Patents
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
07/2002
07/10/2002EP1221699A2 Fuse circuit using capacitors as fuse elements
07/10/2002CN1087474C Semiconductor nonvolatile memory device
07/09/2002US6418047 System and method for storing data in read-only memory
07/09/2002US6417720 High voltage sense circuit for programming of programmable devices
07/09/2002US6417043 Memory cell configuration and fabrication method
07/04/2002US20020087784 Data processing device with a memory location in which data is stored according to a WOM code
07/04/2002US20020084827 High voltage sense circuit for programming of programmable devices
07/02/2002US6414876 Flash EEprom system
06/2002
06/27/2002WO2002051006A1 Circuit arrangement for level amplification in particular for controlling a programmable connection
06/27/2002WO2002050841A2 Circuit arrangement for controlling a programmable connection
06/27/2002WO2002050839A2 Circuit arrangement for triggering a programmable connection
06/27/2002WO2002050838A2 Circuit arrangement for controlling a programmable connection
06/27/2002US20020080004 Fuse circuit using capacitors as fuse elements
06/26/2002EP0645046B1 Data writing to non-volatile memory
06/25/2002US6411404 Memory management device and communication apparatus comprising said memory management device
06/25/2002US6410385 ROM-embedded-DRAM
06/20/2002WO2002049041A1 Data processing device with a memory location in which data is stored according to a wom code
06/20/2002US20020075744 Antifuse memory cell and antifuse memory cell array
06/20/2002US20020075743 Antifuse address detecting circuit programmable by applying a high voltage and semiconductor integrated circuit device provided with the same
06/20/2002US20020075733 Redundant circuit for memory device
06/20/2002US20020075719 Low-cost three-dimensional memory array
06/20/2002US20020074666 Semiconductor device having identification number, manufacturing method thereof and electronic device
06/20/2002US20020074616 System and method for one-time programmed memory through direct-tunneling oxide breakdown
06/13/2002US20020073271 Data writing system
06/13/2002US20020070754 Antifuse programming method
06/11/2002US6404683 Nonvolatile semiconductor memory device and test method with memory-assisted roll call
06/11/2002US6404677 Semiconductor memory device capable of performing stable read operation and read method thereof
06/11/2002US6404666 Read only memory having correction current supplying circuit
06/11/2002US6404264 Fuse latch having multiplexers with reduced sizes and lower power consumption
06/06/2002US20020069381 Nonvolatile semiconductor memory device with a fail bit detecting scheme and method for counting the number of fail bits
06/06/2002US20020069314 Semiconductor storage device
06/06/2002US20020067639 Row decoder of a NOR-type flash memory device
06/06/2002US20020067633 Semiconductor integrated circuit
06/05/2002EP1211693A2 Improvements in or relating to fuse and antifuse link structures for integrated circuits
06/04/2002US6400632 Semiconductor device including a fuse circuit in which the electric current is cut off after blowing so as to prevent voltage fall
06/04/2002US6400208 On-chip trim link sensing and latching circuit for fuse links
05/2002
05/30/2002WO2002043152A2 Poly fuse rom
05/30/2002US20020065983 Method for storing digital information in write-once memory array
05/30/2002US20020064081 Device for accessing a rom unit with groups of memory module information saved therein
05/29/2002DE10136503A1 Sense amplifier integrated circuit for high speed semiconductor memory, has current amplifier with input stage and output stage which are responsive to control signal that reduces gain of current amplifier
05/28/2002US6396767 Device for accessing a ROM unit with groups of memory module information saved therein
05/28/2002US6396759 Semiconductor device with test fuse links, and method of using the test fuse links
05/28/2002US6396736 Nonvolatile semiconductor memory device which stores multi-value information
05/28/2002US6396098 Semiconductor memory device and method of fabricating the same
05/23/2002WO2002041323A2 Circuit arrangement
05/23/2002US20020060941 Antifuse detection circuit
05/23/2002US20020060927 Non-volatile read only memory and its manufacturing method
05/23/2002DE10056590A1 Digital signal processing and/or storing circuit for smart card controller has at least one programmable fuse formed in multiple stages
05/22/2002EP1088311B1 Electronic test memory device
