Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
Patents for G11C 17 - Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards (10,133)
12/2007
12/20/2007US20070291526 Structure for a non-volatile memory device
12/19/2007CN101089998A Data storage device, data storage method and data read method
12/18/2007US7310282 Distributed programmed memory cell overwrite protection
12/18/2007US7310278 Method and apparatus for in-system redundant array repair on integrated circuits
12/18/2007US7310261 Nitride read-only memory (NROM) device and method for reading the same
12/13/2007US20070288817 Semiconductor integrated circuit and a method of testing the same
12/13/2007US20070285991 Semiconductor memory
12/13/2007US20070285123 Programming semiconductor dies for pin map compatibility
12/13/2007DE102006033915B3 Memory data reading method for e.g. conductive bridging RAM memory circuit, involves detecting current flowing via cell and adjusting control parameter based on current, where measuring parameter is selected from different values of cell
12/11/2007US7307910 Redundancy program circuit and methods thereof
12/11/2007US7307889 Semiconductor memory
12/11/2007US7307865 Integrated read-only memory, method for operating said read-only memory and corresponding production method
12/11/2007US7307864 Semiconductor integrated circuit with fuse data read circuit
12/06/2007WO2007138883A1 Memory element, data recording method and ic tag
12/06/2007US20070279829 Control system for static neutralizer
12/05/2007EP1104578B1 Universal memory element with systems employing same and apparatus and method for reading, writing and programming same
12/05/2007CN100353462C Method for characterizing active track and latch sense-amp (comparator) in one time programmable (OTP) salicided poly fuse array
12/05/2007CN100353454C A secure poly fuse rom with a power-on or on-reset hardware security features and method therefor
12/04/2007US7304879 Non-volatile memory element capable of storing irreversible complementary data
12/04/2007US7304878 Autonomous antifuse cell
12/04/2007US7304366 Self correcting multiple-link fuse
11/2007
11/29/2007US20070274126 Method And Apparatus For Hot Carrier Programmed One Time Programmable (Otp) Memory
11/29/2007US20070274118 Dynamically read fuse cell
11/29/2007DE102006022867A1 Read-out circuit for ROM, has input, in which read signal is coupled and high signal level and another low signal level related to reference potential depending on information contained
11/27/2007US7302348 Method and system for quantifying and removing spatial-intensity trends in microarray data
11/27/2007US7301845 Defect address storing circuit for semiconductor memory device
11/27/2007US7301834 Semiconductor memory
11/27/2007US7301802 Circuit arrays having cells with combinations of transistors and nanotube switching elements
11/22/2007WO2007019109A3 One time programmable memory and method of operation
11/21/2007CN101076866A System and method for collocating integrate circuit
11/21/2007CN100350507C Semiconductor stroage device
11/20/2007US7298639 Reprogrammable electrical fuse
11/15/2007WO2007128620A1 Conventionally printable non-volatile passive memory element and method of making thereof.
11/15/2007US20070263423 Three-dimensional memory device incorporating segmented array line memory array
11/14/2007EP1083575B1 Non volatile memory with detection of short circuits between word lines
11/13/2007US7295455 Semiconductor integrated circuit with photo-detecting elements for reverse-engineering protection
11/08/2007WO2006036907A3 One time programmable latch and method
11/08/2007US20070258311 Mos electric fuse, its programming method, and semiconductor device using the same
11/08/2007US20070258310 Semiconductor integrated circuit
11/08/2007US20070258309 Securing an integrated circuit
11/08/2007US20070258280 Securing an integrated circuit
11/08/2007DE102006021043A1 Semiconductor component e.g. RAM, operating method, involves programming efuses of efuse bank provided at semiconductor component after integrating component in electronic module, where programming is controlled by efuse control register
11/07/2007EP1483763B1 Extraction of a binary code from the physical parameters of an integrated circuit
11/07/2007CN101067973A Fuse circuit for repair and detection of memory
11/06/2007US7292493 Semiconductor device with electrically broken fuse and its manufacture method
11/01/2007US20070253237 Semiconductor memory with resistance change element
