Patents
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
06/2010
06/16/2010CN101740130A Efuse device
06/15/2010US7738310 Fuse data acquisition
06/15/2010US7738309 Semiconductor memory device having fuse circuits and method of controlling the same
06/15/2010US7738304 Multiple use memory chip
06/15/2010US7737825 Integrated circuits with persistent data storage
06/10/2010US20100142299 Anti-fuse repair control circuit and semiconductor device including dram having the same
06/10/2010US20100142298 Memory compiler redundancy
06/10/2010US20100142251 Memory devices having programmable elements with accurate operating parameters stored thereon
06/09/2010CN101727987A Data programming and reading method and single time programmable memory applying the same
06/09/2010CN101055765B Programmable read-only memory
06/08/2010US7732263 Semiconductor device
06/03/2010US20100135096 Antifuse circuit with well bias transistor
06/03/2010US20100135060 Memory device and storage apparatus
06/03/2010US20100133968 Casing comprising a re-recordable computer medium to be fixed in a service cabinet
06/03/2010US20100133651 Semiconductor structure processing using multiple laterally spaced laser beam spots with joint velocity profiling
06/02/2010CN101720485A High forward current diodes for reverse write 3d cell and method of making thereof
06/02/2010CN101359509B Disposable programmable memory circuit and programming and reading method thereof
06/01/2010US7729864 Computer systems and methods for identifying surrogate markers
06/01/2010US7729155 High speed, low power, low leakage read only memory
05/2010
05/27/2010US20100128511 High density prom
05/26/2010CN101714194A User control pre-recorded memory
05/25/2010US7724601 Electrical fuses with redundancy
05/25/2010US7724600 Electronic fuse programming current generator with on-chip reference
05/20/2010US20100124139 Semiconductor device including an anti-fuse element
05/19/2010CN101711412A Programming methods of a diode using forward bias
05/19/2010CN101136252B Repair circuitry and method for preventing electrical fuse from being burned during static discharge testing
05/18/2010US7721163 JTAG controlled self-repair after packaging
05/18/2010US7720611 Baselining amplification data
05/18/2010US7719872 Write-once nonvolatile memory with redundancy capability
05/13/2010US20100118636 Methods and Systems Involving Electrically Reprogrammable Fuses
05/13/2010US20100118584 Memory device using antifuses
05/12/2010CN1828774B Nonvolatile semiconductor memory device and manufacturing method of the same
05/12/2010CN1655186B Semiconductor device
05/11/2010US7715265 Differential latch-based one time programmable memory
05/11/2010US7715219 Non-volatile programmable memory cell and memory array
05/11/2010US7714447 Semiconductor chip arrangement
05/06/2010US20100110781 Phase change memory device generating program current and method thereof
05/06/2010US20100110752 Method of making a diode read/write memory cell in a programmed state
05/06/2010US20100110751 Semiconductor storage device
05/06/2010US20100110750 Non-volatile semiconductor memory device
05/06/2010DE10304173B4 Halbleiterspeicherbaustein und ein zugehöriges Einschaltleseverfahren Semiconductor memory device and an associated Einschaltleseverfahren
05/05/2010CN1988042B One time programmable internal memory and its data burning method
05/04/2010US7710813 Electronic fuse array
05/04/2010US7710758 Multichip system and method of transferring data therein
04/2010
04/29/2010US20100103750 Antifuse replacement determination circuit and method of semiconductor memory device
04/29/2010DE102006059743B4 Verfahren zum Trimmen eines Parameters eines Halbleiter-Bauelements A method for trimming a parameter of a semiconductor device
04/28/2010EP2179419A2 Secure storage of a codeword within an integrated circuit
04/27/2010US7706202 Semiconductor device having electrical fuses with less power consumption and interconnection arrangement
04/27/2010US7706166 Semiconductor memory device comprising memory element programming circuits having different programming threshold power supply voltages
04/27/2010US7704825 Method of fabricating memory including diode
04/22/2010US20100097871 Redundant memory array for replacing memory sections of main memory
04/22/2010US20100097843 Extraction of a binary code based on physical parameters of an integrated circuit
