Patents
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
05/2001
05/08/2001US6229733 Non-volatile memory cell for linear mos integrated circuits utilizing fused mosfet gate oxide
05/08/2001US6229383 Internal power-source potential supply circuit, step-up potential generating system, output potential supply circuit, and semiconductor memory
05/08/2001US6227637 Circuit and method for encoding and retrieving a bit of information
05/03/2001US20010000758 Method of programming a semiconductor memory
05/02/2001CN1293536A Manufacturing system possessing feeding/prognamming buffering system
05/02/2001CN1293434A Buff circuit
05/01/2001US6226222 Synchronous semiconductor memory device having a function for controlling sense amplifiers
05/01/2001US6226214 Read only memory
05/01/2001US6226199 Non-volatile semiconductor memory
05/01/2001US6225157 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
04/2001
04/26/2001WO2001029257A2 Methods of genetic cluster analysis
04/25/2001CN1292553A Method for writing electrically-erasable programmable ROM, equipment and system
04/24/2001US6222776 Programmable latches that include non-volatile programmable elements
04/24/2001US6221723 Method of setting threshold voltage levels of a multiple-valued mask programmable read only memory
04/18/2001EP1093332A2 Micro device production manufacturing system
04/12/2001DE10034231A1 Sense amplifier circuit for semiconductor memory has first and second load transistors respectively connected to first and second data lines to provide charging currents to data lines
04/11/2001EP1090389A1 Data storage and processing apparatus, and method for fabricating the same
04/10/2001US6215723 Semiconductor memory device having sequentially disabling activated word lines
04/10/2001US6215351 Fuse-latch circuit
04/05/2001DE19946435A1 Integrated semiconductor memory for constant values, e.g. ROM, comprises MOS transistors arranged on a semiconductor substrate, bit lines connected to source and/or drain zones and word lines
04/04/2001EP1088343A1 Scaleable integrated data processing device
04/04/2001EP1088311A1 Electronic test memory device
04/03/2001CA2170087C High-density read-only memory
03/2001
03/28/2001EP1087404A2 Method, system and apparatus for determining that a programming voltage level is sufficient for reliably programming an EEPROM
03/28/2001CN1289445A Fuse circuit having zero power draw for partially blown condition
03/27/2001US6208549 One-time programmable poly-fuse circuit for implementing non-volatile functions in a standard sub 0.35 micron CMOS
03/27/2001CA2242152C Poly fuses in cmos integrated circuits
03/21/2001EP1085521A1 Non-volatile semiconductor memory
03/20/2001US6205077 One-time programmable logic cell
03/20/2001US6204541 Semiconductor memory
03/14/2001EP1083575A1 Non volatile memory with detection of short circuits between word lines
03/14/2001CN1287362A Non-volatile semiconductor memory
03/13/2001US6201750 Scannable fuse latches
03/13/2001US6201432 Integrated circuit devices using fuse elements to generate an output signal that is independent of cut fuse remnants
03/07/2001EP0686978B1 A method for in-factory testing of flash EEPROM devices
03/06/2001US6199025 Semiconductor device having selectable device type and methods of testing device operation
03/06/2001US6198685 Word-line driving circuit and semiconductor memory device
03/06/2001US6198678 Semiconductor memories
03/06/2001US6198648 Semiconductor memory device with hierarchical bit line architecture
03/06/2001US6198338 Method of constructing a fuse for a semiconductor device and circuit using same
03/01/2001DE10035690A1 Semiconductor memory device has input/output mode set by shifting levels of signals received at contacts of mode setting circuit
02/2001
02/27/2001US6195297 Semiconductor memory device having pull-down function for non-selected bit lines
02/27/2001US6194767 X-ROM semiconductor memory device
02/27/2001US6194738 Method and apparatus for storage of test results within an integrated circuit
02/22/2001DE10026993A1 Semiconductor memory device e.g. EEPROM, has write-in driver circuit that substitutes the defect data in primary row with the data of secondary row selected by redundancy selector
02/20/2001US6191641 Zero power fuse circuit using subthreshold conduction
02/20/2001US6190972 Method for storing information in a semiconductor device
02/15/2001WO2001011628A1 Comparators, memory devices, comparison methods and memory reading methods
