Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2009
06/17/2009CN201259528Y Circuit breaker experiment platform having fixed transfer equipment
06/17/2009CN201259527Y Current overload characteristic detection device for circuit breaker
06/17/2009CN201259526Y Analogue debugging apparatus for FT50 instrument control main board
06/17/2009CN201259525Y Test device of crosslinking polyethylene-insulated cable material water treeing resistance performance
06/17/2009CN201259524Y High voltage open circuit positioning device
06/17/2009CN201259523Y Test module group
06/17/2009CN201259522Y Digital synthetic measurement device
06/17/2009CN201259521Y Multifunctional detection pen having household infrared remote controller detection
06/17/2009CN201259520Y Multifunctional off-line detector capable of discriminating failure of various kinds of low-voltage electric appliance
06/17/2009CN101460859A Method for judging abnormality of battery pack, and battery pack
06/17/2009CN101460858A Semiconductor defect analysis device, defect analysis method, and defect analysis program
06/17/2009CN101460857A Light-assisted testing of an optoelectronic module
06/17/2009CN101460856A Method for determining linear electric response of transformer, electricity generator or electric motor
06/17/2009CN101460855A Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection
06/17/2009CN101458311A Detection device for power supplier
06/17/2009CN101458310A Battery consistency evaluating method
06/17/2009CN101458309A Rapid warm raising measurement set for electric automobile motor drive system and measurement method
06/17/2009CN101458308A AC test device for transformer on-load tap-changer operating characteristic
06/17/2009CN101458307A Synchronization controller for introducing electric voltage in high-voltage circuit-breaker synthesizing test
06/17/2009CN101458306A Breaker operating characteristic test apparatus
06/17/2009CN101458305A Embedded module test and maintenance bus system
06/17/2009CN101458304A Embedded boundary scanning technique verification platform
06/17/2009CN101458303A General-purpose interface device for developing and debugging embedded equipment
06/17/2009CN101458302A Semiconductor tester
06/17/2009CN101458301A Method for implementing matching test for automatic test equipment
06/17/2009CN101458300A Circuit discharging detecting system
06/17/2009CN101458299A On site programmable gate array single particle effect test method
06/17/2009CN101458298A Hi-fix board, test tray, test handler, and method for manufacturing packaged chips
06/17/2009CN101458297A Printed circuit board test system and test method
06/17/2009CN101458296A Multi-product silicon wafer test method
06/17/2009CN101458295A Circuit status maintaining system and method thereof
06/17/2009CN101458294A Method for downloading user code in chip when multi-chip test by tester
06/17/2009CN101458293A Damaging degree detecting method for ion-implantation Tellurium-cadmium-mercury photovoltaic detector
06/17/2009CN101458292A Power VDMOS cut-in voltage remote on-line automatic test system and method
06/17/2009CN101458291A Transformer partial discharge online detection data acquisition unit and detecting method
06/17/2009CN101458290A Multi-core cable sequence measuring method based on frequency modulation digital code and apparatus thereof
06/17/2009CN101458289A Motherboard line detection device
06/17/2009CN101458288A Apparatus and method for detecting open circuit defect by utilizing capacitive lead frame sensing
06/17/2009CN101458287A Electric power line detecting method
06/17/2009CN101458286A Phasor measuring set based on in situ spectroscopic analysis and applied wide domain measuring system
06/17/2009CN101458285A Reliability testing method and device
06/17/2009CN100502546C Motor current test method
06/17/2009CN100502350C Differential delay compensation and measurement in bonded systems
06/17/2009CN100501690C Embedded micro computer unit (MCU) using a memory emulation module and a method of testing the same
06/17/2009CN100501437C Power supply aging system
06/17/2009CN100501436C Electric resistance loading system
06/17/2009CN100501435C Mobile terminal and its information prompt method
06/17/2009CN100501434C Method for parallel detecting synchronous communication chips
06/17/2009CN100501433C High power semiconductor tube test method and device
06/17/2009CN100501432C Method for real-time generating flash-storage testing vector
