Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2010
12/08/2010CN101539394B Intelligent communication cable alarm distance meter and test method thereof
12/08/2010CN101515015B Power quality monitoring and recording device of power system
12/08/2010CN101487866B On-line detection method for AC power transmission line porcelain zero resistance insulator based on infrared thermal imaging
12/08/2010CN101477165B Integrated test system for security and efficiency of washing machine
12/08/2010CN101441242B Method for detecting failure current cutting-off time when electric power system out of order
12/08/2010CN101432630B Power applying circuit and testing apparatus
12/08/2010CN101430849B Test device for display driving circuit
12/08/2010CN101413983B IGBT bridge circuit and drive protective circuit detection device
12/08/2010CN101413981B Electric power system operation standby reliability testing system
12/08/2010CN101408583B Method and device for detecting inserting state between printed circuit boards and printed circuit boards
12/08/2010CN101387689B Method for testing safety of lithium secondary battery by alkaline cell
12/08/2010CN101382670B Liquid crystal display device signal lead repairing structure and repairing method thereof
12/08/2010CN101375172B Test tray for test sorter
12/08/2010CN101373193B Battery emulation apparatus
12/08/2010CN101369008B Thermal switching test system and method for redundant power supply
12/08/2010CN101359799B Connecting method of electric connector and general battery interface
12/08/2010CN101359037B Method for implementing gradation for battery voltage of mobile terminal and the mobile terminal
12/08/2010CN101308184B Method and system for analyzing and detecting inserting element using image
12/08/2010CN101299054B Measuring method of dye sensitization nano-film solar cell I-V characteristic and conversion efficiency characteristic
12/08/2010CN101261306B Full-automatic wafer test method and equipment accomplishing the method
12/08/2010CN101191817B Circular edge detector and edge detection method
12/08/2010CN101183399B Method for analyzing and increasing yield of semi-conductor production line
12/08/2010CN101183139B Board based on JTAG interface and design method thereof
12/08/2010CN101169340B Main board light-emitting diode detection device and method
12/08/2010CN101162253B PDP substrates medium layer characteristic test device
12/08/2010CN101144741B Temperature detector
12/08/2010CN101140312B Plasma display board electric pole short circuit, broken circuit detecting method and device thereof
12/08/2010CN101135710B Circuit for detecting radio-frequency power amplifier output terminal port communicating condition
12/08/2010CN101093498B Apparatus for storing variable values to provide context for test results that are to be formatted
12/08/2010CN101086520B Method and apparatus for real-time life estimation of an electric energy storage device in a hybrid electric vehicle
12/08/2010CN101025746B Method and apparatus for inferring relationships between test results
12/07/2010USRE41992 Methods and circuitry for built-in self-testing of content addressable memories
12/07/2010US7849426 Mechanism for detection and compensation of NBTI induced threshold degradation
12/07/2010US7849374 Testing a transceiver
12/07/2010US7849373 Method of testing a memory module and hub of the memory module
12/07/2010US7849344 Method for improving accuracy in providing information pertaining to battery power capacity
12/07/2010US7848899 Systems and methods for testing integrated circuit devices
12/07/2010US7848248 Method and apparatus for measuring one way transmission delay
12/07/2010US7848245 Network-wide connection-based debug mechanism
12/07/2010US7848241 Method and apparatus for handoff control in mobile communications systems
12/07/2010US7848240 Method and apparatus for forwarding data in a data communications network
12/07/2010US7848237 System and method for selective packet discard for the transport of multiple transportation streams of streaming media in packet-based networks
12/07/2010US7848231 Packet communication network and packet communication method
12/07/2010US7848227 Retransmit timeout suppression in large scale networks
12/07/2010US7848224 Method and apparatus for constructing a repair path for multicast data
12/07/2010US7847580 System and method for motor fault detection using stator current noise cancellation