05/22/2002EP0728359B1 Flash eprom integrated circuit architecture
05/21/2002US6392933 EEPROM erasing method
05/21/2002US6392436 Programmable circuit with preview function
05/21/2002US6392284 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
05/16/2002WO2002039457A2 Memory management logic for expanding the utilization of read-only memories
05/16/2002DE10055096A1 Memory management of semiconductor type memory in which the advantages or ROM, i.e. high speed access, are combined with the flexibility of RAM where necessary
05/15/2002CN1349259A Fuse circuit used for semiconductor integrated circuit
05/15/2002CN1349251A Circuit and method used for micro-regualtion integrated circuit
05/14/2002US6388932 Memory with high speed reading operation using a switchable reference matrix ensuring charging speed
05/14/2002US6388910 NOR type mask ROM with an increased data flow rate
05/09/2002US20020055247 Method for fabricating a memory cell configuration
05/09/2002US20020054528 Semiconductor memory testing method and apparatus
05/09/2002US20020054526 Semiconductor memory and its test method
05/09/2002US20020054524 Redundant encoding for buried metal fuses
05/08/2002EP0935256B1 Test method for writable nonvolatile semiconductor memory device
05/07/2002US6385088 Non-volatile memory device
05/07/2002US6385075 Parallel access of cross-point diode memory arrays
05/07/2002US6385074 Integrated circuit structure including three-dimensional memory array
05/07/2002US6384666 Antifuse latch device with controlled current programming and variable trip point
05/07/2002US6384664 Differential voltage sense circuit to detect the state of a CMOS process compatible fuses at low power supply voltages
05/07/2002US6384435 Data cell region and system region for a semiconductor memory
05/02/2002WO2002001575A3 Digital trimming of analog components using non-volatile memory
05/02/2002US20020051999 Classifiying structures in a library; obtain matrix, calibrate mass measurements, monitor physical properties of particle in library
05/02/2002US20020051400 Semiconductor integrated circuit device and method of manufacturing thereof
05/02/2002US20020051399 Semiconductor device including a fuse circuit in which the electric current is cut off after blowing so as to prevent voltage fall
05/02/2002EP1202288A2 Improvements in or relating to fuse and antifuse link structures for integrated circuits
04/2002
04/30/2002US6381187 Sense amplifier circuit for use in a semiconductor memory device
04/30/2002US6381181 Timing independent current comparison and self-latching data circuit
04/30/2002US6381115 Redundant electric fuses
04/30/2002US6380597 Read-only memory and read-only memory device
04/25/2002WO2002033707A2 Area efficient method for programming electrical fuses
04/25/2002US20020049931 Method of and apparatus for executing diagnostic testing of a ROM
04/25/2002US20020048191 Semiconductor device and testing method thereof
04/25/2002US20020047181 Semiconductor integrated circuit device with electrically programmable fuse
04/25/2002DE10051167A1 Configuration for fuse initialization in memory e.g. DRAM, has fuse banks in specific positions of memory cell array, that receive delayed initialization signals through respective lines
04/24/2002CN1346093A Memory and memory access limiting method
04/18/2002US20020046318 Flash eeprom system
04/18/2002US20020044492 Configuration for fuse initialization
04/18/2002US20020044484 Interface circuit and method for writing data into a non-volatile memory, and scan register
04/18/2002US20020044006 Fuse circuit for semiconductor integrated circuit
04/16/2002US6373772 Semiconductor integrated circuit device having fuses and fuse latch circuits
04/16/2002US6373771 Integrated fuse latch and shift register for efficient programming and fuse readout
04/16/2002US6373747 Flash EEprom system
04/11/2002US20020042182 Ultra-late programming ROM and method of manufacture
04/11/2002US20020041533 Fuse circuit using anti-fuse and method for searching for failed address in semiconductor memory
04/11/2002US20020041511 Two-dimensional resonant tunneling diode memory cell
04/10/2002EP1195772A1 Fuse circuit
04/10/2002EP1195771A2 Differential voltage sense circuit to detect the state of a CMOS process compatible fuses at low supply voltages
04/10/2002EP0753193B1 Improvements in an apparatus and method of use of radiofrequency identification tags
04/09/2002US6370074 Redundant encoding for buried metal fuses
04/09/2002US6370060 Semiconductor memory device
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