06/17/2009CN100501431C Method and set of testing equipment for assessment of electric parameters of lightning protection systems
06/17/2009CN100501430C Method and device for measuring insertion loss of digital subscriber line
06/17/2009CN100501429C Wiring identifying device and method
06/17/2009CN100501428C De-excitation system performance test analyzing method and test analyzer thereof
06/17/2009CN100501427C Identifying system and method
06/16/2009US7549101 Clock transferring apparatus, and testing apparatus
06/16/2009US7549100 Dynamic verification traversal strategies
06/16/2009US7549099 Testing apparatus and testing method
06/16/2009US7549098 Redundancy programming for a memory device
06/16/2009US7549097 Semiconductor integrated circuit device and method of testing the same
06/16/2009US7549096 Methods and systems for tracking and playing back errors in a communications network
06/16/2009US7548844 Sequential tester for longest prefix search engines
06/16/2009US7548841 Method for logic checking to check operation of circuit to be connected to bus
06/16/2009US7548828 Automatic test equipment platform architecture using parallel user computers
06/16/2009US7548825 Method and apparatus for current and temperature measurement in an electronic power circuit
06/16/2009US7548821 Battery management system and driving method thereof
06/16/2009US7548820 Detecting a failure condition in a system using three-dimensional telemetric impulsional response surfaces
06/16/2009US7548517 Method and apparatus for determining the location of a node in a wireless system
06/16/2009US7548201 Method and system for automatically analyzing and modifying cable television signal leak information
06/16/2009US7548083 Test apparatus having auto probe that contacts a display device and test method using the same
06/16/2009US7548082 Inspection probe
06/16/2009US7548081 System and method for controlling environmental parameters of a device under test
06/16/2009US7548080 Method and apparatus for burn-in optimization
06/16/2009US7548079 Semiconductor device including analog voltage output driver LSI chip having test circuit
06/16/2009US7548078 Performance board for electronically connecting a device under test with a test apparatus for testing a device under test
06/16/2009US7548077 Measuring apparatus and a measuring method for measuring a polarization characteristic of an optical system
06/16/2009US7548071 Reflectometry test system using a sliding pseudo-noise reference
06/16/2009US7548070 Method and circuit arrangement for detecting a wire break
06/16/2009US7548069 Signal measurement systems and methods
06/16/2009US7548068 System for testing properties of a network
06/16/2009US7548067 Methods for measuring capacitance
06/16/2009US7548055 Testing an electronic device using test data from a plurality of testers
06/16/2009US7548053 Wide-band antenna coupled spectrometer using CMOS transistor
06/16/2009US7548029 Bi-directional current sensing by monitoring VS voltage in a half or full bridge circuit
06/16/2009US7547560 Defect identification system and method for repairing killer defects in semiconductor devices
06/11/2009WO2009073593A2 Networked battery monitors
06/11/2009WO2009073120A1 Method and apparatus for testing a system-on-chip involving parallel and serial accesses
06/11/2009WO2009073119A1 Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testing
06/11/2009WO2009073100A1 Method and apparatus for testing a system-on-chip involving parallel and serial accesses
06/11/2009WO2009072929A1 System for monitoring the detachable joint of a cable path using radio frequency identifications
06/11/2009WO2009072864A1 Eco contactor
06/11/2009WO2009072863A1 Air gap contactor
06/11/2009WO2009072509A1 Testing apparatus, and calibration method
06/11/2009WO2009072341A1 Probe apparatus
06/11/2009WO2009072204A1 Life estimating method and device of electronic weighting instrument
06/11/2009WO2009072077A1 Testing of a photovoltaic panel
06/11/2009WO2009072052A1 Semiconductor device and wafer with a test structure and method for assessing adhesion of under-bump metallization
06/11/2009WO2009071656A1 Method for monitoring the shaft current and/or the insulation of the shaft of electric machines and device for performing the method
06/11/2009WO2009071516A1 Device for detecting and locating electrical discharges in a fluid-insulated electrical apparatus
06/11/2009WO2009071438A1 Method for detection of interlaminar sheet short circuits in the stator sheet core of electromachines