Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2009
07/07/2009US7557565 Handler for sorting packaged chips
07/07/2009US7557564 Test handler comprising at least one opening unit opening one part of the plurality of inserts
07/07/2009US7557561 Electronic device, circuit and test apparatus
07/07/2009US7556972 Detection and characterization of SiCOH-based dielectric materials during device fabrication
07/07/2009US7555929 Micromechanical sensor having fault identification
07/07/2009CA2387905C A method and system for predicting failures in a power resistive grid of a vehicle
07/02/2009WO2009082408A1 Method and apparatus for monitoring ultraviolet lamps
07/02/2009WO2009082403A1 System and method for solving connection violations
07/02/2009WO2009081743A1 Analog scan circuit, analog flip-flop, and data processing device
07/02/2009WO2009081522A1 Test apparatus and measurement device
07/02/2009WO2009081215A2 Equipment and procedure to determine fault location and fault resistance during phase to ground faults on a live network
07/02/2009WO2009080686A1 Monitor circuit for an energy storage and method for monitoring an energy storage
07/02/2009WO2009080551A1 Method for ascertaining damage to a connection line
07/02/2009WO2009080405A1 Method for detecting an electric fault in an electric network of a motor vehicle
07/02/2009WO2009050127A3 Probe holder
07/02/2009WO2009004259A3 Device for determining a charge distribution in a dielectric element
07/02/2009US20090172489 Circuit arrangement and method for checking the function of a logic circuit in a circuit arrangement
07/02/2009US20090172488 Semiconductor device
07/02/2009US20090172486 Testing embedded memories in an integrated circuit
07/02/2009US20090172485 Interconnections for plural and hierarchical p1500 test wrappers
07/02/2009US20090172484 Method for Implementing a Serialization Construct Within an Environment of Parallel Data Flow Graphs
07/02/2009US20090172282 Digital circuits and methods for testing a digital circuit
07/02/2009US20090171606 Semiconductor manufacture performance analysis
07/02/2009US20090171601 Battery detection device and method thereof
07/02/2009US20090171600 Battery State Judging Method, And Battery State Judging Device
07/02/2009US20090171599 Battery Discharge Indicator For Golf Car
07/02/2009US20090171598 Battery Pack, Electronic Appliance, And Method of Detecting Remaining Amount of Battery
07/02/2009US20090168665 Method and System for Network Migration Scheduling
07/02/2009US20090168643 Method and Apparatus for Transparent Auto-Recovery in Chain and Ring Networks
07/02/2009US20090167617 Antenna device and radio communication device
07/02/2009US20090167429 Methodology for assessing degradation due to radio frequency excitation of transistors
07/02/2009US20090167359 Current mode logic circuit and control apparatus therefor
07/02/2009US20090167341 System and method for testing a liquid crystal panel
07/02/2009US20090167340 Semiconductor chip test apparatus and testing method
07/02/2009US20090167339 Contactless Testing of Wafer Characteristics
07/02/2009US20090167338 Test pattern for analyzing capacitance of interconnection line
07/02/2009US20090167337 Semiconductor integrated circuit device which has first chip and second chip accessed via the first chip and test method thereof
07/02/2009US20090167336 Method and apparatus for dynamic characterization of reliability wearout mechanisms
07/02/2009US20090167335 Probe Card
07/02/2009US20090167333 Wafer level testing
07/02/2009US20090167331 Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection
07/02/2009US20090167323 Dynamic Range Recovery for Pulse-Modulated Measurements
07/02/2009US20090167319 Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatus
07/02/2009US20090167318 Voltage variance tester
07/02/2009US20090167317 Apparatus And Method For Test, Characterization, And Calibration Of Microprocessor-Based And Digital Signal Processor-Based Integrated Circuit Digital Delay Lines
07/02/2009US20090167316 Motherboard testing apparatus
07/02/2009US20090167315 High voltage cable testing method
07/02/2009US20090167314 Method and Device for Detecting Ground Faults in a Supply Cable
07/02/2009US20090167312 Short circuit detection for batteries
07/02/2009US20090167294 Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays
07/02/2009US20090167287 Method for distinguishing a first group of wires from other wires of a multi-wire cable, test connector for use in this method and a kit comprising such a multi-wire cable and test connector
07/02/2009US20090167275 Voltage regulator feedback protection method and apparatus
07/02/2009US20090167257 Shorted rotating diode detection and protection
07/02/2009DE112007002009T5 Schwellenspannungs-Steuervorrichtung, Prüfvorrichtung und Schaltungsanordnung Threshold voltage control device, test device and the circuit arrangement
07/02/2009DE112007001984T5 Signalerzeugungsvorrichtung, Prüfvorrichtung und Schaltungsanordnung Signal generating means, test device and the circuit arrangement
