Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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05/11/1988 | EP0266728A2 Method and device for ascertaining the quality of surfaces, particularly semiconductor plates |
05/11/1988 | EP0266604A2 Anode plate for a parallel-plate reactive ion etching reactor |
05/11/1988 | EP0266572A1 Semiconductor memory device having a plurality of memory cells of single transistor type |
05/11/1988 | EP0266535A1 Electron beam contactless testing system with grid bias switching |
05/11/1988 | EP0266522A2 Polyimide stud transfer process |
05/11/1988 | EP0266518A1 Metal etching process with etch rate enhancement |
05/11/1988 | EP0266466A2 Method of imaging resist patterns of high resolution of the surface of a conductor and a liquid toner for use in that method |
05/11/1988 | EP0266412A1 Surface mountable diode. |
05/11/1988 | DE3721929A1 Method for fabricating hermetically tight electrical conductor tracks in semiconductor elements |
05/11/1988 | DE3637513A1 Method of producing finely structured contact electrodes of power semiconductor components |
05/11/1988 | CN87203844U Large power triode with two passivating layers |
05/11/1988 | CN87106448A Electron device and its manufacturing method |
05/10/1988 | US4744054 Semiconductor device with a memory circuit |
05/10/1988 | US4743957 Logic integrated circuit device formed on compound semiconductor substrate |
05/10/1988 | US4743953 Dielectric film with conductivity type opposite substrate particle sizes and reduced mimimizes current leakage |
05/10/1988 | US4743952 Insulated-gate semiconductor device with low on-resistance |
05/10/1988 | US4743949 Infrared optical-electronic device |
05/10/1988 | US4743841 Semiconductor integrated circuit including circuit elements evaluating the same and having means for testing the circuit elements |
05/10/1988 | US4743806 Process and arrangement to irradiate solid state materials with ions |
05/10/1988 | US4743772 Method for determining the position of an object in an automated production process and a device for carrying out the method |
05/10/1988 | US4743570 Facilitating heat exchange between wafer and heat sink by gas |
05/10/1988 | US4743569 Doping, short rapid heating; then longer heating at lower temperature; reduced defects |
05/10/1988 | US4743568 Multilevel interconnect transfer process |
05/10/1988 | US4743567 Method of forming thin, defect-free, monocrystalline layers of semiconductor materials on insulators |
05/10/1988 | US4743566 Method of manufacturing a semiconductor device, in which a silicon slice is locally provided with field oxide with a channel stopper |
05/10/1988 | US4743565 Controlling width of semiconductor |
05/10/1988 | US4743564 Taper contact holes |
05/10/1988 | US4743563 Overcoating cilicon substrate with oxidation resistant material, doping, then oxidizing |
05/10/1988 | US4743489 For mounting plurality of electronic circuit elements |
05/10/1988 | US4743465 Waste drawing, pastes, plugging prevention |
05/10/1988 | US4743463 Method for forming patterns on a substrate or support |
05/10/1988 | US4743310 Mercury-cadmium-tellurium layer, infrared detectors |
05/10/1988 | US4743299 Cermet substrate with spinel adhesion component |
05/10/1988 | US4743156 Dump transfer wafer carrier |
05/10/1988 | US4742947 Optical system for use as stand alone unit or with a device for attaching modular electronic components to or removing them from a substrate |
05/10/1988 | EP0252977A4 Ultra high density pad array chip carrier. |
05/10/1988 | CA1236595A1 Apparatus and method for displaying hole-electron pair distributions induced by electron bombardment |
05/10/1988 | CA1236590A1 Semiconductor device with hole conduction via strained lattice |
05/10/1988 | CA1236554A1 Growth of semiconductors |
05/10/1988 | CA1236425A1 Method of forming a metal part having an annular flange |
05/10/1988 | CA1236294A1 Temperature gradient furnace for materials processing |
05/05/1988 | WO1988003329A1 Process for forming mos integrated circuit devices |
05/05/1988 | WO1988003328A1 Striped-channel transistor and method of forming the same |
05/05/1988 | WO1988002927A3 T-gate electrode for field effect transistor and field effect transistor made therewith |
05/04/1988 | EP0266288A2 Vacuum processing method and apparatus |
05/04/1988 | EP0266275A2 An X-ray exposure mask for transferring patterns onto a semiconductor wafer |
05/04/1988 | EP0266268A1 Method of depositing an insulating layer on a III-V material substrate by chemical vapour deposition with thermal irradiation, use in the production of an MIS structure |