11/01/2007US20070253236 Semiconductor memory device comprising memory element programming circuits having different programming threshold power supply voltages
10/2007
10/31/2007DE102006019075A1 Integrated circuit for storing data, has memory circuit with inverter circuits, where strengthening and/or weakening of transistors in corresponding inverter circuits is realized by change of channel lengths and breadths of transistors
10/30/2007US7289382 Rewritable fuse memory
10/30/2007US7289376 Method for eliminating crosstalk in a metal programmable read only memory
10/25/2007WO2007119485A1 Test device and test method
10/25/2007WO2007118679A1 Circuit arrangement comprising a non-volatile memory cell, and method
10/25/2007US20070247954 Memory device with shared reference and method
10/25/2007US20070247890 Nano-vacuum-tubes and their application in storage devices
10/25/2007US20070247889 Semiconductor memory device
10/25/2007US20070247888 Non-volatile memory cell
10/25/2007US20070246797 Fuse corner pad for an integrated circuit
10/25/2007DE10051167B4 Anordnung zur Fuseinitialisierung Arrangement for Fuseinitialisierung
10/24/2007CN100345294C Fuse circuit
10/23/2007US7285464 Nonvolatile memory cell comprising a reduced height vertical diode
10/18/2007WO2007117790A2 Programmable cell
10/18/2007WO2005053002A3 Two-component, rectifying-junction memory element
10/18/2007US20070243620 Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function
10/18/2007US20070242548 Programmable Semiconductor Device
10/18/2007US20070242495 Programmable read-only memory
10/18/2007DE10216223B4 Speicherzellenstruktur eines programmierbaren Festwertspeichers Memory cell structure of a programmable read-only memory
10/18/2007DE102006017480A1 Schaltungsanordnung mit einer nicht-flüchtigen Speicherzelle und Verfahren Circuit arrangement with a non-volatile memory cell and method
10/17/2007CN101055874A Non-volatile memory, manufacturing method thereof and read-in read-out method for the same
10/17/2007CN101055765A Programmable read-only memory
10/17/2007CN100343769C Programmable fuse array circuit and method for disposable terminal user
10/16/2007US7283912 DNA probe design device and information processing method for DNA probe design
10/16/2007US7283403 Memory device and method for simultaneously programming and/or reading memory cells on different levels
10/16/2007US7283397 Flash EEprom system capable of selective erasing and parallel programming/verifying memory cell blocks
10/16/2007US7282755 Stress assisted current driven switching for magnetic memory applications
10/11/2007US20070237018 Programmable cell
10/11/2007DE10308323B4 Halbleiterchipanordnung mit ROM Semiconductor chip assembly with ROM
10/09/2007US7280425 Dual gate oxide one time programmable (OTP) antifuse cell
10/09/2007US7280411 Output buffer circuit and semiconductor memory using the same
10/09/2007US7280394 Field effect devices having a drain controlled via a nanotube switching element
10/04/2007US20070230232 Memory transistor gate oxide stress release and improved reliability
10/03/2007EP1714294A4 Nonvolatile memory
10/03/2007CN101047187A 存储器及其制造方法 Memory and manufacturing method thereof
10/03/2007CN101047037A Burning detection method and its circuit
10/03/2007CN101047036A Fuse detection circuit and its detection method
10/03/2007CN101047035A 半导体器件 Semiconductor devices
10/03/2007CN101047034A 存储器 Memory
10/02/2007US7277349 Circuit and method for reading an antifuse
10/02/2007US7277348 Memory cell comprising an OTP nonvolatile memory unit and a SRAM unit
10/02/2007US7277347 Antifuse capacitor for configuring integrated circuits
10/02/2007US7277346 Method and system for hard failure repairs in the field
10/02/2007US7277312 Integrated semiconductor memory with an arrangement of nonvolatile memory cells, and method
10/02/2007US7277311 Flash cell fuse circuit
09/2007
09/27/2007WO2007107357A1 Method for programming an electronic circuit and electronic circuit
09/27/2007US20070223277 Flash memory
09/27/2007US20070223266 One-time-programmable (OTP) memory device and method for testing the same
09/25/2007US7274615 Semiconductor memory device and semiconductor memory device test method
09/25/2007US7274614 Flash cell fuse circuit and method of fusing a flash cell
09/25/2007US7274585 Methods of operating integrated circuit memory devices
09/20/2007WO2007106481A1 Memory device distributed controller system
09/20/2007US20070217276 Fuse latch circuit, semiconductor device and semiconductor memory system
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