Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
04/2007
04/25/2007EP0913071A4 Method and device for measuring the thickness of opaque and transparent films
04/25/2007EP0781398B1 Movement and position mesuring device and method
04/25/2007CN2893643Y ribbed reinforced bar characteristic dimension measuring instrument
04/25/2007CN1953848A Method for robot-assisted measurement of measurable objects
04/25/2007CN1952599A A flat leaf area nondestructive measuring system and method thereof
04/25/2007CN1952596A Probe observing device, surface property detector
04/25/2007CN1952595A Three-dimensional shape measuring apparatus, computer-readable recording medium, and three-dimensional shape measuring method
04/25/2007CN1952594A Surface profile measuring method and apparatus thereof
04/25/2007CN1952593A 激光检测仪 Laser Detector
04/25/2007CN1952592A 一种光学测量方法 An optical measurement method
04/25/2007CN1312465C Device for measuring silicon sheet binding strength
04/25/2007CN1312461C Reconstruction system and method for sheet three-dimensional surface of flexible body
04/25/2007CN1312460C Device and method for measuring geometries of essentially two-dimensional objects
04/25/2007CN1312459C Device of measuring dynamic characteristics of micro electromechanical system possessing environment-loading function
04/25/2007CN1312458C Camera corrector
04/24/2007US7209857 Method of evaluating shape of semiconductor wafer and apparatus for evaluating shape of semiconductor wafer
04/24/2007US7209586 Method and arrangement for detecting the spatial form of an object
04/24/2007US7209584 Pattern inspection apparatus
04/24/2007US7209291 Optical displacement sensor
04/24/2007US7209272 Object detecting apparatus having operation monitoring function
04/24/2007US7209243 Illumination device, and coordinate measuring instrument having an illumination device
04/24/2007US7209242 Non-contact surface configuration measuring apparatus and method thereof
04/24/2007US7209241 Method for determining wavefront aberrations
04/24/2007US7209240 System and apparatus for measuring displacements in electro-active materials
04/24/2007US7209239 System and method for coherent optical inspection
04/24/2007US7209238 Interferometer arrangement and interferometric measuring method
04/24/2007US7209235 Accurate positioning of components of a optical assembly
04/24/2007US7209232 Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution
04/24/2007US7209228 Scanning apparatus
04/24/2007US7209225 Inclination angle detection device and inclination angle detection method
04/24/2007US7208749 System and method for locating and positioning an ultrasonic signal generator for testing purposes
04/24/2007US7208714 Optical displacement sensor and external force detecting device
04/19/2007WO2007044934A2 Methods for characterizing semiconductor material using optical metrology
04/19/2007WO2007044786A2 Interferometry method and system including spectral decomposition
04/19/2007WO2007043424A1 Fluid pressure drive apparatus with displacement detector
04/19/2007WO2007043324A1 Exposure apparatus
04/19/2007WO2007042676A1 Method and device for measuring heights of patterns
04/19/2007WO2007006772A3 Optomechanical device for detecting position and for determining an angle
04/19/2007WO2006135898A3 Lighting subsystem for a machine vision system
04/19/2007WO2006044320A3 Overlay measurement target
04/19/2007WO2005047974A3 Measurement and compensation of errors in interferometers
04/19/2007US20070088478 Vehicle travel distance calculation method, vehicle travel distance calculation apparatus, vehicle current position detection method and vehicle current postition detection apparatus
04/19/2007US20070086021 Drop location verification system
04/19/2007US20070086020 Shadow moire using non-zero talbot distance
04/19/2007US20070086019 Methods and systems for determining optical properties using low-coherence interference signals
04/19/2007US20070086018 Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure
04/19/2007US20070086017 Imaging Systems Using Unpolarized Light And Related Methods And Controllers
04/19/2007US20070086013 Interferometry method and system including spectral decomposition
04/19/2007US20070086000 Device and method for inspecting surfaces in the interior of holes
04/19/2007US20070085904 In-situ component monitoring
