Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133) |
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10/17/2013 | US20130272075 Memory address repair without enable fuses |
10/17/2013 | US20130272051 Non-volatile memory and semiconductor device |
10/17/2013 | US20130272050 Non-volatile memory, semiconductor device and reading method |
10/15/2013 | US8559205 Nonvolatile semiconductor memory apparatus and manufacturing method thereof |
10/10/2013 | US20130265815 Method of reading data stored in fuse device and apparatuses using the same |
10/08/2013 | US8554492 Method and apparatus for searching nucleic acid sequence |
10/08/2013 | US8553486 Semiconductor memory device correcting fuse data and method of operating the same |
10/08/2013 | US8553443 Memory device and memory access method |
10/08/2013 | US8553442 Method and apparatus for increasing yield |
10/08/2013 | US8552528 Diode-less array for one-time programmable memory |
10/03/2013 | US20130258749 Apparatus for High Speed ROM Cells |
10/03/2013 | US20130258748 Fuse data reading circuit having multiple reading modes and related devices, systems and methods |
10/03/2013 | US20130258747 Method and apparatus for read assist to compensate for weak bit |
10/03/2013 | US20130258740 Small-Grain Three-Dimensional Memory |
10/03/2013 | US20130257520 Semiconductor device and method for driving the same |
10/02/2013 | CN102034551B Efuse devices, correction methods thereof, and methods for operating efuse devices |
10/01/2013 | US8547724 Nonvolatile memory device comprising one-time-programmable lock bit register |
10/01/2013 | US8546898 Optoelectronic light exposure memory |
10/01/2013 | US8546231 Memory arrays and methods of forming memory cells |
09/26/2013 | US20130250647 Multi-Time Programmable Memory |
09/25/2013 | CN103325418A Apparatus for ROM cell |
09/24/2013 | US8542549 Electrical fuse bit cell |
09/24/2013 | US8542517 Low voltage programmable mosfet antifuse with body contact for diffusion heating |
09/19/2013 | US20130242635 Semiconductor memory device including sensing verification unit |
09/18/2013 | CN203205075U 熔丝读出装置和系统 Fuse readout devices and systems |
09/18/2013 | CN101752002B Aluminum copper oxide based memory devices and methods for manufacture |
09/12/2013 | WO2013134097A1 Flash memory with integrated rom memory cells |
09/12/2013 | WO2013134053A1 Voltage mode sensing for low power flash memory |
09/12/2013 | WO2013131185A1 Methods for testing unprogrammed otp memory |
09/12/2013 | US20130235645 Semiconductor memory device |
09/12/2013 | US20130235644 System and method of in-system repairs or configurations for memories |
09/12/2013 | US20130235643 Semiconductor device having a fuse |
09/11/2013 | EP2636058A1 Integrated circuit chip customization using backside access |
09/11/2013 | CN103295640A Semiconductor device capable of rescuing defective characteristics occurring after packaging |
09/11/2013 | CN103295639A A fast OTP memory data write and read circuit |
09/11/2013 | CN101872646B NMOS (N-channel Metal Oxide Semiconductor) one time programmable device |
09/10/2013 | US8532935 Method and device for providing offset model based calibration for analyte sensor |
09/10/2013 | US8531861 One time programming memory and method of storage and manufacture of the same |
09/04/2013 | CN101727987B Data programming and reading method and single time programmable memory applying the same |
09/03/2013 | US8526211 Memory program circuit |
09/03/2013 | US8526210 Semiconductor device with OTP memory cell |
09/03/2013 | US8526209 Complementary read-only memory (ROM) cell and method for manufacturing the same |
08/29/2013 | US20130223124 Variable resistive memory device and method of fabricating and driving the same |
08/22/2013 | US20130215662 Anti-fuse circuit and semiconductor device having the same |
08/20/2013 | US8514648 Anti-fuse, anti-fuse circuit including the same, and method of fabricating the anti-fuse |
08/20/2013 | US8514606 Circuit and system of using junction diode as program selector for one-time programmable devices |
08/15/2013 | US20130208526 Circuit and system of using junction diode as program selector and mos as read selector for one-time programmable devices |
08/15/2013 | US20130208525 Soft breakdown mode, low voltage, low power antifuse-based non-volatile memory cell |
08/13/2013 | US8509023 Method and system for split threshold voltage programmable bitcells |
08/13/2013 | US8509022 Fuse set and semiconductor integrated circuit apparatus having the same |
08/13/2013 | US8508972 Built-in self test for one-time-programmable memory |
