1982842A Flatness measuring device |
| 06/20/2007 | CN1982841A 3d shape measuring apparatus and method thereof |
| 06/20/2007 | CN1982840A Filter-rod periphery inspecting controller |
| 06/20/2007 | CN1982201A Micro-optic reflecting component |
| 06/20/2007 | CN1322310C Measuring device for elevator guide rail lateral displacement |
| 06/20/2007 | CN1322309C Surface roughness non-contact measuring system |
| 06/20/2007 | CN1322308C Micro-corner interferometer |
| 06/20/2007 | CN1322307C Apparatus for surface inspection and method and apparatus for inspecting substrate |
| 06/20/2007 | CN1322306C Dynamic measuring device and method for position posture of space motion object |
| 06/19/2007 | US7233878 Method and system for monitoring component consumption |
| 06/19/2007 | US7233401 Method and apparatus for measuring thickness of a material |
| 06/19/2007 | US7233400 Interferometer for measuring virtual contact surfaces |
| 06/19/2007 | CA2183779C Method and apparatus for monitoring and positioning a beam or jet for operating on a workpiece |
| 06/14/2007 | WO2007066687A1 Temperature measuring method, exposure method, exposure apparatus and method for manufacturing device |
| 06/14/2007 | WO2007066659A1 Surface roughness tester |
| 06/14/2007 | WO2007066465A1 Optical image measuring instrument |
| 06/14/2007 | WO2007066061A1 Coating thickness gauge |
| 06/14/2007 | WO2007065704A1 Device and method for measuring the surface of a body |
| 06/14/2007 | WO2007045871A3 Optical angle detection |
| 06/14/2007 | US20070135958 Integrated endpoint detection system with optical and eddy current monitoring |
| 06/14/2007 | US20070133863 Image Alignment Method, Comparative Inspection Method, and Comparative Inspection Device for Comparative Inspections |
| 06/14/2007 | US20070133862 Detection of surface defects employing subsampled images |
| 06/14/2007 | US20070133013 Guidance system |
| 06/14/2007 | US20070133012 Method and device for determining the actual position of a geodetic instrument |
| 06/14/2007 | US20070133011 3D image measuring apparatus and method thereof |
| 06/14/2007 | US20070133010 Off-axis paraboloid interferometric mirror with off focus illumination |
| 06/14/2007 | US20070133009 Phase shifting imaging module and method of imaging |
| 06/14/2007 | US20070133008 Optical fiber delivered reference beam for interferometric imaging |
| 06/14/2007 | US20070133007 Lithographic apparatus and device manufacturing method using laser trimming of a multiple mirror contrast device |
| 06/14/2007 | US20070133006 Position measurement system |
| 06/14/2007 | US20070133002 Systems and methods for endoscopic angle-resolved low coherence interferometry |
| 06/14/2007 | US20070132996 Alignment devices and methods for providing phase depth control |
| 06/14/2007 | US20070132995 Guidance system |
| 06/14/2007 | US20070131850 Method and apparatus for detecting objects using structured light patterns |
| 06/14/2007 | DE19744938B4 Optische Positionsmeßeinrichtung Optical position |
| 06/14/2007 | DE102006054390A1 Ringkonfiguriertes Photodiodenarray und optische Codierer, die dasselbe verwenden Ringkonfiguriertes photodiode array and optical encoders that use the same |
| 06/14/2007 | DE102006042007A1 Interferometer system, has measurement channel for providing signal indicating measurement along path, and another measurement channel for providing signal indicating measurement having component one direction |
| 06/14/2007 | DE102005059923A1 Eye tissue surface measuring point determining method, involves deriving length of optical path through measuring point to light sensor from measured value of frequency and specific light speed on basis of impulse light source |
| 06/14/2007 | DE102005059550A1 Optical measuring device for measuring inner wall of e.g. ear channel, in animal, has rotatable reflector rotatable around rotary axis so that inner wall of cavity is scanned along line circulating rotary axis |
| 06/14/2007 | DE102005058873A1 Vorrichtung und Verfahren zur Vermessung der Oberfläche eines Körpers Apparatus and method for measuring the surface of a body |
