Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2010
12/29/2010CN101387765B Display device
12/29/2010CN101382578B Detection device for quality of rubber stress cone with different cable sectional
12/29/2010CN101354420B System for detecting programmed control distance-changing accidental resonance square wave
12/29/2010CN101292166B Insulation inspecting device and insulation inspecting method
12/29/2010CN101286050B Test instrumentation control system and method
12/29/2010CN101281225B Special high-tension current inductor transient characteristics tester
12/29/2010CN101272057B Portable mobile charging power supply
12/29/2010CN101256199B Clamper
12/29/2010CN101236232B Method for looking for power line damaged porcelain bottle
12/29/2010CN101122613B Carrier tray for use with prober
12/29/2010CN101093244B Semiconductor device, semiconductor device testing method, and probe card
12/29/2010CN101023528B Electric assembly processor, contact assembly and double side contacts element
12/29/2010CA2766481A1 Detection of defects in an electrochemical device
12/28/2010US7861228 Variable delay instruction for implementation of temporal redundancy
12/28/2010US7861130 System and method of determining the speed of digital application specific integrated circuits
12/28/2010US7861129 Integrated circuit for writing and reading registers distributed across a semiconductor chip
12/28/2010US7861128 Scan element with self scan-mode toggle
12/28/2010US7860054 Method and apparatus for using single-radio nodes and multi-radio nodes in a network
12/28/2010US7860021 Apparatus, system and method for maintaining communication between an information processing device and a server
12/28/2010US7860018 Thermal transmission control of wireless data modem
12/28/2010US7860017 Network assessment and fault isolation
12/28/2010US7860015 Methods and apparatus for physical and logical SAN fabric analysis
12/28/2010US7860013 Methods and systems for using in-stream data within an on demand content delivery path
12/28/2010US7860012 Employing parallel processing for routing calls
12/28/2010US7860011 Method and system for fault resilience in networks with Audio/Video Bridging aware Shortest Path Bridging
12/28/2010US7860001 Telecommunications method and system involving active nodes having full receive state and isolated receive state from non-allocated traffic
12/28/2010US7859994 Method and apparatus to switch data flows using parallel switch fabrics
12/28/2010US7859993 Two-phase fast reroute with optimized traffic engineering
12/28/2010US7859992 Router redundancy in data communication networks
12/28/2010US7859420 Devices for testing the operability of electronic circuitry
12/28/2010US7859293 Semiconductor integrated circuit
12/28/2010US7859291 Method of measuring on-resistance in backside drain wafer
12/28/2010US7859290 Apparatus and method for measuring effective channel
12/28/2010US7859289 Method for measuring interface traps in thin gate oxide MOSFETS
12/28/2010US7859288 Test apparatus and test method for testing a device based on quiescent current
12/28/2010US7859287 Device power supply extension circuit, test system including the same and method of testing semiconductor devices
12/28/2010US7859286 Electronic device test system
12/28/2010US7859285 Device under test array for identifying defects
12/28/2010US7859284 Semiconductor device and semiconductor device module
12/28/2010US7859283 Probe apparatus, probing method, and storage medium
12/28/2010US7859282 Electrical connecting apparatus
12/28/2010US7859281 Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester
12/28/2010US7859280 Probe card for testing semiconductor devices
12/28/2010US7859279 Charge eliminating apparatus and method, and program storage medium
12/28/2010US7859277 Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array
12/28/2010US7859276 Non-destructive validation of semiconductor devices
12/28/2010US7859275 Parallel scan distributors and collectors and process of testing integrated circuits
12/28/2010US7859274 System for testing a flat panel display device and method thereof
12/28/2010US7859269 Pade' approximant based compensation for integrated sensor modules and the like
12/28/2010US7859268 Method of testing driving circuit and driving circuit for display device
12/28/2010US7859267 Testing device for lighting means
12/28/2010US7859248 Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus
12/28/2010US7859247 Device, system and method for monitoring electromagnetic fields
12/28/2010US7858406 Semiconductor device test structures and methods
