Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2010
12/01/2010CN101900748A Inspection fixture
12/01/2010CN101900747A Package chip acceptance device, test disk containing the packaging chip acceptance device and test grader using the packaging chip acceptance device
12/01/2010CN101614597B Monitoring device used for high voltage cable connector status in mine roadway
12/01/2010CN101592695B Dynamic performance test method for synchronous phasor measurement unit PMU
12/01/2010CN101571564B Testing tool of radio frequency (RF) coaxial connector
12/01/2010CN101509938B Low voltage high-current harmonic generator based on resonance manner
12/01/2010CN101477172B Analogue circuit fault diagnosis method based on neural network
12/01/2010CN101477168B Parallelization test system and method for transient stability of electric power system
12/01/2010CN101452680B Display driver with built-in test circuit and test method thereof
12/01/2010CN101408585B Method for testing evenness of bush DC motor windings
12/01/2010CN101408577B Analysis method of low-frequency oscillation node contribution factor based on wide field measuring information
12/01/2010CN101388544B Double loop cross wire failure type discriminating method for stabilizing control system
12/01/2010CN101382577B Single-phase earth fault positioning device for electrical power distribution network
12/01/2010CN101377449B Automatic test device of erbium-doped optical fiber amplifier
12/01/2010CN101363901B Method for detecting early failure of generator by enhancing transformations by electrical current characteristic
12/01/2010CN101354432B Battery performance monitor
12/01/2010CN101349731B Real time evaluating method of voltage stability
12/01/2010CN101344552B Grid system integrated protector tester
12/01/2010CN101344536B IC picking device with uniformly-spaced movement
12/01/2010CN101334445B Auxiliary fault detection system and method
12/01/2010CN101324653B Boundary scanning test connecting apparatus, method and system
12/01/2010CN101315403B Ground net corrosion detection method and system
12/01/2010CN101046505B Battery capacity calculation method
12/01/2010CN101042425B AC motor equipment exception signal extraction method
12/01/2010CN101022180B Battery pack
11/2010
11/30/2010US7844876 Temperature sampling in electronic devices
11/30/2010US7844875 Programmable test clock generation responsive to clock signal characterization
11/30/2010US7844873 Fault location estimation system, fault location estimation method, and fault location estimation program for multiple faults in logic circuit
11/30/2010US7844872 Semiconductor device
11/30/2010US7844871 Test interface for memory elements
11/30/2010US7844870 Method for embedded integrated end-to-end testing
11/30/2010US7844869 Implementing enhanced LBIST testing of paths including arrays
11/30/2010US7844857 Writing data processing control apparatus, writing method, and writing apparatus
11/30/2010US7844844 System and method for reserving information handling system battery charge to perform diagnostics
11/30/2010US7844747 Performance tuning using encoded performance parameter information
11/30/2010US7844725 Data streaming through time-varying transport media
11/30/2010US7844413 Self-generated test automation
11/30/2010US7844408 System and method for time domain reflectometry testing
11/30/2010US7844019 Timing recovery system for a multi-pair gigabit transceiver
11/30/2010US7843947 System and method for providing unequal error protection to priority labeled datagrams in a DVB-H transmission system
11/30/2010US7843850 Video quality assessment
11/30/2010US7843845 Diagnostic tool and method for troubleshooting multicast connectivity flow problem(s) in a layer 2 aggregation network
11/30/2010US7843843 Adaptive, application-aware selection of differntiated network services
11/30/2010US7843842 Method and system for initiating a remote trace route
11/30/2010US7843841 Method and apparatus for providing automatic crankback for emergency calls
11/30/2010US7843836 Systems, methods and computer program products for controlling high speed network traffic in server blade environments
11/30/2010US7843833 Detection and handling of lost messages during load-balancing routing protocols
11/30/2010US7843832 Dynamic bandwidth allocation apparatus and method
11/30/2010US7843830 Resilient retransmission of epoch data
11/30/2010US7843824 Method and apparatus for statistically multiplexing services
11/30/2010US7843821 Method, apparatus and program product to use factory-defined multiple MAC addresses for virtual NICS
