Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2007
10/03/2007CN200955953Y Laser road structure depth detecting instrument
10/03/2007CN200955950Y Size detecting equipment for cutting ribbed steel bar, rod, wire
10/03/2007CN200955949Y Ceramic tile size and shape on-line vision measuring system
10/03/2007CN200955948Y Device for dynamically measuring geometrical size increase or decrease of object
10/03/2007CN101048676A Optical element manufacturing method, optical element, nipkow disc, confocal optical system, and 3d measurement device
10/03/2007CN101046624A Pattern defect detection device, pattern defect detection method and manufacturing method for photomask
10/03/2007CN101046444A Process of applying white light interference system in measuring variable light absorbing wavelength of spectrophotometer
10/03/2007CN101046372A Crystal chip bearing tray detecting process
10/03/2007CN101046371A Method for measuring curvature of micron/nanometer cantilever based on microinterference and finite difference
10/03/2007CN101046370A Phase expansion method based on rotary iteration
10/03/2007CN101045459A Contactless CCD high speed dynamic detection device
10/03/2007CN101045397A Printer device
10/03/2007CN101045374A Method and device for processing picture taking for edges of moving object
10/03/2007CN100341314C Optical sensing device
10/03/2007CN100341130C Apparatus and method for automatically detecting chip surface quality through measuring bonding speed
10/03/2007CN100341022C TFT sensor having improved imaging surface
10/03/2007CN100340892C Medical optical guage
10/03/2007CN100340869C Electro-optic double modulation polarized light laser distance measuring method and its device
10/03/2007CN100340840C Method and device for optical form measurement and/or estimation
10/03/2007CN100340839C Fibre-optical strain measuring device and method thereof
10/03/2007CN100340838C Method and device for measuring double refraction single-shaft crystal wave plate thickness
10/03/2007CN100340837C Laser distance tester
10/03/2007CA2541635A1 Hybrid sensing apparatus for adaptive robotic processes
10/02/2007US7277642 Fine displacement detection device by sound or the like
10/02/2007US7277594 System and method for preparing an image corrected for the presence of a gravity induced distortion
10/02/2007US7277566 Microscope system
10/02/2007US7277190 Measurement system with an optical measurement arrangement
10/02/2007US7277189 Generation of a library of periodic grating diffraction signals
10/02/2007US7277188 Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
10/02/2007US7277187 Overhead dimensioning system and method
10/02/2007US7277185 Method of measuring overlay
10/02/2007US7277184 Method of characterization of liquid crystal cell
10/02/2007US7277183 Vibration resistant interferometry
10/02/2007US7277181 Interferometric apparatus and method for surface profile detection
10/02/2007US7277180 Optical connection for interferometry
10/02/2007US7277173 Active optical alignment using MEMS mirrors
10/02/2007US7277164 Process and station for inspecting the painting of motor vehicle bodywork parts
10/02/2007US7277162 Dynamic performance monitoring of long slender structures using optical fiber strain sensors
10/02/2007US7276717 Measuring apparatus, exposure apparatus and device manufacturing method
10/02/2007US7276380 Transparent liquid inspection apparatus, transparent liquid inspection method, and transparent liquid application method
09/2007
09/27/2007WO2007109778A1 Fiber optic instrument sensing system
09/27/2007WO2007109739A1 Measuring movement of an elongated instrument
09/27/2007WO2007109616A2 System and method to measure nano-scale stress and strain in materials
09/27/2007WO2007108182A1 Method for forming laser welded part
09/27/2007WO2007108060A1 Interference measurement method and interference measurement instrument employing it
09/27/2007WO2007107693A1 Fiber optic cable
09/27/2007WO2007107242A1 Method for determining the position and orientation of a measuring or repairing device and an apparatus operating on the basis of the method
09/27/2007WO2007045994B1 Drop location verification system
09/27/2007WO2007030993A8 Micro-cavity measuring equipment and method based on double optical fiber coupling
09/27/2007WO2007016544A3 An apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
09/27/2007US20070225692 Methods and Systems for Laser Calibration and Eye Tracker Camera Alignment
09/27/2007US20070223011 Optimization of diffraction order selection for two-dimensional structures
