Patents
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
10/2013
10/17/2013US20130272075 Memory address repair without enable fuses
10/17/2013US20130272051 Non-volatile memory and semiconductor device
10/17/2013US20130272050 Non-volatile memory, semiconductor device and reading method
10/15/2013US8559205 Nonvolatile semiconductor memory apparatus and manufacturing method thereof
10/10/2013US20130265815 Method of reading data stored in fuse device and apparatuses using the same
10/08/2013US8554492 Method and apparatus for searching nucleic acid sequence
10/08/2013US8553486 Semiconductor memory device correcting fuse data and method of operating the same
10/08/2013US8553443 Memory device and memory access method
10/08/2013US8553442 Method and apparatus for increasing yield
10/08/2013US8552528 Diode-less array for one-time programmable memory
10/03/2013US20130258749 Apparatus for High Speed ROM Cells
10/03/2013US20130258748 Fuse data reading circuit having multiple reading modes and related devices, systems and methods
10/03/2013US20130258747 Method and apparatus for read assist to compensate for weak bit
10/03/2013US20130258740 Small-Grain Three-Dimensional Memory
10/03/2013US20130257520 Semiconductor device and method for driving the same
10/02/2013CN102034551B Efuse devices, correction methods thereof, and methods for operating efuse devices
10/01/2013US8547724 Nonvolatile memory device comprising one-time-programmable lock bit register
10/01/2013US8546898 Optoelectronic light exposure memory
10/01/2013US8546231 Memory arrays and methods of forming memory cells
09/2013
09/26/2013US20130250647 Multi-Time Programmable Memory
09/25/2013CN103325418A Apparatus for ROM cell
09/24/2013US8542549 Electrical fuse bit cell
09/24/2013US8542517 Low voltage programmable mosfet antifuse with body contact for diffusion heating
09/19/2013US20130242635 Semiconductor memory device including sensing verification unit
09/18/2013CN203205075U 熔丝读出装置和系统 Fuse readout devices and systems
09/18/2013CN101752002B Aluminum copper oxide based memory devices and methods for manufacture
09/12/2013WO2013134097A1 Flash memory with integrated rom memory cells
09/12/2013WO2013134053A1 Voltage mode sensing for low power flash memory
09/12/2013WO2013131185A1 Methods for testing unprogrammed otp memory
09/12/2013US20130235645 Semiconductor memory device
09/12/2013US20130235644 System and method of in-system repairs or configurations for memories
09/12/2013US20130235643 Semiconductor device having a fuse
09/11/2013EP2636058A1 Integrated circuit chip customization using backside access
09/11/2013CN103295640A Semiconductor device capable of rescuing defective characteristics occurring after packaging
09/11/2013CN103295639A A fast OTP memory data write and read circuit
09/11/2013CN101872646B NMOS (N-channel Metal Oxide Semiconductor) one time programmable device
09/10/2013US8532935 Method and device for providing offset model based calibration for analyte sensor
09/10/2013US8531861 One time programming memory and method of storage and manufacture of the same
09/04/2013CN101727987B Data programming and reading method and single time programmable memory applying the same
09/03/2013US8526211 Memory program circuit
09/03/2013US8526210 Semiconductor device with OTP memory cell
09/03/2013US8526209 Complementary read-only memory (ROM) cell and method for manufacturing the same
08/2013
08/29/2013US20130223124 Variable resistive memory device and method of fabricating and driving the same
08/22/2013US20130215662 Anti-fuse circuit and semiconductor device having the same
08/20/2013US8514648 Anti-fuse, anti-fuse circuit including the same, and method of fabricating the anti-fuse
08/20/2013US8514606 Circuit and system of using junction diode as program selector for one-time programmable devices
08/15/2013US20130208526 Circuit and system of using junction diode as program selector and mos as read selector for one-time programmable devices
08/15/2013US20130208525 Soft breakdown mode, low voltage, low power antifuse-based non-volatile memory cell
08/13/2013US8509023 Method and system for split threshold voltage programmable bitcells
08/13/2013US8509022 Fuse set and semiconductor integrated circuit apparatus having the same
08/13/2013US8508972 Built-in self test for one-time-programmable memory
08/13/2013US8508971 Semiconductor device with one-time programmable memory cell including anti-fuse with metal/polycide gate
