Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2009
06/23/2009US7551563 Routing diversified session via multiple network connections
06/23/2009US7551562 Determining bidirectional path quality within a wireless mesh network
06/23/2009US7551558 Method and system for controlling bandwidth allocation
06/23/2009US7551552 Method for providing guaranteed distributed failure notification
06/23/2009US7551550 Method and system for allocating protection path resources
06/23/2009US7551436 Electronic apparatus
06/23/2009US7550990 Method and apparatus for testing integrated circuits for susceptibility to latch-up
06/23/2009US7550989 System for automatic mounting of workpieces
06/23/2009US7550988 Test device with test parameter adaptation
06/23/2009US7550987 Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks
06/23/2009US7550986 Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method
06/23/2009US7550985 Methods of testing memory devices
06/23/2009US7550984 Probe station with low noise characteristics
06/23/2009US7550983 Membrane probing system with local contact scrub
06/23/2009US7550982 Semiconductor device test method for comparing a first area with a second area
06/23/2009US7550976 Apparatus/method for measuring the switching time of output signals of a DUT
06/23/2009US7550975 Portable information terminal apparatus and voltage measurement apparatus
06/23/2009US7550974 Ignition coil tester apparatus and method
06/23/2009US7550964 Apparatus and method for linked slot-level burn-in
06/23/2009US7550961 Systems and methods for evaluating electromagnetic interference
06/23/2009US7550960 Method and apparatus for measuring voltage in a power switching device
06/23/2009US7550855 Vertically spaced plural microsprings
06/23/2009US7550763 Semiconductor integrated circuit device and manufacture thereof
06/23/2009US7550762 Isolation circuit
06/23/2009CA2368851C A system for monitoring connection pattern of data ports
06/18/2009WO2009076355A1 Sub-symbol rate cable tester
06/18/2009WO2009076237A1 Method and apparatus for estimating resistance and capacitance of metal interconnects
06/18/2009WO2009075696A1 Rapid charging and power management of a battery-powered fluid analyte meter
06/18/2009WO2009075681A1 Planarizing probe card
06/18/2009WO2009075469A1 Semiconductor device test system
06/18/2009WO2009075109A1 Lifetime estimating method and deterioration suppressing method for lithium secondary cell, lifetime estimator and deterioration suppressor, battery pack using the same, and charger
06/18/2009WO2009075091A1 Testing apparatus, testing method, measuring apparatus and measuring method
06/18/2009WO2009075078A1 Jitter application circuit and test device
06/18/2009WO2009074790A1 A method of measuring delay in an integrated circuit
06/18/2009WO2009074193A1 Apparatus and method for generating a defined charge pulse for carrying out a partial discharge measurement
06/18/2009WO2009073995A1 Lighting device for checking photovoltaic panels
06/18/2009WO2009046884A3 Handler for electronic components, in particular ic's, comprising a plurality of circulating carriages that are guided along a circulating track
06/18/2009WO2009046883A3 Handler for electronic components, in particular ic's, comprising circulating units, the temperature of which can be controlled
06/18/2009WO2009046882A3 Handler for electronic components, in particular ic's, comprising a pneumatic cylinder displacement unit for moving plungers
06/18/2009WO2004003967A3 Scan test method providing real time identification of failing test patterns and test controller for use therewith
06/18/2009WO2003075632A3 Rf amplifier system with interface to provide a computer readable spectral depiction of the re output
06/18/2009US20090158107 System-on-chip with master/slave debug interface
06/18/2009US20090158106 Position Independent Testing of Circuits
06/18/2009US20090158105 In system diagnostics through scan matrix
06/18/2009US20090158103 Test apparatus and test method
06/18/2009US20090157340 Method and system for yield enhancement
06/18/2009US20090157336 Static measuring method of electrical references of three-phase permanent magnet synchronous motor
06/18/2009US20090157335 Telematics-based method and system of battery parasitic load validation for a vehicle fleet
06/18/2009US20090154348 Method for configuring ACLS on network device based on flow information
06/18/2009US20090154343 Apparatus and method for adapting to failures in gateway devices in mesh networks
06/18/2009US20090154342 Systems and methods for redundant switch fabric and switch controller
06/18/2009US20090154033 Electrical Arc Fault Circuit Interrupter Apparatus and Method
06/18/2009US20090153856 Close Proximity Scanning Surface Contamination Analyzer
06/18/2009US20090153178 Method for transferring test trays in a side-docking type test handler