07/02/2009DE112007001316T5 Elektrisches System Electrical System
07/02/2009DE10252760B4 Verfahren zur Vorhersage des Innenwiderstands einer Speicherbatterie und Überwachungseinrichtung für Speicherbatterien A method for prediction of the internal resistance of a storage battery and monitoring device for storage batteries
07/02/2009DE102008061445A1 Halbleiter und Verfahren Semiconductors and procedures
07/02/2009DE102007063334A1 Prüfvorrichtung für eine Steckverbindung Device for testing a plug-in connection
07/02/2009DE102007063332A1 Prüfvorrichtung für eine Steckverbindung Device for testing a plug-in connection
07/02/2009DE102007063283A1 Prüfvorrichtung für eine Steckverbindung Device for testing a plug-in connection
07/02/2009DE102007063280A1 Battery sensor for measuring power, temperature and/or voltage of battery i.e. motor vehicle battery, has evaluation unit with communication units, where data is wirelessly conveyed to controller by sensor
07/02/2009DE102007063058A1 Contacting device for use in test system of electrical circuit, has holding frame for holding printed circuit board, and adjustment device for positioning printed circuit board part in adjustable position
07/02/2009DE102007062711A1 Halbleiterwafer mit einer Vielzahl von Sensorelementen und Verfahren zum Vermessen von Sensorelementen auf einem Halbleiterwafer Semiconductor wafer having a plurality of sensor elements and methods for measurement of sensor elements on a semiconductor wafer
07/02/2009DE102007061642A1 Defektkontrolle für ein oder mehrere elektrische Betriebselemente Defect inspection for one or more electrical elements
07/02/2009DE102007061539A1 Überwachungsschaltung für einen Energiespeicher und Verfahren zum Überwachen eines Energiespeichers Monitoring circuit for an energy storage device and method for monitoring an energy storage device
07/02/2009DE102007061532A1 Soldered contact connection manufacturing and verifying method for enameled wire wound coil, involves contacting solders surrounding enameled wire ends by contact pins based on verification result
07/02/2009DE10034835B4 Vorrichtung und Verfahren zum Transport von Bauteilen mittels Gasdruck Device and method for transport of components by means of gas pressure
07/02/2009CA2748172A1 Reducing power consumption in a network by detecting electrical signatures of appliances
07/01/2009EP2075871A2 method of identification and quality documentation of accumulators and accumulators for industrial tools
07/01/2009EP2075839A1 Method for evaluating semiconductor wafer
07/01/2009EP2075590A1 Method and apparatus for monitoring and analyzing battery consumption in mobile communication devices
07/01/2009EP2074549A1 Method and system for standing wave detection for radio frequency identification marker readers
07/01/2009EP2074438A1 Solar inverter and plant for converting solar energy into electrical energy
07/01/2009EP2074437A1 Method and device for monitoring a system
07/01/2009EP2074436A2 Thermography measurement system for conducting thermal characterization of integrated circuits
07/01/2009EP2074417A1 A self-contained apparatus for inspection of electric conductors
07/01/2009EP2000811A9 Method for determining location of phase-to-earth fault
07/01/2009EP1836515A4 Apparatus and method for using a counter-propagating signal method for locating events
07/01/2009EP1483818B1 Device for a battery charger
07/01/2009EP1474858B1 Method and apparatus for controlling energy transfer between an energy bus and a battery system based upon battery operating condition
07/01/2009EP1430318B1 Method and device for localizing a line fault
07/01/2009CN201266235Y Battery detection equipment
07/01/2009CN201266234Y Test device for electric property of AC generator set
07/01/2009CN201266233Y Checkout console for circuit breaker deferred action characteristic
07/01/2009CN201266232Y AC test device for on-load tap-changer operating characteristic of transformer
07/01/2009CN201266231Y 试验电路板 Breadboard
07/01/2009CN201266230Y Device for testing preventing quality of 10kV hot-line work insulated clothes
07/01/2009CN201266229Y 150kV portable intelligent series resonance pressure test device
07/01/2009CN201266228Y Automatic test device for detecting human body electrostatic grounding equipment
07/01/2009CN201266227Y Coaxial adapter
07/01/2009CN201266226Y Test system for integrated switch mechanical characteristic
07/01/2009CN201266225Y Test device for circuit board of electric energy meter based on virtual instrument technology
07/01/2009CN201266224Y Detection device for dimension variable accidental resonance square wave
07/01/2009CN201266223Y Cascade dimension variable accidental resonance rectangular filter
07/01/2009CN201266222Y Test device
07/01/2009CN201266221Y Improved structure of testing machine
07/01/2009CN201266220Y Power module test device
07/01/2009CN101473238A Logic device and method supporting scan test
07/01/2009CN101473237A Semiconductor device with test structure and semiconductor device test method