08/13/2013 | US8508971 Semiconductor device with one-time programmable memory cell including anti-fuse with metal/polycide gate |
08/08/2013 | US20130201749 Circuit and System for Using Junction Diode as Program Selector for One-Time Programmable Devices |
08/08/2013 | US20130201748 Circuit and System of Protective Mechanisms for Programmable Resistive Memories |
08/08/2013 | US20130201747 Permanent solid state memory using carbon-based or metallic fuses |
08/08/2013 | US20130201746 Circuit and system for testing a one-time programmable (otp) memory |
08/08/2013 | US20130201745 Circuit and System of a Low Density One-Time Programmable Memory |
08/07/2013 | CN203118490U ROM (Read Only Memory) and layout thereof |
08/07/2013 | CN103236271A Memory for reinforcing single event upset based on triple modular redundancy, and reinforcing method |
08/06/2013 | US8503215 Vertically stacked field programmable nonvolatile memory and method of fabrication |
08/06/2013 | US8503214 Semiconductor memory device |
08/01/2013 | US20130194856 Reference and Read OTP Sensors |
07/31/2013 | CN102034550B Electric fuse burning operation method and burning device |
07/31/2013 | CN101944388B Anti-fuse PROM |
07/30/2013 | US8499207 Memory devices and method for error test, recordation and repair |
07/25/2013 | WO2013110016A1 Method and apparatus for testing one time programmable (otp) arrays |
07/25/2013 | US20130188410 Method and apparatus for testing one time programmable (otp) arrays |
07/24/2013 | CN103219046A OTP (one time programmable) storage |
07/24/2013 | CN103219045A OTP (one time programmable) storage and cleanup method for stray spurious charges in storage |
07/24/2013 | CN102064178B Cell structure of one-time programmable memory (OTP) device and manufacturing method and operating method of cell structure |
07/23/2013 | US8493767 One-time programmable device having an LDMOS structure |
07/18/2013 | US20130182518 Memory cell of semiconductor memory device and method for driving the same |
07/17/2013 | CN103208302A Memory device and method for selecting regional bit line in the memory device |
07/16/2013 | US8488405 Process variability tolerant programmable memory controller for a pipelined memory system |
07/16/2013 | US8488360 Semiconductor integrated circuit including a logic circuit module with a plurality of photodetectors |
07/16/2013 | US8488359 Circuit and system of using junction diode as program selector for one-time programmable devices |
07/11/2013 | US20130176805 Methods and systems involving electrically reprogrammable fuses |
07/11/2013 | US20130176765 One-time programable cell circuit, semiconductor integrated circuit including the same, and data judging method thereof |
07/10/2013 | CN203057316U A camera module OTP burning device |
07/09/2013 | US8483002 Antifuse unit cell of nonvolatile memory device for enhancing data sense margin and nonvolatile memory device with the same |
07/09/2013 | US8482973 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material |
07/09/2013 | US8482952 One time programming bit cell |
07/04/2013 | US20130170277 Encoded Read-Only Memory (ROM) Bitcell, Array, and Architecture |
07/04/2013 | US20130170276 One-time programmable fuse read |
07/03/2013 | CN103189973A Integrated circuit chip customization using backside access |
07/03/2013 | CN103187097A Efuse macro |
07/03/2013 | CN103187096A Fuse reading device, method and system |
07/03/2013 | CN103187095A Efuse module control method and chip with efuse module |
07/02/2013 | US8478545 Identification of aberrant microarray features |
07/02/2013 | US8477521 Fuse circuit and memory device including the same |
06/27/2013 | US20130163306 One-Time Programmable Memory Cell, Memory and Manufacturing Method Thereof |
06/26/2013 | CN103177767A Simplified storage method for one-time programmable memory |
06/25/2013 | US8473221 Process, software arrangement and computer-accessible medium for obtaining information associated with a haplotype |
06/25/2013 | US8472269 Redundancy control circuit and memory device including the same |
06/25/2013 | US8472265 Repairing circuit for memory circuit and method thereof and memory circuit using the same |
06/25/2013 | US8472235 Semiconductor device |
06/25/2013 | US8472234 Anti-fuse circuit and integrated circuit including the same |
06/25/2013 | US8472233 Circuits and methods for multiple programmable memory using one-time programmable memory |
06/24/2013 | DE202013101729U1 Einmalig programmierbarer Speicher und integrierte Schaltung, die diesen aufweist One-time programmable memory and integrated circuit having these |
06/20/2013 | US20130155799 Electrical fuse memory |