Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133) |
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11/19/2008 | CN101308704A Electrical fuse circuit for security applications |
11/19/2008 | CN100435239C Fuse circuit |
11/18/2008 | US7453755 Memory cell with high-K antifuse for reverse bias programming |
11/18/2008 | US7453717 Three-state memory cell |
11/13/2008 | WO2008136798A1 Nano-vacuum-tubes and their application in storage devices |
11/13/2008 | US20080279018 Redundancy circuit capable of reducing time for redundancy discrimination |
11/12/2008 | EP1691986A4 Fuse density on an inkjet printhead chip |
11/11/2008 | US7450459 Multi-port memory device |
11/11/2008 | US7450450 Circuitry for a programmable element |
11/06/2008 | WO2008133040A1 Semiconductor device |
11/06/2008 | WO2007117790A9 Programmable cell |
11/06/2008 | US20080273411 Fuse of a semiconductor memory device and repair process for the same |
11/06/2008 | DE10319273B4 Verfahren und Vorrichtung zum Bewerten und Nachprogrammieren von einmal programmierbaren Zellen Method and apparatus for evaluating and reprogramming of one-time programmable cells |
11/05/2008 | CN100431040C Memory circuit with memory elements overlying driver cells |
11/05/2008 | CN100431039C Reading circuit for reading a memory cell |
11/04/2008 | US7447959 Semiconductor integrated circuit and a method of testing the same |
11/04/2008 | US7447054 NBTI-resilient memory cells with NAND gates |
11/04/2008 | US7447053 Memory device and method for operating such a memory device |
10/30/2008 | US20080266994 Level detect circuit |
10/30/2008 | DE102008020372A1 Sicherungserfassungsverfahren und -Vorrichtung Fuse detection method and apparatus |
10/28/2008 | US7443756 Memory device having redundancy fuse blocks arranged for testing |
10/28/2008 | US7443706 High-performance memory and related method |
10/28/2008 | US7442959 Semiconductor device having identification number, manufacturing method thereof and electronic device |
10/23/2008 | DE69937559T2 Nicht-flüchtige Speicher mit Erkennung von Kurzschlüssen zwischen Wortleitungen Non-volatile memory with detection of shorts between word lines |
10/23/2008 | DE10164032B4 Verfahren zum Aktivieren von Sicherungseinheiten in elektronischen Schaltungseinrichtungen Method for activating fuse units in electronic circuitry |
10/22/2008 | CN101292245A 识别统计线性数据 Identifying statistical linear data |
10/22/2008 | CN101290806A Semiconductor memory device |
10/21/2008 | US7440349 Integrated semiconductor memory with determination of a chip temperature |
10/21/2008 | US7440306 Method for programming one-time programmable memory of integrated circuit |
10/16/2008 | US20080253162 Multibit rom memory |
10/15/2008 | EP1979912A2 Electrically programmable fuse bit |
10/15/2008 | CN101286365A Multibit ROM memory |
10/14/2008 | US7436729 Fuse circuit and semiconductor device using fuse circuit thereof |
10/14/2008 | US7436690 Flat cell read only memory using common contacts for bit lines and virtual ground lines |
10/14/2008 | US7436222 Circuit and method for trimming integrated circuits |
10/14/2008 | US7435927 Semiconductor link processing using multiple laterally spaced laser beam spots with on-axis offset |
10/09/2008 | US20080247213 Memory Device for Protecting Memory Cells during Programming |
10/09/2008 | US20080246098 Split-channel antifuse array architecture |
10/08/2008 | EP1978526A1 Non-volatile memory with improved programming and method thereof |
10/08/2008 | CN101283412A Electrically one time programmable and one time erasable fuse |
10/02/2008 | WO2008118274A1 System and method to control one time programmable memory |
10/02/2008 | WO2007090089A9 Electrically programmable fuse bit |
10/02/2008 | US20080239786 Logic coding in an integrated circuit |
10/01/2008 | EP1975943A1 Logical coding in an integrated circuit |
10/01/2008 | CN100423131C 半导体集成电路 The semiconductor integrated circuit |
09/25/2008 | US20080232162 One time programming cell structure and method of fabricating the same |
09/25/2008 | US20080232152 Method and Structure for Implementing a Reprogrammable ROM |
09/25/2008 | US20080232151 System and method to control one time programmable memory |