05/04/1988 | EP0266252A1 Transistor-driven electro-optic display and its manufacturing method |
05/04/1988 | EP0266166A2 High electron mobility transistor |
05/04/1988 | EP0266093A2 Process of making a high power multi-layer semiconductive switching device with multiple parallel contacts |
05/04/1988 | EP0266030A2 Semiconductor dopant source |
05/04/1988 | EP0265988A1 Epitaxial layers with controlled quantities of nitrogen, grown on silicon substrates and method for producing the same |
05/04/1988 | EP0265958A2 Process of making insulated- gate field-effect transistors |
05/04/1988 | EP0265927A2 Wire stacked bonding method |
05/04/1988 | EP0265917A2 Illumination apparatus for exposure |
05/04/1988 | EP0265913A2 Semi-custom-made integrated circuit device |
05/04/1988 | EP0265873A2 Holder for plastic leaded chip carrier |
05/04/1988 | EP0265872A2 Simultaneously etching personality and select |
05/04/1988 | EP0265833A1 Semiconductor component having at least one power MOSFET |
05/04/1988 | EP0265805A2 Apparatus for measuring crystal diameter |
05/04/1988 | EP0265764A1 Method and apparatus for radiation induced dry chemical etching |
05/04/1988 | EP0265658A2 High energy laser mask and method of making same |
05/04/1988 | EP0265638A2 Lithographic image size reduction |
05/04/1988 | EP0265631A1 Use of tapered head pin design to improve the stress distribution in the braze joint |
05/04/1988 | EP0265619A2 Planarization through silylation |
05/04/1988 | EP0265616A2 A semiconductor trench capacitor structure |
05/04/1988 | EP0265613A2 Method for repair of opens in thin film lines on a substrate |
05/04/1988 | EP0265593A2 Field-effect transistor formed in a semi-insulating substrate |
05/04/1988 | EP0265584A2 Method and materials for etching silicon dioxide using silicon nitride or silicon rich dioxide as an etch barrier |
05/04/1988 | EP0265517A1 Article transfer apparatus |
05/04/1988 | EP0265494A1 Accelerometer proof mass interface |
05/04/1988 | EP0265489A1 Process for manufacturing semiconductor devices. |
05/04/1988 | CN87107167A Method for making ring slot on semiconductor flake edge of power part |
05/04/1988 | CN87106114A Integrated circuit manufacturing process |
05/04/1988 | CN87104849A Hermetic terminal assembly and method of manufacturing same |
05/03/1988 | US4742494 Device for reading a two-dimensional charge image |
05/03/1988 | US4742492 EEPROM memory cell having improved breakdown characteristics and driving circuitry therefor |
05/03/1988 | US4742491 Memory cell having hot-hole injection erase mode |
05/03/1988 | US4742471 Method for improving wirability of master-image DCVS chips |
05/03/1988 | US4742425 Multiple-cell transistor with base and emitter fuse links |
05/03/1988 | US4742384 Hydrogenated amorphous silicon |
05/03/1988 | US4742381 Semiconductor charge-coupled device with an increased surface state |
05/03/1988 | US4742379 HEMT with etch-stop |
05/03/1988 | US4742325 Thin-film circuit and method of making the same |
05/03/1988 | US4742286 Gas bearing X-Y-θ stage assembly |
05/03/1988 | US4742253 Integrated insulated-gate field-effect transistor circuit for evaluating the voltage of a node to be sampled against a fixed reference voltage |
05/03/1988 | US4742233 Method and apparatus for automated reading of vernier patterns |
05/03/1988 | US4742026 Ion milling with dichlorodifluoromethane |
05/03/1988 | US4742025 Method of fabricating a semiconductor device including selective etching of a silicide layer |
05/03/1988 | US4742023 Forming grooves in barrier metals, burying stoppers, etching; bumps for electrodes |
05/03/1988 | US4742022 Method of diffusing zinc into III-V compound semiconductor material |
05/03/1988 | US4742021 Compatible with standard bipolar integrated circuit wafer fabrication processes |
05/03/1988 | US4742020 Multilayering process for stress accommodation in deposited polysilicon |
05/03/1988 | US4742019 Method for forming aligned interconnections between logic stages |
05/03/1988 | US4742018 Large capicitance |
05/03/1988 | US4742017 Implantation method for forming Schottky barrier photodiodes |
05/03/1988 | US4742015 Method for producing a protective arrangement for a field-effect transistor |
05/03/1988 | US4742014 Method of making metal contacts and interconnections for VLSI devices with copper as a primary conductor |
05/03/1988 | US4742013 Process for the production of a semiconductor laser with tape geometry and laser obtained by this process |
05/03/1988 | US4741964 Structure containing hydrogenated amorphous silicon and process |