04/19/2007DE4320485B4 Verfahren zur Objektvermessung mittels intelligenter Entfernungsbildkamera Method for object measurement using intelligent distance camera
04/19/2007DE102005049927A1 Sensor arrangement, for monitoring the transport of printed material in a printing machine, comprises a sensor arranged on the printing path, a cleaning device for the sensor and a storage device
04/19/2007DE102005049441A1 Verfahren zur Schichtdickebestimmung eines füllerlosen Automobillacks A method for determining a filler-free layer thickness automotive paint
04/19/2007DE10027473B4 Verfahren zum Ermitteln der Neigungen von wenigstens zwei übereinander angeordneten Flächen Method for determining the inclination of at least two superimposed surfaces
04/18/2007EP1775570A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775569A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775568A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775567A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775548A2 Method and device for the detection of the deformation of objects
04/18/2007EP1775547A1 Method for layer thickness measurement of a car paint without filler primer
04/18/2007EP1775546A1 Method and system for determining mail piece dimensions using swept laser beam
04/18/2007EP1774255A2 Measurement device
04/18/2007EP1474652B1 Method for determining the range of visibility and method for detecting the presence of fog
04/18/2007EP1419362A4 In-situ mirror characterization
04/18/2007CN1950844A Object posture estimation/correlation system, object posture estimation/correlation method, and program for the same
04/18/2007CN1950670A Measuring device provided with a probe-tip
04/18/2007CN1950669A Device and method for optical precision measurement
04/18/2007CN1950668A Device and method for a combined interferometry and image-based determination of geometry, especially for use in microsystems technology
04/18/2007CN1949842A Image display with vision protection function and controlling method thereof
04/18/2007CN1948955A Substrate inspection apparatus
04/18/2007CN1948901A Large component assembling and welding deformation auto-real-time monitoring method
04/18/2007CN1948900A Optical type positioning device
04/18/2007CN1948899A Volume precision measuring apparatus and method thereof
04/18/2007CN1948897A Pipe displace ment sensor of optical fibre grating marmen
04/18/2007CN1948896A Dynamic 3D laser scanning testing head
04/18/2007CN1948895A Measuring method of complete imaging based on form
04/18/2007CN1948894A Bar cutter angle measuring microscope
04/18/2007CN1948893A Automatically balancing method of interfering measuring system
04/18/2007CN1310622C Method and device for determining a load axis of an extremity
04/17/2007US7206717 Sensor alignment method for 3D measurement systems
04/17/2007US7206716 Wheel alignment with surface-oriented runout determination
04/17/2007US7206080 Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatus
04/17/2007US7206078 Non-destructive testing system using a laser beam
04/17/2007US7206077 Flying height tester and flying height test method
04/17/2007US7206076 Thickness measurement of moving webs and seal integrity system using dual interferometer
04/17/2007US7206074 Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
04/17/2007US7206071 Detector configurations for optical metrology
04/17/2007US7206058 Off-axis levelling in lithographic projection apparatus
04/17/2007US7205742 Calibration method
04/17/2007US7205549 Pattern defect inspection method and its apparatus
04/17/2007US7205531 Sample information measuring method and scanning confocal microscope
04/17/2007US7205529 Laser mirror vision
04/17/2007US7205521 Speckle based sensor for three dimensional navigation
04/17/2007US7204943 Method and apparatus for handling parts ejected from an injection molding machine
04/17/2007US7204254 Markers and systems for detecting such markers
04/17/2007US7204146 Device and method for measuring thickness
04/12/2007WO2007041691A2 Method for synchronizing the operation of multiple devices for generating three dimensional surface models of moving objects
04/12/2007WO2007041412A1 Method and apparatus for method for viewing and analyzing of one or more biological samples with progressively increasing resolutions
04/12/2007WO2007041376A1 Method and apparatus for optical imaging via spectral encoding
04/12/2007WO2007040530A1 Novel temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials