| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/04/2011 | US7864681 Method and system for a gigabit ethernet IP telephone chip with 802.1p and 802.1Q quality of service (QoS) functionalities |
| 01/04/2011 | US7864671 Connection control apparatus, connection control method, and program |
| 01/04/2011 | US7864670 Dynamic cable assignment on Gigabit infrastructure |
| 01/04/2011 | US7864665 Methods and systems for detecting IP route failure and for dynamically re-routing VoIP sessions in response to failure |
| 01/04/2011 | US7863954 Timing vernier using a delay locked loop |
| 01/04/2011 | US7863925 Test circuit, wafer, measuring apparatus, and measuring method |
| 01/04/2011 | US7863924 Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies |
| 01/04/2011 | US7863923 Adaptive test time reduction for wafer-level testing |
| 01/04/2011 | US7863922 Evaluation method of insulating film and measurement circuit thereof |
| 01/04/2011 | US7863921 Circuit board and method for automatic testing |
| 01/04/2011 | US7863920 Electrostatic discharge test system and electrostatic discharge test method |
| 01/04/2011 | US7863919 Applying test response start and command signals to power lead |
| 01/04/2011 | US7863918 Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits |
| 01/04/2011 | US7863917 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same |
| 01/04/2011 | US7863916 Device mounted apparatus, test head, and electronic device test system |
| 01/04/2011 | US7863915 Probe card cooling assembly with direct cooling of active electronic components |
| 01/04/2011 | US7863914 Method for testing semiconductor memory device using probe and semiconductor memory device using the same |
| 01/04/2011 | US7863913 Parallel scan distributors and collectors and process of testing integrated circuits |
| 01/04/2011 | US7863912 Circuit board testing system using free space optical communications |
| 01/04/2011 | US7863911 Test device and method for measurement of tunneling magnetoresistance properties of a manufacturable wafer by the current-in-plane-tunneling technique |
| 01/04/2011 | US7863906 Systems and methods for determining the configuration of electronic connections |
| 01/04/2011 | US7863905 Detection and monitoring of partial discharge of a power line |
| 01/04/2011 | US7863890 Apparatus for testing integrated circuitry |
| 01/04/2011 | US7863889 Component receptacle to segregate components |
| 01/04/2011 | US7863888 Efficient switching architecture with reduced stub lengths |
| 01/04/2011 | US7862944 Method for detection and diagnosis of isolation faults in fuel cell hybrid vehicles |
| 01/04/2011 | CA2551565C Cdma integrated circuit demodulator with build-in test pattern generation |
| 01/04/2011 | CA2522239C Anisotropic conductive film and manufacturing method thereof |
| 01/04/2011 | CA2434948C Ground fault/arc fault circuit interrupter and method of testing the same with a test button and a reset button |
| 01/04/2011 | CA2379639C Method and apparatus for detecting slow and small changes of electrical signals including the sign of the changes, and circuit arrangement for the exact detection of the peak value of an alternating voltage |
| 12/30/2010 | US20100332932 Test method, test control program and semiconductor device |
| 12/30/2010 | US20100332931 Method for Speeding Up Serial Data Tolerance Testing |
| 12/30/2010 | US20100332930 Storage circuit, integrated circuit, and scanning method |
| 12/30/2010 | US20100332929 Scan testable register file |
| 12/30/2010 | US20100332928 Scalable scan system for system-on-chip design |
| 12/30/2010 | US20100332927 Generic debug external connection (gdxc) for high integration integrated circuits |
| 12/30/2010 | US20100332177 Test access control apparatus and method thereof |
| 12/30/2010 | US20100332166 Information processing apparatus and battery degradation detection method |
| 12/30/2010 | US20100332165 Method of Estimating Pulse Response Using an Impedance Spectrum |
| 12/30/2010 | US20100332163 Methods, device and installation for locating a defect in an electric link |
| 12/30/2010 | US20100332162 System for testing matrix type connector |
| 12/30/2010 | US20100332161 Monitoring system and method for wiring systems |
| 12/30/2010 | US20100328824 Arc Flash Detection |
| 12/30/2010 | US20100327958 Leakage Current Mitigation in a Semiconductor Device |
| 12/30/2010 | US20100327911 Semiconductor Device and a Display Device |
| 12/30/2010 | US20100327908 Method and apparatus for die testing on wafer |
| 12/30/2010 | US20100327901 Power supply testing system |
| 12/30/2010 | US20100327900 Polishing head testing with movable pedestal |
| 12/30/2010 | US20100327899 Design support apparatus and design support method |
| 12/30/2010 | US20100327898 Probe card and inspection apparatus |
| 12/30/2010 | US20100327897 Wiring substrate and probe card |