12/07/2010US7847579 Systems and methods to evaluate permanent magnet motors
12/07/2010US7847578 Power supply circuit and test apparatus
12/07/2010US7847577 Active matrix substrate, display device, and active matrix substrate inspecting method
12/07/2010US7847576 Comparator with latching function
12/07/2010US7847575 Method and apparatus for nano probing a semiconductor chip
12/07/2010US7847574 Semiconductor device
12/07/2010US7847573 Test apparatus and performance board
12/07/2010US7847572 Test system, electronic device, and test apparatus
12/07/2010US7847571 Semiconductor test system with self-inspection of electrical channel for Pogo tower
12/07/2010US7847570 Laser targeting mechanism
12/07/2010US7847569 Probe device and method of regulating contact pressure between object to be inspected and probe
12/07/2010US7847568 Multi-site probe
12/07/2010US7847567 Verifying a printed circuit board manufacturing process prior to electrical intercoupling
12/07/2010US7847566 Configurable prober for TFT LCD array test
12/07/2010US7847563 Test system
12/07/2010US7847562 Method and apparatus for detection of resistive fault conditions
12/07/2010US7847561 Network device, network connection detector and detection method thereof
12/07/2010US7847560 Method to detect and locate a breach in vertical or horizontal intersections in a membrane of a roof
12/07/2010US7847538 Testing micromirror devices
12/07/2010US7847439 Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith
12/07/2010US7847388 Method of manufacturing a semiconductor device
12/07/2010US7847237 Method and apparatus for testing and evaluating performance of a solar cell
12/07/2010US7846792 Method for manufacturing semiconductor device and semiconductor device manufacturing system
12/07/2010CA2356068C Network test instrument
12/02/2010WO2010139157A1 An intelligent polar identifying device
12/02/2010WO2010138966A1 Monolithic voltage reference device with internal, multi-temperature drift data and related testing procedures
12/02/2010WO2010138951A2 Control system for a flow cell battery
12/02/2010WO2010138246A1 Detection of rotor side anomaly in an induction machine
12/02/2010WO2010137935A1 Device for the predictive monitoring and thermal protection of motors and electrical machines
12/02/2010WO2010137199A1 Semiconductor device
12/02/2010WO2010137076A1 Pulse measurement device, pulse measurement method, and test apparatus using the device and the method
12/02/2010WO2010137058A1 Reception device, test device, reception method, and test method
12/02/2010WO2010136999A1 Instrument and method for detecting partial electric discharges in an electric apparatus
12/02/2010WO2010136330A1 Measuring a substrate having electrically conductive structures
12/02/2010WO2010136284A1 Method and device for monitoring the insulation of ungrounded dc and ac voltage networks
12/02/2010WO2010136266A1 Method for determining the origin of power outages
12/02/2010WO2010116319A3 A method and apparatus for monitoring an elongate conductor
12/02/2010US20100306609 Low Power Decompression Of Test Cubes
12/02/2010US20100306608 Circuit States
12/02/2010US20100306607 Semiconductor integrated circuit and method of testing the same
12/02/2010US20100306606 Compactor independent direct diagnosis of test hardware
12/02/2010US20100305897 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
12/02/2010US20100305890 System and method for evaluating power usage
12/02/2010US20100304512 System for Diagnosis and Treatment of Photovoltaic and Other Semiconductor Devices
12/02/2010US20100304510 Fabrication method of semiconductor integrated circuit device
12/02/2010US20100304509 Contactless technique for evaluating a fabrication of a wafer
12/02/2010US20100303589 Plunger for holding and moving electronic components in particular ics
12/02/2010US20100301895 Test system and test method of semiconductor integrated circuit
12/02/2010US20100301894 Semiconductor device capable of verifying reliability
12/02/2010US20100301893 Semiconductor integrated circuit and circuit operation method
12/02/2010US20100301892 Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method
12/02/2010US20100301891 Liquid crystal display, testing method thereof and manufacturing method thereof
12/02/2010US20100301889 Circuit board unit and testing apparatus
12/02/2010US20100301888 Probe device
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