12/28/2010US7858405 Process condition evaluation method for liquid crystal display module
12/28/2010US7858404 Measurement of overlay offset in semiconductor processing
12/28/2010US7858402 Integrated circuit package having reversible ESD protection
12/23/2010WO2010147376A2 Method for controlling electric compressor
12/23/2010WO2010146773A1 Microcontact prober
12/23/2010WO2010146709A1 Electronic parts transfer system, and electronic parts transfer method
12/23/2010WO2010146708A1 Electronic-part transfer apparatus, and electronic-part testing system provided with the transfer device
12/23/2010WO2010146279A1 Measurement of the ionisation current of an ignition system of an internal combustion engine
12/23/2010WO2010146086A1 Device for monitoring a gas-insulated high-voltage substation by measuring partial discharges
12/23/2010WO2010145692A1 An arrangement for testing a switching cell
12/23/2010WO2010145631A1 Measuring instrument, electrical resistance elements and measuring system for measuring time-variable magnetic fields or field gradients
12/23/2010WO2010145287A1 Method for displaying standby time of mobile terminal and device thereof
12/23/2010WO2010114281A3 Voltage-detecting member, and battery module including same
12/23/2010US20100325499 Cpu voltage testing system and method thereof
12/23/2010US20100324855 Systems and methods for remote electronics device testing
12/23/2010US20100324848 Apparatus and method for testing state of charge in battery
12/23/2010US20100324847 Battery gas-gauge circuit and method thereof
12/23/2010US20100324846 Method and system for estimating battery life
12/23/2010US20100322024 Semiconductor memory, system, operating method of semiconductor memory, and manufacturing method of semiconductor memory
12/23/2010US20100321838 Arc flash detection system
12/23/2010US20100321056 System and method of measuring probe float
12/23/2010US20100321055 Ic test vector generator for synchronized physical probing
12/23/2010US20100321054 Semiconductor inspecting device and semiconductor inspecting method
12/23/2010US20100321053 Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method
12/23/2010US20100321052 Pre-alignment method of semiconductor wafer and computer-readable recording medium having pre-alignment program recorded thereon
12/23/2010US20100321051 Semiconductor integrated circuit, debug/trace circuit and semiconductor integrated circuit operation observing method
12/23/2010US20100321050 On-chip measurement of signals
12/23/2010US20100321031 Optical component identifier
12/23/2010US20100321030 System and method to provide lubrication for a plug-in hybrid
12/23/2010US20100320996 Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested
12/23/2010US20100320995 Atom chip device
12/23/2010US20100320348 Opener and buffer table for test handler
12/23/2010DE202010014592U1 Kontrolle der externen Energiequelle eines Elektrozaungerätes Check the external power source of an electric fence controller
12/23/2010DE202010014204U1 Vorrichtung zur Einzelüberwachung aller Fotovoltaikmodule einer Fotovoltaikanlage Device for individual monitoring of all PV modules of a photovoltaic system
12/23/2010DE112008003713T5 Elektromigrationster für hohe Kapazität und hohen Strom Electromigration provider for high capacity and high power
12/23/2010DE112008003165T5 System zum Schätzen des Degradationszustands eines Akkumulators System for estimating the degradation state of an accumulator
12/23/2010DE102009044816A1 Electrically operable adjusting device for adjusting e.g. seating furniture, has monitoring device including voice outputting device and storage device for storing voice information outputted from voice outputting device
12/23/2010DE102009029933A1 Gebäudemanagementsystem Building Management System
12/23/2010DE102006035103B4 Otologische Vorrichtung mit Batteriestandsanzeige Otological device with battery level indicator
12/22/2010EP2264945A2 Communication analysis apparatus and communication analysis method
12/22/2010EP2264944A2 Communication analysis apparatus and communication analysis method
12/22/2010EP2264600A2 Enhanced embedded logic analyzer
12/22/2010EP2264599A2 Enhanced embedded logic analyzer
12/22/2010EP2264598A2 Enhanced embedded logic analyzer
12/22/2010EP2264473A1 Method and system for optimal adjustment of the impedance of an input source of electronic components, in particular of transistors
12/22/2010EP2264472A2 Device for measuring the loss factor
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