04/22/2010US20100097837 Memory based computation systems and methods of using the same
04/22/2010US20100097836 Memory Bitcell and Method of Using the Same
04/21/2010CN1783342B System and method for achieving reliable WORM storage using WMRM storage
04/20/2010US7701744 Method of arranging fuses in a fuse box of a semiconductor memory device and a semiconductor memory device including such an arrangement
04/20/2010US7699232 Semiconductor device
04/20/2010CA2649002C A program verify method for otp memories
04/15/2010US20100091546 High density reconfigurable spin torque non-volatile memory
04/15/2010US20100091545 Electically programmable fuse bit
04/14/2010CN1581358B 存储器 Memory
04/13/2010US7698071 Methods and devices relating to estimating classifier performance
04/13/2010US7697361 Apparatus for electrical fuse option in semiconductor integrated circuit
04/08/2010DE102008048830A1 Schaltungsanordnung mit Schmelzsicherung und Verfahren zum Ermitteln eines Zustands einer Schmelzsicherung Circuit arrangement with fuse and method for determining a state of a fuse
04/07/2010CN1707697B Method for programming a memory arrangement and programmed memory arrangement
04/06/2010US7692995 Redundancy program circuit and methods thereof
04/01/2010US20100080035 Sram based one-time-programmable memory
03/2010
03/31/2010CN101689401A Nano-vacuum-tubes and their application in storage devices
03/30/2010US7689365 Apparatus, method, and computer program product for determining gene function and functional groups using chromosomal distribution patterns
03/30/2010US7688664 Electrical fuse circuit, memory device and electronic part
03/30/2010US7688613 Method and system for controlling multiple electrical fuses with one program device
03/25/2010US20100073985 Method for operating one-time programmable read-only memory
03/24/2010EP2165369A1 Anti-fuse memory cell
03/24/2010EP2165335A1 Programming methods of a diode using forward bias
03/23/2010US7684276 Techniques for configuring memory systems using accurate operating parameters
03/23/2010US7684226 Method of making high forward current diodes for reverse write 3D cell
03/23/2010US7684225 Sequential and video access for non-volatile memory arrays
03/23/2010US7683456 Semiconductor devices, capacitor antifuses, dynamic random access memories, and cell plate bias connection methods
03/23/2010CA2375586C Reprogrammable secure software in an embedded processor
03/18/2010US20100067319 Implementing Precise Resistance Measurement for 2D Array Efuse Bit Cell Using Differential Sense Amplifier, Balanced Bitlines, and Programmable Reference Resistor
03/18/2010US20100067287 Temperature compensation in memory devices and systems
03/17/2010CN101673224A Option protection circuit for burn microcontroller
03/11/2010WO2010026865A1 Semiconductor memory device and semiconductor device
03/11/2010US20100061168 Fuses for memory repair
03/11/2010US20100061160 Die thermal sensor suitable for auto self refresh, integrated circuit with the same and method for on die thermal sensor suitable for auto self refresh
03/11/2010US20100061137 One-time programmable read only memory
03/11/2010US20100061136 Semiconductor Memory Device and Semiconductor Device
03/10/2010CN101667460A One-time programmable memory based on variable-resistance memory and preparation method thereof
03/09/2010US7675512 Memory circuit, display device and electronic equipment each comprising the same
03/03/2010EP1436815B1 Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
03/03/2010CN101661797A Manufacturing method of nonvolatile memory, writing method and reading method thereof
03/02/2010USRE41155 Image recording apparatus
03/02/2010US7672787 Electronic hybridization assay and sequence analysis
03/02/2010US7672185 Method and apparatus to monitor circuit variation effects on electrically programmable fuses
03/02/2010US7672151 Method for reading non-volatile ferroelectric capacitor memory cell
02/2010
02/25/2010US20100046307 Semiconductor memory and system
02/25/2010US20100046270 Resistance variable memory apparatus
02/25/2010US20100046269 Programmable read only memory
02/24/2010EP2157608A1 Storage of an image in an integrated circuit
02/24/2010CN101656109A Programmable read only memory
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