08/08/2013US20130201749 Circuit and System for Using Junction Diode as Program Selector for One-Time Programmable Devices
08/08/2013US20130201748 Circuit and System of Protective Mechanisms for Programmable Resistive Memories
08/08/2013US20130201747 Permanent solid state memory using carbon-based or metallic fuses
08/08/2013US20130201746 Circuit and system for testing a one-time programmable (otp) memory
08/08/2013US20130201745 Circuit and System of a Low Density One-Time Programmable Memory
08/07/2013CN203118490U ROM (Read Only Memory) and layout thereof
08/07/2013CN103236271A Memory for reinforcing single event upset based on triple modular redundancy, and reinforcing method
08/06/2013US8503215 Vertically stacked field programmable nonvolatile memory and method of fabrication
08/06/2013US8503214 Semiconductor memory device
08/01/2013US20130194856 Reference and Read OTP Sensors
07/2013
07/31/2013CN102034550B Electric fuse burning operation method and burning device
07/31/2013CN101944388B Anti-fuse PROM
07/30/2013US8499207 Memory devices and method for error test, recordation and repair
07/25/2013WO2013110016A1 Method and apparatus for testing one time programmable (otp) arrays
07/25/2013US20130188410 Method and apparatus for testing one time programmable (otp) arrays
07/24/2013CN103219046A OTP (one time programmable) storage
07/24/2013CN103219045A OTP (one time programmable) storage and cleanup method for stray spurious charges in storage
07/24/2013CN102064178B Cell structure of one-time programmable memory (OTP) device and manufacturing method and operating method of cell structure
07/23/2013US8493767 One-time programmable device having an LDMOS structure
07/18/2013US20130182518 Memory cell of semiconductor memory device and method for driving the same
07/17/2013CN103208302A Memory device and method for selecting regional bit line in the memory device
07/16/2013US8488405 Process variability tolerant programmable memory controller for a pipelined memory system
07/16/2013US8488360 Semiconductor integrated circuit including a logic circuit module with a plurality of photodetectors
07/16/2013US8488359 Circuit and system of using junction diode as program selector for one-time programmable devices
07/11/2013US20130176805 Methods and systems involving electrically reprogrammable fuses
07/11/2013US20130176765 One-time programable cell circuit, semiconductor integrated circuit including the same, and data judging method thereof
07/10/2013CN203057316U A camera module OTP burning device
07/09/2013US8483002 Antifuse unit cell of nonvolatile memory device for enhancing data sense margin and nonvolatile memory device with the same
07/09/2013US8482973 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material
07/09/2013US8482952 One time programming bit cell
07/04/2013US20130170277 Encoded Read-Only Memory (ROM) Bitcell, Array, and Architecture
07/04/2013US20130170276 One-time programmable fuse read
07/03/2013CN103189973A Integrated circuit chip customization using backside access
07/03/2013CN103187097A Efuse macro
07/03/2013CN103187096A Fuse reading device, method and system
07/03/2013CN103187095A Efuse module control method and chip with efuse module
07/02/2013US8478545 Identification of aberrant microarray features
07/02/2013US8477521 Fuse circuit and memory device including the same
06/2013
06/27/2013US20130163306 One-Time Programmable Memory Cell, Memory and Manufacturing Method Thereof
06/26/2013CN103177767A Simplified storage method for one-time programmable memory
06/25/2013US8473221 Process, software arrangement and computer-accessible medium for obtaining information associated with a haplotype
06/25/2013US8472269 Redundancy control circuit and memory device including the same
06/25/2013US8472265 Repairing circuit for memory circuit and method thereof and memory circuit using the same
06/25/2013US8472235 Semiconductor device
06/25/2013US8472234 Anti-fuse circuit and integrated circuit including the same
06/25/2013US8472233 Circuits and methods for multiple programmable memory using one-time programmable memory
06/24/2013DE202013101729U1 Einmalig programmierbarer Speicher und integrierte Schaltung, die diesen aufweist One-time programmable memory and integrated circuit having these
06/20/2013US20130155799 Electrical fuse memory
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