Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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07/24/2007 | US7248365 Method for adjusting a substrate in an appliance for carrying out exposure |
07/24/2007 | US7248352 Method for inspecting defect and apparatus for inspecting defect |
07/24/2007 | US7248351 Optimizing light path uniformity in inspection systems |
07/24/2007 | US7248349 Exposure method for correcting a focal point, and a method for manufacturing a semiconductor device |
07/24/2007 | US7248344 Surface profile measurement |
07/24/2007 | US7248337 Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby |
07/24/2007 | US7248298 Fingerprint recognition sensor and manufacturing method thereof |
07/24/2007 | US7248287 Method for examining shooting direction of camera apparatus, device thereof and structure for installing sensor |
07/24/2007 | US7247952 Optical targets |
07/24/2007 | US7247868 Position detection method and apparatus |
07/24/2007 | US7247843 Long-range gap detection with interferometric sensitivity using spatial phase of interference patterns |
07/24/2007 | US7247345 Optical film thickness controlling method and apparatus, dielectric multilayer film and manufacturing apparatus thereof |
07/19/2007 | WO2007082228A1 Systems and methods for generating data based on one or more spectrally-encoded endoscopy techniques |
07/19/2007 | WO2007080407A2 Disc cover layer measurement system |
07/19/2007 | WO2007080014A1 Method for optically measuring a chassis |
07/19/2007 | WO2007080012A1 Method for optically measuring a chassis |
07/19/2007 | WO2007080011A2 Method for optically measuring a chassis |
07/19/2007 | WO2007079837A1 Scanning system for scanning an object surface, in particular for a coordinate measurement machine |
07/19/2007 | WO2007079811A1 Method and device for optical distance measurement |
07/19/2007 | US20070165939 Reduction of false alarms in pcb inspection |
07/19/2007 | US20070165247 Method of placing at least one component on at least one substrate as well as such a system |
07/19/2007 | US20070165246 Three-dimensional video scanner |
07/19/2007 | US20070165245 Device and method for three-dimensional optical measurement |
07/19/2007 | US20070165244 Apparatus and method for performing enrollment of user biometric information |
07/19/2007 | US20070165243 Device for measuring 3d shape using irregular pattern and method for the same |
07/19/2007 | US20070165242 Surface shape measurement apparatus and method |
07/19/2007 | US20070165241 Dual technology optical profilometer |
07/19/2007 | US20070165240 Shape measurement method |
07/19/2007 | US20070165206 Installation for processing plate-shaped substrates |
07/19/2007 | US20070165205 Doppler tracking optical monopulse |
07/19/2007 | US20070163671 Method and device for non-contacting monitoring of a filling state |
07/19/2007 | US20070163137 Metrology instruments |
07/19/2007 | DE19624167B4 Kohärenz-Biometrie und -Tomographie mit dynamischem kohärentem Fokus Coherence biometry and tomography with dynamic coherent focus |
07/19/2007 | DE10256154B4 System und Verfahren zur Kompensation von Hochgeschwindigkeits-Nichtlinearitäten bei heterodynen Interferometern System and method of compensating for high speed non-linearities in heterodyne interferometers |
07/19/2007 | DE102006002460A1 Optical scanning system for semiconductor wafer, has control unit for controlling movement of deflecting units such that optical path has constant length from scanning surface of object to camera, when surface is scanned at preset area |
07/19/2007 | DE102006001496A1 Work piece geometrical changes determining system, has evaluation unit for evaluating differential geometrical value, which specifies difference between work piece geometrical value and reference geometrical value |
07/19/2007 | DE102005022095B4 Verfahren und Vorrichtung zur Bestimmung einer lateralen Relativbewegung zwischen einem Bearbeitungskopf und einem Werkstück Method and apparatus for determination of a lateral relative movement between a machining head and a workpiece |
07/19/2007 | DE10127304C5 Verfahren und Vorrichtung zur Bestimmung der dreidimensionalen Kontur einer spiegelnden Oberfläche eines Objektes Method and apparatus for determining the three-dimensional contour of a reflecting surface of an object |
07/19/2007 | DE10115080B4 Objekterkennungssystem Object recognition system |
07/19/2007 | DE10042123B9 Vorrichtung zur Durchführung von optischen Messungen an einer Probe in einer Vakuumkammer Device for carrying out optical measurements on a sample in a vacuum chamber |
07/19/2007 | CA2634290A1 Scanning system for scanning an object surface, in particular for a coordinate measurement machine |
07/18/2007 | EP1808810A1 3d shape estimation system and image generation system |
07/18/2007 | EP1808686A1 Testing device for hollow objects |
07/18/2007 | EP1808670A2 Optical determination of the relative positions of objects in space |
07/18/2007 | EP1808669A1 Device and method for three dimensional optical measuring |
07/18/2007 | EP1808232A1 Centrifugal separator and analyzer with the same |
07/18/2007 | EP1807676A1 Navigation system and method using modulated celestial radiation sources |
07/18/2007 | EP1182486B1 Confocal microscope comprising pattern forming rotation disk |
