Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2005
01/27/2005US20050017239 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device
01/27/2005US20050017237 Device with n-type semiconductor
01/27/2005US20050017236 Semiconductor device and semiconductor substrate
01/27/2005US20050017235 Semiconductor device including band-engineered superlattice
01/27/2005US20050017176 Quantum dot infrared photodetector focal plane array
01/27/2005US20050017154 Solid-state imaging device and method for driving the same
01/27/2005US20050016960 Method for producing semiconductor device, polishing apparatus, and polishing method
01/27/2005US20050016289 Physical value detecting apparatus and housing for physical value detecting means
01/27/2005US20050015970 Method, system, and apparatus for transfer of dies using a pin plate
01/27/2005DE10361707A1 Verfahren zum Herstellen eines Flash-Speicherbausteins A method of manufacturing a flash memory device
01/27/2005DE10297349T5 Halbleiterstruktur mit verbesserten geringeren Durchlassspannungsverlusten und höherer Sperrfähigkeit Semiconductor structure having improved lower forward voltage loss and higher blocking capability
01/27/2005DE102004027152A1 Flüssigkristallanzeigevorrichtung, welche Dünnschichttransistoren mit polykristallinem Silizium aufweist, und Verfahren zum Herstellen derselben A liquid crystal display device which has thin film transistors with polycrystalline silicon, and process for producing same
01/27/2005DE102004006494A1 Semiconducting wafer has separation longer than sum of difference between maximum, minimum final tolerances of wafer, bearer plate diameter and maximum positioning error when wafer and plate joined
01/27/2005DE102004006197A1 Micromechanical pressure sensor, has component bordering on another component, where cavity of latter component is arranged or structured so that medium to be measured gains access to diaphragm through cavity
01/27/2005CA2525618A1 Semi-insulating gan and method of making the same
01/26/2005EP1501151A1 High frequency switch and electronic device containing the same
01/26/2005EP1501130A1 Semiconductor MOS device and related manufacturing method
01/26/2005EP1501128A1 Three - dimensional ferro-electric memory cell and manufacturing process thereof
01/26/2005EP1501126A1 Semiconductor chip having a cavity for stacked die application
01/26/2005EP1500722A1 Single crystal material having high density dislocations arranged one-dimensionally in straight line form, functional device using said single crystal material, and method for their preparation
01/26/2005EP1500149A1 Silicon particles used as additives for improving the charge carrier mobility in organic semiconductors
01/26/2005EP1500144A2 Trench-gate semiconductor devices
01/26/2005CN1572026A Protective device
01/26/2005CN1572025A Semiconductor device and its manufacturing method
01/26/2005CN1572018A Method for fabricating a power semiconductor device having a floating island voltage sustaining layer
01/26/2005CN1571987A 有源矩阵显示装置 The active matrix display device
01/26/2005CN1571166A Semiconductor device and method of manufacturing the same
01/26/2005CN1571165A Semiconductor device with film transistor
01/26/2005CN1571164A Mos trasistor having a mesh-type gate electrode
01/26/2005CN1571161A Nonvolatile semiconductor memory device and method of manufacturing the same
01/26/2005CN1571150A Mini flipchip transistor and method for manufacturing same
01/26/2005CN1571117A Process of surface treatment, surface treating device, surface treated plate, and electro-optic device
01/26/2005CN1571067A Ferroelectric memory
01/26/2005CN1570745A 薄膜晶体管阵列基板及其修补方法 The thin film transistor array substrate and repair methods
01/26/2005CN1570744A Liquid crystal display and thin film transistor panel therefor
01/26/2005CN1570743A 薄膜晶体管阵列基板及其修补方法 The thin film transistor array substrate and repair methods
01/26/2005CN1570742A 薄膜晶体管阵列基板及其修补方法 The thin film transistor array substrate and repair methods
01/26/2005CN1570741A Thin film transistor array base plate and making method thereof
01/26/2005CN1570740A Warming up method for optical compensation bending mode liquid crystal display
01/26/2005CN1570738A Polycrystalline silicon thin-film transistor (p-SiTFT) liquid crystal display possessing multiple common voltage drive circuit
01/26/2005CN1570735A Active element array architecture
01/26/2005CN1570734A Active assembly array structure and optical self-compensation birefringent liquid crystal display
01/26/2005CN1570204A Film-forming method, semiconductor device, method of manufacturing semiconductor device, display device and method of manufacturing display device
01/26/2005CN1186822C Organic thin film transistor and preparing method