09/25/2008 | US20080232150 Method and Structure for Implementing a Reprogrammable ROM |
09/25/2008 | US20080230819 Spin transfer magnetic element with free layers having high perpendicular anisotropy and in-plan equilibrium magnetization |
09/18/2008 | US20080225620 Semiconductor memory device |
09/18/2008 | US20080225572 Circuit arrays having cells with combinations of transistors and nanotube switching elements |
09/18/2008 | US20080225568 Dense read-only memory |
09/18/2008 | US20080225567 Method and structure for increasing effective transistor width in memory arrays with dual bitlines |
09/18/2008 | US20080225566 Using eFuses to Store PLL Configuration Data |
09/18/2008 | DE60035810T2 Flash-Speicher Flash memory |
09/17/2008 | CN100419916C Electrical fuses memory grid with redundancy backup function and redundancy backup method thereof |
09/12/2008 | WO2008107737A1 Providing feedback in an electronic circuit |
09/04/2008 | US20080212388 Integrated circuit fuse array |
09/04/2008 | US20080212387 Integrated circuit fuse array |
09/04/2008 | US20080212364 Magnetic Memory Cell and Method of Fabricating Same |
09/04/2008 | US20080212356 Random Access Memory Featuring Reduced Leakage Current, and Method for Writing the Same |
09/04/2008 | US20080212355 Compact Virtual Ground Diffusion Programmable ROM Array Architecture, System and Method |
09/04/2008 | US20080212354 Biased sensing module |
09/04/2008 | US20080211024 Memory Device and Manufacturing Method of the Same |
09/03/2008 | EP1965391A1 Non-volatile semiconductor memory device |
09/03/2008 | EP1774531A4 Programmable semi-fusible link read only memory and method of margin testing same |
09/03/2008 | EP1554743A4 Method and apparatus for bootstrapping a programmable antifuse circuit |
09/03/2008 | CN101258558A Memory cell with high-K antifuse for reverse bias programming |
09/03/2008 | CN100416706C Method and circuitry for identifying weak bits in an MRAM |
09/02/2008 | US7420859 Memory device and method of controlling access to such a memory device |
08/28/2008 | WO2008051674A3 Electrical fuse and method of making the same |
08/28/2008 | US20080206946 Memory and method of fabricating the same |
08/28/2008 | US20080205150 Hybrid non-volatile memory |
08/28/2008 | US20080205148 Nonvolatile semiconductor memory device |
08/28/2008 | US20080205115 Apparatus and method for trimming integrated circuit |
08/28/2008 | US20080203438 Demultiplexers using transistors for accessing memory cell arrays |
08/27/2008 | CN101253573A Random access electrically programmable-E-FUSE ROM |
08/26/2008 | US7417913 Fuse cell having adjustable sensing margin |
08/26/2008 | US7417839 Zener-zap memory |
08/21/2008 | WO2008098808A1 Electronic fuse apparatus and methodology including addressable virtual electronic fuses |
08/21/2008 | US20080198646 Nonvolatile memory device using resistance material |
08/21/2008 | US20080198643 One-time programmable cell and memory device having the same |
08/21/2008 | US20080198642 Semiconductor memory device |
08/21/2008 | US20080197981 Integrated circuits with persistent data storage |
08/20/2008 | CN101246747A One-time programmable cell and memory device having the same |
08/20/2008 | CN101246746A Virtual electronic fuse apparatus and methodology |
08/20/2008 | CN101246745A Three-dimensional memory module(3D2-M2) based on three-dimensional memory |
08/20/2008 | CN100412989C Non-Volatile semiconductor memory with charging read mode |
08/20/2008 | CN100412983C Memory with low and fixed pre-charge loading |
08/14/2008 | US20080192558 Semiconductor memory device and operating method thereof |
08/13/2008 | EP1955167A2 Dense read-only memory |
08/13/2008 | CN101241764A Electric fuse circuit |
08/12/2008 | US7411852 Semiconductor memory device and method of adjusting same |
08/12/2008 | US7411851 Semiconductor device |
08/12/2008 | US7411814 Programmable magnetic memory device FP-MRAM |
08/12/2008 | US7411808 Method for reading ROM cell |
08/12/2008 | US7411803 Resistive coupled hall effect sensor |
08/07/2008 | US20080186789 Electric fuse circuit available as one time programable memory |
08/07/2008 | US20080186788 Electrical fuse and associated methods |