07/18/2007 | EP1169632A4 Optical autofocus for use with microtiter plates |
07/18/2007 | EP0895609B1 Method for marking an object made of translucent synthetic material, in particular an ophthalmic lens, marked object and corresponding method of identification of such an object |
07/18/2007 | EP0866954A4 Five-axis/six-axis laser measuring system |
07/18/2007 | CN2924484Y Three grating beam type strain measurment structure |
07/18/2007 | CN1327262C Object lens producing device and producing method |
07/18/2007 | CN1327261C An optical aspheric surface detection qausi-universal compensating mirror |
07/18/2007 | CN1327204C Measurement error correction method for automobile head light |
07/18/2007 | CN1327191C 曲面测量仪 Surface measuring instrument |
07/18/2007 | CN1326505C Method and system for determining the position and alignment of a surface of an object in relation to a laser beam |
07/18/2007 | CN101002306A Method of measuring the position of a mask surface along the height direction, exposure device, and exposure method |
07/18/2007 | CN101002230A Method and apparatus for improved vision detector image capture and analysis |
07/18/2007 | CN101002229A Method and apparatus for improved vision detector image capture and analysis |
07/18/2007 | CN101000499A Contour machining method and system based on multi-sensor integral measuring |
07/18/2007 | CN101000252A Double-raster displacement sensor |
07/18/2007 | CN101000247A Device for discriminating rotar position of magnet suspension flywheel |
07/18/2007 | CN101000236A Reflection type optical sensor and method for detecting surface roughness |
07/18/2007 | CN101000235A Device for detecting three-axle parallel of large photoelectric monitoring equipment using thermal target technology |
07/18/2007 | CN101000234A Device and method for three dimensional optical measuring |
07/18/2007 | CN101000233A Underwater 3D topographic surveying system |
07/18/2007 | CN101000232A Method for precision measuring space offset of telephotolens and eyepiece using interferometer |
07/18/2007 | CN100999220A On-line detection method and device for vehicle wheel set diameter |
07/17/2007 | US7245790 System and method for resolution enhancement of a distributed sensor |
07/17/2007 | US7245388 Method and device for surface inspection |
07/17/2007 | US7245387 Three-dimensional measuring instrument |
07/17/2007 | US7245386 Object measuring device and associated methods |
07/17/2007 | US7245385 Characterizing unsteady pressures in pipes using optical measurement devices |
07/17/2007 | US7245384 Sample inclination measuring method |
07/17/2007 | US7245383 Optical image measuring apparatus for obtaining a signal intensity and spatial phase distribution of interference light |
07/17/2007 | US7245317 Imaging device having a luminous profile detecting element |
07/17/2007 | US7244937 Optical measurement apparatus with laser light source |
07/17/2007 | US7244623 Method of manufacturing semiconductor device and apparatus of automatically adjusting semiconductor pattern |
07/17/2007 | US7243441 Method and apparatus for measuring depth of holes formed on a specimen |
07/17/2007 | US7243437 Decoding device for double-sided keys |
07/17/2007 | US7243433 Laser level with adjustable laser projection line |
07/17/2007 | CA2334585C Device for determining the contour of a road surface |
07/17/2007 | CA2309008C High speed laser triangulation measurements of shape and thickness |
07/12/2007 | WO2007078584A1 Optical translation of triangulation position measurement |
07/12/2007 | WO2007077063A1 Method and apparatus for contactlessly measuring the axle geometry |
07/12/2007 | WO2007076746A1 Optical imaging system for testing a wave front |
07/12/2007 | WO2007044934A3 Methods for characterizing semiconductor material using optical metrology |
07/12/2007 | WO2006124939A3 Optical vibration imager |
07/12/2007 | WO2006066255A3 System and method for inspecting a workpiece surface using surface structure spatial frequencies |
07/12/2007 | US20070162254 Diving information processing device, control method for a diving information processing device, and a control program |
07/12/2007 | US20070160338 Connector box partly embedded in a fibre-reinforced part for protecting and connecting purposes |
07/12/2007 | US20070159640 Shared color sensors for high-resolution 3-D camera |
07/12/2007 | US20070159632 Pattern forming method, pattern forming apparatus, and device manufacturing method |
07/12/2007 | US20070159631 Transparent wafer with optical alignment function and fabricating method and alignment method thereof |
07/12/2007 | US20070159609 Exposure apparatus and device manufacturing method |
07/12/2007 | DE102006059235A1 Phasenschiebendes Bildgebungsmodul und Bildgebungsverfahren Phase shift end imaging module and imaging techniques |
07/12/2007 | DE102006021557B3 Device under test reproducing and/or measuring arrangement for micro system technology, has illumination device illuminating device under test whose light is kept away from reference path |
07/12/2007 | DE102006000673A1 Vorrichtung und Verfahren zum Abtasten von Oberflächen Apparatus and method for scanning surfaces |
07/12/2007 | CA2635864A1 Optical translation of triangulation position measurement |