09/27/2007US20070223010 Apparatus for optically determining the profile and/or upper surface properties of flat workpieces in a wide belt abrading machine
09/27/2007US20070223009 Apparatus and method for measuring structural parts
09/27/2007US20070223008 Wavelength determining apparatus, method and program for thin film thickness monitoring light
09/27/2007US20070223007 Displacement measurement systems lithographic apparatus and device manufacturing method
09/27/2007US20070223006 Systems and methods for performing rapid fluorescence lifetime, excitation and emission spectral measurements
09/27/2007US20070222991 Image control in a metrology/inspection positioning system
09/27/2007US20070222990 Alignment tool for a lithographic apparatus
09/27/2007US20070222989 Semiconductor integrated circuit and semiconductor integrated circuit arrangement device and process
09/27/2007DE112005002690T5 Verfahren und System zur optischen Kantenbestimmung A method and system for optical edge determination
09/27/2007DE112005002395T5 Sichtlinien-Detektionsverfahren Line of sight detection method
09/27/2007DE102006014509A1 Prüfkörper und Verfahren zum Einmessen eines Koordinatenmessgerätes Apparatus and method for calibrating a coordinate measuring machine
09/27/2007DE102006013584A1 Vorrichtung und Verfahren zum Vermessen von Bauteilen Apparatus and method for measuring components
09/27/2007DE102006013185A1 Verfahren zur Ermittlung der Position und Orientierung einer Meß- oder Reparatureinrichtung und eine nach dem Verfahren arbeitende Vorrichtung Method for determining the position and orientation of a measurement or repair facility and operating according to the process equipment
09/27/2007CA2646530A1 Measuring movement of an elongated instrument
09/26/2007EP1837623A1 Method and device for recording the surface form of a partially reflective surface
09/26/2007EP1837622A1 Method and device for determining the geometrical data of a cable crimp
09/26/2007EP1837596A2 Calibration of optical patternator spray parameter measurements
09/26/2007EP1387996B1 Method for measuring and/or machining a workpiece
09/26/2007CN200952937Y Digital object position measuring device
09/26/2007CN200952936Y Stereo cutter blade detecting device
09/26/2007CN200951900Y Detecting apparatus of matter tray bulk dish
09/26/2007CN101044370A Method for calibrating the geometry of a multi-axis metrology system
09/26/2007CN101042542A Displacement measurement systems lithographic apparatus and device manufacturing method
09/26/2007CN101042298A Optical ranging sensor and warm water wash toilet seat
09/26/2007CN101042297A On-line measurement method and system for photo-electric liquid surface floating oil layer thickness
09/26/2007CN101042296A Apparatus for measuring three dimensional shape
09/26/2007CN101042295A Producing method capable of global indexing coding sequence and uses thereof
09/26/2007CN100339700C Method and device for investigating polarization film
09/26/2007CN100339681C Optical disk detecting device
09/26/2007CN100339680C T-shape guide linear laser detecting instrument
09/26/2007CN100339679C Surveying instrument
09/26/2007CN100339678C 旋转角检测装置 Rotation angle detection device
09/25/2007US7275006 Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor
09/25/2007US7275005 Worked product appearance inspection method and system therefore
09/25/2007US7274812 Image processing device and method
09/25/2007US7274472 Resolution enhanced optical metrology
09/25/2007US7274471 Systems and methods for measuring distance of semiconductor patterns
09/25/2007US7274470 Optical 3D digitizer with enlarged no-ambiguity zone
09/25/2007US7274469 Method and apparatus for calibrating laser 3D digitizing sensor
09/25/2007US7274467 Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element
09/25/2007US7274466 Method and apparatus for measuring dynamic configuration surface
09/25/2007US7274465 Optical metrology of a structure formed on a semiconductor wafer using optical pulses
09/25/2007US7274464 Position measuring device
09/25/2007US7274463 Anodizing system with a coating thickness monitor and an anodized product
09/25/2007US7274462 In SITU measurement and compensation of errors due to imperfections in interferometer optics in displacement measuring interferometry systems
09/25/2007US7274461 Optical lens system and position measurement system using the same
09/25/2007US7274452 Alignment apparatus
09/25/2007US7274451 Optical beam translation device and method utilizing a pivoting optical fiber