| 06/14/2007 | DE102005058808A1 Position measuring device, has sensing plate supporting hologram consisting of laminar partial holograms that deflect incident laser light in direction of photodetectors, which are assigned to partial holograms, respectively |
| 06/14/2007 | DE102005058519A1 Micro display positioning method, involves selectively correcting undirected movement of micro displays by movement devices, and interrupting formation of polymer structure during correction of position of micro displays |
| 06/14/2007 | DE102005058057A1 Piston-shaped component e.g. pipe, controlling device, has light source with reflecting surface larger than reflector`s opening surface, and camera arranged at vertex angle in component`s lateral surface to record part of lateral surface |
| 06/14/2007 | DE102004049838B4 Messsystem zur Messgenauigkeitsprüfung einer Messeinrichtung und entsprechendes Verfahren Measurement system for measuring accuracy test of a measuring device and corresponding method |
| 06/14/2007 | DE102004028191B4 Verfahren und Vorrichtung zur quantitativen Erfassung der Lage der optischen Achse eines optoelektronischen Sensorsystems Method and apparatus for the quantitative detection of the position of the optical axis of an optoelectronic sensor system |
| 06/13/2007 | EP1795862A1 Device for measuring thickness of transparent objects |
| 06/13/2007 | EP1794684A1 Process and system for analysing deformations in motor vehicles |
| 06/13/2007 | EP1794572A1 Interferometric system with reference surfaces with a mirrored zone |
| 06/13/2007 | EP1794568A2 Dual use detectors for flow cytometry |
| 06/13/2007 | EP1794540A1 Optical measuring device for measuring several surfaces of a measuring object |
| 06/13/2007 | EP1662227B1 Optical method and device for texture quantification of photovoltaic cells |
| 06/13/2007 | EP1203928B1 Road surface roughness measuring device |
| 06/13/2007 | CN2911653Y Video tensiometer |
| 06/13/2007 | CN2911632Y Co-taper optical measurer for helicopter lifting airscrew |
| 06/13/2007 | CN1980775A Robot-controlled optical measurement array, and method and auxiliary mechanism for calibrating said measurement array |
| 06/13/2007 | CN1979137A Substrate inspection device, method and device for setting inspection logic |
| 06/13/2007 | CN1979091A Optical measuring system |
| 06/13/2007 | CN1979089A Coke-blowhole harshness detecting method |
| 06/13/2007 | CN1979087A Image processing device and method |
| 06/13/2007 | CN1979086A Low walk-off interferometer |
| 06/13/2007 | CN1321446C Wire loop height measurement apparatus and method |
| 06/13/2007 | CN1321444C Wiring pattern embedding checking method, semiconductor device manufacturing method and checking device |
| 06/13/2007 | CN1321417C Method and device for measuring angle of torsion of suspension for magnetic disk |
| 06/13/2007 | CN1321316C 光学式测定装置及光学式测定方法 Optical measuring apparatus and an optical measurement method |
| 06/12/2007 | US7231081 Stereoscopic three-dimensional metrology system and method |
| 06/12/2007 | US7231079 Method and system for inspecting electronic circuit pattern |
| 06/12/2007 | US7230728 Disc imbalance compensation during disc drive assembly |
| 06/12/2007 | US7230727 System for sensing an absolute position in two dimensions using a target pattern |
| 06/12/2007 | US7230726 Scanning unit for a position measuring instrument for optical scanning of a object measuring graduation |
| 06/12/2007 | US7230725 Method and apparatus for imaging three-dimensional structure |
| 06/12/2007 | US7230724 Three-dimensional measuring apparatus for scanning an object and a measurement head of a three-dimensional measuring apparatus and method of using the same |
| 06/12/2007 | US7230723 High-accuracy pattern shape evaluating method and apparatus |
| 06/12/2007 | US7230722 Shadow moire using non-zero talbot distance |
| 06/12/2007 | US7230721 Arrangement for measuring the geometry or structure of an object |
| 06/12/2007 | US7230720 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
| 06/12/2007 | US7230719 High sensitivity scanning probe system |