| 12/30/2010 | US20100327896 Probe assembly and manufacturing method thereof |
| 12/30/2010 | US20100327893 Probing Structure for Evaluation of Slow Slew-Rate Square Wave Signals in Low Power Circuits |
| 12/30/2010 | US20100327892 Parallel Array Architecture for Constant Current Electro-Migration Stress Testing |
| 12/30/2010 | US20100327891 Method and apparatus for thermally conditioning probe cards |
| 12/30/2010 | US20100327890 Quality control process for umg-si feedstock |
| 12/30/2010 | US20100327879 Circuit test jig and circuit testing method |
| 12/30/2010 | US20100327878 Disconnection detecting device |
| 12/30/2010 | US20100327877 Radio frequency identification (rfid) device and method for testing the same |
| 12/30/2010 | US20100327876 Layout structure of electronic elements and method for addressing to detect electronic elements |
| 12/30/2010 | US20100327875 Integrated Circuit Thermally Induced Noise Analysis |
| 12/30/2010 | US20100327872 Devices And Methods For LED Life Test |
| 12/30/2010 | US20100327815 Battery pack |
| 12/30/2010 | US20100327800 High speed feedback for power load reduction using a variable generator |
| 12/30/2010 | US20100325872 Razors |
| 12/30/2010 | DE102010017934A1 Alarmsysteme und Verfahren für Fahrzeugladekabel Alarm systems and procedures for vehicle charging cable |
| 12/30/2010 | DE102009030540A1 Electronic component analyzing method involves loading electronic component in mechanical manner, where electronic component is switched in electric circuit, and is applied with electrical signal |
| 12/30/2010 | DE102009024377A1 Zerstörungsfreies Analyseverfahren zur Güteermittlung einer Dünnschichtsolarzelle mittels Photolumineszenzspektroskopie Non-destructive analysis method for determining a quality thin-film solar cell by means of photoluminescence spectroscopy |
| 12/30/2010 | DE102007050241B4 Speichermodul und Testsystem Memory module test system, and |
| 12/30/2010 | DE102006005319B4 Heizvorrichtung zum Testen integrierter Bauelemente Heating device for testing integrated components |
| 12/30/2010 | CA2707781A1 Arc flash detection |
| 12/29/2010 | WO2010150667A1 Battery control apparatus and battery control method |
| 12/29/2010 | WO2010150625A1 Battery charging and discharging control apparatus |
| 12/29/2010 | WO2010150601A1 Insulation resistance measurement device and insulation resistance measurement method |
| 12/29/2010 | WO2010150599A1 Capacitor capacity diagnosis device and power equipment provided with a capacitor capacity diagnosis device |
| 12/29/2010 | WO2010150532A1 Electronic part and method of detecting faults therein |
| 12/29/2010 | WO2010150436A1 Contactless charging system |
| 12/29/2010 | WO2010150322A1 Test method and test system for ac coupling input buffer, and semiconductor integrated circuit |
| 12/29/2010 | WO2010150304A1 Phase detection device, test device, and adjustment method |
| 12/29/2010 | WO2010150076A1 Upper-limit of state-of-charge estimating device and upper-limit of state-of-charge estimating method |
| 12/29/2010 | WO2010149935A1 Detection of defects in an electrochemical device |
| 12/29/2010 | WO2010149613A1 Warning system for battery systems |
| 12/29/2010 | WO2010149551A1 Method for measuring a power component |
| 12/29/2010 | WO2010149077A1 Method for implementing electromagnetic anti-interference filter impedance match and measuring system thereof |
| 12/29/2010 | WO2010148570A1 Method for identifying type of fault on power line |
| 12/29/2010 | WO2010148427A1 Power lead testing system and electronic tag |
| 12/29/2010 | EP2267861A1 Battery charging system for charging a plurality of batteries |
| 12/29/2010 | EP2267739A1 Method for monitoring a state of a voltage switch and device for monitoring the mechanical state of a voltage switch |
| 12/29/2010 | EP2267574A2 Detection of bad clock conditions |
| 12/29/2010 | EP2267469A1 Apparatus and method for detecting the state of a battery |
| 12/29/2010 | EP2267468A1 Monitoring system and method for wiring systems |
| 12/29/2010 | EP2267466A1 Apparatus for measuring the voltage and current generated by photovoltaic panels |
| 12/29/2010 | EP2266180A1 Battery module |
| 12/29/2010 | EP2038668B1 Semiconductor device with test structure and semiconductor device test method |
| 12/29/2010 | EP2024755B1 A method for determining the linear electrical response of a transformer, generator or electrical motor |
| 12/29/2010 | EP2020070B1 A time alert device for use together with an earth leakage protection device |
| 12/29/2010 | EP1751560B1 Method of operating a shielded connection, and communications network |
| 12/29/2010 | EP1601980B1 Wrist joint for positioning a test head |
| 12/29/2010 | EP1410048B1 Test head docking system and method |
| 12/29/2010 | EP1364297B1 Methods and apparatus for protecting against overload conditions on nodes of a distributed network |