06/18/2009US20090153177 Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device
06/18/2009US20090153176 Semiconductor device
06/18/2009US20090153175 Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus
06/18/2009US20090153174 Simple and effective method to detect poly residues in locos process
06/18/2009US20090153173 Semiconductor Device
06/18/2009US20090153172 Structure for indicating status of an on-chip power supply system
06/18/2009US20090153171 Apparatus for testing objects under controlled conditions
06/18/2009US20090153170 Inspection apparatus
06/18/2009US20090153169 Probe having a field-replaceable tip
06/18/2009US20090153168 Hi-fix board, test tray, test handler, and method for manufacturing packaged chips
06/18/2009US20090153167 Chuck for holding a device under test
06/18/2009US20090153166 Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
06/18/2009US20090153165 High Density Interconnect System Having Rapid Fabrication Cycle
06/18/2009US20090153163 Circuit board having bypass pad
06/18/2009US20090153158 Rf integrated circuit test methodology and system
06/18/2009US20090153146 Apparatus for inspecting circuit board and method of inspecting circuit board
06/18/2009US20090153144 Fault detection apparatuses and methods for fault detection of semiconductor processing tools
06/18/2009US20090152595 Semiconductor devices and method of testing same
06/18/2009US20090152543 System, Structure and Method of Providing Dynamic Optimization of Integrated Circuits Using a Non-Contact Method of Selection, and a Design Structure
06/18/2009US20090151149 Method of controlling contact load in electronic component mounting apparatus
06/18/2009DE102008058876A1 Verfahren und System zur Ermittlung eines Ladezustands einer Batterie A method and system for determining a state of charge of a battery
06/18/2009DE102007059754A1 Diagnosis system for a personalized vehicle component, e.g. a radio model, has a matrix for all the possible types for irrelevant models to be deactivated or deleted
06/18/2009DE102007059289A1 Vorrichtung zur Prüfung von Transformatoren Device for testing of transformers
06/18/2009DE102007058999A1 Portable electromagnetic compatibility test apparatus, employs software-controlled source of signals at predetermined carrier frequencies, with narrowband amplifier modules
06/18/2009DE102007058989A1 Fehlerstromschutzschalter und Verfahren zum Durchführen eines Selbsttestes eines Fehlerstromschutzschalters Residual current circuit breakers and method for performing a self-test of a residual current circuit breaker
06/18/2009DE102007055712A1 Messmodul zur schnellen Messung von elektrischen, elektronischen und mechanischen Bauteilen bei kryogenen Temperaturen sowie Messeinrichtung mit einem solchen Messmodul Measuring module for rapid measurement of electrical, electronic and mechanical components at cryogenic temperatures and measuring device with such a measurement module
06/18/2009DE102004051832B4 Notbetrieb-Steuerverfahren Emergency operation control method
06/18/2009CA2708707A1 Apparatus and method for generating a defined charge pulse for performing a partial discharge measurement
06/18/2009CA2707315A1 Rapid charging and power management of a battery-powered fluid analyte meter
06/17/2009EP2071374A2 Apparatus and method for using a counter-propagating signal method for locating events
06/17/2009EP2071345A1 Method of calculating the internal resistance of an automobile battery
06/17/2009EP2071344A1 Method for determining the store temperature of an electric store and corresponding device
06/17/2009EP2071343A1 Self-guilding instrument carrier for in-situ operation in a generator
06/17/2009EP2071342A1 Device and method for creating a defined charge pulse for a partial discharge measurement
06/17/2009EP2069814A1 Parametric scan register, digital circuit and method for testing a digital circuit using such register
06/17/2009EP2069813A2 Method and device for characterising an electric signal propagating through a sample
06/17/2009EP2069812A2 Low-noise source
06/17/2009EP2069811A1 Method and circuit arrangement for detecting the state of a load device which can be connected to a switching connection
06/17/2009EP2069810A1 Method for testing an electronic unit
06/17/2009EP2069809A2 Method and apparatus for indirect planarization
06/17/2009EP2069808A2 Single support structure probe group with staggered mounting pattern
06/17/2009EP2069008A2 Remaining time indication for a rechargeable implantable medical device
06/17/2009EP1982198B1 Test system for a circuit carrier
06/17/2009EP1859290A4 Method, system and apparatus for diagnostic testing of an electrochemical cell stack
06/17/2009CN201259530Y Connection rod resistance on-line test system
06/17/2009CN201259529Y 60HZ electric grid MW grade wind generating set experiment platform