02/13/2001US6189081 Non-volatile semiconductor storage with memory requirement and availability comparison means and method
02/13/2001US6188612 Semiconductor memory
02/13/2001US6188239 Semiconductor programmable test arrangement such as an antifuse to ID circuit having common access switches and/or common programming switches
02/13/2001US6188102 Non-volatile semiconductor memory device having multiple different sized floating gates
02/06/2001US6185705 Method and apparatus for checking the resistance of programmable elements
02/06/2001US6185147 Programmable read only memory with high speed differential sensing at low operating voltage
02/06/2001US6185122 Vertically stacked field programmable nonvolatile memory and method of fabrication
02/06/2001US6185121 Access structure for high density read only memory
01/2001
01/30/2001US6181627 Antifuse detection circuit
01/30/2001US6181625 Semiconductor storage memory having a reference voltage generation circuit generating the word line voltage
01/30/2001US6181603 Nonvolatile semiconductor memory device having plural memory cells which store multi-value information
01/30/2001US6180992 Fuse configuration for a semiconductor storage device
01/25/2001DE10005460A1 Mehrwert-Masken-Nurlesespeicher Value-mask read-only memory
01/17/2001EP1068644A1 Memory cell arrangement and method for producing the same
01/16/2001US6175481 Semiconductor device having a deactivation fuse
01/16/2001US6175261 Fuse cell for on-chip trimming
01/10/2001CN1279482A 快闪存储器 Flash memory
01/09/2001US6172936 Memory circuit
01/09/2001US6172930 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
01/09/2001US6172929 Integrated circuit having aligned fuses and methods for forming and programming the fuses
01/09/2001US6172923 Programmable read only memory with high speed differential sensing at low operating voltage
01/09/2001US6172922 Semiconductor memory device having a single transistor two functions as a GND/Y selecting transistor and a precharge selecting transistor
01/09/2001US6172896 Layout arrangements of fuse boxes for integrated circuit devices, including bent and straight fuses
01/03/2001EP1065594A2 Error detection and correction circuit in a flash memory
01/03/2001CN1278645A Memory for high-density integrated circuit
01/02/2001US6169690 Non-volatile semiconductor memory device
01/02/2001US6169393 Trimming circuit
12/2000
12/28/2000WO2000079541A1 The high-density integrated circuit memory
12/26/2000US6166987 Nonvolatile semiconductor memory device having row decoder
12/26/2000US6166974 Dynamic precharge redundant circuit for semiconductor memory device
12/26/2000US6166960 Method, system and apparatus for determining that a programming voltage level is sufficient for reliably programming an eeprom
12/26/2000US6166952 Read-only memory having specially output circuits and word line connected to a group of memory cells
12/26/2000US6166943 Method of forming a binary code of a ROM
12/20/2000CN1277724A A read-only memory and read-only memory device
12/20/2000CN1277723A A read-only memory and read-only memory devices
12/19/2000US6163492 Programmable latches that include non-volatile programmable elements
12/19/2000US6163488 Semiconductor device with antifuse
12/19/2000US6163478 Common flash interface implementation for a simultaneous operation flash memory device
12/12/2000US6160738 Nonvolatile semiconductor memory system
12/05/2000US6157580 Semiconductor memory device capable of easily controlling a reference ratio regardless of change of a process parameter
12/05/2000US6157562 ROM with four-phase dynamic circuits
12/05/2000US6157460 Memory management device and facsimile apparatus using the device
12/05/2000US6157241 Fuse trim circuit that does not prestress fuses
12/05/2000US6157069 Highly integrated mask ROM for coding data
11/2000
11/30/2000WO1996008822A3 Sense amplifier for non-volatile semiconductor memory
11/28/2000US6154410 Method and apparatus for reducing antifuse programming time
11/28/2000US6154401 Circuit and method for memory device with defect current isolation
11/28/2000US6154398 Low current redundancy anti-fuse method and apparatus
11/23/2000DE19922360A1 Programming circuit for electrically-programmable element
11/23/2000DE19920721A1 Programming circuit for electrically-programmable element
11/21/2000US6151250 Flash memory device and verify method thereof
11/21/2000US6151249 NAND-type EEPROM having bit lines and source lines commonly coupled through enhancement and depletion transistors
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