01/26/2005CN1186821C Double perpendicular channel thin film transistor and its manufacturing method
01/26/2005CN1186820C 半导体存储阵列及其制造方法 The semiconductor memory array and method of manufacturing
01/26/2005CN1186817C Programmable non-volatile memory using ultra-thin medium breakdown phenomenon
01/26/2005CN1186812C Method for manufacturing semiconductor memory device with anti-reflecting film
01/26/2005CN1186811C Compensating metal oxide semiconductor device structure and manufacturing method thereof
01/26/2005CN1186684C Display unit and its manufacture
01/25/2005US6847577 Semiconductor memory with inter-block bit wires and inter-block ground wires
01/25/2005US6847556 Method for operating NOR type flash memory device including SONOS cells
01/25/2005US6847125 Resin-encapsulated semiconductor apparatus and process for its fabrication
01/25/2005US6847123 Vertically staggered bondpad array
01/25/2005US6847114 Micro-scale interconnect device with internal heat spreader and method for fabricating same
01/25/2005US6847102 Low profile semiconductor device having improved heat dissipation
01/25/2005US6847098 Non-floating body device with enhanced performance
01/25/2005US6847097 Glass substrate assembly, semiconductor device and method of heat-treating glass substrate
01/25/2005US6847095 Variable reactor (varactor) with engineered capacitance-voltage characteristics
01/25/2005US6847094 Contact structure on a deep region formed in a semiconductor substrate
01/25/2005US6847093 Semiconductor integrated circuit device
01/25/2005US6847092 Microelectronic capacitor structure with radial current flow
01/25/2005US6847091 Vertical semiconductor component having a reduced electrical surface field
01/25/2005US6847089 Gate edge diode leakage reduction
01/25/2005US6847088 Non-volatile semiconductor memory devices and methods for manufacturing the same
01/25/2005US6847087 Bi-directional Fowler-Nordheim tunneling flash memory
01/25/2005US6847086 Semiconductor device and method of forming the same
01/25/2005US6847084 Semiconductor device
01/25/2005US6847083 Semiconductor device, electro-optic device, and electronic instrument
01/25/2005US6847082 Semiconductor integrated device including an electrostatic breakdown protection circuit having uniform electrostatic surge response
01/25/2005US6847081 Dual gate oxide high-voltage semiconductor device
01/25/2005US6847079 Semiconductor device having a stacked gate insulation film and a gate electrode and manufacturing method thereof
01/25/2005US6847078 Non-volatile memory device and method of forming the same
01/25/2005US6847076 Enhanced retention time for embedded dynamic random access memory (DRAM)
01/25/2005US6847070 Five transistor CMOS pixel
01/25/2005US6847069 Thin-film semiconductor device, manufacturing method of the same and image display apparatus
01/25/2005US6847068 Floating gate and fabrication method therefor
01/25/2005US6847067 A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof
01/25/2005US6847065 Radiation-hardened transistor fabricated by modified CMOS process
01/25/2005US6847064 Semiconductor device having a thin film transistor
01/25/2005US6847063 Semiconductor device
01/25/2005US6847062 Semiconductor device
01/25/2005US6847061 Elimination of implant damage during manufacture of HBT
01/25/2005US6847060 Bipolar transistor with graded base layer
01/25/2005US6847058 Semiconductor device
01/25/2005US6847054 Optical transistor and method thereof
01/25/2005US6847051 Elevated photodiode in an image sensor
01/25/2005US6847050 Semiconductor element and semiconductor device comprising the same
01/25/2005US6847048 Organic thin film transistor (OTFT)
01/25/2005US6847046 Light-emitting device and method for manufacturing the same
01/25/2005US6846753 Flash memory device and a fabrication process thereof, method of forming a dielectric film
01/25/2005US6846751 Nitrogen implementation to minimize device variation
01/25/2005US6846743 Method for vapor deposition of a metal compound film
01/25/2005US6846728 Semiconductor thin film, semiconductor device employing the same, methods for manufacturing the same and device for manufacturing a semiconductor thin film
01/25/2005US6846721 Manufacturing method of semiconductor device
01/25/2005US6846720 Method to reduce junction leakage current in strained silicon on silicon-germanium devices
01/25/2005US6846716 Integrated circuit device and method therefor
01/25/2005US6846715 Gate technology for strained surface channel and strained buried channel MOSFET devices
01/25/2005US6846712 Fabrication of gate dielectric in nonvolatile memories having select, floating and control gates
01/25/2005US6846710 Method for manufacturing self-aligned BiCMOS