11/30/2010US7843813 Managing hierarchically organized subscriber profiles
11/30/2010US7843812 Relay apparatus capable of preventing mistaken learning of MAC address learning table
11/30/2010US7843811 Method of solving a split-brain condition
11/30/2010US7843809 Preserving stable calls during failover
11/30/2010US7843807 Fault reporting tag for mesh access points
11/30/2010US7843210 Semiconductor integrated circuit device and testing method of the same
11/30/2010US7843208 Display substrate and apparatus and method for testing display panel having the same
11/30/2010US7843207 Methods and apparatus to test electronic devices
11/30/2010US7843206 Semiconductor integrated circuit and method for inspecting same
11/30/2010US7843205 Process monitor for monitoring an integrated circuit chip
11/30/2010US7843204 Electrical connecting apparatus
11/30/2010US7843203 Support member assembly having reinforcement member for conductive contact members
11/30/2010US7843202 Apparatus for testing devices
11/30/2010US7843198 Electrical connecting apparatus
11/30/2010US7843197 Protective device with end-of-life indication before power denial
11/30/2010US7842949 IC with comparator receiving expected and mask data from pads
11/30/2010US7842948 Flip chip semiconductor die internal signal access system and method
11/30/2010US7842621 Method of measuring nitrogen concentration, method of forming silicon oxynitride film, and method of manufacturing semiconductor device.
11/30/2010US7842519 In-line lithography and etch system
11/30/2010US7842189 Treatment device, treatment device consumable parts management method, treatment system, and treatment system consumable parts management method
11/30/2010US7841071 Position-correction device for correcting the position of a component holder for electronic components
11/30/2010CA2463590C Method and device for inspecting laminated iron cores of electrical machines for interlamination shorts
11/30/2010CA2420872C Re-locatable partial discharge transducer head
11/27/2010CA2666894A1 System for condition-based maintenance of complex equipment and structures
11/25/2010WO2010135607A1 Systems and methods for self testing a voltage controlled oscillator in an open loop configuration
11/25/2010WO2010134853A1 Modular energy storage system for driving electric motor
11/25/2010WO2010134625A1 Battery voltage monitoring device
11/25/2010WO2010134515A1 Method for calculating number of healthy strings of sodium-sulfur battery and failure detection method using same
11/25/2010WO2010134403A1 Semiconductor integrated circuit, circuit test system, circuit test unit, and circuit test method
11/25/2010WO2010133999A1 Test device to test the robustness of electronic circuits or devices
11/25/2010WO2010133730A2 Method and device for measuring characteristic curves in photovoltaic systems
11/25/2010WO2010133444A2 Method for examining an electric energy accumulator
11/25/2010WO2010133325A1 Method for spatially determining the series resistance of a semiconductor structure
11/25/2010WO2010133282A1 Method and device for insulation monitoring of non-grounded electrical dc and ac grids
11/25/2010WO2010133171A1 Testing system for hybrid power motor and testing method thereof
11/25/2010WO2010101416A3 Method and apparatus for diagnosing an abnormality of a current-measuring unit of a battery pack
11/25/2010WO2010098558A3 Probe block
11/25/2010WO2010096180A9 Adaptive energy management terminal for a battery
11/25/2010WO2010093517A3 Integrated unit for electrical/reliability testing with improved thermal control
11/25/2010US20100299571 Selectively accessing test access ports in a multiple test access port environment
11/25/2010US20100299570 Selectively accessing test access ports in a multiple test access port environment
11/25/2010US20100299569 Wafer scale testing using a 2 signal jtag interface
11/25/2010US20100299568 Selectively accessing test access ports in a multiple test access port environment
11/25/2010US20100299567 On-Chip Logic To Support Compressed X-Masking For BIST
11/25/2010US20100299566 Debugging module for electronic device and method thereof
11/25/2010US20100299096 Delay fault testing computer product, apparatus, and method
11/25/2010US20100299090 Method for monitoring the shaft current and/or the insulation of the shaft of electric machines and device for performing the method
11/25/2010US20100297863 Electrical contactor, especially wafer level contactor, using fluid pressure
11/25/2010US20100297785 Manufacture of defect cards for semiconductor dies
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