| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 05/31/2007 | US20070124108 Structure, system and method for dimensionally unstable layer dimension measurement |
| 05/31/2007 | US20070122026 Method for planning an inspection path for determining areas that are to be inspected |
| 05/31/2007 | US20070121138 Image processing device, method, and program |
| 05/31/2007 | US20070121124 Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium |
| 05/31/2007 | US20070121123 End point detection in workpiece processing |
| 05/31/2007 | US20070121122 Method for the automatic parameterization of measuring systems |
| 05/31/2007 | US20070121121 Method and apparatus for detecting the deformation of objects |
| 05/31/2007 | US20070121120 Apparatus and method for measuring scleral curvature and velocity of tissues of the eye |
| 05/31/2007 | US20070121108 Surface inspection apparatus and method thereof |
| 05/31/2007 | US20070121105 Optical sample characterization system |
| 05/31/2007 | US20070121102 Positioning a first surface in a pre-determined position relative to a second surface |
| 05/31/2007 | US20070121101 Target plate for positioning components |
| 05/31/2007 | US20070120945 Recording material discrimination device, image forming apparatus and method therefor |
| 05/31/2007 | US20070120872 Image processing device and method therefor and program codes, storing medium |
| 05/31/2007 | US20070120079 Measuring device and measuring method for verifying the cut quality of a sheet |
| 05/31/2007 | US20070120078 Method of measuring pattern dimension and method of controlling semiconductor device process |
| 05/31/2007 | US20070119272 Aligning components of a measuring system |
| 05/31/2007 | US20070119066 Apparatus for automatically measuring external and internal profile of a pipe at the end thereof |
| 05/31/2007 | DE19527268B4 Mehrkoordinatenmeßgerät mit interferometrischer Meßwerterfassung Mehrkoordinatenmeßgerät with interferometric data acquisition |
| 05/31/2007 | DE10341959B4 Verfahren zum Vermessen einer Oberfläche gegenüber einer Referenzoberfläche A method for measuring a surface relative to a reference surface |
| 05/31/2007 | DE102006055652A1 Verfahren zur Aufarbeitung dreidimensionaler Daten und Vorrichtung zur Aufarbeitung dreidimensionaler Daten A process for the work-up of three-dimensional data and three-dimensional data for the processing device |
| 05/31/2007 | DE102006040858A1 Laserscanner und Laserpositioniergerät Laser scanner and Laserpositioniergerät |
| 05/31/2007 | DE102005055949A1 Verfahren zur Herstellung eines Drehmoment- und Winkelsensors sowie zugehöriger Drehmoment- und Winkelsensor A process for the preparation of a torque and angle sensor and associated torque and angle sensor |
| 05/31/2007 | DE102005054607A1 Verfahren zur Bestimmung der Restschichtdicke, bei der Ausbildung von Sacklöchern oder Schnittfugen in Bauteilen Method for the determination of the residual layer thickness in the training of blind holes or cut joints in structures |
| 05/31/2007 | DE102005052757A1 Vorrichtung zur Positionsmessung eines Objekts mit einem Laser-Interferometersystem A device for measuring the position of an object with a laser interferometer system |
| 05/31/2007 | DE102005042890B4 Konfokalmikroskop und Verfahren zur Detektion mit einem Konfokalmikroskop Confocal microscope and method for detection with a confocal microscope |
| 05/31/2007 | CA2630231A1 Method and apparatus for establishing reflection properties of a surface |
| 05/30/2007 | EP1791165A1 Stage device and exposure system |
| 05/30/2007 | EP1790975A2 A device for welding check of welded trays and relative procedure |
| 05/30/2007 | EP1790970A2 Sample analyzing method, sample analyzing apparatus, manufacturing method of organic el element, manufacturing equipment, and recording medium |
| 05/30/2007 | EP1789783A1 Apparatus and method for analysis of size, form and angularity and for compositional analysis of mineral and rock particles |
| 05/30/2007 | EP1789753A1 Method and apparatus for thin film metrology |
| 05/30/2007 | EP1789752A2 Thin film interference filter and bootstrap method for interference filter thin film deposition process control |
| 05/30/2007 | EP1718957B1 Method and device for control by shadowgraphy |
| 05/30/2007 | EP1269813B1 Method and device for monitoring electric components in a pick-and-place device for substrates |
| 05/30/2007 | EP1003978A4 Load indicating fastener systems method and apparatus |
| 05/30/2007 | CN2906667Y Quick spectrometer adjuster |
| 05/30/2007 | CN2906663Y Adjustable laser alignment tube device |
| 05/30/2007 | CN2906558Y Mini-sensor with inclined steel belt grating |
| 05/30/2007 | CN2906549Y Image measuring machine with a work table employing toothless polished-rod transmission mechanism |
| 05/30/2007 | CN1973371A Elongated features for improved alignment process integration |
| 05/30/2007 | CN1973180A Scanner system and method for registering surfaces |
| 05/30/2007 | CN1973179A Monitoring device for rotating body |
| 05/30/2007 | CN1973178A Distributed optical fiber sensor |
| 05/30/2007 | CN1971232A Hartmann wavefront sensor with active alignment function and detection method therefor |
| 05/30/2007 | CN1971211A Three-point-linked variable spherical curvature measuring instrument and method therefor |
| 05/30/2007 | CN1971210A Laser plane coordinate calibration device |
| 05/30/2007 | CN1971209A Wide-range displacement transducer for measuring linear phase grating profile |
| 05/30/2007 | CN1971208A Method for measuring object deformation field by using moire interference carrier frequency modulation technology |
| 05/30/2007 | CN1971207A Large-shearing carrier-frequency electronic speckle interference displacement field separating method |
| 05/30/2007 | CN1971206A Calibration method for binocular vision sensor based on one-dimension target |
| 05/30/2007 | CN1971205A Portable reverse measuring system for area-structure light |
| 05/30/2007 | CN1971204A Measuring device and method based on machine vision and plane orthogonal grating |
| 05/30/2007 | CN1319143C Wafer pre-alignment apparatus and method |
| 05/30/2007 | CN1319049C Method and arrangement for removing noise and measurements of head-media spacing modulation for digital recording |
| 05/30/2007 | CN1319012C Part recognizing method and device |
| 05/30/2007 | CN1318840C Synchronous optical measurement and inspection method and means |
| 05/30/2007 | CN1318822C Coded disc |
| 05/29/2007 | US7224655 Apparatus method for detecting tilt at inner and outer circumference and determining tilt degree based on times when focus error signals are detected |
| 05/29/2007 | US7224475 Methods and apparatus for measurement of a dimensional characteristic and methods of predictive modeling related thereto |
| 05/29/2007 | US7224473 Strobe light and laser beam detection for laser receiver |
| 05/29/2007 | US7224472 Operation lamp with camera system for 3D referencing |
| 05/29/2007 | US7224471 Azimuthal scanning of a structure formed on a semiconductor wafer |
| 05/29/2007 | US7224470 Method and apparatus for measuring surface configuration |
| 05/29/2007 | US7224469 Optical system alignment system and method with high accuracy and simple operation |
| 05/29/2007 | US7224467 System for rotation measurement with laser interferometry |
| 05/29/2007 | US7224466 Compact multi-axis interferometer |
| 05/29/2007 | US7224459 Exposure apparatus, method of controlling same, method of manufacturing devices, computer-readable memory and program |
| 05/29/2007 | US7224447 System and method for measuring the permeability of a material |
| 05/29/2007 | US7223977 Method of measuring thickness of an opaque coating using near-infrared absorbance |
| 05/29/2007 | US7223963 Optical encoder |
| 05/29/2007 | US7222431 Alignment correction system and methods of use thereof |
| 05/29/2007 | CA2378867C Method and system for measuring the relief of an object |
| 05/29/2007 | CA2281627C System and method for laser ultrasonic bond integrity evaluation |
| 05/24/2007 | WO2007059292A2 Apparatus and method for measuring scleral curvature and velocity of tissues of the eye |
| 05/24/2007 | WO2007059249A2 Interferometer with coherent artifact reduction plus vibration and enviromental compensation |
| 05/24/2007 | WO2007059088A2 Interferometer and method for measuring characteristics of optically unresolved surface features |
| 05/24/2007 | WO2007058151A1 Plane position detecting apparatus, exposure apparatus and device manufacturing method |
| 05/24/2007 | WO2007057578A1 Method and system for reconstructing surfaces of objects by polarization imagery |
| 05/24/2007 | WO2007057414A1 Method and device for characterizing a sample by means of double-beam laser interferometry |
| 05/24/2007 | WO2007056974A1 Optical measurement of metallic surfaces |
| 05/24/2007 | WO2007024858A9 Method and apparatus for measuring the crepe of a moving sheet |
| 05/24/2007 | WO2007005527A3 Method and system for measuring the curvature of an optical surface |
| 05/24/2007 | WO2006132585A8 Method and device for optimization of flatness control in the rolling of a strip |
| 05/24/2007 | US20070118330 Dual wall turbine blade ultrasonic wall thickness measurement technique |
| 05/24/2007 | US20070116378 Image processing device, method, and program |
| 05/24/2007 | US20070116377 Image processing device, method, and program |
| 05/24/2007 | US20070116352 Pick and place machine with component placement inspection |
| 05/24/2007 | US20070116351 Pick and place machine with component placement inspection |
| 05/24/2007 | US20070115486 Film forming device, and production method for optical member |
| 05/24/2007 | US20070115485 Optical position/motion tracking system |
| 05/24/2007 | US20070115484 3d shape measurement system and method including fast three-step phase shifting, error compensation and calibration |
| 05/24/2007 | US20070115483 Surface finish roughness measurement |
| 05/24/2007 | US20070115482 Flatness tester for optical components |
| 05/24/2007 | US20070115481 Method and system of coregistrating optical coherence tomography (OCT) with other clinical tests |
| 05/24/2007 | US20070115480 Multi-cavity fabry-perot interferometric thin-film sensor with built-in temperature compensation |
| 05/24/2007 | US20070115476 Common path frequency domain optical coherence reflectometry/tomography device |
| 05/24/2007 | US20070115471 Wafer, exposure mask, method of detecting mark and method of exposure |
| 05/24/2007 | US20070115470 Automated laser-assisted positioning method and system for a display production line |
| 05/24/2007 | US20070114873 Method and apparatus for checking stator core alignment |